Quasi-homoepitaxial GaN-based blue light emitting diode on thick GaN template

The high power GaN-based blue light emitting diode (LED) on an 80-μ-thick GaN template is proposed and even realized by several technical methods like metal organic chemical vapor deposition (MOCVD), hydride vapor-phase epitaxial (HVPE), and laser lift-off (LLO). Its advantages are demonstrated from material quality and chip processing. It is investigated by high resolution X-ray diffraction (XRD), high resolution transmission electron microscope (HRTEM), Rutherford back-scattering (RBS), photoluminescence, current-voltage and light output-current measurements. The width of (0002) reflection in XRD rocking curve, which reaches 173" for the thick GaN template LED, is less than that for the conventional one, which reaches 258". The HRTEM images show that the multiple quantum wells (MQWs) in 80-μm-thick GaN template LED have a generally higher crystal quality. The light output at 350 mA from the thick GaN template LED is doubled compared to traditional LEDs and the forward bias is also substantially reduced. The high performance of 80-μm-thick GaN template LED depends on the high crystal quality. However, although the intensity of MQWs emission in PL spectra is doubled, both the wavelength and the width of the emission from thick GaN template LED are increased. This is due to the strain relaxation on the surface of 80-μm-thick GaN template, which changes the strain in InGaN QWs and leads to InGaN phase separation.     

Study on GaN-based light emitting diode with InGaN/GaN/InGaN multi-layer barrier

The current study investigates GaN-based light-emitting diodes (LEDs) with InGaN/GaN/InGaN multi-layer barrier (MLB). Simulation results show that GaN-based LEDs with MLB have better performance than conventional GaN-based LEDs with only one GaN barrier because of the enhancement in hole injection into the quantum well and decrease in electron leakage current.     

Stackable luminescent device integrating blue light emitting diode with red organic light emitting diode

We present a novel stackable luminescent device integrating a blue light emitting diode(LED)with a red organic LED(OLED)in series.The anode of the OLED is connected with the cathode of the LED through a via in the insulation layer on the LED.The LED–OLED hybrid device is electroluminescent and two electroluminescence(EL)peaks(the blue peak around 454 nm and the red peak around 610 nm)are observed clearly.The effect of the indium tin oxide(ITO)layer on the device performance is analyzed.Compared with the individual LED and OLED,their combination shows great potential applications in the field of white lighting,plant lighting,and display.     

GaN基蓝光发光二极管的波长稳定性研究

尽管GaN基蓝绿光发光二极管（LED）已进入大规模商品化阶段，但其发光波长随注入电流的变化仍是一个尚未解决的关键技术难题.同时，蓝绿光LED电注入发光光谱的半高全宽多为25nm以上.通过优化LED器件材料的生长条件和总应变量，获得了高质量的InGaN/GaN多量子阱LED外延片.由此制作的LED器件在0—120?mA的注入电流下，发光波长变化小于1nm.在20mA的正向电流下，其光谱半高全宽只有18nm，且随注入电流变化较小. 关键词： GaN 发光二极管 波长稳定性     

Degradation behaviors of high power GaN-based blue light emitting diodes

The degradation mechanism of high power InGaN/GaN blue light emitting diodes(LEDs)is investigated in this paper.The LED samples were stressed at room temperature under 350-mA injection current for about 400 h.The light output power of the LEDs decreased by 35%during the first 100 h and then remained almost unchanged,and the reverse current at 5 V increased from 10 9A to 10 7A during the aging process.The power law,whose meaning was re-illustrated by the improved rate equation,was used to analyze the light output power-injection current(L–I)curves.The analysis results indicate that nonradiative recombination,Auger recombination,and the third-order term of carriers overflow increase during the aging process,all of which may be important reasons for the degradation of LEDs.Besides,simulating L–I curves with the improved rate equation reveal that higher-than-third-order terms of carriers overflow may not be the main degradation mechanism,because they change slightly when the LED is stressed.     

