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受探测器尺寸和重建锥角的限制,基于单圆轨道扫描和FDK算法的三维CT成像方法难以对大物体进行三维CT成像。提出了一种基于平板探测器,采用锥束RT扫描方式的成像方法,推导了其三维CT成像算法。首先把对回转物体进行三次锥束平移透照的投影数据重新排成为更大范围的倾斜平行投影数据,然后经过加权滤波和反投影重建,获得物体的三维层析结果。仿真结果表明,该方法在重构大物体图像时,获得了满意的图像质量。水平方向视场是单圆轨道FDK算法视场的2.88倍,在垂直方向减少了锥角过大形成的伪影,提高了物体的重构精度。 相似文献
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锥束CT具有高效率和高精度的显著特点, 在医学成像与工业无损检测等领域已得到广泛应用, 但余晖的存在降低了CT图像的质量. 本文借鉴余晖多指数衰减模型的思想, 结合平板探测器输出信号的实际衰减规律, 提出了一种新的基于多指数拟合的余晖衰减建模及校正方法. 首先进行了基于平板探测器的锥束CT成像实验, 结果表明平板探测器各像素的余晖衰减规律具有良好的一致性, 且余晖衰减规律与初始灰度的大小无关; 其后根据建立的余晖衰减模型实现了余晖的快速校正, 并分析比较了余晖校正前后投影图像和切片图像质量, 表明余晖校正后的零件轮廓清晰度得到了显著提升. 该方法无需获取探测器闪烁体成分及其衰减时间常数, 便于实际锥束CT成像系统的余晖检测与校正.
关键词:
余晖
平板探测器
锥束CT
多指数衰减 相似文献
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为了克服三维重建高度依赖标定板,满足3D打印模型的工业需求,提出基于图像自标定的高效3D打印模型生成方法,无需借助标定板计算相机参数,直接使用单相机采集序列图像进行三维重建。为了克服基于自标定方法易受图像质量和特征点匹配精确度的影响,根据人机交互与自适应分割算法相结合的方法去除原始图像背景及过滤噪声,使图像感兴趣区域特征更为明显,采用快速稳定特征算法提取序列图像中特征点并根据特征点的匹配度进行精确的特征点匹配,再使用匹配信息自标定求解得到相机模型参数,最后根据相机模型以及特征点信息完成三维目标的稠密重建。实验结果表明,自标定及重建方法对大小各异,表面材质不同的目标均可实现重建。 相似文献
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《光学学报》2016,(9)
锥束计算机断层成像(CT)在临床医学及工业无损检测等诸多领域获得了越来越广泛的应用。但是,受面阵探测器尺寸等硬件条件限制,锥束CT的成像视野有限,难以满足实际应用中对大尺寸物体成像的需求。为了扩展锥束CT的视野,提出了锥束CT转台单侧两次螺旋扫描单层重排重建算法。该算法在转台的同一侧进行两次螺旋扫描,通过统一成像几何条件,将两组螺旋锥形束投影重排为多层平行束投影,利用平行束投影的对称性去除数据的横向截断,得到一组完全覆盖物体横截面的平行束投影数据,再通过滤波反投影方式得到重建图像。实验结果表明,该方法的成像视野扩展率可达2.56,且成像质量与传统全覆盖算法相当。 相似文献
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构建了具有单光子成像能力的光子成像系统,提出应用管道滤波方法实现对光子受限静止点目标的探测。分析了光子图像静止点目标与点状噪声特征,根据静止点目标在序列图像中位置的确定性以及噪声点的不相关性,研究了基于管道滤波的光子成像静止点目标探测方法。为降低目标探测的虚警概率,优化了管道滤波直径。以实验采集得到的多组光子图像序列为样本,获得了探测概率、虚警概率与信号光子数、噪声光子数、管道长度以及检测阈值的关系。检测结果显示,对信号与噪声的平均发生率为0.4和5.215的序列图像,当管道长度为9、检测阈值为2时,探测概率达0.9以上且虚警概率〈0.08。对比多组图像序列的检测结果表明,影响探测概率的主要参数是信号光子数,而影响虚警概率的主要参数是噪声光子数。 相似文献
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现有的工业计算机断层成像(ICT)图像缺陷识方法中,多采用对单张图像进行孤立评判方法,此类方法未能考虑到单张图像在相邻层图像信息关联性,因而易将孤立的噪音视为缺陷,造成误判。为解决这一问题,提出一种基于序列ICT切片图像自动识别方法,该方法将识别过程分为两步:单张图像的潜在缺陷提取和相邻层图像缺陷的匹配。第一步运用传统方法识别出每张图像中所有潜在缺陷;第二步根据真缺陷在相邻层具有匹配关系而伪缺陷则相对孤立的特点,通过分步匹配的方法确定每张图像上所有潜在缺陷在相邻层图像上的匹配关系,区分出真伪缺陷。最后通过实例验证表明:利用该方法可以有效得提高真缺陷得识别率,降低误判率。 相似文献
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This paper presents an improved depth extraction method of 3D objects using computational integral imaging reconstruction (CIIR) based on the multiple windowing models. The proposed method records 3D objects using the lenslet array; and it reconstructs multiple sets of slice images from multiple CIIR methods based on the different windowing models. A depth map is then extracted by a block matching algorithm among multiple set of slice images. A preliminary experiment is carried out to show the feasibility of the proposed method. Experimental results indicate the proposed method outperforms the previous method with two windowing models. 相似文献
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空间目标容易受到太空垃圾碰撞及干扰从而产生抖动。针对空间抖动目标红外图像的模型构建问题,对天基空间红外成像系统的主要噪声进行分析并考虑杂散光影响,基于Creator与Vega软件平台相结合,提出抖动状态下空间目标表面缺陷的红外图像的建模方法。依据空间目标基本特征分析其红外辐射特性,在Creator中对空间目标缺陷进行三维建模;根据目标以及背景红外辐射特性对三维模型进行温度场分析,将分析所得结果与Vega红外模块相结合获得红外图像模型;确定抖动图像数学模型并对仿真图像施加抖动影响,然后施加杂散光影响获得最终模拟图像。实验结果表明:该方法生成的抖动状态下空间目标红外图像与实验图像相似程度高,能为空间目标探测与态势感知提供一种有效的模拟系统。 相似文献
