GeV能量的Fe离子在C60薄膜中的辐照效应研究

利用傅立叶转换红外光谱和Raman谱仪分析了0.98 GeV的Fe离子在电子能损Se为3.5 keV/nm时， 不同辐照剂量（5×1010 —8×1013 ions/cm2)下， 在C60薄膜中引起的辐照损伤效应。 分析表明， Fe离子辐照引起了C60分子的聚合与损伤。 在辐照剂量达到一中间值1×1012 ions/cm2， C60分子的损伤得到部分恢复， 归因于电子激发引起的退火效应。 通过对Raman数据的拟合分析， 演绎出Fe离子辐照在C60材料中形成的潜径迹截面或引起损伤的截面约为1.32×10-14 cm2。     

高温注氦及随后230MeV的208Pb27+辐照Al2O3的光致发光谱的研究

主要研究了110keV的He⁺高温注入Al₂O₃单晶及1.1MeV/u的²⁰⁸Pb²⁷⁺辐照注氦Al₂O₃样品的光致发光的特性. 从测试结果可以清楚地看到在375nm, 413nm和450nm处出现了强烈的发光峰. 并且在600K, 5×10sup>16ions/cm²剂量点, 样品的发光峰是最强的. 这 表明He⁺注入Al₂O₃后使带隙中深的辐射中心复合的效率大幅度提高, 极大的增强了其发光强度,而且发光伴随着蓝移现象. 而经过高能²⁰⁸Pb²⁷⁺辐照后的样品, 在390nm出现了新的发光峰,从FTIR谱中我们能够看到, 可能是²⁰⁸Pb²⁷⁺辐照相对沉积膜出现一定的晶化, 其中含有许多纳米尺寸的Al₂O₃晶粒所致.     

退火对Pb辐照Al2O3单晶发光特性的影响

研究了230MeV的²⁰⁸Pb²⁷⁺辐照Al₂O₃样品及随后在600,900,1100K高温条件下退火后的光致发光特性。从辐照样品的测试结果可以清楚地看到在波长为390,450nm处出现了强的发光峰。辐照量为1×10¹³ions/cm²时,样品的发光峰最强。经过600K退火2h后测试结果显示,380nm发光峰剧烈增强,而其他发光峰显示不明显。在900K退火条件下,380nm的发光峰开始减弱,而在360,510nm出现了明显的发光峰,至到1100K退火完毕后380nm的发光峰完全消失,而360,510nm的发光峰相对增强。从被辐照样品的FTIR谱中看到,波数在460~510cm^-1间的吸收是振动模式,经过离子辐照后,吸收带展宽,随着辐照量的增大,Al₂O₃振动吸收峰消失,说明Al₂O₃振动模式被完全破坏。1000~1300cm^-1之间为Al—O—Al桥氧的伸缩振动模式,辐照后吸收带向高波数方向移动,说明其振动模式受到影响。辐照剂量较小的样品,损伤程度相对较低,经退火晶化后,振动模式基本恢复到单晶状态;辐照剂量较高的样品,损伤程度大,退火处理后表面变得较粗糙,振动模式并未出现,说明结构破坏严重。     

Aligned Elongation of Ag Nanoparticles Embedded in Silica Irradiated with High Energy Ni Ions

Metallic nanoparticle(NP) shapes have a significant influence on the property of composite embedded with metallic NPs. Swift heavy ion irradiation is an effective way to modify shapes of metallic NPs embedded in an amorphous matrix. We investigate the shape deformation of AgNPs with irradiation fluence, and 357 MeV Ni ions are used to irradiate the silica containing AgNPs, which are prepared by ion implantation and vacuum annealing. The UV-vis results show that the surface plasmon resonance(SPR) peak from AgNPs shifts from 400 to 377 nm. The SPR peak has a significant shift at fluence lower than 1 × 10~(14) ions/cm2 and shows less shift at fluence higher than 1 × 10~(14) ions/cm~2. The TEM results reveal that the shapes of AgNPs also show significant deformation at fluence lower than 1 × 10~(14) ions/cm~2 and show less deformation at fluence higher than1 × 10~(14) ions/cm~2. The blue shift of the SPR peak is considered to be the consequence of defect production and AgNP shape deformation. Based on the thermal spike model calculation, the temperature of the silica surrounding Ag particles first increases rapidly, then the region of AgNPs close to the interface of Ag/silica is gradually heated. Therefore, the driven force of AgNPs deformation is considered as the volume expansion of the first heated silica layer surrounding AgNPs.     

