磁控溅射技术室温生长氢化ZnO∶Ga薄膜及其特性研究

采用直流脉冲磁控溅射方法,在室温下生长氢化Ga掺杂ZnO薄膜(GZO/H),并通过湿法后腐蚀技术获得绒面结构.研究了室温下H2流量对薄膜结构、光电性能及表面形貌的影响.实验表明,氢化GZO(GZO/H)薄膜具有良好的(002)晶面择优取向生长,引入适当流量的H2可以有效提高薄膜的电学特性,GZO/H薄膜具有更低的电阻率以及较高的迁移率和载流子浓度.当通入H2流量为6 sccm时,薄膜电阻率为6.8 ×10-4 Ω·cm,Hall迁移率达34.2 cm2/Ⅴ·s,制备的GZO/H薄膜可见光区域平均透过率优于85;.此外,研究了H2流量对湿法腐蚀后绒面GZO/H薄膜表面形貌的影响,提出了一种薄膜绒面结构形成过程模型.     

加磁场对GZO薄膜结构及光电性能的影响

采用射频磁控溅射法在玻璃基底上制备了Ga掺杂ZnO (GZO)薄膜,在传统磁控溅射系统中引入外加磁场,探究了磁场强度变化对GZO薄膜晶体结构和光电性能的影响.结果表明:所制得的GZO薄膜结构均为六角纤锌结构且在[002]方向沿C轴择优取向;外加磁场强度对薄膜的光电性能具有较大影响,在可见光范围内,薄膜的平均透光率超过93;,并出现了Moss-Burstein效应;薄膜的电学性能得到提升,其电阻率从4.96×10-3 Ω·cm降至3.17×10-4Ω·cm,霍尔迁移率从7.36cm2 ·V-1 ·S-1增至9.53 cm2·V-1·S-1.     

原子层沉积Sn掺杂ZnO薄膜结构及光电性能的研究

采用原子层沉积方法以臭氧为氧源,分别在Si和K-9玻璃衬底沉积Sn掺杂ZnO薄膜.系统研究了Sn掺杂浓度对ZnO薄膜成分、晶体结构及光电性能的影响.XRD分析表明:所制备SnZO薄膜具有垂直于衬底表面的c轴择优取向.XPS分析表明:在ZnO中掺杂离子以Sn4+形式存在.Hall分析表明Sn是一种有效的施主掺杂元素,其通过置换Zn2+位置释放导电电子.当Sn掺杂浓度为1.8at;时,Hall测试表明ZnO薄膜具有最低电阻率为9.5×10-4Ω·cm,载流子浓度达到最高值为3.2×1020 cm-3,进一步增加Sn浓度使得ZnO薄膜电学性能变差.SnZO薄膜在可见光区域的光透过率超过85;,光学带隙值由未掺杂ZnO的3.26 eV增加到5.7at; Sn掺杂时3.54 eV.     

钛铝共掺杂氧化锌和钛掺杂氧化锌透明导电薄膜的制备与性能对比研究

利用直流磁控溅射法,在相同实验条件下成功沉积出了钛掺杂氧化锌(TZO)透明导电薄膜和钛铝共掺杂氧化锌(TAZO)透明导电薄膜,并对两种薄膜的结构、应力和光电性能进行了对比研究.结果表明:两种薄膜均为具有c轴择优取向的六角纤锌矿结构多晶薄膜;TAZO薄膜的导电性能优于TZO薄膜,100 W溅射功率下制备的TZO薄膜的电阻率具有其最小值5.17×10-4 Ω·cm,而相同功率下TAZO薄膜的电阻率为3.88×10-4 Ω·cm;同时TAZO薄膜的光学性能也优于TZO薄膜,所有TAZO薄膜样品的可见光透过率均大于91;,而TZO薄膜的可见光透过率均大于85;.     

Na掺杂ZnO薄膜的表面形貌及其光学性质

采用溶胶-凝胶技术制备不同Na掺杂ZnO薄膜,用XRD、拉曼光谱仪、AFM、SEM和紫外可见分光光度计等表征方法研究了Na掺杂量对ZnO薄膜的表面形貌和光学性质的影响.XRD和Raman光谱分析表明:8.0 at;Na掺杂ZnO薄膜具有最佳c轴择优取向,内部残余张应力最大;表面形貌研究结果显示:薄膜的平均粒径和粗糙度均随Na含量的增加而增大.薄膜在可见光范围内的平均透射率大于80;,随着Na含量从0增加到10at;,薄膜的光学带宽由3.283 eV增大到 3.305 eV.     