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A variety of methods for the investigation and 3D representation of the inner structure of materials has been developed. In this paper, techniques based on slice and view using scanning microscopy for imaging are presented and compared. Three different methods of serial sectioning combined with either scanning electron or scanning ion microscopy or atomic force microscopy (AFM) were placed under scrutiny: serial block-face scanning electron microscopy, which facilitates an ultramicrotome built into the chamber of a variable pressure scanning electron microscope; three-dimensional (3D) AFM, which combines an (cryo-) ultramicrotome with an atomic force microscope, and 3D FIB, which delivers results by slicing with a focused ion beam. These three methods complement one another in many respects, e.g., in the type of materials that can be investigated, the resolution that can be obtained and the information that can be extracted from 3D reconstructions. A detailed review is given about preparation, the slice and view process itself, and the limitations of the methods and possible artifacts. Applications for each technique are also provided. 相似文献
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Cone-beam computed tomography(CBCT) has the notable features of high efficiency and high precision, and is widely used in areas such as medical imaging and industrial non-destructive testing. However, the presence of the ray scatter reduces the quality of CT images. By referencing the slit collimation approach, a scatter correction method for CBCT based on the interlacing-slit scan is proposed. Firstly, according to the characteristics of CBCT imaging, a scatter suppression plate with interlacing slits is designed and fabricated. Then the imaging of the scatter suppression plate is analyzed, and a scatter correction calculation method for CBCT based on the image fusion is proposed, which can splice out a complete set of scatter suppression projection images according to the interlacing-slit projection images of the left and the right imaging regions in the scatter suppression plate, and simultaneously complete the scatter correction within the flat panel detector(FPD). Finally, the overall process of scatter suppression and correction is provided. The experimental results show that this method can significantly improve the clarity of the slice images and achieve a good scatter correction. 相似文献
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为获得工业CT切片序列在三维空间任意方向的剖面,提出了一种基于三维纹理映射技术的任意剖面绘制方法。该方法首先把工业CT图片序列存储为体数据,然后使用传递函数对体数据进行分类,并将分类处理后的体数据定义为三维纹理,结合人机交互给出的平面参数计算出剖切多边形各顶点及其对应的纹理坐标,最后进行纹理映射得到剖面图像。该方法的特点是利用图形处理器支持的纹理映射功能完成剖面像素的采样和插值。实验结果表明,该方法成像质量较高,显示速度较快,能够满足人机交互实际应用需要。 相似文献
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Deliberately introducing defects into photonic crystals is an important way to functionalize the photonic crystals. We prepare a special large-scale three-dimensional(3D) photonic crystal(PC) with designed defects by an easy and low-cost method. The defect layer consists of photoresist strips or air-core strips. Field emission scanning electron microscopy(FESEM) shows that the 3D PC is of good quality and the defect layer is uniform. Different defect states shown in the ultraviolet-visible spectra are induced by the photoresist strip layer and air-core strip layer. The special large-scale 3D PC can be tested for integrated optical circuits, and the defects can act as optical waveguides. 相似文献
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Two kinds of paramagnetic defects whose density increases and decreases with temperature have been observed in Ge42S58 glass using ESR technique. The increasing and decreasing defects are interpreted as resulting from Ge dangling bonds with negative and positive effective electron correlation energies, respectively. Unlike usual amorphous semiconductors, Ge42S58 glass contains defects with the effective electron correlation energy whose value ranges from positive to negative depending on environment around the defect. The densities of the defects with the positive and negative values are about 4 × 1015 and 3 × 1017 cm?3 respectively. 相似文献