铅离子辐照注碳4H—SiC的红外光谱特性研究

主要研究了铅离子辐照注碳4H—SiC样品在3个不同退火温度下傅立叶变换红外光谱的变化。从红外谱的变化可以知道铅辐照注碳4H-SiC样品在一定深度内出现了非晶层,波数在960—1450cm^-1范围内出现了干涉带,干涉带强度随着退火温度的升高而 变弱。1373K退火后样品的卢瑟福背散射分析结果显示,一定深度内硅原子的背散射产额明显减少。4H-SiC specimens were implanted with C-ions and then irradiated with Pb-ions, and subsequently annealed at three different temperatures. The samples were investigated by using Fourier transformation infrared spectrum（FTIR） and Rutherford backward scattering（RBS）. The obtained FTIR spectra showed that there is a buried amorphous layer close to the ion-incident surface and there are several interference fringes in the range from 960 to 1 450 cm ^-1. The intensity of fringes decreases with the increase of annealing temperature. The obtained RBS spectra showed that the yield of Si atoms in 4H-SiC crystal decreases in a well-defined depth region after annealing at 1 373 K.     

高能Xe离子辐照引起的注碳a:SiO2中新结构的形成

先用120keV的碳离子注入非晶二氧化硅a:SiO2薄膜，再用能量为1754MeV的Xe离子辐照。注碳量为5．0×10^16—8．6×10^17ion／cm^2，Xe离子辐照剂量为1．0×10^11和5．0×10^11ion／cm^2。辐照后的样品中形成的新结构用显微傅立叶变换红外光谱仪进行测试分析。结果表明，Xe离子辐照引起了注碳a:SiO2中Si—C，C—C，Si—O—C键以及CO和CO2分子的形成与演化。在注碳量较高时，Xe离子辐照在样品中产生了大量的Si—C键。与注入未辐照和辐照的低注碳量样品比较，增强的Si—C键的形成，预示着辐照可引起注碳a:SiO2样品中的SiC结构相变。Amorphous silicon-dioxide （a:SiO2） films were firstly implanted at room temperature （RT） with 120 keV C-ions to doses ranging from 5.0 × 10^16 to 8.6 × 10^17 ion/cm^2, and then the C-doped a:SiO2 films were irradiated at RT with 1 754 MeV Xe ions to 1.0 × 10^11 and 5.0 × 10^11 ion/cm^2, respectively. The information of new tex- ture formation in the C-doped SiO2 films after high-energy Xe ion irradiation was investigated using micro-FTIR measurements. The obtained results showed that Si--C, C--C, Si--O--C bonds as well as CO and CO2 molecules were formed in the C-doped a-SiO2 films after Xe ion irradiation. Furthermore, Xe-ion irradiation induced a plenteous formation of Si--C bonds in the high dose C-ion implanted a:SiO2 films. Compared with the C-implanted sampies without Xe-ion irradiation and the low dose C-implanted samples with Xe-ion irraddiation, the enhanced and plenty of Si--C bond formation implied that the phase of SiC structures may be produced by Xe-ion irradiation in the high dose C-ion implanted a:SiO2 films.     

退火对He注入及随后208Pb27+辐照的Al2O3单晶PL谱的影响

利用高能离子研究了110 keV 的He⁺注入Al₂O₃单晶及随后230 MeV的²⁰⁸Pb²⁷⁺辐照并在不同温度条件下退火样品的光致发光的特性. 从测试结果可以清楚地看到在375 nm，390 nm，413 nm 和450 nm 出现了强烈的发光峰. 经过600 K退火2 h后测试结果显示，390 nm发光峰增强剧烈，而别的发光峰显示不明显. 在900 K退火条件下，390 nm的发光峰开始减弱相反在510 nm出现了较强的发光峰，到1100 K退火完毕后390 nm的发光峰完全消失，而510 nm的发光峰相对增强. 从辐照样品的FTIR谱中看到，波数在460—510 cm^-1间的吸收是振动模式，经过离子辐照后，吸收带展宽，随着辐照量的增大，Al₂O₃振动吸收峰消失，说明Al₂O₃振动模式被完全破坏. 1000—1300 cm^-1之间为Al-O-Al桥氧的伸缩振动模式，辐照后吸收带向高波数方向移动. 退火后的FTIR谱变化不大.     

