掺铒SiO_x的光致发光特性

利用分子束外延设备生长了掺铒ＳｉＯｘ，观察到铒掺入的同时Ｏ的掺入效率也得到提高．铒可以促进氧的掺入的原因是铒与氧在硅衬底表面反应，以络合物形式掺入硅中，从而提高了硅中氧的浓度．测量了铒在ＳｉＯｘ中的光致发光特性，结果表明掺铒的ＳｉＯｘ的发光强度从１８Ｋ到３００Ｋ仅下降了约１／２，这说明Ｅｒ掺在ＳｉＯｘ中是一种降低发光强度的温度淬灭效应的途径，最后讨论了温度淬灭的机制．     

掺铒高硅氧玻璃光谱性质的研究

应用Judd-Oflet理论计算了新型掺铒高硅氧玻璃中铒离子的强度参量Ω_t(t=2,4,6)，Ω₂=8.15×10^-20，Ω₄=1.43×10^-20，Ω₆=1.22×10^-20，相比于其他氧化物玻璃，表现出较大的Ω_2,6值，反映了铒离子周围的近邻结构不对称性和Er-O键的离子键成分较高.利用McCumber理论计算得到了能级^{关键词： 掺铒高硅氧玻璃 Judd-Ofelt理论 量子效率}     

掺铒氢化非晶氧化硅1.54μm发光性质的研究

采用等离子体增强化学汽相沉积技术生长不同氧含量的氢化非晶氧化硅薄膜(a-SiOx:H),离子注入铒及退火后在室温观察到很强的光致发光.当材料中氧硅含量比约为1和1.76时,分别对应77K和室温测量时最强的1.54μm光致发光.从15到250K的变温实验显示出三个不同的强度与温度变化关系,表明氢化非晶氧化硅中铒离子的能量激发和发光是一个复杂的过程.提出氢化非晶氧化硅薄膜中发光铒离子来自于富氧区,并对实验现象进行了解释.氢化非晶氧化硅中铒发光的温度淬灭效应很弱.从15到250K,光致发光强度减弱约1/2.     

掺饵氢化非晶氧化硅1.54μm发光性质的研究

采用等离子体增强化学汽相沉积技术生长不同氧含量的氢化非晶氧化硅薄膜(a-SiO_{x∶H),离子注入铒及退火后在室温观察到很强的光致发光.当材料中氧硅含量比约为1和 1.76时,分别对应77Ｋ和室温测量时最强的1.54μm光致发光.从15到250Ｋ的变温实验显示 出三个不同的强度与温度变化关系,表明氢化非晶氧化硅中铒离子的能量激发和发光是一个 复杂的过程.提出氢化非晶氧化硅薄膜中发光铒离子来自于富氧区,并对实验现象进行了解 释.氢化非晶氧化硅中铒发光的温度淬灭效应很弱.从15到250Ｋ,光致发光强度减弱约1/2. 关键词： 铒 光致发光 氧含量}     

镱铒共掺Al2O3薄膜上转换机理及其温度特性

采用中频磁控溅射法制备了镱铒共掺Al₂O₃薄膜,铒镱掺杂浓度分别为0.3%,3.6%(摩尔分数,全文同).讨论了三价铒离子529nm和549nm光致发光的上转换机理.在291.8—573.3K温度区间测量了两绿上转换光谱荧光强度比的温度特性,拟合表达式为R=5.37exp(-738/T).366 K温度时灵敏度最大,为0.0039 K^-1.结果表明镱铒共掺Al₂O₃薄膜适合作为小型、高温和高灵敏的光学温度传感材料. 关键词： 2O₃薄膜')" href="#">镱铒共掺Al₂O₃薄膜 中频磁控溅射 上转换 荧光强度比     

掺铒硅多孔化后的光致发光特性

采用一种新的方法制备掺Er多孔硅.首先通过分子束外延法生长Er,O共掺的硅外延层,然后通过常规的电化学阳极腐蚀法将外延层制备成掺Er离子的纳米硅柱结构.由于实现了Er离子在多孔硅中沿深度方向的均匀分布,得到峰宽仅6nm的Er3+本征发光.同时,由于铒与氧共掺于硅柱内部,多孔硅不再需要通过高温后处理引入氧来实现铒的光学激活.实验还对多孔化前后,Er3+的发光强度作出直观的比较,讨论多孔硅可见光及红外光区域的发光对Er3+红外发射的影响. 关键词：     

