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电阻应变片灵敏度的测量 总被引:1,自引:0,他引:1
阐明将“电阻应变片灵敏度的测量”引入大学物理实验的意义,叙述该实验的原理、注意事项,同时给出参考数据. 相似文献
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分体插接式光纤光栅应变片设计与实现 总被引:1,自引:0,他引:1
提出一种适合作为二次变换元件使用的通用型应变传感预制结构——光纤光栅应变片.它以裸Bragg光栅为研究对象,采用分体式设计方法把敏感光栅与连接光纤分别封装于独立的基体中,并通过两个基体相互之间的插入实现了Bragg光栅与测量光路的机械连接.理论分析和实验研究表明:光纤光栅应变片具有与Bragg光栅相同的反射谱,其测量线性度好,灵敏度高,温度误差则随被测试件性质不同而变化,当试件材料与基底材料一致时,温度误差可以忽略. 相似文献
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Microstructure and strain films using in-plane grazing analysis of GaN epitaxial incidence x-ray diffraction 下载免费PDF全文
This paper investigates the major structural parameters, such as crystal quality and strain state of (001)-oriented GaN thin films grown on sapphire substrates by metalorganic chemical vapour deposition, using an in-plane grazing incidence x-ray diffraction technique. The results are analysed and compared with a complementary out-of-plane x- ray diffraction technique. The twist of the GaN mosaic structure is determined through the direct grazing incidence t of (100) reflection which agrees well with the result obtained by extrapolation method. The method for directly determining the in-plane lattice parameters of the GaN layers is also presented. Combined with the biaxial strain model, it derives the lattice parameters corresponding to fully relaxed GaN films. The GaN epilayers show an increasing residual compressive stress with increasing layer thickness when the two dimensional growth stage is established, reaching to a maximum level of-0.89 GPa. 相似文献
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