Effect of surface treatment of GaN based light emitting diode wafers on the leakage current of light emitting diode devices

To form low-resistance Ohmic contact to p-type GaN, InGaN/GaN multiple quantum well light emitting diode wafers are treated with boiled aqua regia prior to Ni/Au (5~nm/5~nm) film deposition. The surface morphology of wafers and the current--voltage characteristics of fabricated light emitting diode devices are investigated. It is shown that surface treatment with boiled aqua regia could effectively remove oxide from the surface of the p-GaN layer, and reveal defect-pits whose density is almost the same as the screw dislocation density estimated by x-ray rocking curve measurement. It suggests that the metal atoms of the Ni/Au transparent electrode of light emitting diode devices may diffuse into the p-GaN layer along threading dislocation lines and form additional leakage current channels. Therefore, the surface treatment time with boiled aqua regia should not be too long so as to avoid the increase of threading dislocation-induced leakage current and the degradation of electrical properties of light emitting diodes.     

GaN基高压直流发光二极管制备及其性能分析

GaN基高压直流发光二极管工艺制备, 采用蓝宝石图形衬底(PSS) 外延片制备正梯形芯粒结构的GaN基高压直流LED.相对其他结构器件, 该结构器件发光效率最高, 封装白光后, 在色温4500 K, 驱动电流20 mA时, 光效116.06 lm/W, 对应电压50 V. 测试其I-V曲线表明, 开启电压为36 V, 对应驱动电流为1.5 mA; 在电流15 mA至50 mA时, 光功率随驱动电流增加近似于线性增加, 在此区域光效随电流增加而降低的幅度比较缓慢, 表明GaN基高压直流LED适宜于采用大电流密度驱动, 而不会出现驱动电流密度增加导致量子效率明显下降(efficiency droop), 为从芯片层面研究解决量子效率下降难题提供了一种新思路.     

基于电容和电导特性分析GaN蓝光发光二极管老化机理

采用正向交流小信号方法测试和分析老化前后GaN发光二极管（LED）的电容-电压特性,结合串联电阻、理想因子、隧穿电流参数讨论负电容以及电导变化情况.基于L-V曲线定性分析老化前后负电容的阈值电压,老化之后样管的受主浓度降低,辐射复合概率下降,大量缺陷以及非辐射复合中心出现,对载流子俘获作用增强,造成负电容降低.反向偏压以及小正向偏压下,隧穿效应导致老化之后样管的电导增大;正向偏压大于2.2 V区域,考虑串联电阻效应,老化后样管电导减小.在分析LED电容-电压、光输出、电学特性曲线与老化机理基础上,通过实验论证以及理论解释表明,负电容以及电导特性可作为分析LED老化特性的参考依据. 关键词： GaN发光二极管 负电容 电导 老化机理     

Pure blue emission from undoped organic light emitting diode based on anthracene derivative

This paper presents organic light emitting diodes (OLEDs) which were fabricated by using undoped 9,10-di(2-naphthyl)anthracene (ADN) as the emitting layer, N,N′-diphenyl-N,N′-bis(3-methylphenyl)-1,1′-biphenyl-4,4′-amine (TPD) as the hole transporting layer, and one of tris-(8-hydroxy-quinolinato) aluminum (Alq₃), 4,7-diphenyl-1,10-phenanthroline (Bphen) and 2-tert-butylphenyl-5-biphenyl-1,3,4-oxadiazole (PBD) as the electron transporting layer. By optimization for the thickness of device, efficient pure blue organic light emitting diodes were obtained, which is attributed to the synergy of both the hole transporting layer and the electron transporting layer.     

硅衬底InGaN/GaN基蓝光发光二极管droop效应的研究

InGaN/GaN基阱垒结构LED当注入的电流密度较大时, LED的量子效率随注入电流密度增大而下降, 即droop效应.本文在Si (111)衬底上生长了 InGaN/GaN 基蓝光多量子阱结构的LED,通过将实验测量的光电性能曲线与利用ABC模型模拟的结果进行对比, 探讨了droop效应的成因.结果显示:温度下降会阻碍电流扩展和降低空穴浓度, 电子在阱中分布会越来越不平衡,阱中局部区域中因填充了势能越来越高的电子而溢出阱外, 从而使droop效应随着温度的降低在更小的电流密度下出现且更为严重, 不同温度下实验值与俄歇复合模型模拟的结果在高注入时趋势相反.这此结果表明,引起 droop效应的主因不是俄歇非辐射复合而是电子溢出,电子溢出的本质原因是载流子在阱中分布不均衡.     

