Growth of High-Quality GaAs on Ge by Controlling the Thickness and Growth Temperature of Buffer Layer

In the last two decades, m-v compound semi- conductor materials grown on elemental semiconduc- tor substrates have attracted much attention due to their potential applications in high-efficiency so- lar cells, photodetectors, quantum-dot （QD） lasers, and metal-oxide-semiconductor field-effect transistors （MOSFETs）. Due to their extremely high electron mobility, III-V semiconductors such as GaAs, InGaAs and InAs are believed to be chan- nel materials for future complementary metal-oxide- semiconductor （CMOS） technology.CMOS tran- sistors on Ge substrates with high mobility In- GaAs/Ge channels have already been fabricated by using a wafer bonding technique, which is a promis- ing step for such a device on Si.     

Effect of Stress in GaN/AIInGaN Grown on GaN Templates with Different Stress States

We clarify the effect of the stress in GaN templates on the subsequent AIlnGaN deposition by simply growing 150nm AIInGaN on a 30μm GaN template （sample 1） prepared by hydride vapor phase epitaxy and a 2.3μm thin control GaN template （sample 2） prepared by metalorganic chemical vapor deposition. X-ray diffraction and secondary iron mass spectroscopy measurements reveal the stress states （tensile stress and full relaxed for samples 1 and 2, respectively） and compositions （Al0.169In0.01 Ga0.821N, Al0.171In0.006 Ga0.823N for samples 1 and 2, respectively） of AlInGaN. By carefully eliminating other possible factor, as template surface roughness, it is concluded that different stress states of AlInGaN should stem from different stress states of GaN templates.     

Synthesis and Growth Mechanism： A Novel Fishing Rod-Shaped GaN Nanorods

A novel fishing rod-shaped GaN nanorod is successfully fabricated through a new method by using the two-step growth technology. This growth method is applicable to continuous synthesis and is able to produce a large number of single-crystalline GaN nanorods with a relatively high purity and at a low cost. X-ray diffraction, scanning electron microscopy and high-resolution transmission electron microscopy are used to characterize the as- synthesized nanorods. The results show that most of the nanorods consist of a main rod and a top curved thread. It is single-crystal GaN with hexagonal wurtzite structure. The representative photoluminescence spectrum at room temperature exhibits a strong UV light emission band centered at 370.8nm. Furthermore, a possible two-stage growth mechanism of the fishing rod-shaped GaN nanorod is also briefly discussed.     

Structure Dependence of Magnetic Properties for Annealed GaMnN Films Grown by MOCVD

GaMnN/GaN multilayers and conventional GaMnN single layers are grown by metal-organic chemical vapor deposition. Both kinds of samples show room-temperature ferromagnetism. After thermal annealing, the sample with GaMnN/GaN multilayer structure displays a larger coercivity and better thermal stability compared to the GaMnN single layer. The annealing effects on Vca related defects are observed from photoluminescenee measurements. Moreover, a different magnetic behavior is also found in the annealed GaMnN films grown on different （n-type GaN and p-type GaN） templates. These kinds of structure-dependent magnetic behaviors indicate that defects or carriers transformation introduced during annealing may have important effects on the electronic structure of Mn ions and on the ferromagnetism. Our work may be helpful for further understanding the origin of ferromagnetism in GaN-based diluted magnetic semiconductors.     

Radio-Frequency Performance of Epitaxial Graphene Field-Effect Transistors on Sapphire Substrates

We report dc and the first-ever measured small signal rf performance of epitaxial graphene field-effect transistors （GFETs）, where the epitaxial graphene is grown by chemical vapor deposition （CVD） on a 2-inch c-plane sapphire substrate. Our epitaxial graphene material has a good flatness and uniformity due to the low carbon concentration during the graphene growth. With a gate length Lg = 100 nm, the maximum drain source current Ids and peak transconductance gm reach 0.92 A/mm and 0.143 S/mm, respectively, which are the highest results reported for GFETs directly grown on sapphire. The extrinsic cutoff frequency （fT） and maximum oscillation frequency （fmax） of the device are 12 GHz and 9.5 GHz, and up to 32 GHz and 21.5 GHz after de-embedding, respectively. Our work proves that epitaxial graphene on sapphire substrates is a promising candidate for rf electronics.     

