4B9B束线低能分支的性能改进

分析了北京同步辐射实验室4B9B原束线低能分支的构造及弊病,在不影响束线高能分支性能及总体机械结构的基础上提出了改进方案.详细介绍了该设计方案和光束线调试工作及出光后束线的性能测试工作,该测试结果完全符合束线的设计.该束线在同步辐射专用光实验中充分发挥了改进后的优势,取得了令人满意的结果     

软x射线平面镜不同掠射角下的反射率标定

报道了平面反射镜在不同掠射角下的反射率标定实验.实验利用北京同步辐射装置(BSRF)-3W1B束线及反射率计靶室，在束流强度40—120 mA、贮存环电子能量2 GeV专用光运行模式下，在50—1500 eV能区，做了四种材料平面镜在不同掠射角下的反射率标定.标定过程用高灵敏度无死层的硅光二极管代替x射线二极管作探测器，使输出信号提高2—3个数量级.最终给出C，Si，Ni和Au四种材料平面镜在1°—7°掠射角下的反射率标定曲线，并把实验数据与理论计算值进行了比对和分析. 关键词： 同步辐射 平面镜 反射率 标定     

Circular dichroism beamline B23 at the Diamond Light Source

Synchrotron radiation circular dichroism (SRCD) is a well established technique in structural biology. The first UV‐VIS beamline, dedicated to circular dichroism, at Diamond Light Source Ltd, a third‐generation synchrotron facility in south Oxfordshire, UK, has recently become operational and it is now available for the user community. Herein the main characteristics of the B23 SRCD beamline, the ancillary facilities available for users, and some of the recent advances achieved are summarized.     

High pressure x-ray diffraction techniques with synchrotron radiation

This article summarizes the developments of experimental techniques for high pressure x-ray diffraction(XRD) in diamond anvil cells(DACs) using synchrotron radiation. Basic principles and experimental methods for various diffraction geometry are described, including powder diffraction, single crystal diffraction, radial diffraction, as well as coupling with laser heating system. Resolution in d-spacing of different diffraction modes is discussed. More recent progress, such as extended application of single crystal diffraction for measurements of multigrain and electron density distribution, timeresolved diffraction with dynamic DAC and development of modulated heating techniques are briefly introduced. The current status of the high pressure beamline at BSRF(Beijing Synchrotron Radiation Facility) and some results are also presented.     

软X射线谱学显微光束线单色器结构设计及精度测试

针对上海光源谱学显微光束线站的性能要求,对其核心部件单色器进行结构设计。阐述了单色器的扫描运动原理,论述了波长扫描机构的设计方案,具体分析平面镜和光栅的转角重复精度影响因素;描述光栅切换机构,着重分析其水平偏差、垂直偏差、滚角、摆角和投角的精度问题;采用六杆并联机构的方案完成镜箱调节机构的设计,分析其支杆的调节范围和分辨力情况。给出了单色器的结构,并且对其精度进行了测试。测试结果表明,平面镜和光栅的转角重复精度分别为0.166″和0.149″;光栅切换机构的滚角、摆角和投角的重复精度分别为0.08″、0.12″和0.05″。这说明了单色器的结构设计方案和机械精度满足技术要求。     

Light flux density threshold at which protein denaturation is induced by synchrotron radiation circular dichroism beamlines

New high‐flux synchrotron radiation circular dichroism (SRCD) beamlines are providing important information for structural biology, but can potentially cause denaturation of the protein samples under investigation. This effect has been studied at the new CD1 dedicated SRCD beamline at ISA in Denmark, where radiation‐induced thermal damage effects were observed, depending not only on the radiation flux but also on the focal spot size of the light. Comparisons with similar studies at other SRCD facilities worldwide has lead to the estimation of a flux density threshold under which SRCD beamlines should be operated when samples are to be exposed to low‐wavelength vacuum ultraviolet radiation for extended periods of time.     

Fabrication of a 256-bits organic memory by soft x-ray lithography

This paper reports a procedure of soft x-ray lithography for the fabrication of organic crossbar structure. Electron beam lithography is employed to fabricate the mask for soft x-ray lithography, with direct writing technology to lithograph positive resist, polymethyl methacrylate on the polyimide film. Then Au is electroplated on the polyimide film. Hard contact mode exposure is used in x-ray lithography to transfer the graph from the mask to the wafer. The 256-bits organic memory is achieved with the critical dimension of 250~nm.     

