非掺杂ZnO薄膜中紫外与绿色发光中心

用直流反应溅射方法在硅衬底上淀积了ZnO薄膜,测量它们的光致发光(PL)光谱,观察到两个发光峰,峰值能量分别为3.18(紫外峰,UV)和2.38eV(绿峰).样品用不同温度分别在氧气、氮气和空气中热处理后,测量了PL光谱中绿峰和紫外峰强度随热处理温度和气氛的变化,同时比较了用FP-LMT方法计算的ZnO中几种本征缺陷的能级位置.根据实验和能级计算的结果,推测出ZnO薄膜中的紫外峰与ZnO带边激子跃迁有关,而绿色发光主要来源于导带底到氧错位缺陷(O_Zn)能级的跃迁,而不是通常认为的氧空 关键词： ZnO薄膜 热处理 光致发光光谱 缺陷能级     

ZnO薄膜近带边紫外发光的研究

用ZnO陶瓷靶,采用脉冲激光沉积(PLD)技术在c-Al₂O₃衬底上制备了ZnO薄膜。通过不同温度下光致发光(PL)光谱的测量,对样品的紫外发光机理进行研究。 在较低温度(10 K)下的PL光谱中,观测到一个位于3.354 eV处的束缚激子(D⁰X)发射,随着温度的升高(~50 K),在D⁰X的高能侧观测到了自由激子的发射峰。在10 K温度下,3.309 eV处出现了一个较强的发光带A,此发光带强度随着温度升高先增大然后减小,并且一直延续到室温。重点讨论了此发光带的起源,并认为A带可归属于自由电子-受主之间的复合发射。     

氧化锌/硅纳米孔柱阵列的结构和光致发光特性研究

以硅纳米孔柱阵列(Si-NPA)为衬底、用化学气相沉积法制备了具有规则阵列结构特征的ZnO/Si-NPA纳米复合体系，并对其结构和光致发光性质进行了表征. 实验结果显示，组成ZnO/Si-NPA表面阵列的每个柱子均呈现层壳结构. 不同于衬底Si-NPA的红光和蓝光发射，ZnO/Si-NPA在紫外光区和蓝绿光区呈现出两个强的宽发光峰. 分析表明，紫外光发射应归因于ZnO晶体的带边激子跃迁；而蓝绿光发射则来自于ZnO晶体本征缺陷所形成的两类深能级复合中心上载流子的辐射跃迁.     

K_2ZnSiO_4∶Eu~(3+)红色荧光粉的制备及发光性能

采用高温固相法合成了适合近紫外光、蓝光激发的K2ZnSiO4∶Eu3+红色荧光粉,研究了该荧光粉的发光特性。XRD结果显示,所合成的荧光粉主晶相为K2ZnSiO4。样品的激发光谱由O2-→Eu3+电荷迁移带(200~350nm)和Eu3+离子的特征激发峰(350~500nm)组成,最强峰位于396nm,次强峰位于466nm。在396nm和466nm激发下,样品均呈多峰发射,分别由Eu3+离子的5D0→7FJ(J=0,1,2,3,4)能级跃迁产生,其中619nm处峰值最大。增加Eu3+离子的掺杂浓度,荧光粉的发光逐渐增强。在实验测定的浓度范围内,未出现浓度猝灭现象。不同Eu3+浓度样品的色坐标均位于色品图红光区,非常接近NTSC标准。     

微纳跨尺度ZnO结构的紫外发射机理研究

利用气相输运的方法在Si(100)衬底上生长了ZnO的微纳跨尺度结构.扫描电镜照片可以明显地看到样品表面为椎顶六角微米柱-纳米棒的复合结构.样品在室温下的光致发光谱出现了很强的紫外发射峰,没有观察到与杂质或缺陷相关的深能级发射,表明样品有很好的光学质量.通过详细的研究样品的紫外发射谱与温度(83—307K)的依赖关系,发现在室温下样品的近带边发射包含两个部分,分别与自由激子发射和自由载流子到施主(受主)的跃迁(FB跃迁)相关,这个施主(受主)束缚态的离化能为124.6meV. 关键词： ZnO微纳跨尺度结构 光致发光谱 自由载流子到施主(受主)的跃迁 自由激子发射     