基于发光机理提高掺铒硅基材料发光效率的几条途径

掺铒硅基发光材料可以用于制备光通信用光源、光纤放大器，更重要的是可能成为实现硅基光电子集成技术的重要途径，已成为研究的热点之一．文章讨论了掺铒硅及掺铒硅基材料的发光机理，指出了制约实用化方面存在的问题．从不同方面着重探讨了共掺氧对提高掺铒硅发光效率的作用．最后介绍了基于掺铒硅发光机理提高掺铒硅基材料发光效率的几种途径、目前存在的主要问题及研究进展．     

掺铒纳米晶硅和掺铒非晶纳米硅薄膜的发光性质

采用等离子体增强化学气相沉积（PECVD）方法制备含有纳米晶硅的SiO2（NCSO）和含有非晶纳米硅颗粒的氢化非晶氧化硅（a—SiOx：H）薄膜。采用离子注入和高温退火方法将稀土Er掺入含有纳米晶硅（ncSi）和非晶纳米硅（a—n—Si）颗粒的基体中。利用IFS／20HR傅里叶变换红外光谱仪和微区拉曼散射光谱仪研究含有纳米晶硅和非晶纳米硅颗粒的薄膜掺稀土前后的发光特性。结果表明来自Be-Si在800nm的发光强度比来自a—SiOx：H基体中非晶纳米硅的发光强度高近一个数量级,而来自a-SiOx：H在1．54μm的发光强度比NCSO高4倍。还研究了掺铒a-SiOx：H薄膜中Si颗粒和Er^3＋的发光强度随退火温度的变化,结合掺铒纳米晶硅和非晶纳米硅薄膜发光强度随Er掺杂浓度变化和Raman散射等的测量结果,进一步明确指出a-Si颗粒在Er^3＋的激发中可以起到和nc-Si同样的作用,即作为光吸收介质和敏化剂的作用。     

镱铒共掺Al2O3薄膜光致发光特性优化

用中频磁控溅射方法在SiO2/Si基底上制备了五组固定掺铒浓度不同镱铒浓度比率的镱铒共掺Al2O3薄膜样品.室温下测量了薄膜在1.430 μm~1.630 μm波段范围内光致发光光谱.研究发现,镱的掺入有效地提高了三价铒离子的光致发光强度,最优的镱铒掺杂为：掺铒0.33 mol%,Yb3+∶Er3+=10∶1,比相同掺铒浓度单掺铒样品光致发光峰值强度增强40倍；确定的掺铒浓度,有着固定的最佳镱铒浓度比率,主要是镱铒离子间的正向和反向能量传递相互作用的结果,但最佳镱铒浓度比率随着掺铒浓度的增加呈现下降趋势；单掺铒薄膜的光致发光峰值强度随掺铒浓度呈现近Gauss形状变化,而最佳镱铒共掺样品的光致发光峰值强度随掺铒浓度呈现了倒Gauss形状变化.     

掺铒硅发光的晶场分裂

测量了掺铒硅的高分辨光致发光光谱，得到9条铒发光分裂谱线.利用群对称理论指出9条谱线来自Er³⁺中⁴I_13/2到⁴I_15/2光跃迁在T_d晶场下的分裂.Er³⁺的第一激发态⁴I_13/2最低能量的两个Stark能级为Γ₈，Γ₆(能量递增)，它们到基态⁴关键词：     

无序GaInP光致发光谱的温度依赖关系

研究了无序ＧａＩｎＰ样品的温度依赖关系，大低温ＰＬ谱中，谱线呈单峰结构。随着温度从１５Ｋ升高到２５０Ｋ，说地宽从１６ｍｅＶ增大到３１ｍｅＶ，并且发生红移，同时强度减小两个数数量级。     

