压力对纳米金刚石膜生长的影响（英文）

纳米金刚石膜具有高耐磨能力和低摩擦系数,在多个领域有广阔的应用前景。纳米金刚石膜可通过热丝化学气相沉积方法进行制备。其中,系统压力是关键的参数,适当的压力下可生长纳米金刚石膜,而改变压力则金刚石膜的表面形态将发生变化。实验通过不同压力下制备金刚石膜,采用扫描电镜进行形貌观察,并通过拉曼光谱确定纳米金刚石结构。实验表明,金刚石膜形态随压力变化而改变,一定压力下生长出纳米金刚石膜,降低压力则晶体颗粒变粗。分析其原因是与氢原子的运动密切相关。     

飞秒激光制备硅窗口增透保护类金刚石膜

采用飞秒激光(800 nm,120 fs,3 W,1 000 Hz)制备类金刚石膜,研究了不同偏压、生长温度和氧气氛等辅助手段对激光沉积类金刚石膜的影响,实验发现在室温(25℃)、无偏压和低气压氧气氛(2 Pa)条件下沉积的类金刚石膜性能最优。在单面预镀普通增透膜的硅红外窗口材料上镀制出了无氢类金刚石膜,3~5μm波段平均透过率达到90%以上,纳米硬度高达40 GPa,用压力为9.8 N的橡皮磨头,摩擦105次,膜层未见磨损,并且通过了军标规定的高温、低温、湿热、盐雾等环境试验,所制类金刚石膜可对红外窗口起到较好的增透保护作用。     

脉冲高能量密度等离子体法类金刚石膜的制备及分析

利用脉冲高能量密度等离子体法在光学玻璃衬底上、在室温下成功的制备了光滑、致密、均匀的纳米类金刚石膜.工艺研究表明：放电电压和放电距离以及工作气体种类对纳米类金刚石膜的沉积起着关键作用.利用拉曼光谱、扫描电镜以及电子能量损失谱分析薄膜的形态结构表明：薄膜具有典型的类金刚石特征；纳米类金刚石膜的晶粒尺寸小于20nm甚至为非晶态；类金刚石膜中含有一定量的氮原子，随着沉积能量的升高，氮的含量增大.纳米类金刚石膜的薄膜电阻超过109Ω/cm2.对放电溅射过程进行了理论分析，结果与工艺研究的结论吻合.     

高温高压条件下石墨的再结晶与金刚石单晶的生长

 用电子显微镜观察到了在高温高压条件下再结晶石墨的形状随温度变化而改变的规律。实验表明：从石墨向金刚石的转变，与石墨在催化剂——溶剂合金中的再结晶状态有关，类球形再结晶石墨是转变成金刚石小单元的基础。金刚石晶体的不同形态及其多样化的表面结构表明金刚石单晶的生长具有比较复杂的过程。研究了具有一定规则形状由类球形再结晶石墨晶粒组成的聚合体，这种聚合体将在适当温度压力下转变成金刚石颗粒。本研究给出了生长粗颗粒、晶形完整的金刚石单晶的原则办法。     

具有广阔应用前景的纳米金刚石膜

纳米金刚石膜的制备、表征和应用研究已经成为CVD金刚石膜研究领域的一个新的热点．文章重点介绍了Gruen等人在贫氢和无氢环境中制备纳米金刚石膜的开创性工作,并和在富氢气氛中制备的纳米金刚石膜进行了对比评述．对纳米金刚石膜的表征技术和应用前景进行了讨论．     

用表面生长CVD金刚石的石墨合成高压金刚石

 用热灯丝CVD方法在多晶石墨衬底表面制备CVD金刚石颗粒，并用这种石墨在高温高压条件下采用六面顶压机合成出高压金刚石。初步实验结果表明：采用其表面生长CVD金刚石颗粒的石墨合成高压金刚石，可以提高金刚石的转化率和降低合成压力。     

大面积均匀纳米金刚石薄膜制备研究

报道了一种利用偏压恒流等离子辅助热丝化学气相沉积城硅基板上制备大面积均匀纳米金刚石薄膜的新工艺，在不同沉积条件下研究了纳米金刚石薄膜的成核和生长过程，并通过扫描电镜、拉曼光谱和表面粗糙度测试仪观察了纳米金刚石薄膜的结构特征。最后成功制备了直径100mm、平均晶粒尺寸10nm的光滑纳米金刚石薄膜。     

