增强辉光放电等离子体离子注入的三维PIC／MC模拟

采用三维粒子模拟／蒙特卡洛模型自洽地模拟了增强辉光放电等离子体离子注入过程中离子产生和注入,获得了放电空间的离子总数、电势分布、等离子体密度分布和离子入射剂量等信息．模拟结果表明,5μs时鞘层达到稳定扩展,15μs时离子的产生与注入达到平衡,证实了增强辉光放电等离子体离子注入能在一定条件下实现白持的辉光放电．注入过程中,在点状阳极正下方存在一个高密度的等离子体区域,证实了电子聚焦效应．除靶台边缘外,离子的注入速率稳定且入射剂量均匀．脉冲负偏压提高时注入速率增加但入射剂量的均匀性变差．     

北京大学1.7 MV串列静电加速器的离子注入/辐照实验系统

北京大学1.7 MV串列静电加速器运行至今已有三十多年。该加速器配备有高频电荷交换负离子源和铯溅射负离子源,能够引出从H到 Au之间 的大部分元素的离子。离子能量可被加速至几百keV到若干MeV,主要开展离子注入/辐照实验和卢瑟福背散射(RBS)和沟道分析等离子束分析工作。基于辐照实验需求,建立了高温辐照系统,温度最高可达950 ℃。为了实现更加精确的离子注入,设计了直接式与间接式两种法拉第杯结构,使束流扫描面积精确控制,并且在测量束流强度时除了抑制次级电子,还考虑到了次级正离子的影响。利用不同能量的Au离子在单晶Si片上进行了注入实验,通过RBS分析显示测量剂量与期望剂量误差在4%以内,此外,注入均匀性的测试表明注入剂量的相对标准偏差为2%。     

半圆形容器等离子体源离子注入过程中离子动力学的两维PIC计算机模拟

利用两维particle-in-cell方法研究了半圆形容器表面等离子体源离子注入过程中鞘层的时空演化规律. 详尽考察了鞘层内随时间变化的电势分布和离子密度分布规律,离子在鞘层中的运动轨迹和运动状态,得到了半圆容器内、外表面和边缘平面上各点离子注入剂量分布规律,获得了工件表面各点注入离子的入射角分布规律. 研究结果揭示了半圆容器边缘附近鞘层中离子聚焦现象,以及离子聚焦现象导致工件表面注入剂量分布和注入角度分布存在很大不均匀的基本物理规律. 关键词： 等离子体源离子注入 鞘层 两维particle-in-cell方法 离子运动轨迹     

离子注入对C60薄膜结构的影响

利用高能离子注入技术系统地研究了不同剂量、不同种类离子注入对Ｃ６０薄膜结构的影响，并利用Ｒａｍａｎ光谱对其结构进行分析．结果表明：中等能量的离子注入会影响Ｃ６０薄膜的结构，使Ｃ６０分子薄膜产生聚合和非晶碳化现象，但上述现象的出现与注入离子的剂量大小有关，并存在一注量阈值，只有在此阈值之上，Ｃ６０薄膜结构才发生改变，研究表明这与注入离子同Ｃ６０分子之间互作用方式有关     

靶材偏置低电压对激光等离子体诱导靶上电势信号的影响

针对激光等离子体在Cu靶上诱导产生的电势信号展开实验研究，主要讨论了靶材偏置低电压时对电势信号的影响. 实验结果表明，外加低电压时，靶上电势信号呈现单峰脉冲结构，且靶材偏置负压时为正脉冲，偏置正压时为负脉冲，脉冲幅值随偏置电压增大而增大. 通过对靶上电势信号演化特性的详细分析，从等离子体荷电效应出发，结合靶材偏压造成的电场效应成功解释了靶材偏压对靶上电势信号的影响.     