应用于ICF实验的软X射线平面镜反射率

在北京同步辐射装置上,通过对应用于惯性约束聚变（ICF）实验的平面镜反射率的进一步研究,提高了辐射温度的测量精度。进行了对软X射线平面镜反射率的测量、反射镜的清洗、反射率的模拟计算,证明影响反射率变化的主要因素是平面镜的安装角度和沾污。实验结果表明:平面镜的沾污主要来源于ICF实验中的油沾污,采用射频辉光放电清洗非常有效。     

Kirkpatrick–Baez mirrors to focus hard X‐rays in two dimensions as fabricated,tested and installed at the Advanced Photon Source

The micro‐focusing performance for hard X‐rays of a fixed‐geometry elliptical Kirkpatrick–Baez (K–B) mirrors assembly fabricated, tested and finally implemented at the micro‐probe beamline 8‐BM of the Advanced Photon Source is reported. Testing of the K–B mirror system was performed at the optics and detector test beamline 1‐BM. K–B mirrors of length 80 mm and 60 mm were fabricated by profile coating with Pt metal to produce focal lengths of 250 mm and 155 mm for 3 mrad incident angle. For the critical angle of Pt, a broad bandwidth of energies up to 20 keV applies. The classical K–B sequential mirror geometry was used, and mirrors were mounted on micro‐translation stages. The beam intensity profiles were measured by differentiating the curves of intensity data measured using a wire‐scanning method. A beam size of 1.3 µm (V) and 1.2 µm (H) was measured with monochromatic X‐rays of 18 keV at 1‐BM. After installation at 8‐BM the measured focus met the design requirements. In this paper the fabrication and metrology of the K–B mirrors are reported, as well as the focusing performances of the full mirrors‐plus‐mount set‐up at both beamlines.     

Performance of a polarizer using synthetic mica crystal in the 12-25 nm wavelength range

To develop polarizer functioning in the extreme ultraviolet (EUV) and soft X-ray region, the polar- ization performance of synthetic mica has been investigated theoretically with a simulation code using Fresnel equations and optical constants from the Henke database. The reflectance of synthetic mica crystal for s and p polarization was measured to investigate its polarization performance in a home-made synchrotron radiation soft X-ray polarimeter at beamline 3W1B, Beijing Synchrotron Radiation Facility (BSRF). The reflectivity of the synthetic mica crystal at an angle of grazing incidence of 48° was obtained from the experimental data, which is about 4.8x10<'-3> at 25 nm and 6.0×10<'-4> at 12 nm, and the linear polarizance of the X-ray reflected by the synthetic mica crystal that we measured using an analyzer-rotating method increases from 80% to 96.6% in this EUV region, while higher than 98.2% in the simulation. The result indicates that this synthetic mica crystal works as a practical polarizer in this EUV region of 12-25 nm, and also in an extensive wavelength region higher than 25 nm.     

同步辐射中双压电片反射镜的研究现状

反射镜是同步辐射光束线中应用广泛的光学元件之一,双压电片反射镜由于具有结构简单、面形能动以及自适应可调等优点,逐渐引起同步辐射界的重视.本文综述了同步辐射中双压电片反射镜的研究现状.主要讨论了双压电片反射镜的工作原理和研究概况,包括在几个大型同步辐射装置中的结构特点、制备技术及面形校正结果等;简要介绍了双压电片反射镜面形校正时所采用的反射波前探测技术和反馈控制算法;最后总结了其发展中存在的关键问题,并展望了其未来的发展方向.     

Focusing high-energy x-rays by a PMMA compound x-ray lens on Beijing synchrotron radiation facility

The x-ray compound lens is a novel refractive x-ray optical device. This paper reports the authors' recent research on a polymethyl methacrylate (PMMA) compound x-ray lens. Firstly the designing and LIGA fabrication process for the PMMA compound x-ray lens are briefly described. Then, a method for theoretical analysis, as well as the experimental system for measurement is also introduced. Finally, the focusing spots for 8keV monochromatic x-rays by the PMMA compound x-ray lens are measured and analysed. According to the experimental results, it is concluded that the PMMA compound x-ray lens promises a good focusing performance under the high-energy x-rays.     

