Influence of Growth Temperature and Trimethylindium Flow of InGaN Wells on Optical Properties of InGaN Multiple Quantum-Well Violet Light-Emitting Diodes

An InGaN multiple-quantum-well (MQW) violet-light-emitting diode (LED) is grown by low-pressure metalorganic chemical vapour deposition. It is found that photoluminescence wavelength of the InGaN MQW violet LED is lengthened with increasing growth temperature and with the increasing trimethylindium flow of the InGaN wells. The electroluminescence peak wavelength of the violet LED are about 401 nm with full width at half maximum of 14nm, and the output power in injection current of 2OmA at room temperature is 4.1mW.     

用X射线衍射法测定氮化镓马赛克结构中的面内扭转角

Ⅲ-Ⅴ族氮化物半导体材料在发光二极管、激光器和探测器方面有着广泛的应用,采用高分辨X射线衍射来测定用金属有机化学气相沉淀法在蓝宝石衬底上生长的氮化镓外延层马赛克结构的扭转角,分别研究了(0002)、(1013)、(1012)、(1011)、(2021)五个面的X射线摇摆曲线,并且用Pseudo-Voigt方程拟合每一个面的摇摆曲线,我们利用外推法很方便地测得氮化镓外延薄膜的面内扭转角。另外我们采用同步辐射X射线掠入射衍射对样品进行(1100)面反射φ扫描直接测得面内扭转角,对第一种方法进行验证,两种方法测量结果相同。从而提供一种简单、方便的GaN外延层的面内扭转角的测试方法,为深入研究GaN材料奠定良好基础。     

HVPE反应器的环形分隔进口数对生长均匀性的影响

利用FLUENT软件对3种环形分隔进口(4环、8环、12环)的氢化物气相外延(HVPE)反应器的生长均匀性进行了二维数值模拟研究。分别考虑输运模型和输运-生长模型,模拟过程保持相同的GaCl、NH3及N2气体进口流量。结果显示:在只考虑输运的模型中,反应室流动均匀性随着进口环数的增多而改善。8环进口时,衬底上方温度分布最均匀;4环进口时,衬底上方的GaCl浓度较高,但均匀性最差,Ⅴ/Ⅲ比也较低;8环及12环进口可得到均匀的GaCl浓度分布及较高的Ⅴ/Ⅲ比。在包括输运和GaN生长的模型中,尽管8环进口反应器衬底上方的GaCl浓度低于12环进口反应器,却因其较薄的边界层厚度而导致较高的生长速率,并且生长均匀性较高。因此,8环进口反应室更有利于GaN的HVPE生长。     

太阳能电池在微生物燃料电池中的光电催化性能研究

微生物燃料电池（microbialfuelcell,MFC）是利用电化学技术将微生物代谢能转化为电能并可同时降解废水的一种装置．本文针对目前MFC输出功率密度小、工作效率低等缺点,提出了利用半导体光催化和微生物催化协同作用构建新型MFC体系的设想,即将半导体太阳能电池串入MFC体系,组成“光电池．微生物电池”新型电池体系．实验结果表明,在光照的作用下,新型MFC体系的开路电压、短路电流和最大输出功率密度,与普通MFC体系相比,均有了明显的提高．光电催化作用的引入,有效地改善了MFC体系阴极的接受电子的能力,使阳极提供电子的能力得到最大限度的发挥,既给MFC体系的运转提供了一部分动力,也为MFC体系提高污染物的降解速率提供了基础．此项研究对解决能源危机和环境污染具有重要意义．     

低压MOCVD生长GaN p—n结蓝光LED

简要报道了采用一种改进的低压金属有机化物化学气相沉积（ＬＰ－ＭＯＣＶＤ）方法制备ＧａＮｐ－ｎ结蓝光光发射二极管（ＬＥＤ），介绍了ＬＥＤ的基本特性，这种ＬＥＤ具有良好的Ｉ－Ｖ特性和光谱特性，室温下，在正向电压５Ｖ，正向电流３－２０ｍＡ的条件下，峰值波长为依Ｍｇ的掺杂浓度和退火条件的不同而不同，分别在４２５ｎｍ，４３５ｎｍ和４８０ｎｍ附近，发射谱的半峰宽约为５０ｎｍ。     