乙炔气体流量对纳米TiC类金刚石复合膜的化学结构及力学性能影响

采用离子注入与反应磁控溅射相结合的方法在钛合金及硅片基体表面上制备了纳米TiC类金刚石(DLC)复合膜.通过纳米压痕技术检测了薄膜的纳米硬度，显微划痕试验评估了薄膜的结合力.通过X射线光电子能谱及X射线衍射表征了薄膜的化学结构.结果表明，通过改变C₂H₂气体流量，可以达到控制薄膜中钛原子含量的目的，合适的C₂H₂气体流量可以在DLC膜中形成较多的纳米TiC晶粒，形成DLC包覆TiC晶粒的复合结构，使DLC膜力学性能得到明显提高.另外，划痕试验表明掺钛、先注入后沉积工艺都使薄膜的结合力得到了较大提高. 关键词： 纳米TiC类金刚石复合膜 类金刚石膜 力学性能     

负偏压热灯丝CVD金刚石膜核化和早期生长的研究

利用扫描电子显微镜、Raman谱和X射线光电子能谱，研究了Si衬底上热灯丝CVD金刚石膜的核化和早期生长.在-300V和100mA条件下预处理15min，镜面抛光的Si(100)表面上金刚石核密度超过了10⁹cm^-2，但是核的分布极不均匀且可分为三个区域：A区，边缘处以锥体为主；B区，位于边和中心之间过渡区是纳米金刚石；C区，中心处有SiC层.无偏压下生长4h后，A区形成许多大而弧立的金刚石颗粒，B区成为织构金刚石膜，而C区变为含有大量缺陷的连续金刚石膜.衬底负 关键词：     

微波化学气相沉积中气压对金刚石薄膜生长速率和质量的影响

研究了微波化学气相沉积中沉积气压对金刚石薄膜生长速率和质量的影响.研究表明，金刚石薄膜的生长速率随沉积气压的提高而增大，生长速率与沉积气压为线性关系.在高沉积气压下生长的金刚石薄膜晶形完整，拉曼谱测量可得到锐利的金刚石相的峰，但电压-电流测量表明，随着制备时沉积气压的提高，金刚石薄膜的暗电流增大，膜的电学质量下降. 关键词： 金刚石薄膜 生长速率 沉积气压     

Mo衬底生长金刚石薄膜表面晶形研究

 用HFCVD方法在Mo衬底上进行了金刚石薄膜生长研究，观察到在不同的反应压强条件下，金刚石薄膜晶粒的三种形貌，并且讨论了反应条件对晶粒形貌的影响以及菜花状大晶粒的构成机理。     

Precursors for CVD growth of nanocrystalline diamond

Various routes to grow nanocrystalline diamond films by the chemical vapor deposition technique are reviewed. Among the various routes, NCD films deposited on mirror-polished silicon substrates by biased enhanced growth by microwave plasma chemical vapor deposition are described in detail. The qualitative concentration of NCD was assessed by Raman spectroscopy and x-ray diffraction patterns of the films. The hardness of the films approaches that of natural diamond at optimized conditions while still having a low amount of stress (<1 GPa).     

Physical investigations on pulsed laser deposited nanocrystalline ZnO thin films

The nanocrystalline ZnO thin films were deposited by pulsed laser deposition on quartz and i-Si (100) substrates at different substrate temperatures (473 K–873 K) and at different mixed partial pressures (0.05, 0.01, and 0.5 mbar) of Ar+O₂. The structural studies from XRD spectra reveals that the films deposited at 0.05 mbar and at lower substrate temperatures were c-axis oriented with predominant (002) crystallographic orientation. At 873 K along with (002) orientation, additional crystallographic orientations were also observed in case of films deposited at 0.01 and 0.5 mbar pressures. The composition of Zinc and Oxygen in ZnO films from EDAX reveals that the films deposited at lower partial pressures were have high at.% of O₂ whereas higher partial pressures and substrate temperatures had high at.% Zn. The surface microstructure of the films show that the films deposited at lower partial pressures (0.05 mbar ) and at lower substrate temperatures (473 K) were found to have nanoparticles of size 15 nm where as films deposited at 873 K have nanorods. The length of these nanorods increases with increasing Ar+O₂ partial pressure to 0.5 mbar. The optical energy gap of the film deposited at lower partial pressure and substrate temperature was 3.3 eV and decrease with the increase of substrate temperatures. The films deposited at 0.5 mbar and at 873 K emitted an intense luminescence at a wavelength of 390 nm. The measured thickness of deposited films by spectroscopic ellipsometry is around 456 nm.     