注入Ar+的蓝宝石晶体退火前后光致发光谱的分析

对注入Ar⁺后不同晶面取向的蓝宝石晶体在不同退火条件下的光致发光谱进行了分析.分析结果表明:三种晶面取向的蓝宝石样品经Ar⁺注入后,其光致发光谱中均出现了新的位于506nm处的发光峰;真空和空气气氛下的退火均对样品在506nm处的发光有增强作用,不同晶面取向的样品发光增强程度不同,且发光增强至最大时的退火温度也不同,空气气氛下的退火使样品发光增强程度更为显著.由此可以看出,退火气氛、退火温度和晶面取向均对样品发光峰强度有影响. 关键词： 2O₃')" href="#">Al₂O₃ 离子注入 退火 光致发光谱     

Optical properties of CH3NH3PbI3 crystal grown using inverse temperature crystallization

Perovskite CH₃NH₃PbI₃ (MAPbI₃) single crystal was grown using inverse temperature crystallization method. Crystallinity of the perovskite was confirmed by X-ray diffraction. Photoluminescence (PL) spectra revealed abnormal behavior due to a temperature-induced orthorhombic to the tetragonal phase transition. Four PL emission peaks, A, B, C, and D, were observed in the low temperature regime. Peaks A and B were observed at 756 and 776?nm?at 12?K, and were blue-shifted and disappeared at 130 and 70?K, respectively. Peaks C and D were observed at 789 and 807?nm?at 40?K and were also blue-shifted to 780 and 794?nm?at 100?K. On the other hand, the peak C red-shifted to 799?nm from 100 to 140?K because of an orthorhombic to the tetragonal phase change and was also blue-shifted above 140?K. From the excitation intensity- and temperature-dependent PL results, peaks A and B were assigned to the free-exciton and bound-exciton of the orthorhombic phase crystal, respectively. In addition, peaks C and D were associated with the free-exciton and bound-exciton of the tetragonal phase crystal, respectively. The activation energy of peak C was calculated to be 98?meV from temperature dependence of the PL intensity.     

硅中热施主的电子结构

利用20—300K的Hall系数测量和6-300K的红外光吸收,研究了含氧P型CZ硅单晶经450℃不同时间热处理后所产生的热施主问题。Hall系数测量表明:经100hr热处理的样品存在两个施主能级:E₁=58meV,E₂=110meV。对不同热处理时间的样品,从低温红外光吸收则可看见由于热施主所引起的复杂吸收光谱。这些吸收峰的数目随着热处理时间的加长而增加和加强。利用类氢模型和有效质量理论拟会和计算,可以证明与氧有关的热施主很可能是双重电荷施主。这些双重施主有多种组态,它与450℃热处理的时间有关。 关键词：     

退火对非故意掺杂4H-SiC外延材料386 nm和388 nm发射峰的影响

10 K条件下,采用光致发光(PL)技术研究了不同退火处理后非故意掺杂4H-SiC外延材料的低温PL特性.结果发现,在370—400 nm范围内出现了三个发射峰,能量较高的峰约为3.26 eV,与4H-SiC材料的室温禁带宽度相当.波长约为386 nm和388 nm的两个发射峰分别位于~3.21 eV和~3.19 eV,与材料中的N杂质有关.当退火时间为30 min时,随退火温度的升高,386 nm和388 nm两个发射峰的PL强度先增加后减小,且退火温度为1573 K时,两个发射峰的PL强度均达到最大. 关键词： 光致发光 退火处理 能级 4H-SiC     

Thermal quenching of photoluminescence in GeSe2 glass,thin films and crystals

Investigations were carried out on the temperature dependence of the photoluminescence intensity and the emission band characteristics in GeSe₂ glasses, evaporated thin films and crystals at T >80 K, paying special attention to the fatigue taking place 20–50 s from the onset of excitation. From the temperature dependence of the initial and quasi-steady-state values of the PL intensity an activation energy 295?30 meV at T >210 K was deduced for the glass whereas two activation energies E₁=56±2 meV and E₂=96±3 meV were deduced for the crystalline GeSe₂. The strong fatigue observed in the evaporated thin films was attributed to their loose structure. The fast fatigue in the crystal was considered to result from the recombination of quasi-excitons through radiative and non-radiative channels. A configuration coordinate diagram involving a stable and a metastable state is proposed as a means of explaining this type of fatigue. The temperature dependence of the PL intensity is discussed in terms of a recently proposed model.     