Growth and Optical Properties of Double Heterostructure GaN／InGaN／GaN Films with Large Composition

The double heterostructure GaN/InGaN/GaN films with different thicknesses of the InGaN layer were grown at 780℃ or 800℃ by metal-organic chemical vapour deposition.The samples were investigated using x-ray diffraction (XRD),room-temperature photoluminescence (PL) and Raman scattering.The dependences of the samples on both the growth temperature and the thickness of the InGaN layer were studied.The composition of InGaN was determined by the results of XRD,and the bowing parameter of InGaN was calculated in terms of the PL spectra.When the thickness of the InGaN layer was reduced,the phase separation of InGaN was found in some samples.The raman frequency of the A1(LO) and E2(low) modes in all the samples shifted and did not agree with Vegard‘s law.     

Barrier Enhancement Effect of Postannealing in Oxygen Ambient on Ni/AIGaN Schottky Contacts

Al0.2 Ga0.8N/GaN samples are grown by metalorganic chemical vapour deposition （MOCVD） method on （0001） sapphire substrates. A 10nm-thick Ni layer is deposited on AlGaN as the transparent Schottky contact. The effect of postannealing in oxygen ambient on the electrical properties of Ni/AlGaN is studied by current-voltage- temperature （I-V-T） measurement. The annealing at a relatively low temperature of 300℃ for 90 s results in a decrease of the ideality factor from 2.03 to 1.30 and an increase of the Schottky barrier height from 0.77eV to 0.954 e V. The I-V-T analysis confirms the improvement originated from the formation of NiO, a layer with higher resistance, which could passivate the surface states of AlGaN and suppress the tunnelling current. Furthermore, the annealing also leads to an increase of the transmittance of the contacts from 57.5% to 78.2%, which would be favourable for A1GaN-based photodetectors.     

Electrical Characteristics of InGaN/AlGaN and InGaN/GaN MQW Near UV-LEDs

Electrical characteristics of In0.05 Ga0.95N/Al0.07Ga0.9aN and In0.05 Ga0.95N/GaN multiple quantum well （MQW） ultraviolet light-emltting diodes （UV-LEDs） at 400hm wavelength are measured. It is found that for InGaN/AlGaN MQW LEDs, both ideality factor and parallel resistance are similar to those of InGaN/GaN MQW LEDs, while series resistance is two times larger. It is suggested that the Al0.07Ga0.93N barrier layer did not change crystal quality and electrical characteristic of p-n junction either, but brought larger series resistance. As a result, InGaN/AlGaN MQW LEDs suffer more serious thermal dissipation problem although they show higher light output efficiency.     

Effects of transverse mode coupling and optical confinement factor on gallium-nitride based laser diode

We have investigated the transverse mode pattern and the optical field confinement factor of gallium nitride （GaN） laser diodes （LDs） theoretically. For the particular LD structure, composed of approximate 4 μm thick n-GaN substrate layer, the maximum optical confinement factor was found to be corresponding to the 5^th order transverse mode, the so-called lasing mode. Moreover, the value of the maximum confinement factor varies periodically when increasing the n-side GaN layer thickness, which simultaneously changes and increases the oscillation mode order of the GaN LD caused by the effects of mode coupling. The effects of the thickness and the average composition of Al in the AlGaN/GaN superlat.tice on the optical confinement factor are also presented. Finally, the mode coupling and optimization of the layers in the GaN-based LD are discussed.     

基于粒子群优化的网络动态可靠性分析

时变性是节点和网络的典型特征。针对时变可靠性问题主要是基于上穿率法进行分析,传统的上穿率法分析方法通过时间离散,然后采用FORM法计算其瞬时可靠度,进而计算上穿率。对于功能函数非线性程度较高时,FORM求解精度降低。本文采用pso算法改进上穿率法,首先在离散时间之后,通过pso算法求解瞬时可靠度指标,然后计算上穿率进行时变可靠性分析,并通过实例与上穿率法及Monte-Carlo方法进行对比,本文提出的方法可以提高计算精度。