轴承滚珠等离子体浸没离子注入过程的数值模拟

 利用轴对称PIC模型对轴承滚珠等离子体浸没离子注入（PIII）过程进行了数值模拟，对归一化电势的扩展情况进行了研究。在滚珠批量处理过程中，为了避免相邻滚珠周围鞘层的相互重叠对注入均匀性造成不良影响，对滚珠在靶台上摆放的最小距离进行了数值计算，计算结果表明：在电压为－40kV, 氮等离子体密度为4.8×10⁹ cm^-3，脉冲宽度为10μs时，滚珠摆放的最小距离应大于34.18cm。分析了滚珠圆周方向注入剂量的分布情况，针对静止滚珠改性处理后剂量分布很不均匀的问题，通过旋转靶台使滚珠注入均匀性明显得到改善。利用朗谬尔探针测量了滚珠周围鞘层扩展的情况测量，模拟结果和实验测量结果相吻合，最大相对误差小于8.4 %。     

多模式离子推力器栅极系统三维粒子模拟仿真

栅极系统是离子推力器推力产生的主要部件,推力器的性能和寿命都与栅极系统密切相关.对于具有多种工作模态的离子推力器,基于电流电压入口的仿真可以有效评估推力器的工作状况.采用三维粒子模拟方法对两栅极系统等离子体输运过程进行了仿真,获得了不同模式下的推力器性能参数,对比NSTAR的在轨测试参数,验证了模型的正确性;分析了工作模式变化对栅极区域电场分布和束流状态的影响以及离子推力器多模式设计需求.分析结果表明:远离栅极系统的外凸型屏栅鞘层和内凹型零等势面、低鞍点电势值和平缓的下游电势分布,有利于提高栅极系统离子通过率,抑制电子返流,减小Pits-and-Grooves腐蚀,是离子推力器工作模式的设计方向;提高束流电压会导致发散角损失增大,但可扩展栅极工作电流范围,在束流强度较大的模式下,使束流具有较好的聚焦状态,有利于减小Barrel腐蚀.研究结果为多模式离子推力器工作模式设计提供了参考.     

ICP等离子体鞘层附近区域发光光谱特性分析

为了独立控制鞘层附近区域离子密度和离子能最分布,采用光发射谱(OES)测量技术,对不同射频功率、放电气压和基底偏压下感应耦合等离子体鞘层附近区域辉光特性进行了研究.原子谱线和离子谱线特性分析表明,在鞘层附近区域感应耦合等离子体具有较高的离子密度和较低的电子温度.改变放电气压和射频功率,对得到的光谱特性分析表明,鞘层附近区域离子密度随射频功率的增大而线性增大,在低压下随气压的升高而增大.低激发电位原子谱线强度增加迅速,高激发电位原子谱线强度增加缓慢,而离子谱线强度增加很不明显.改变基底直流偏压,对得到的发射光谱强度变化分析表明,谱线强度随基底正偏压的增加而增大.随着基底负偏压的加入,谱线强度先减小而后增大;直流偏压为-30 V时,光谱强度最弱.快速离子和电子是引起Ar激发和电离过程的主要能量来源.     

在等离子体源离子注入中靶周围等离子体的行为

在等离子体源离子注入中，将待处理的工件直接放在等离子体内，并在工件上按一定的占空比加脉冲连续式负偏压，我们通过计算，分析了在工件未加负偏压时等离子体对工件的作用，并给出了在工件加上负偏压时注入工件的离子能量的简化分布模型，最后计算了在负偏压脉冲持续时间内离子阵鞘层边界的扩展。     

离子注入对C60薄膜结构的影响

利用高能离子注入技术系统地研究了不同剂量、不同种类离子注入对C₆₀薄膜结构的影响,并利用Raman光谱对其结构进行分析．结果表明：中等能量的离子注入会影响C₆₀薄膜的结构,使C₆₀分子薄膜产生聚合和非晶碳化现象,但上述现象的出现与注入离子的剂量大小有关,并存在一注量阈值,只有在此阈值之上,C₆₀薄膜结构才发生改变,研究表明这与注入离子同C₆₀分子之间互作用方式有关.     