Harmonic generation in ZnO nanocrystalline laser deposited thin films

ZnO plasma produced by third harmonic 355 nm of Nd:YAG laser at various ambient pressures of oxygen was used for depositing quality nanocrystalline ZnO thin films. Time and space resolved optical emission spectroscopy is used to correlate the plasma properties with that of deposited thin films. The deposited films showed particle size of 8 and 84 nm at ambient oxygen pressure of 100 and 900 mTorr, respectively. Third harmonic generation observed in ZnO thin films deposited under 100 mTorr of ambient oxygen is reported.     

金属Pd薄膜的超临界流体沉积制备及其结构表征

用超临界流体化学沉积法以有机金属化合物为前驱物制备金属单质薄膜.超临界CO₂为溶剂,六氟乙酰丙酮钯(Pd(Ⅱ)(hfac)₂)为前驱物,在温度为100 ℃、压力为12-18 MPa、反应时间为10-20 h的条件下,经过H₂气催化还原在单晶Si片上制备金属Pd薄膜,薄膜均匀且连续,厚度为0.3-1.5 μm.经X射线光电子能谱和X射线衍射谱分析可知,沉积的薄膜为金属Pd单质晶体结构.扫描电子显微镜研究结果表明,沉积压力对薄膜的晶粒尺寸有很大 关键词： 超临界流体沉积 金属Pd薄膜 2气')" href="#">H₂气 柱腔     

等离子体诱导碳纳米管到纳米金刚石的相变

采用氢等离子体，实现了碳纳米管向金刚石的结构相变，并实现了金刚石的高密度成核，有效成核密度可达10\+\{11\}／cm\+2以上，处于目前金刚石成核密度的最高行列，为制备优质的金刚石薄膜提供了保证.高分辨透射电镜、x射线衍射和拉曼光谱都证实了金刚石的形成.同时，对纳米金刚石晶粒的生成机理进行了初步探讨. 关键词： 等离子体 碳纳米管 纳米金刚石 结构相变     

Ar环境气压对纳米Si晶粒成核区范围的影响

为了研究不同环境气压条件下纳米Si晶粒成核区的范围,采用波长为308 nm的 XeCl脉冲准分子激光器,分别在1-200 Pa的Ar气环境下, 烧蚀高阻抗单晶Si靶,在距离烧蚀点正下方2.0 cm处水平放置一系列单晶Si 或玻璃衬底,沉积制备了纳米Si薄膜. Raman谱和X射线衍射谱测量证实了薄膜中纳米Si晶粒已经形成. 扫描电子显微镜的测量结果表明,环境气压的变化影响了衬底上纳米Si晶粒的平均尺寸及其分布范围. 根据成核区位置的确定方法,计算得出随着环境气压的增加纳米Si晶粒成核区的范围先变宽后变窄的规律. 从烧蚀动力学的角度对实验结果进行了分析.     

Growth and electron field emission of ZnO nanorods on diamond films

Zinc oxide (ZnO) nanorods grown on chemical vapor deposited diamond films by thermal vapor transport method have been investigated. In the initial growth status, the semi-spherical ZnO nuclei were preferably deposited near the growth steps on the terraces and the boundaries of diamond grains. With increasing the growth time, the [0 0 0 1] orientated ZnO nanorods appeared and further covered the whole diamond film. It is found that the size of diamond grains would determine the diameter of ZnO nanorods. The electron field emission properties of the ZnO nanorods/diamond system have been significantly improved with respect to pure diamond film. The feature of the ZnO nanorods grown on diamond films played an important role in further enhancing the electron field emission performances.