水热合成ZnO:Cd纳米棒的微结构及光致发光特性

采用水热法制备了ZnO和不同掺杂浓度的ZnO:Cd纳米棒,通过SEM,XRD、拉曼光谱等的分析,研究了ZnO和ZnO:Cd的微结构并测试分析了其光致发光特性.结果表明,ZnO和ZnO:Cd纳米棒呈六角纤锌矿结构,Cd掺杂使得纳米棒体积更小.由于内部张应力的影响,Cd掺杂使得材料光学带隙减少.当掺杂浓度为2%时,合成的材料光致发光谱中出现了位于2.67 eV处,由导带底和Zn空位(VZn)缺陷能级跃迁造成的蓝光发射峰,并且Cd的掺入使得位于2.90 eV附近的紫光发射峰强度增强,对于研究ZnO蓝紫发光器件具有重要的意义.     

Fe掺杂对CdS光学特性的影响

采用低压金属有机化学气相沉积技术,在固定源流量的条件下,通过调节衬底温度(270~360℃)生长了不同Fe掺杂浓度的CdS薄膜。光谱测量表明低铁掺杂对CdS晶格振动的影响较小,但对光致发光性质影响较为明显。样品的光致发光谱包括两部分:2.5eV附近带-带跃迁的发光以及2.0~2.4eV之间与缺陷相关的发光。随着铁含量的增加,带-带跃迁逐渐被抑制,发光光谱被缺陷相关的发光主导,同时薄膜的电导也由n型转为p型,说明Fe离子掺入在薄膜引入了受主杂质。通过不同激发密度下的光致发光光谱测量,我们将2.0~2.4eV的发光归结为铁受主相关的D-A对发射,并根据掺杂浓度和发光峰位置估算了Fe受主的能级位置。     

KBr:Na中的自俘激子发光

我们知道,如果用紫外线或X光照射激发含有少量外来碱金属离子的碱金属卤素晶体,则要另外产生(表征杂质离子的)发光。KBr晶体中添加的Na~ ,在紫外线的激发下,除了产生4.4eV(σ)及2.3eV(π)的本征发射带外,还在2.9eV附近产生一个强的发射带。这个发射保持到～100°K,在图1中画出了在10°K观测到的这个发射带。     

金属有机化学气相沉积生长Zn1-xMnxSe薄膜的发光和磁光性质

利用金属有机化学气相沉积(MOCVD)方法在GaAs衬底上生长了不同组分的Zn_1-xMn_xSe薄膜。X射线衍射和X射线摇摆曲线证明样品具有较好的结晶质量。在低温、强磁场下对样品的发光进行了研究,在带边附近观察到两个发光峰的相对强度随着磁场增强发生了变化。通过变温光谱探讨了这两个发光峰的来源,并被分别归因于自由激子跃迁和与Mn有关的束缚态激子跃迁。同时随着磁场的增强,ZnMnSe带隙发光红移是由于类S带和类P带电子与Mn离子的3d⁵电子的自旋交换作用。     

退火对多晶ZnO薄膜结构与发光特性的影响

用射频反应溅射法在Si（111）衬底上制备了C轴取向的多晶ZnO薄膜，通过不同温度的退火处理，研究了退火对多晶ZnO薄膜结构和发光特性的影响.由x射线衍射得知，随退火温度的升高，晶粒逐渐变大，薄膜中压应力由大变小至出现张应力.光致发光测量发现，样品在430nm附近有一光致发光峰, 峰的强度随退火温度升高而减弱，联合样品电阻率随退火温度升高而逐渐变大的测量及能级图，推测出ZnO薄膜中的蓝光发射主要来源于锌填隙原子缺陷能级与价带顶能级间的跃迁. 关键词： ZnO薄膜 退火 光致发光 射频反应溅射     