Non-Uniformity of Ion Implantation in Direct-Current Plasma Immersion Ion Implantation

A particle-in-cell simulation is developed to study dc plasma immersion ion implantation. Particular attention is paid to the influence of the voltage applied to the target on the ion path, and the ion flux distribution on the target surface. It is found that the potential near the aperture within the plasma region is not the plasma potential, and is impacted by the voltage applied to the implanted target. A curved equipotential contour expands into the plasma region through the aperture and the extent of the expansion depends on the voltage. Ions accelerated by the electric field in the sheath form a beam shape and a flux distribution on the target surface, which are strongly dependent on the applied voltage. The results of the simulations demonstrate the formation mechanism of the grid-shadow effect, which is in agreement with the result observed experimentally.     

Peculiarities of pulsed ion implantation from a laser plasma containing multiply charged ions

A mathematical model describing the dynamics of a pulsed laser plasma with multiply charged ions, as well as the formation of the accelerated ion flow in an external magnetic field, is developed. Experimental studies and mathematical simulation by the particle-in-cell method are used to determine the role of multiply charged ions in the process of ion implantation into a silicon substrate from the pulsed plasma containing singly and doubly charged titanium ions. The plasma spreads between parallel-plate electrodes (Ti target and Si substrate) along the normal to the surface of the target. Ions are accelerated by high-voltage negative pulses applied to the substrate. It is found that doubly charged ions effectively participate in the implantation process when an external electric field is applied very soon after the laser action on the target. The application of a high-voltage pulse with an amplitude of 50 kV 0.5 μs after a laser pulse leads to ion implantation with an energy close to 100 keV. With increasing delay in the application of the high-voltage pulse, the upper boundary of the energy spectrum of implanted ions is displaced towards lower energies. Comparison of the depth profiles of titanium distribution in silicon calculated from the results of simulation are compared with the experimental profiles shows that the model developed here correctly describes the formation of the high-energy component of the ion flow, which is responsible for defect formation and doping of deep layers of the substrate.     

聚合物物理属性对离子注入效应的影响

聚合物导电性能差, 表面电荷积聚所产生的电容效应致使其表面电位衰减, 采用等离子体浸没离子注入对其表面改性是非常困难的. 建立了绝缘材料等离子体浸没离子注入过程的粒子模拟(PIC)模型, 实时跟踪离子在等离子体鞘层中的运动形态及特性并进行统计分析. 并基于PIC模型, 将聚合物表面的二次电子发射系数直接与离子注入即时能量建立关联, 研究了聚合物厚度、介电常数和二次电子发射系数等物理量对鞘层演化、离子注入能量和剂量的影响规律. 研究结果表明: 当聚合物厚度小于200 μ m, 相对介电常数大于7, 二次电子发射系数小于0.5时, 离子注入剂量和高能离子所占的份额与导体离子注入情况相当. 通过对聚合物表面离子注入剂量和高能离子所占份额的研究, 为绝缘材料和半导体材料表面等离子体浸没离子注入的实现提供了理论和实验依据.     

Spin-dependent delay time and Hartman effect in asymmetrical graphene barrier under strain

We study the spin-dependent tunneling time, including group delay and dwell time, in a graphene based asymmetrical barrier with Rashba spin–orbit interaction in the presence of strain, sandwiched between two normal leads. We find that the spin-dependent tunneling time can be efficiently tuned by the barrier width, and the bias voltage. Moreover, for the zigzag direction strain although the oscillation period of the dwell time does not change, the oscillation amplitude increases by increasing the incident electron angle. It is found that for the armchair direction strain unlike the zigzag direction the group delay time at the normal incidence depends on the spin state of electrons and Hartman effect can be observed. In addition, for the armchair direction strain the spin polarization increases with increasing the RSOI strength and the bias voltage. The magnitude and sign of spin polarization can be manipulated by strain. In particular, by applying an external electric field the efficiency of the spin polarization is improved significantly in strained graphene, and a fully spin-polarized current is generated.     