Deep blue organic light emitting diode based on anthracene derivative as a dopant

This letter presents a deep blue organic light emitting diode which was fabricated by using 9,10-di(2-naphthyl)anthracene as a dopant and 4,4′-N,N′-dicarbazole-biphenyl as a host. The Commission Internationale de l’Eclairage coordinates of (0.1516, 0.0836) were achieved in the cell, which is very close to the National Television Standards Committee standard of (0.14, 0.08). Meanwhile, maximum luminance over 6500 cd/cm² and maximum current efficiency of 3.5 cd/A were also obtained.     

基于缺陷光子晶体结构的GaN基发光二极管光提取效率的有关研究

现有的研究表明,利用光子晶体可以有效提高发光二极管的光提取效率.由于在制造时光子晶体中可能会存在缺陷和错位,本文基于时域有限差分法对光子晶体中的缺陷和错位对发光二极管发光效率的影响进行了研究.数值仿真结果表明,光子晶体中少量缺陷或者微小错位并不会降低发光二极管的光提取效率,其中某些缺陷反而能增强光子晶体发光二极管的光提取效率.本文对其物理机理给出了详细的理论分析,并设计了一种具有缺陷的光于晶体,在未刻蚀到有源层(离有源层20 nm)的情况下,其光提取效率达到了完美光子晶体的1.6倍.通过对这种缺陷光子晶体的空间频谱分析可知,可以通过设计具有特殊空间频谱分布的光子晶体来提高发光二极管的发光效率,这对设计高光提取效率的光子晶体结构和制造高效率的发光二极管有指导意义.     

Properties of InGaN/GaN quantum wells and blue light emitting diodes

We have reported the effects of growth interruption time on the optical and structural properties of high indium content In_xGa_1−xN/GaN (x>0.2) multilayer quantum wells (QWs). The InGaN/GaN QWs were grown on c-plane sapphire by metal organic chemical vapor deposition. The interruption was carried out by closing the group-III metal organic sources before and after the growth of the InGaN QW layers. The transmission electron microscopy (TEM) images show that with increasing interruption time, the quantum-dot-like region and well thickness decreases due to indium reevaporation or the thermal etching effect. As a result the photoluminescence (PL) peak position was blue-shifted and the intensity was reduced. The sizes and number of V-defects did not differ with the interruption time. The interruption time is not directly related to the formation of defects. The V-defect originates at threading dislocations and inversion domain boundaries due to higher misfit strain. Temperature dependent PL spectra support the results of TEM measurements. Also, the electroluminescence spectra of light-emitting diode show that dominant mechanism in InGaN/GaN QWs is a localized effect in the quantum-dot-like regions.     

Efficiency and droop improvement in a blue InGaN-based light emitting diode with a p-InGaN layer inserted in the GaN barriers

The advantages of a blue InGaN-based light-emitting diode with a p-InGaN layer inserted in the GaN barriers is studied. The carrier concentration in the quantum well, radiative recombination rate in the active region, output power, and internal quantum efficiency are investigated. The simulation results show that the InGaN-based light-emitting diode with a p-InGaN layer inserted in the barriers has better performance over its conventional counterpart and the light emitting diode with p-GaN inserted in the barriers. The improvement is due to enhanced Mg acceptor activation and enhanced hole injection into the quantum wells.     

无序光子晶体提高GaN基蓝光发光二极管光提取效率的研究

亚波长尺度光子晶体结构可有效提升发光二极管(LED)的光提取效率(LEE),然而在制造过程中会存在缺陷或无序.利用时域有限差分法对理想方形光子晶体结构进行了优化,在此基础上对三种无序光子晶体结构进行了仿真,研究了光子晶体结构参数的无序变化对GaN基蓝光LED LEE的影响.结果表明,光子晶体空气孔位置和半径的无序变化使优化的80 nm光子晶体LED的LEE下降,而可使非优化的60nm光子晶体LED的LEE增加;当光子晶体空气孔位置和半径的无序变化量从0到士20 nm之间变化时,LEE最大会产生53.8％的浮动;光子晶体刻蚀深度的无序变化对LEE影响较小,一般可以忽略,研究结果为高性能蓝光光子晶体LED的设计制作提供了重要的理论参考.     