Sn-Al共掺杂ZnO薄膜的制备及其光电性能

采用溶胶凝胶法在普通载玻片上制备了Sn-Al共掺杂ZnO薄膜(ZASO薄膜).利用XRD、扫描电子显微镜、霍尔测试仪、双电测四探针测试仪和紫外-可见分光光度计等设备,研究了Sn-Al掺杂浓度、预烧温度对氧化锌薄膜的晶体结构和光电性能的影响.结果表明:预烧温度为500℃,Sn、Al掺杂浓度分别为1.0at;时,得到的ZASO薄膜的综合光电性能最好,晶粒尺寸较大,方块电阻可达3.3 kΩ/□,光学透过率达92.9;.     

二元掺杂对SnO2薄膜的结构与光学性能的影响

采用超声雾化热解法在石英玻璃基底上制备了SnO2/Sb:Ni薄膜,并对薄膜的晶体结构、表面形貌和光学性能进行了表征.结果表明:薄膜晶粒生长致密,晶粒大小均匀,呈柱状晶结构,(200)晶面是优势生长面.经过二元掺杂后,薄膜的平均可见光透过率最高为87.54;;波长为300 nm时,薄膜的紫外透过率约为50;.     

F掺杂对溶胶-凝胶法制备的ZnO∶ Fe薄膜结构及光学性质的影响

采用溶胶-凝胶法在玻璃衬底上制备了Zn0.98-xFe0.02FxO(x =0,0.01,0.02,0.03,0.04)薄膜,进而利用X射线衍射仪(XRD)、扫描电子显微镜(SEM)、紫外-可见透过谱(UV-VIS)、光致发光(PL)多种测试手段研究了不同掺F浓度对ZnO∶ Fe薄膜的表面形貌、微结构、禁带宽度及光致发光的影响.结果表明:样品均为六角纤锌矿结构,当F掺杂浓度为2at;时,薄膜的结晶度最好且表现出明显的c轴择优取向.随着F掺杂浓度的进一步增大,薄膜的结晶性逐渐变差,c轴择优取向消失.F掺杂ZnO∶ Fe薄膜在可见光区均有很高的透过率,平均可达93;.样品的禁带宽度随着掺F浓度的增加而减小.PL谱观察到Zn0.98-xFe0.02FxO薄膜的发射峰主要由紫外发射峰和蓝光发射峰组成,其中2at;F掺杂样品的紫外发射强度最大,同时蓝光发射强度随着F含量的增大逐渐减小.     

溶胶-凝胶法制备Ag掺杂的ZnO薄膜及其结构和光学性能的研究

溶胶-凝胶法制备了Ag掺杂的ZnO薄膜(AZO).采用X射线衍射(XRD)、扫描电子显微镜(SEM)、UV-VIS分光光度计、光致发光检测研究了掺杂浓度和退火温度对AZO薄膜光学和结构的影响.AZO薄膜呈(002)择优生 长的纤维锌矿六角形结构的多晶相.0.5;和1; Ag掺杂的薄膜在可见光波长区域光学透过率在70;～ 80;之间,随着Ag掺杂浓度的升高平均透过率有所降低.5; Ag掺杂的ZnO薄膜经空气中700℃退火后出现两条发射光谱带,经He气氛中退火后UV发射光谱显著增强,并且可见光发射光谱随之消失.     

Ti含量对溶胶-凝胶法制备Ti、Ga共掺ZnO薄膜性能的影响

采用溶胶-凝胶旋涂法在玻璃衬底上沉积纳米结构Ti、Ga共掺ZnO薄膜(TGZO,Ga掺杂量为1.0;(原子分数,下同)),用X射线衍射仪(XRD)、扫描电子显微镜(SEM)、分光光度计(UV-Vis)、四探针测试仪、霍尔效应测试仪研究了Ti含量对TGZO薄膜的物相组成、表面形貌、电学和光学性能的影响.结果表明:所有TGZO薄膜均表现出六方纤锌矿的多晶结构,并具有(002)择优取向生长,在380～780 nm波长范围内具有良好的透射率(>86;);随着Ti含量的增加,TGZO薄膜的晶粒尺寸和可见光平均透射率均先增加后减小,而光学带隙和电阻率先减小后增加;Ti掺杂量为1.0;时,具有最高的可见光透射率92.82;,最窄的光学带隙3.249 eV,以及最低电阻率2.544×10-3Ω·cm.     

