两种红外干涉图采集及光谱复原方法的对比研究

目前,傅里叶变换红外(FTIR)光谱仪主要的数据采样方法有He-Ne激光触发方法和Brault方法。Brault方法使用硬件计数器而且采集到的数据有延时,会增加数据处理的时间,因此讨论了一种基于Brault方法改进的数据采样与处理方法,该方法采用同步数据采集卡,同时采样两路数据,用近似的相似三角形法得到精确的He-Ne激光过零点信息,然后根据三次样条插值方法重采样干涉信号,实现了软件数据采样与处理。将该方法与He-Ne激光触发方法得到的光谱图进行对比。结果表明,两种方法得到的背景光谱图中H2O和CO2的吸收峰与标准吸收谱带一致,基于Brault方法改进的数据采样与处理方法提高了光谱的信噪比,其激光过零点信息可得到动镜扫描速度的稳定性,而He-Ne激光触发方法的采样与处理时间小于改进的Brault方法。     

消声器传递损失预测的边界元模态展开混合方法

将边界元法和解析方法结合形成一种混合方法用于计算消声器的传递损失,消声器被划分成若干个子结构,解析方法和边界元方法被分别用于计算规则结构和不规则结构的阻抗矩阵,不同子结构之间通过阻抗矩阵连接起来。为减少计算时间,采用一种基于模态配点法的简化方法。对单级膨胀腔、双级膨胀腔和穿孔管阻性消声器的传递损失进行了计算,混合方法计算结果与解析方法和三维数值方法计算结果吻合良好。分析了混合方法的计算效率并与传统子结构方法进行了比较,混合方法能明显节省计算时间。      

简支矩形板模态辐射抗的一种快速计算方法分析

在模态辐射阻快速计算方法的基础上,进一步推导出简支矩形板模态辐射抗快速计算方法的相关计算公式,给出了相应的计算步骤,并与传统模态辐射阻抗的数值计算方法进行了详细的对比研究。与以往的二重积分方法相比,该方法为一重数值积分,因而其计算速度远高于以往方法。而且,与以往方法不同,该方法的计算速度不随模态数的增加而迅速减小。该方法可在结构与重流体的声振耦合问题上得到广泛的应用。      

基于最优非线性加权的光点定位方法

对传统的光点信号定位方法作了理论分析,讨论了各种方法的目标函数与优化过程。在此基础上,提出了一种基于最优加权的光点定位方法,使得像素的灰度对光点定位的贡献达到最佳。传统的方法均可看作是此方法理论框架下的特例。理论和实验表明该方法优于传统的方法。     

消声器传递损失预测的边界元模态展开混合方法

将边界元法和解析方法结合形成一种混合方法用于计算消声器的传递损失,消声器被划分成若干个子结构,解析方法和边界元方法被分别用于计算规则结构和不规则结构的阻抗矩阵,不同子结构之间通过阻抗矩阵连接起来。为减少计算时间,采用一种基于模态配点法的简化方法。对单级膨胀腔、双级膨胀腔和穿孔管阻性消声器的传递损失进行了计算,混合方法计算结果与解析方法和三维数值方法计算结果吻合良好。分析了混合方法的计算效率并与传统子结构方法进行了比较,混合方法能明显节省计算时间。     

局部间断Petrov-Galerkin方法在大气污染模型中的应用

构造数值模拟两类大气污染模型的局部间断Petrov-Galerkin方法。首先通过变量代换将大气污染模型方程转化为与之等价的一阶微分方程组,再利用间断Petrov-Galerkin方法求解微分方程组。该方法既可以选取不同的检验函数和试探函数空间,又可以保持间断Petrov-Galerkin方法的优势。同局部间断有限元方法相比,该方法的计算公式较为简便,数值算例表明该方法具有三阶精度。与有限体积元方法相比,该方法具有较小的误差。本算法可为大气污染模型的数值模拟提供实用工具。     

LATTICE-BOLTZMANN方法及其在顶盖驱动流数值模拟中的应用

Ｌａｔｔｉｃｅ－Ｂｏｌｔｚｍａｎｎ方法（以下简称ＬＢ方法）,作为一种新的数值计算方法,在近十年得到迅速发展。本文对ＬＢ方法的基本思想及实施方法进行了概括介绍,并将该方法运用到顶盖驱动流的计算中,所得结果与基准解吻合良好。     

椭圆截面的Abel逆变换方法

介绍了等离子体椭圆截面的Abel逆变换方法,并和圆截面的Abel逆变换方法进行了比较。给定一个探测阵列对一个辐射源函数的测量结果,分别用Barr方法、等值同心圆方法和幂级数方法进行了椭圆逆变换,结果表明该方法的可靠性可应用于实验数据处理中。     