Luminescence of irradiated β-SiC

The influence of electron irradiation with energy of 3.5 MeV on the luminescence of cubic Silicon Carbide β-Sic) was investigated. It was shown that irradiation results in the diminution of edge emission and appearance of the red band (2.0–1.3 eV). Obtained results give an opportunity to consider the red band as transitions from excited states. The data on temperature stability of irradiated damage is given. The probable nature of irradiated defects are discussed.     

Luminescence of a ZnO:Ga crystal upon excitation in vacuum UV region

The spectral-kinetic characteristics of a ZnO:Ga single crystal upon excitation in the vacuum UV region have been studied. At a temperature of 8 K, the exciton luminescence line peaking at 3.356 eV has an extremely small half-width (7.2 meV) and a short decay time (360 ps). In the visible range, a wide luminescence band peaking at ～2.1 eV with a long luminescence time at 8 K and a decay time in the nanosecond range at 300 K is observed. The luminescence excitation spectra of ZnO:Ga have been measured in the range of 4–12.5 eV.     

Interplay of native defect-related photoluminescence response of ZnO nanosticks subjected to 80 keV Ar ion irradiation

We report on the effect of 80 keV Ar⁺ ion irradiation on the luminescence response of zinc oxide (ZnO) nanosticks synthesized using a simple microemulsion route. The formation of nanoscale rods was confirmed from the transmission electron microscopy, whereas the hexagonal wurtzite phase of the nanorods was detected in an X-ray diffraction pattern. The photoluminescence pattern of the nanorods was dominated by various native defect states of ZnO, which are responsible for the quenching of the typical band edge emission of ZnO. Under Ar⁺ ion irradiation at a fluence of 1×10¹³ ions/cm², the band edge emission was recovered owing to the suppression of oxygen vacancy defects. In addition, the formation of new zinc vacancy and ionized zinc interstitial defects were also evident. Conversely, the band edge emission was found to be quenched as a result of the creation of more oxygen vacancy (V_O) defects due to ion irradiation (fluence: 1×10¹⁵ ions/cm²). The nuclear energy loss of the Ar⁺ ions in ZnO is responsible for the formation of point (vacancy-related) defects, while relatively small amount of electronic energy loss of the Ar⁺ ion results in the ionization of the neutral zinc interstitial (Zn_i) defects. The energy deposition scheme of the energetic ions has been elaborated with the help of theoretical modeling that explains the observed features quite satisfactorily.     

Luminescence of different modifications of crystalline silicon dioxide: Stishovite and coesite

Luminescence of very small samples of single crystals of coesite and stishovite has been studied. The spectra were detected under ionizing radiation (X-ray and electron beam) and the decay kinetics of cathodoluminescence in the range of time from 10 ns to 3 ms was measured. The coesite luminescence possesses a broad band at 3 eV with exponential decay about 680 μs at 80 K. The nature of this luminescence was explained as a self-trapped exciton creation in tetrahedron framework. The stishovite luminescence possesses two bands—blue (2.8 eV) and UV (4.7 eV). The UV band intensity grows more than 20 times with irradiation dose from initial level. This shows that the corresponding luminescence centers could be induced by the radiation. The decay of the UV band possesses a fast and a slow component. The determination of the fast decay parameters is beyond the capabilities of our apparatus (less than 10 ns), whereas the slow decay of the UV is non-exponential and takes place in the range of hundreds of microsecond. The blue band decay kinetics can be well approximated by power law ∼t⁻², which may correspond to recombination of defects created by radiation. The stishovite single crystal luminescence is very similar to that of germanium dioxide single crystal of rutile structure. The nature of the stishovite luminescence is explained as recombination of defects created by irradiation in octahedron-structured lattice.     

