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用热蒸发的方法制备了纳米Ag材料,并用扫描电子显微镜对纳米粒子进行了形貌的表征,通过紫外—可见分光光度计得到Ag纳米粒子的透过谱,得到了Ag纳米粒子的表面等离子体共振的峰值位置.以罗丹明6G为探针分子测定Ag纳米粒子衬底的表面增强拉曼散射效应,通过拉曼散射光谱与透过谱研究了由表面等离子体激元的强极化场引起的表面增强拉曼散射效应,结合透过谱与拉曼增益因子提出了一种描述表面等离子体光学和电学特性的方法,并结合扫描电镜的结果给出了不同结构的纳米Ag材料对表面等离子体激元强度的影响.
关键词:
热蒸发
纳米Ag材料
表面等离子体
表面增强拉曼散射 相似文献
103.
Microstructure and lateral conductivity control of hydrogenated nanocrystalline silicon oxide and its application in a-Si:H/a-SiGe:H tandem solar cells 下载免费PDF全文
Phosphorous-doped hydrogenated nanocrystalline silicon oxide(n-nc-SiO_x:H) films are prepared via radio frequency plasma enhanced chemical vapor deposition(RF-PECVD). Increasing deposition power during n-nc-SiO_x:H film growth process can enhance the formation of nanocrystalline and obtain a uniform microstructure of n-nc-SiO_x:H film. In addition,in 20 s interval before increasing the deposition power, high density small grains are formed in amorphous SiO_x matrix with higher crystalline volume fraction(I_c) and have a lower lateral conductivity. This uniform microstructure indicates that the higher Ic can leads to better vertical conductivity, lower refractive index, wider optical band-gap. It improves the back reflection in a-Si:H/a-SiGe:H tandem solar cells acting as an n-nc-SiO_x:H back reflector prepared by the gradient power during deposition. Compared with the sample with SiO_x back reflector, with a constant power used in deposition process,the sample with gradient power SiO_x back reflector can enhance the total short-circuit current density(Jsc) and the initial efficiency of a-Si:H/a-SiGe:H tandem solar cells by 8.3% and 15.5%, respectively. 相似文献
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退火温度和β-FeSi2薄膜厚度对n-β-FeSi2/p-Si异质结太阳电池的影响 总被引:2,自引:1,他引:1
本文采用室温直流磁控溅射Fe-Si组合靶的方法,并通过后续退火温度的优化得到了单一相高质量的β-FeSi2薄膜.结果表明,在本实验条件下得到的未掺杂的β-FeSi2薄膜在室温下是n型导电的,其电学特性存在一个退火温度的最优点:800 ℃.而且在这个最佳温度点上,在Si(111)衬底上外延得到的薄膜载流子迁移率比在Si(100)上高出了一倍多.在上述研究的基础上,采用p-Si(111)单晶片作为外延生长β-FeSi2薄膜的衬底,并通过退火温度和薄膜厚度的优化制备出了国内第一个n-β-FeSi2/p-Si异质结太阳电池,其Jsc=7.90 mA/cm2 ,Voc=0.21 V,FF=0.23,η=0.38;. 相似文献
105.
利用电子束沉积技术在玻璃衬底上制备了IWO( In2O3∶WO3)薄膜和SiO2缓冲层,并将SiO2缓冲层对IWO薄膜性能的影响作了探究.SiO2缓冲层在室温生长.SIMS测试表明:SiO2缓冲层能有效阻挡浮法玻璃中的杂质进入到IWO薄膜.实验获得的具有SiO2阻挡层的IWO薄膜的电子迁移率μ~54.5 cm2·V-1·s-1,电阻率p ~5.86×10-4Ω,cm,电子载流子浓度n~ 1.95×1020 cm-3,400~1600nm砌光谱区域内的平均透过率~76;. 相似文献
106.
本文首先采用电阻蒸发法制备了不同厚度的Al薄膜,并选择了两个典型厚度的Al薄膜制备工艺来制备非晶硅太阳电池的Al背电极,研究了Al背电极厚度对电池性能的影响.结果表明,Al背电极的厚度由800nm减薄到70nm时,电池的Voc平均值由0.826V增加到0.829V,电池的Jsc平均值由11.747mA/cm2减小到11.318 mA/cm2,电池的FF平均值由0.701增加到0.728,而电池效率的平均值略有增加,由6.803;增加到6.833;.用扫描电镜(SEM)和X射线衍射(XRD)研究了玻璃衬底上蒸发的Al薄膜和非晶硅电池Al背电极表面形貌和微观结构的变化,分析了电池性能随Al背电极厚度变化的原因. 相似文献
107.
P型ZnO薄膜的制备及其在太阳电池中的初步应用 总被引:3,自引:0,他引:3
利用超声雾化热分解技术(USP)、通过N-Al共掺的方法,在coming 7059衬底上生长出P型透明导电膜.该薄膜在可见光范围内的透过率可达到90;以上.X射线衍射的测试结果表明:P型透明导电膜具有c轴择优生长特性.通过霍耳测试得到P型ZnO薄膜的电学特性为:电阻率为4.21 Ω·cm、迁移率是0.22 cm2/(V·s)、载流子浓度为6.68×1018cm-3.此材料初步应用到微晶硅电池中,其开路电压为0.47 V. 相似文献
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Effect of substrate temperature and pressure on properties of microcrystalline silicon films 下载免费PDF全文
In this paper intrinsic microcrystalline silicon films have been prepared by very high
frequency plasma enhanced chemical vapour deposition (VHF-PECVD) with
different substrate temperature and pressure. The film properties were
investigated by using Raman spectra, x-ray diffraction, scanning
electron microscope (SEM), and optical
transmittance measurements, as well as dark conductivity. Raman results
indicate that increase of substrate temperature improves the microcrystallinity
of the film. The crystallinity is improved when the pressure increases from
50Pa to 80Pa and the structure transits from microcrystalline to amorphous
silicon for pressure higher than 80Pa. SEM reveals the effect of substrate
temperature and pressure on surface morphology. 相似文献