光子晶体发光二极管

利用光子晶体的光子禁带和光栅衍射效应可以提高LED的出光效率,扩大LED的应用范围。总结了光子晶体发光二极管的原理和典型器件。通过比较表明,与光子禁带效应相比,利用光栅衍射效应提高LED出光效率的方法更适用于电注入发光。因此可望用更廉价的方法在LED表面制造光子晶体,可通过光栅衍射效应来有效地提高其出光效率。     

GaN基蓝光发光二极管正向电压温度特性研究

对GaN基蓝光发光二极管（LED）正向电压温度特性进行了研究,发现在温度较高时,正向电压随温度的变化系数逐渐减小,直至出现拐点,正向电压随温度的变化系数由负数变为正数.此时若继续升高温度,则正向电压随温度升高迅速增加,并常常伴随有器件失效的现象发生.在小电流情况下,这种现象不很明显,随着电流的增加,现象表现得越来越明显,拐点出现的温度也越来越低,而且温度超过拐点之后,正向电压值增加得更快.通过与相同封装的另一组器件测试结果对比,排除了封装材料玻璃转换温度的影响.分析认为,这一现象的出现是由器件等效串联电阻 关键词： 发光二极管 氮化镓 正向电压 温度系数     

Optical design and optimization of light emitting diode automotive head light with digital micromirror device light emitting diode

This research proposes a new method for light emitting diode automotive headlight design with digital micromirror device (DMD). The optical design is advanced because of the following features. First, this optical design controls the angle of light pattern without light masking so as to achieve much higher light efficiency compared with traditional optical design for headlight systems. Second, in view of the tendency that the advanced light emitting diode automobile headlight is designed to be a low beam light module and a high beam light still needs an auxiliary lighting system, the optical system designed in this research, mainly adopting DMD module as high/low beam light switch, can switch on and off both the high and low beam lights. Because DMDs function of accepting a bidimensional image, high/low beam light patterns can be determined by DMD. Third, a light pattern will be created and compensated simultaneously by DMD, which might replace mechanical adaptive front-lighting system in the future because DMD takes advantage of fast response and simultaneous compensation. Fourth, a design using a multiple reflection curved mirror is employed in this research to adjust light energy distribution; therefore, the articulation of the light pattern can be enhanced. For this method, experimental results of light efficiency are up to 85%, which is superior to current products in the market.     

基于氧化锌纳米线的紫外发光二极管

构建了基于n-ZnO纳米线/p-Si异质结的紫外发光二极管.ZnO纳米线准阵列采用水热法生长于重掺p型Si片上.此法简易，反应温度低，易于大规模生产；其产物ZnO纳米线结晶良好，以c轴为优势取向，光激发下的紫外荧光发射很强.二极管的电学接触采用聚合物填充的In阴极或以氧化铟锡(ITO)玻璃紧压形成阴极.它们的I-V特性体现出良好的二极管性质.在正向偏置电压驱动下，构建的发光二极管可稳定发射波长在387nm的较强的近紫外光和较弱的绿光. 关键词： ZnO纳米线 异质结 电致发光 水热法     

Effects of strain on the characteristics of InGaN–GaN multiple quantum-dot blue light emitting diodes

In this study, Raman spectra were measured in the backscattering geometry at temperatures from 100 K to 298 K. Samples with the InGaN self-assembled quantum dot (SAQD) structures of high strain show a strong compressive stress in InGaN epilayer by Raman measurement. Furthermore, we have applied the dots-in-a-well (DWELL) structure to nitride-based light-emitting diodes (LEDs). It was found that EL peak variation of the LED with DWELL structure is more sensitive to the amount of injection current, as compared with the MQW LEDs.