Simulation of Ion Paths in the Target Material for the Injection Complex of the BELA Facility

To realize the simulation experiments with the use of two ion beams at the injection complex of the BELA accelerator (Based on ECR ion source Linear Accelerator), it is necessary to determine the energy and irradiation angle of the beam of light ions which will be implanted into the region of radiation damage induced by heavy-ion beam. The depth of light-ion implantation is determined by the energy and kind of particles initiating the damage, as well as by their incidence angle. It is supposed that the incidence direction of heavy ions will coincide with the normal to the specimen surface. In our work, the necessary implantation zone for the iron ion beam with an energy of 3.2 MeV is located at depths of 300–800 nm. The simulation of the hydrogen and helium ion paths in the material of the iron target in the energy range from 150 to 600 keV at the angle to the normal from 0° to 65° is performed. The range of energies and irradiation angles for the hydrogen and helium ions are determined for the implantation into the radiation-induced defect-formation zone.     

有限尺寸方靶等离子体离子注入动力学的三维粒子模拟研究

采用三维粒子模拟模型研究了有限尺寸方靶等离子体浸没离子注入过程中的鞘层动力学行为,得到了鞘层尺寸和方靶表面的注入剂量、注入能量以及注入角度等信息,并与二维无限长方靶注入结果进行了对比.模拟结果表明,与无限长方靶不同,有限尺寸方靶周围鞘层很快扩展为球形,但鞘层厚度明显减小.在模拟的50ω^-1_pi时间尺度内靶表面注入剂量很不均匀,中心区域注入剂量最小,四个边角附近位置注入剂量最大.这种剂量不均匀性是由于鞘层扩展为球形,使得鞘层内离子被聚焦并注入到边角附 关键词： 等离子体浸没离子注入 数值模拟 三维粒子模拟 有限尺寸方靶     

脉冲偏压上升沿特性对等离子体浸没离子注入鞘层扩展动力学的影响

等离子体浸没离子注入(PIII)是用于材料表面改性的一种廉价高效、非视线的技术.采用等离子体粒子模型，通过假设电子密度服从Boltzmann分布，求解Poisson方程和Newton方程，跟踪离子在等离子体鞘层中的运动形态及特性并进行统计分析，研究了不同上升速率和形状的6种波形上升沿对鞘层时空演化、离子注入能量和剂量的影响.结果表明，在PIII过程中，脉冲上升沿影响了等离子体鞘层的扩展，且不同波形诱导的鞘层厚度间存在最大差值.电场强度在鞘层的外边缘区域存在陡降区，离子的运动为非匀加速过程.可以通过调整脉冲 关键词： 等离子体浸没离子注入 鞘层 粒子模型 上升沿     

Current Oscillation and dc-Voltage-Controlled Chaotic Dynamics in Semiconductor Superlattices

We report a detailed theoretical study of current oscillation and dc-voltage-controlled chaotic dynamics in doped GaAs/AlAs resonant tunneling superlattices under crossed electric and magnetic fields. When the superlattice is biased at the negative differential velocity region, current self-oscillation is observed with proper doping concentration. The current oscillation mode and oscillation frequency can be affected by the dc voltage bias, doping density, and magnetic field. When an ac electric field with fixed amplitude and frequency is also applied to the system, different nonlinear properties show up in the external circuit with the change of dc voltage bias. We carefully study these nonlinear properties with different chaos-detecting methods.     

Effect of Cathode and Anode Voltage on an Ion Sheath Thickness in a Magnetically Confined Diffusion Plasma

This article reports about the ion sheath thickness variation occurring in front of a negatively biased plate immersed in the target plasma region of a double plasma device. The target plasma is produced due to the local ionization of neutral gas by the high energetic electrons coming from the source region (main discharge region). It is observed that for an increase in cathode voltage (filament bias voltage) in the source region, the ion flux into the plate increases. As a result, the sheath at the plate contracts. Again, for an increase in source anode voltage (magnetic cage bias), the ion flux to the plate decreases. As a result, the sheath expands at the plate. The ion sheath formed at the separation grid of the device is found to expand for an increase in cathode voltage and it contracts for an increase in the anode voltage of the main discharge region. One important observation is that the applied anode bias can control the Bohm speed of the ions towards the separation grid. Furthermore, it is observed that the ion current collected by the separation grid is independent of changes in plasma density in the diffusion region but is highly dependent on the source plasma parameters. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)