LiF修饰阴极的双层有机电致发光器件的延时效应

基于载流子的注入、传输和复合过程,建立了双层有机发光器件的电致发光延时理论模型;讨论了电致发光延时随电压、注入势垒、内界面势垒、阳极区厚度及LiF缓冲层(BL)厚度的变化关系。结果表明:(1)低电压下,EL延时由复合过程主导,而高电压下,输运过程起着更重要的作用;(2)当δe/δh2时,M/O界面属于欧姆接触,电流是空间电荷限制的,注入势垒的变化对复合时间trec影响较大,当δe/δh2时,M/O界面成为接触限制,注入势垒的变化对trec几乎没有影响;(3)当内界面势垒超过0.3eV,H′h对trec的影响明显变弱,复合延迟时间基本上由电压和其它因素控制;(4)当电压较小时,随Lh/L的增大,trec增大;当电压超过某一值后,trec几乎不随Lh/L的变化而变化;(5)对于LiF/Ag阴极,在不同的偏压下,LiF的厚度在3.1nm左右时的复合时间最短,对应的EL延迟时间也最短,这与实验中从电致发光效率的角度得出的LiF最佳厚度一致。     

低工作电压聚噻吩薄膜晶体管

以高掺杂Si单晶片作为衬底且充当栅电极,采用磁控溅射法在硅片上沉积HfTiO薄膜作为栅介质层,聚三己基噻吩(P3HT)薄膜作为半导体活性层,金属Au作为源、漏电极,并采用十八烷基三氯硅烷(OTS)对栅介质层表面修饰,在空气环境下成功地制备出聚合物薄膜晶体管(PTFT).PTFT器件测试结果表明,该晶体管在低的驱动电压(<-1 V)下仍呈现出良好的饱和行为,其阈值电压和有效场效应迁移率分别为0.4 V和2.2×10^-2 cm²/V ·s.通过对金属-聚合物-氧化物 关键词： 聚合物薄膜晶体管 聚三己基噻吩 场效应迁移率 k栅介质')" href="#">高k栅介质     

介质pH对银基上4-甲基-4H-3-巯基-1,2,4-三氮唑成膜结构和缓蚀性能影响的SERS和电化学研究

在不同pH介质中,缓蚀试剂4-甲基-4H-3-巯基-1,2,4-三氮唑(4-MTTL)都能在银基底上形成自组装膜。SERS光谱表明:当pH=3时,4-MTTL分子是以硫醇式,通过两个氮原子为吸附位点,以较平躺方式在银表面构筑自组装膜;当介质为pH=7和pH=11时,4-MTTL以硫醇式,通过氮和硫原子为吸附位点倾斜或垂直方式作用于银表面。由于后者的吸附方式比前者更为垂直于表面,所以形成的膜中分子排列更为致密。电化学极化实验也表明,在pH=3的条件下,形成的4-MTTL单层有更正的腐蚀电位;在pH=11时,构筑的膜缓蚀能力强于pH=7的。并由电化学交流阻抗数据解析了相应的缓蚀机理。     

同步镀铋膜差分脉冲伏安法测试土壤中铬

采用同步镀铋膜法修饰玻碳电极及差分脉冲溶出伏安法测试土壤中Cr。在优化的实验条件下,以KNO3为支持电解质,NaAc-HAc(pH=5.5)为缓冲溶液的铋膜上得到Cr溶出特征峰电位为-1.14V,线性方程为:I=0.0747C+0.31054,相关系数为0.9981,检出限为0.001μg/L,线性范围为0.01—60μg/L,RSD=2.47%,该方法简单快速,准确度和精密度均符合要求,回收率为96.7%—104.5%。     

Design of a multi-cusp ion source for proton therapy

The permanent magnets of the discharge chamber in a multi-cusp proton source are studied and designed. The three electrode extraction system is adopted and simulated. A method to extract different amounts of current while keeping the beam emittance unchanged is proposed.     

Band Structures of Metal-Oxide Capped Graphene： A First Principles Study

We perform a first-principles calculation based on density functional theory to investigate the interface between single layer graphene and metal oxides. Our study reveals that the monolayer graphene becomes semiconducting by single crystal SiO2 and Al2O3 contact, with energy gaps to - 0.9 and - 1.8 eV, respectively. We find the gap originates from the breakage of π bond integrity, whose extent is related to the interface atom configuration. We believe that our results highlight a promising direction for the feasibility to apply large scale graphene layers as building blocks in future electronics devices.     

Electric Field Analysis of Space Charge Injection from a Conductive Nano-Filler Electrode

A simulation on the electric field distribution near the electrode is proposed to explain the reason for using nanosized carbon black mixed with ethylene vinyl acetate, as the electrode could lead to more charge injection into the polymer than using a deposited metal electrode. The electrode is simplified to a layer of conductive semi-spheres with fixed size and constant electric potential. By using the finite element method, it is found that both the size of the semi-spheres and the distance between adjacent semi-spheres could dramatically influence the electric field near the surface of the spheres; these are considered to be the two decisive factors for the charge injecting rate at electrodes of various materials.     

Influences of Interface States on Resistive Switching Properties of TiOx with Different Electrodes

Different TiOx thin films prepared by graded or sufficient oxidization of Ti are applied with Pt or Ag electrode in metal？insulator-metal （MIM） structures for studying the properties and mechanisms of resistive switching. The differences on the mobile oxygen vacancies in TiOx films and different work functions of the electrode films result in different insulator-metal interface states, which are displayed as ohmic-like or non-ohmic contact. Based on the interface states, the electrical models for MIM devices are analyzed and extracted. The electrode-limited effect and the bulk-limited effect can be unified to explain the mechanisms for resistive switching behavior as the dominant effect respectively in various conditions. All the current-voltage curves of the four kinds of specimens measured in the experiments can be explained and proved in accordance with the theory.     

Effect of Annealing on Microstructure and Electrical Characteristics of Doped Poly （3-Hexylthiophene） Films

The effect of annealing on the microstructure and electrical characteristics of poly （3-hexylthiophene） （P3HT） films doped with very small amounts of the electron acceptor 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane （F4-TCNQ） is studied. X-ray diffraction and UV-vis spectrum studies show that unlike the pure P3HT film, the thermal treatment on the doped fihns under an Ar atmosphere can effectively enhance the crystalline order of P3HT films, as well as successfully facilitate the orientation of the polymer chains. This improvement is attributed to the electrostatic force between P3HT and F4-TCNQ molecules. This force induces the polymer chains to crystallize and orient during the annealing process. As a result, annealing significantly improves performance, especially for the Ion/Ioff ratio of the TFTs based on the doped P3HT films.     

High-Order Energy Decay for Structural Damped Systems in the Electromagnetical Field

This paper is concerned with the decay estimate of high-order energy for a class of special time-dependent structural damped systems represented by Fourier multipliers. This model is widely used in the fields of semiconductivity, superconductivity, electromagnetic waves, electrolyte and electrode materials, etc.