一种测试小分子迁移的新方法

针对高聚物材料中小分子的迁移现象,结合数字图像处理技术,提出了一种基于钠光和斐索等厚原理的光学干涉法.介绍了系统测试原理,针对光学系统的设计作了详细的分析与计算;通过实验测试,设计的光学系统能够采集到清晰的干涉条纹,且满足测试精度要求,由条纹间距随时间的变化测出了丙酮和乙醇小分子迁移时高聚物折射率的变化规律为:丙酮小分...     

基于超声波干涉的峰谷法计算声速值及实验误差探讨

介绍了基于Cassy Lab软件下的超声波干涉实验,提出了利用超声波干涉现象测量声速的方法.根据干涉理论推导了峰谷法测量声速的计算公式.分析和探讨了峰谷法计算声速的误差来源和改进方法.     

微波椭偏法测量不透明材料的厚度

在传统的激光椭偏法测量厚度的基础上,用微波取代激光测量了不透明材料的厚度.分析了偏转角及反射干扰产生的误差,并提出了修正方法.测量结果表明:该方法可以比较精确地测量铝板和塑料板的厚度;由于散射的影响,表面磨砂的有机玻璃板的厚度测量误差很大.     

用于原子干涉仪的拉曼光的制备

原子干涉仪是利用原子物质波的特性而实现的干涉仪,广泛应用于精密测量领域.在原子干涉仪中,通过拉曼光对原子进行相干操作,拉曼光的质量直接影响着干涉仪的技术指标.基于注入锁定技术,采用普通半导体激光器、声光调制器,实现了功率、频率和位相稳定的拉曼光的制备,并对拉曼光的相位噪声技术指标进行了测试.     

Neutron diffraction study on composite compound Nd2Co7

The crystallographic and the magnetic structures of the composite compound Nd₂Co₇ at 300 K are investigated by a combined refinement of X-ray diffraction data and high-resolution neutron diffraction data. The compound crystallizes into a hexagonal Ce₂Ni₇-type structure and consists of alternately stacking MgZn₂-type NdCo₂ and CaCu₅-type NdCo₅ structural blocks along the c axis. A magnetic structure model with the moments of all atoms aligning along the c axis provides a satisfactory fitting to the neutron diffraction data and coincides with the easy magnetization direction revealed by the X-ray diffraction experiments on magnetically pre-aligned fine particles. The refinement results show that the derived atomic moments of the Co atoms vary in a range of 0.7 μ_B-1.1 μ_B and the atomic moment of Nd in the NdCo₅ slab is close to the theoretical moment of a free trivalent Nd³⁺ ion, whereas the atomic moment of Nd in the NdCo₂ slab is much smaller than the theoretical value for a free Nd³⁺ ion. The remarkable difference in the atomic moment of Nd atoms between different structural slabs at room temperature is explained in terms of the magnetic characteristics of the NdCo₂ and NdCo₅ compounds and the local chemical environments of the Nd atoms in different structural slabs of the Nd₂Co₇ compound.     

Atomic NOON state generation in distant cavities by virtual excitations

A general scheme of generating NOON states of virtually-excited 2N atoms is proposed. The two cavities are fibre-connected with N atoms in each cavity. Although we focus on the case of N = 2, the system can be extended to a few atoms with N 〉2. It is found that all 2N atoms can be entangled in the form of NOON states if the atoms in the first cavity are initially in the excited states and atoms in the second cavity are all in the ground states. The feasibility of the scheme is carefully discussed, it shows that the NOON state with a few atoms can be generated with good fidelity and the scheme is feasible in experiment.     

Evaluation of thermal resistance constitution for packaged A1GaN/GaN high electron mobility transistors by structure function method＊

The evaluation of thermal resistance constitution for packaged A1GaN/GaN high electron mobility transistor （HEMT） by structure function method is proposed in this paper. The evaluation is based on the transient heating measurement of the A1GaN/GaN HEMT by pulsed electrical temperature sensitive parameter method. The extracted chip-level and package-level thermal resistances of the packaged multi-finger A1GaN/GaN HEMT with 400μm SiC substrate are 22.5 K/W and 7.2 K/W respectively, which provides a non-invasive method to evaluate the chip-level thermal resistance of packaged A1GaN/GaN HEMTs. It is also experimentally proved that the extraction of the chip- level thermal resistance by this proposed method is not influenced by package form of the tested device and temperature boundary condition of measurement stage.     

Effect of substrate temperature on microstructure and optical properties of single-phased Ag20 film deposited by using radio-frequency reactive magnetron sputtering method

Using a radio-frequency reactive magnetron sputtering technique, a series of the single-phased Ag20 films are deposited in a mixture of oxygen and argon gas with a flow ratio of 2：3 by changing substrate temperature （Ts）. Effects of the Ts on the microstructure and optical properties of the films are investigated by using X-ray diffractometry, scanning electron microscopy and spectrophotometry. The single-phased Ag20 films deposited at values of Ts below 200℃ are （111） preferentially oriented, which may be due to the smallest free energy of the （111） crystalline face. The film crystallization becomes poor as the value of Ts increases from 100℃ to 225℃. In particular, the Ag20 film deposited at Ts=225℃ loses the （111） preferential orientation. Correspondingly, the film surface morphology obviously evolves from a uniform and compact surface structure to a loose and gullied surface structure. With the increase of Ts value, the transmissivity and the reflectivity of the films in the transparent region are gradually reduced, while the absorptivity gradually increases, which may be attributed to an evolution of the crystalline structure and the surface morphology of the films.     

带孔片状不良导体导热系数测试方法探究

推导出稳态法测量带孔片状不良导体导热系数的适用公式,并采用有效的方法对光盘进行了测试分析.     

验证辐射强度与距离平方反比率的实验

利用Nal闪烁谱仪测量了在探测器与放射源间某个距离下对应的计数率.对测量的数据分别利用等精度最小二乘法和未知参数逼近法进行了处理,观察到在某些未知参数下,最小二乘法引起的误差很大,利用未知参数逼近法得到的值能和真实值较好接近,从而验证了辐射强度与距离平方反比率.