Photoluminescence properties of selectively grown InN microcrystals

We investigated the photoluminescence (PL) properties of regularly arranged N‐polar InN microcrystals with m ‐plane sidewall facets. We observed narrow PL emission at 0.678 eV with a linewidth of ～14 meV at 4 K and a clear band‐filling effect with increasing excitation power. We also observed a normal red shift of the PL peak energy as large as 51 meV (～150 nm) with increasing temperature from 4 to 300 K, similar to that observed for non‐degenerated semiconductors. The integrated PL intensity ratio I_300K/I_4K was measured to be 6.1%. These results indicate that InN microcrystals have a low residual carrier density and excellent optical properties without being adversely affected by surface electron accumulation, despite their relatively high surface area. (© 2012 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Low-temperature photoluminescence in CuIn<Subscript>5</Subscript>S<Subscript>8</Subscript> single crystals

Photoluminescence (PL) spectra of CuIn₅S₈ single crystals grown by Bridgman method have been studied in the wavelength region of 720–1020 nm and in the temperature range of 10–34 K. A broad PL band centred at 861 nm (1.44 eV) was observed at T = 10 K. Variations of emission band has been studied as a function of excitation laser intensity in the 0.5– 60.2 mW cm^?2 range. Radiative transitions from shallow donor level located at 17 meV below the bottom of the conduction band to the acceptor level located at 193 meV above the top of the valence band were suggested to be responsible for the observed PL band. An energy level diagram showing transitions in the band gap of the crystal has been presented.     

Optical properties of GaInNAs/GaAs prepared by molecular beam epitaxy

Optical properties of GaInNAs are studied with emphasis on photoluminescence (PL) and photoreflectance (PR) using GaInNAs single quantum wells (GaInNAs-SQW) and thick GaInNAs layers lattice-matched to GaAs (LM-GaInNAs) grown by solid-source molecular-beam epitaxy. First, a blue-shift of band-gap energy as a result of a rapid thermal annealing (RTA) has been confirmed by both PL and PR. Temperature-dependent PL and PR spectra were measured. At low temperature, GaInNAs-SQWs exhibited a PL due to the localized exciton (LE), and the localization was strongly reduced by RTA. A very high-quality GaInNAs-SQW exhibited very intense PL with small half-width (10–20 meV for 8–300 K) without LE emission. In LM-GaInNAs, low-temperature PL exhibited both the LE emission and a deep PL band. Temperature-dependent PL showed that LM-GaInNAs contains large number of non-radiative centers. PR spectra of LM-GaInNAs were composed of more than two transitions, and their relative intensity depended on temperature and annealing.     

Effect of the annealing environment on the optical properties of ZnO/GaAs grown by MOCVD

The optical properties of ZnO grown on (1 0 0) GaAs substrate using metalorganic chemical vapor deposition are investigated by photoluminescence (PL) spectroscopy. Postgrowth annealing in nitrogen and oxygen was performed for different times and temperatures in order to incorporate As from the substrate into the ZnO thin films. The PL spectra of the samples annealed in different ambients reveal that the effect of As diffusion into the ZnO thin films is more pronounced when the annealing is performed in oxygen at 550 °C. The 11 K PL spectra show the appearance of a transition at ∼3.35 eV after annealing in oxygen at 550 °C for 1 h. A further increase in the annealing temperature leads to the disappearance of this line, while for annealing times longer than 2 h at 550 °C, it is no longer prominent. The increase in intensity of this new transition is also accompanied by the enhancement of radiative centers related to structural defects, such as the stacking fault-related transition at 3.31 eV and the Y-line. Temperature dependent PL illustrates the excitonic nature of the new transition at ∼3.35 eV, which is therefore assigned to (A⁰, X) transition, where the acceptor is possibly the 2V_Zn-As_Zn complex, with an activation energy E_A in the range of 160-240 meV. Furthermore, the enhancement of the radiative centers related to structural defects is regarded as evidence that As atoms tend to segregate in the vicinity of structural defects to relieve local strain.