Cathodoluminescence study of extended defects in hydrothermal ZnO crystals

Understanding the luminescence of ZnO is very important for some applications. In spite of the many studies carried out, there are still some points concerning the origin of some of the luminescence emissions in ZnO crystals that require additional study; in particular, the role of extended defects remains to be a matter of controversy. We present here a cathodoluminescence analysis of the defects generated by Vickers indentation in hydrothermal HTT crystals. Special emphasis was paid to the luminescence band peaking around 3.3 eV. The origin of this band is a matter of controversy, since it has been related to different causes, extended defects being one of the candidates for this emission. The CL images were acquired around crystal defects. It is observed that the 3.3 eV emission is enhanced around the crystal defects; though it is also observed, but weaker, out of the defect regions, which suggests that there exist two luminescence emissions peaking very close to 3.3 eV. The two emissions, one related to structural defects and the other to the LO phonon replica of the free excitonic band, appear very close each other and their relative intensity should determine the shape of the spectrum.     

Photoinduced Effects in the ZnO Luminescence Spectra

The effect of intense UV irradiation on the photoluminescence (PL) spectra of ZnO powders and nanocrystalline films obtained by atomic layer deposition (ALD) was investigated. At room temperature, the behavior of the spectra under continuous UV irradiation in multiple vacuum-atmosphere cycles was studied. The changes in the intensities of exciton radiation and radiation in the “green” band region, associated with the phenomena of oxygen photodesorption and photoadsorption, are discussed. In the temperature range of 5–300 K, the effect of strong UV irradiation on the near-edge luminescence spectrum of ZnO films was studied. The nature of a new line arising in the photoluminescence spectra of an irradiated film in the region of emission of bound excitons is discussed.

     

Ultraviolet Luminescence Depending on Zn Interstitial in ZnO Polycrystalline Films

The ultraviolet emission line at 3.315eV is observed at 8K in ZnO polycrystalline films and investigated by temperature-dependent photolumineseence spectra and cathodoluminescence spatial image. The relative intensity of 3.315 eV emission line depends strongly on growth and annealing conditions. The cathodoluminescence image shows that the 3.315 eV emission localizes on the surface and ridge of ZnO grain. These results suggest that the 3.315 eV emission attributes to Zn interstitials at the grain surface and ridge. This emission is stable in the range from 8 K to 300 K and contributes to the room temperature ultraviolet band.     

PbWO4闪烁晶体的发光动力学模型

在对PbWO₄闪烁晶体的光谱特性、发光衰减及其温度依赖以及热释光的研究基础上,并结合理论计算,提出了PbWO₄晶体发光的动力学模型,给出了PbWO₄晶体的基本能带结构及激子发光中心能态、陷阱能级在能隙中的位置。用此模型可以完整说明PbWO₄的发光过程,特别是导致室温下发光效率低的原因。最后还对其主发射成分蓝、绿发光中心的起源作了简要讨论。     

Luminescence and defect creation in LiF and LiF-Na

The topic is the radiative and nonradiative decay of electronic excitations with the creation of radiation defects in LiF. A luminescence band with a peak at 3.45 eV is observed in the x-ray luminescence spectrum at 4.2 K; it may be assigned to the luminescence of a self-localized exciton. In LiF-Na, additional luminescence bands with peaks at 2.0 and 2.4 eV are observed; these may be attributed to the luminescence of electron excitations localized around the Na' ion. The formation of Frenkel defects at 4.2 K in LiF and LiF-Na is discussed.Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 12, pp. 28–32, December, 1994.     

氢化后ZnO发光性质的变化

通过低温光致发光(PL)谱研究氢化对ZnO发光性质的影响。氢通过一个直流等离子体发生装置引入到ZnO晶体。研究发现氢的引入影响了束缚激子的相对发光强度,特别是I4峰(3.363eV)的强度增加和3.366eV峰出现。比较未氢化样品,氢化样品PL谱显示不同的温度依赖。