高压对溶液中聚左旋乳酸单晶生长的影响

采用高压技术实现了500 MPa下聚左旋乳酸(PLLA)在稀薄二甲苯溶液中的单晶生长,采用透射电子显微镜、拉曼光谱和红外光谱对样品的结晶形态和结构进行了表征,考察了高压对聚左旋乳酸单晶生长行为的影响。结果表明,在相同的结晶温度和时间下,高压结晶PLLA的单晶仍为α-型晶体,但单晶尺寸明显大于常压样品;高压环境下PLLA分子链在晶核两端的生长扩散速率不同,容易形成非对称的菱晶形态;高压影响PLLA晶体中分子链的构象分布;在单晶生长期,高压诱导有利于PLLA晶体成核,但不利于单晶生长。     

多尺度无监督彩色图像分割

非采样Contourlet变换是一种新的多尺度多分辨率分析工具.本文提出了一种基于非采样Contourlet变换的彩色图像无监督分割算法.首先利用非采样Contourlet变换的平移不变性在其变换域应用梯度向量法提取图像多尺度边缘|然后在Contourlet变换域的低频子带和高频子带中分别提取局部低频能量纹理特征与高频多尺度Zernike矩纹理特征,并将二种纹理特征融合.最后在边缘图像中映射种子像素点,利用纹理和颜色特征欧氏距离,对彩色图像采用区域生长和区域合并的方法进行分割.实验结果证明:该算法将图像空间域的颜色特征与非采样Contourlet变换域的多尺度边缘和纹理特征恰当结合在一起实现彩色图像无监督自动分割,与传统算法相比有更高的准确性和鲁棒性.     

BaTiO_3晶体薄膜PLD法生长工艺参量研究

采用脉冲激光沉积方法在单晶MgO基片上外延生长了BaTiO3晶体薄膜.为改善薄膜的结晶质量和表面粗糙度,研究并优化了生长工艺中生长温度和激光能量两个参量,并对薄膜样片实行原位退火.找到了BaTiO3薄膜在优先方向上的结晶效果,分析了结晶质量对生长温度的依赖关系和不同激光能量对结晶薄膜的表面粗糙度的影响.利用X射线衍射仪测定结晶效果与特性,原子力显微镜表征BaTiO3薄膜的结晶表面形貌与粗糙度.测试结果表明,在c轴取向生长BaTiO3薄膜,在(001)和(002)方向上都出现强度很高的尖锐衍射峰,具有较好的结晶质量和较小的表面粗糙度,原子力显微镜测定出薄膜的表面粗糙度为0.563nm.     

Ca掺杂对CuCrO_2薄膜形成和电学特性的影响

采用溶胶凝胶法制备CuCrCaO2薄膜,研究不同气氛、退火温度下,Ca掺杂量对薄膜的形成和电学特性的影响.在N2环境中1 100℃退火,制得CuCr1-xCaxO2(x=0、0.01、0.03、0.05、0.07)薄膜.测量CuCrCaO2薄膜的X射线衍射,在低浓度Ca掺杂时,薄膜结晶良好,晶格常数a、c和平均晶粒尺寸n随掺杂浓度上升而上升;高浓度Ca掺杂时,有杂相生成,a、c、n重新变小,和X射线衍射分析结果相吻合.另将3%Ca掺杂量,分层旋涂后的薄膜分别在空气和N2中以不同温度快速退火,X射线衍射表明在N2条件下,分层次的掺杂使CuCrCaO2结晶取向趋于单一,并且退火温度越高,择优取向越明显.用霍尔仪测量不同Ca掺杂量薄膜的电学特性,x=0.03时薄膜有最佳电导率1.22×10-1S/cm,比未掺杂的薄膜提高了三个数量级,说明适量Ca掺杂有助于提高薄膜电导率,对应的薄膜载流子迁移率为1.77×1018cm-3,正的霍尔系数表明该材料是P型结构.     

Effects of V/III ratio on a-plane GaN epilayers with an InGaN interlayer

The effects of V/Ill growth flux ratio on a-plane GaN films grown on r-plane sapphire substrates with an InGaN interlayer are investigated. The surface morphology, crystalline quality, strain states, and density of basal stacking faults were found to depend heavily upon the V/III ratio. With decreasing V/III ratio, the surface morphology and crystal quality first improved and then deteriorated, and the density of the basal-plane stacking faults also first decreased and then increased. The optimal V/III ratio growth condition for the best surface morphology and crystalline quality and the smallest basal-plane stacking fault density of a-GaN films are found. We also found that the formation of basal-plane stacking faults is an effective way to release strain.