强磁防垢除垢系列磁水器装置研制

通常对水防垢除垢的处理是采用化学方法,然而这种方法并不理想,它不仅要消耗大量的化学药品,占用人力物力多,使生产成本提高,而且还会带来二次污染。因此,人们所需要的是既经济简便、效果好、又无污染的处理方法。 永磁场处理水就是其中一种较好的处理方法,该方法是物理方法中的一种。在中小型锅炉、热交换器、冷却器、中央空调循环系统及家用热水器等设备上使用该方法,可获得显著的防垢除垢效果。     

关于量子统计力学中的集团展式方法

一、引言 李政道和杨振宁从统计物理的一般原理出发,应用类似于经典情况下集团展式的方法,建立了处理量子体系的一般方法。这种方法有别于近来广泛被采用的场论方法,前者纯粹运用统计物理的思想。这种近似方法,对处理短程相互作用的低密度体系比较有利,例如他们用来讨论硬球的玻色气体及其相变问题。最近莫林发展了这种方法,并用来讨论短程的费米气体和核物质的一些性质。但这种方法有它的局限性,它只     

A high‐resolution X‐ray fluorescence spectrometer and its application at SSRF

A high‐resolution X‐ray fluorescence spectrometer based on Rowland circle geometry was developed and installed at BL14W1 XAFS beamline of Shanghai Synchrotron Radiation Facility. The spectrometer mainly consists of three parts: a sample holder, a spherically curved Si crystal, and an avalanche photodiode detector. The simplicity of the spectrometer makes it easily assembled on the general purpose X‐ray absorption beamline. X‐ray emission spectroscopy and high‐resolution X‐ray absorption near edge spectroscopy can be carried out by using this spectrometer. X‐ray emission preliminary results with high‐resolution about 3 eV of Mn compounds were obtained, which confirmed the feasibility of the spectrometer. The application about Eu (III) retention on manganese dioxide was also studied using this spectrometer. Compared with conventional X‐ray absorption fine structure spectroscopy technique, the fluorescence peak of probed element [Eu (III) Lα] and matrix constituents (Mn Kα) were discriminated using this technique, indicating its superiority in fluorescence detection. Copyright © 2013 John Wiley & Sons, Ltd.     

应用小型X射线荧光光谱仪快速测定钾长石的化学成份

本文采用粉末压片法制样,用小型多道波长色散Ｘ射线荧光光谱仪测定钾长石中的ＳｉＯ２Ａｌ２Ｏ３、ＣａＯ、ＭｇＯ、Ｆｅ２Ｏ３、Ｋ２Ｏ、Ｎａ２Ｏ。测定准确度、精密度较好,所得结果满足化学分析误差要求,能完全替代化学分析,将一个钾长石作全分析整个过程只需３０ｍｉｎ,本法快速、简便、结果令人满意。     

顺序式X射线荧光光谱仪常见故障的诊断方法

介绍顺序式X射线荧光光谱仪5种常见故障的诊断及处理方法。故障部位包括X射线装置、样品室和光谱室的真空、探测器、晶体和测角仪。     

X荧光分析系列实验

介绍了能量色散X射线荧光分析的原理、应用以及用X荧光谱仪开设的系列实验。     

A three‐crystal spectrometer for high‐energy resolution fluorescence‐detected X‐ray absorption spectroscopy and X‐ray emission spectroscopy at SSRF

A Johann‐type spectrometer for the study of high‐energy resolution fluorescence‐detected X‐ray absorption spectroscopy, X‐ray emission spectroscopy and resonant inelastic X‐ray scattering has been developed at BL14W1 X‐ray absorption fine structure spectroscopy beamline of Shanghai Synchrotron Radiation Facility. The spectrometer consists of three crystal analyzers mounted on a vertical motion stage. The instrument is scanned vertically and covers the Bragg angle range of 71.5–88°. The energy resolution of the spectrometer ranges from sub‐eV to a few eV. The spectrometer has a solid angle of about 1.87 × 0^?3 of 4π sr, and the overall photons acquired by the detector could be 10⁵ counts per second for the standard sample. The performances of the spectrometer are illustrated by the three experiments that are difficult to perform with the conventional absorption or emission spectroscopy. Copyright © 2016 John Wiley & Sons, Ltd.     