Characterization of the N-polar GaN film grown on C-plane sapphire and misoriented C-plane sapphire substrates by MOCVD

Gallium nitride (GaN) thin film of the nitrogen polarity (N-polar) was grown on C-plane sapphire and misoriented C-plane sapphire substrates respectively by metal-organic chemical vapor deposition (MOCVD). The misorientation angle is off-axis from C-plane toward M-plane of the substrates, and the angle is 2° and 4° respectively. The nitrogen polarity was confirmed by examining the images of the scanning electron microscope before and after the wet etching in potassium hydroxide (KOH) solution. The morphology was studied by the optical microscope and atomic force microscope. The crystalline quality was characterized by the x-ray diffraction. The lateral coherence length, the tilt angle, the vertical coherence length, and the vertical lattice-strain were acquired using the pseudo-Voigt function to fit the x-ray diffraction curves and then calculating with four empirical formulae. The lateral coherence length increases with the misorientation angle, because higher step density and shorter distance between adjacent steps can lead to larger lateral coherence length. The tilt angle increases with the misorientation angle, which means that the misoriented substrate can degrade the identity of crystal orientation of the N-polar GaN film. The vertical lattice-strain decreases with the misorientation angle. The vertical coherence length does not change a lot as the misorientation angle increases and this value of all samples is close to the nominal thickness of the N-polar GaN layer. This study helps to understand the influence of the misorientation angle of misoriented C-plane sapphire on the morphology, the crystalline quality, and the microstructure of N-polar GaN films.     

微束斑X射线源及X射线光学元件

高质量的X射线源,尤其高亮度的微纳束斑X射线源是现代X射线光学高清晰成像最为关键的部件之一,在工业无损探伤、生命科学、材料科学等科学研究和实际应用中具有重要的意义。简单介绍了微束斑X射线源的产生方法及发展历史,并对微束X射线光学涉及到的聚焦X射线光学元件（如X射线掠入射反射镜、布拉格法反射镜、多层膜反射镜、多层膜光栅、X射线波带片、毛细管聚焦透镜和复合折射透镜等）的主要特点作了简要的系统介绍。最后展望了微细束X射线在微纳检测与分析等方面的应用前景。     

固定角度平面镜标定方法与不确定度分析

在北京同步辐射装置新建4B7B束线没有安装反射率计,且用户空间有限的情况下,利用X光基准点还原的方法建立了一种Dante谱仪固定角度平面镜反射率标定方法。利用三光束瞄准方法完成了束线软X光基准重建,通过准直方法实现了平面镜与X光之间的高定角精度,并采取了相应的角度姿态监测,最终在实验中得到的平面镜标定角不确定度为1.0 mrad。基于固定角度平面镜多次安装和朝各个方向转动后的标定结果,获得了高精度的反射率曲线。     

北京同步辐射装置3B1B生物光谱实验站

本文介绍北京同步辐射装置（ＢＳＲＦ）３Ｂ１Ｂ光束线、生物光谱实验站和圆二色谱仪的基本情况。报道北京正负电子对撞机（ＢＥＰＣ）同步辐射专用光期间，我们在站测量了１１种手征性生物和药物样品的圆二色（ＣＤ）谱，首次在国内利用同步辐射光获取了Ｄ－苯丙氨酸等样品的ＣＤ谱和Ｄ－及Ｌ－亮氨酸对称的ＣＤ曲线。     

Performance of a polarizer using synthetic mica crystal in the 12–25 nm wavelength range

To develop polarizer functioning in the extreme ultraviolet (EUV) and soft X-ray region, the polarization performance of synthetic mica has been investigated theoretically with a simulation code using Fresnel equations and optical constants from the Henke database. The reflectance of synthetic mica crystal for s and p polarization was measured to investigate its polarization performance in a home-made synchrotron radiation soft X-ray polarimeter at beamline 3W1B, Beijing Synchrotron Radiation Facility (BSRF...     

北京同步辐射装置3B3光束线传输效率及输出特性的计算

从北京正负电子对撞机储存环弯转磁铁光源的辐射特性入手, 分析了BSRF-3B3光源及其光束线光学系统的输出特性, 分别给出各光学元件的传输效率和采用不同单色器晶体在样品处的计算结果. 为光束线设计、调试及诊断提供了理论依据. 同时也为弯转磁铁光源光束线的输出特性的计算, 提供了一个模式.     

A new beamline for infrared microscopy in the SR center of Ritsumeikan University

A new beamline for an infrared (IR) microspectroscopy is under construction in the SR center of Ritsumeikan University. We designed an optical system which collects synchrotron radiation (SR) photons by installing one toroidal mirror and two plane mirrors in the storage ring chamber. As a result, the acceptance angle can be widened up to 250 mrad in horizontal and 63 mrad in vertical. Our aim is to develop an IR microspectroscopy beamline with spatial resolution of the order of sub micron from mid-IR to far-IR. In this paper, we present a designed optical system of IR microspectroscopy and the results of ray-tracing.