高能Pb离子辐照注碳SiO2的红外谱研究

室温下，先用120keV的C离子注入二氧化硅薄膜样品至剂量2.0×1017、5.0×1017或8.6×1017ions/cm2，再用950MeV的Pb离子分别辐照至剂量5.0×1011、1.0×1012或3.8×1012 ions/cm2，然后测量样品的傅里叶变换红外(FTIR)光谱. 通过分析测量得到的傅里叶变换红外谱，发现Pb离子辐照在注碳SiO₂样品中可引起大量的Si－C和Si (C)－O－C等化学键的形成，大剂量Pb离子辐照可在大剂量注碳的SiO₂中产生分子CO₂. 大量的Si－C键的存在和分子CO₂的形成，预示着高能Pb离子辐照在注碳SiO₂样品中有可能形成了纳米Si团簇和/或SiC晶粒.     

重离子辐照SiO2通过能量损失产生发光色心的研究

通过红外光谱和荧光发射光谱分别对600 keV、4 MeV和5 MeV Kr离子辐照的SiO2进行发光特性的研究。在低能量辐照体系中,简单色心(F2色心)的形成在损伤过程中占据主导地位,其主要诱发蓝光发射带;在高能离子辐照条件下,离子径迹上的能量密度较大,因此缺陷浓度的增大产生了一些缺陷团簇和离子径迹,形成了复杂的色心(F2+和F3+色心等)并诱发了强烈的绿光发射带和红光发射带。该实验结果与能量损失过程中统一热峰理论模型(一个综合的基于电子能损与核能损的非弹性碰撞模型和弹性碰撞模型)的模拟结果能够很好地吻合,表明在keV～MeV能区上存在电子能损过程与核能损过程的协同效应。     

载能离子辐照的ODS铁素体钢硬化效应的研究

研究了氧化物弥散强化(ODS) 的3 种铁素体钢,包括: 19Cr-3.5Al ODS钢(MA956),16Cr-0.1TiODS和16Cr-0.1Zr ODS铁素体钢,在多能量的氦离子和MeV能量级的Bi、Xe 离子辐照条件下的硬化效应。获得了辐照硬化与原子离位损伤水平(dpa)、He 注入浓度的关系。结果表明,材料的硬度在低剂量范围会随着辐照剂量迅速增加,而在高剂量范围材料的硬度逐渐趋于饱和,可以用1/2 次的幂函数拟合辐照硬化与离位损伤水平之间的关系。不同入射离子——Bi离子和Xe离子都会引起ODS 钢的硬化,而氦离子还会在材料中聚集导致氦泡的形成,造成更加明显的硬化。实验证明,Ti 或Zr 掺杂的16Cr-ODS 铁素体钢较19Cr-3.5AlODS钢具有更强的抗辐照硬化能力,原因可归于其含有更高数密度的细小氧化物粒子——能够有效俘获点缺陷和氦原子,从而有效抑制晶粒内部和晶界出缺陷的长大。The present work investigates the irradiation hardening of ODS ferritic steels after multi-energy Heion implantation, or energetic Bi-ion and Xe-ion irradiation, to get an understanding of dependence of irradiationhardening on atomic displacement damage and gas accumulation. Three kinds of high-Cr ODS ferritic steels including the commercial MA956 (19Cr-3.5Al), the 16Cr-0.1Ti and the 16Cr-0.1Zr ODS ferritic steels were used.The results show that the hardness increases rapidly at the lower doses but tends to saturate at the higher dose.An 1/2-power law dependence on dpa value is obtained. Helium implantation contributes significantly to the irradiation hardening, possibly due to the impediment of the motion dislocations by helium bubbles. 16Cr-ODS (Ti or Zr added) ferritic which contains finer oxide particles in higher number density shows higher resistance to irradiation hardening than the MA056.