A device for X‐Ray elemental mapping using annular radioisotope source

An energy‐dispersive system is described for elemental mapping by X‐ray fluorescence spectrometry. The present study describes the design of an X‐ray fluorescence spectrometer and presents its performance in elemental mapping applications. The spectrometer is based on a new ring‐shaped collimator with a pinhole in the center of it and a ring‐shaped Am‐241 isotope mounted in the collimator as a source for excitation of X‐ray fluorescence. The photons were detected by high‐resolution Si (Li) detector coupled to a multi‐channel analyser and cooled by liquid nitrogen. In this study, we used two samples; one of them was made from pure elemental powders, and the second one was a piece of a stone and three types of maps were plotted. In the maps type one, the areas of the elements were shown with a single color. These maps only show the location of the elements in the sample. In the maps type two, the area of each element was shown with different colors because of the count (intensity) related to the area. In the third type of the maps for each element, depending on the elements' position on the sample, the counts were plotted in three dimensions. The areas with higher intensity have greater height, and areas with lower intensity have lower altitude. These two last types of maps provide information about the homogeneity or heterogeneity of the elemental distribution in the samples. The spectrometer can perform non‐destructive analyses of samples and objects in the air. Copyright © 2017 John Wiley & Sons, Ltd.     

白云石的X射线荧光快速分析

采用粉末压片法制样,用小型多道波长色散X射线荧光光谱仪测定白云石中的SiO2、Al2O3、CaO、MgO、Fe3O3。所得结果满足化学分析误差要求,能完全替代化学分析,对白云石瞪分析缩短至30min。本方法快速、简便,结果令人满意。     

Confocal macro X‐ray fluorescence spectrometer on commercial 3D printer

Novel confocal X‐ray fluorescence (XRF) spectrometer was designed and constructed for 3D analysis of elementary composition in the surface layer of spatially extended objects having unlimited chemical composition and geometrical shape. The main elements of the XRF device were mounted on a moving frame of a commercial 3D printer. The XRF unit consists of a silicon drift detector and a low‐power transmission‐type X‐ray tube. Both the excitation and secondary X‐ray beams were formed and regulated by simple collimator systems in order to create a macro confocal measuring setup. The spatial accuracy of the mechanical stages of the 3D printer achieved was less than 5 μm at 100‐μm step‐size. The diameter of the focal spot of the confocal measuring arrangement was between 1.5 and 2.0 mm. The alignment of the excitation and secondary X‐ray beams and the selection of the measuring spot on the sample surface were ensured by two laser beams and a digital microscope for visualization of the irradiated spot. The elements of the optical system together with the XRF spectrometer were mounted on the horizontal arm of the 3D printer, which mechanical design is capable of synchronized moving the full spectroscopic device within vertical directions. Analytical capability and the 3D spatial resolution of the confocal spectrometer were determined. Copyright © 2017 John Wiley & Sons, Ltd.     

A high‐energy‐resolution resonant inelastic X‐ray scattering spectrometer at ID20 of the European Synchrotron Radiation Facility

An end‐station for resonant inelastic X‐ray scattering and (resonant) X‐ray emission spectroscopy at beamline ID20 of ESRF – The European Synchrotron is presented. The spectrometer hosts five crystal analysers in Rowland geometry for large solid angle collection and is mounted on a rotatable arm for scattering in both the horizontal and vertical planes. The spectrometer is optimized for high‐energy‐resolution applications, including partial fluorescence yield or high‐energy‐resolution fluorescence detected X‐ray absorption spectroscopy and the study of elementary electronic excitations in solids. In addition, it can be used for non‐resonant inelastic X‐ray scattering measurements of valence electron excitations.     

X‐ray tube spectral measurement method for quantitative analysis of X‐ray fluorescence analysis

Lα and Lβ X‐ray fluorescence spectra of a lead metallic sheet were measured using an energy dispersive X‐ray spectrometer by changing the X‐ray tube voltage and the material of the primary filter. The Lα to Lβ intensity ratio changed from Lα: Lβ = 3: 1 at 15 kV to Lα: Lβ = 1: 1 at 50 kV depending on the X‐ray tube voltage and the filter. The scattered X‐ray spectra of an acrylic slab instead of the sample in the sample holder were measured by changing the applied voltage and the material of the primary filter. The calculated values of the Pb Lα/Lβ intensity ratio of the metallic sheet using the Shiraiwa–Fujino formula by inserting the scattered X‐ray spectra of an acrylic plate as incident X‐ray spectra and the fundamental parameters taken from the Elam database were in good agreement with the experimental ones. We conclude that we can obtain an incident X‐ray spectrum approximately by measuring the scattered X‐ray spectrum without measuring the direct incident beam. Copyright © 2010 John Wiley & Sons, Ltd.