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The study of a new n/p tunnel recombination junction and its application in a-Si:H/μc-Si:H tandem solar cells 总被引:1,自引:0,他引:1 下载免费PDF全文
This paper reports that a double N layer (a-Si:H/μc-Si:H) is used to substitute the single microcrystalline silicon n layer (n-μc-Si:H) in n/p tunnel recombination junction between subcells in a-Si:H/μc-Si:H tandem solar cells. The electrical transport and optical properties of these tunnel recombination junctions are investigated by current-voltage measurement and transmission measurement. The new n/p tunnel recombination junction shows a better ohmic contact. In addition, the n/p interface is exposed to the air to examine the effect of oxidation on the tunnel recombination junction performance. The open circuit voltage and FF of a-Si:H/μc-Si:H tandem solar cell are all improved and the current leakage of the subcells can be effectively prevented efficiently when the new n/p junction is implemented as tunnel recombination junction. 相似文献
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Influence of the total gas flow rate on high rate growth microcrystalline silicon films and solar cells 下载免费PDF全文
This paper reports that high-rate-deposition of microcrystalline
silicon solar cells was performed by very-high-frequency
plasma-enhanced chemical vapor deposition. These solar cells, whose
intrinsic μ c-Si:H layers were prepared by using a different total gas
flow rate (Ftotal), behave much differently in performance,
although their intrinsic layers have similar crystalline volume
fraction, opto-electronic properties and a deposition rate of ~
1.0~nm/s. The influence of Ftotal on the micro-structural
properties was analyzed by Raman and Fourier transformed infrared
measurements. The results showed that the vertical uniformity and
the compact degree of μ c-Si:H thin films were improved with
increasing Ftotal. The variation of the microstructure was
regarded as the main reason for the difference of the J--V
parameters. Combined with optical emission spectroscopy, we
found that the gas temperature plays an important role in
determining the microstructure of thin films. With Ftotal
of 300~sccm, a conversion efficiency of 8.11% has been obtained
for the intrinsic layer deposited at 8.5~\AA/s (1~\AA=0.1\,nm). 相似文献
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采用高压高功率的甚高频等离子体增强化学气相沉积(VHF-PECVD)技术高速(沉积速率约为1.2 nm/s)沉积了一系列不同厚度的本征微晶硅薄膜,并通过Raman谱和XRD谱的测试,研究了高速沉积时本征微晶硅薄膜的微结构演变特性及其对电池性能的影响.针对其微结构特性及高速沉积本身存在的离子轰击作用强的特点,提出了在沉积微晶硅薄膜过程中采用功率梯度的方法,达到有效地控制薄膜微结构变化的目的,并在一定功率梯度范围内降低了电子温度,提高了薄膜质量,从而使电池效率明显提高.最后在沉积速率为1.2 nm/s时,制备
关键词:
高速沉积
微晶硅薄膜
微结构演变
功率梯度 相似文献
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