A review of measurement of thermophysical properties of silicon melt

Measurements of thermophysical properties of Si melt and supplementary study of X-ray scattering/diffraction by the authors' group were reviewed. The values obtained differed variously from those of literature. Density was 2–3% larger, surface tension 20–30% smaller, viscosity up to 40% larger, electrical conductivity 8% smaller, spectral emissivity more or less in good agreement with literature values, and thermal diffusivity a few percent larger. An anomalous density jump was found near the melting point. Surface tension and viscosity also showed anomaly. A strange time-dependent change of density was observed over 3 h after melting. X-ray analyses suggested a slight change in local atom ordering, but showed no sign of cluster formation. An addition of 0.1 at% gallium caused the density jump to disappear, while that of boron caused no change. An EXAFS study of the former melt indicated a strong interaction between Ga and Si atoms as if molecules of GaSi₃ existed. The implications of the measured properties are a possibility of soft-turbulence in an Si melt in a relatively large crucible, a more complicated manner of intake of oxygen depleted molten Si from the free surface region to underneath the growing crystal, and a relaxation of the melt after melting arising from trapped gas species.     

电子显微分析在表征纳米晶体化学组分中的应用

纳米材料的化学组分及含量影响其光、电、声、热、磁等物理性能,电子显微分析是表征纳米晶体化学组分的重要方法之一.本文综述了X-射线能谱(EDS)、X-射线波谱(WDS)、电子能量损失谱(EELS)和选区电子衍射(SAED)等现代电子显微分析技术在表征纳米晶体化学组分、形貌、尺寸和结构等方面的应用及其研究进展,并比较了这些分析方法存在的差异,提出了其应用中存在的不足及今后的研发方向.     

原位氮化法制备TiN纳米粉体

用溶胶凝胶法合成的纳米TiO2粉体作为原料,将该粉体在氨气中进行原位氮化制备了TiN纳米粉体.用XRD,TEM,化学分析等手段对合成的TiN纳米粉体的物相组成、形貌、成分进行了分析.实验分析表明:在1000℃和1100℃下分别氮化5h,可以制备粒径大约为40nm和80nm的TiN粉体,其TiN的含量分别为95.40;和98.37;;而在1000℃条件下氮化时间减少到2h时,TiN的含量仅为58.36;.氮化温度和氮化时间是合成纳米TiN的重要因素,提高合成温度和延长氮化时间均可形成纯度较高的TiN纳米粉体,但延长氮化时间更有利于获得粒径小的氮化钛粉体.     

On the influence of structural features of DNA on the possibility of metabolic transfer of electrons

Abstract

A fragment of a DNA molecule is considered as one of the channels of metabolic electron transfer. The heterogeneity of the complementary chains is effectively taken into account. This made it possible to find the speed of the electron injected into the DNA conduction band and the current density that it creates. Estimates of electron mobility in nucleic acid chains are made. They were an order of magnitude smaller than that of typical semiconductors. For the specific conductivity of nucleic acid chains, estimates provide a conductivity of one to two orders of magnitude lower than in graphite.     

Mesomorphism Dependence on the Position of Substitution of a Pair of Esters

A novel homologous series of ethylene derivatives of thermotropic liquid crystals has been synthesized. The methoxy to octyloxy derivatives are nematogenic, the decyloxy to tetradecyloxy derivatives are smectogenic, in addition to nematogenic, and the hexadecyloxy homologue is smectogenic only. All the members of the series are enantiotropically mesogenic. Thermotropic behavior was determined by an optical polarizing microscope equipped with a heating stage and Differential Scanning Calorimetry (DSC) study. Analytical and spectral data confirm the molecular structures of homologues (infrared, nuclear magnetic resonance, mass spectra, X-ray, and DSC data). Textures of the nematic phase are threaded or Schlieren and that of smectic phase are focal conic fan-shaped of smectic A or C. Transition curves of the phase diagram behave in a normal manner except one or two deviations from the normal trend. The mesophase range (Sm+N) varies from 3°C to 44°C. The average thermal stability for smectic is 93°C and that for nematic 117.4°C. The LC behavior of the novel series is compared with a structurally similar known series.     

PEG聚合度对氧化铝造粒粉的性能影响

为制备适用于干压成型的氧化铝造粒粉,研究了PEG聚合度对氧化铝造粒粉微观形貌、流动性和松装密度的影响.结果表明PEG的聚合度对氧化铝浆料粘度影响显著,PEG2000-6000是较为理想的粘结剂选择,造粒粉的流动性与环境温度及湿度相关.采用正交实验设计,以造粒粉的流动性和松装密度为评价指标,对PEG聚合度、粘结剂添加量和固含量进行了优选,其影响顺序为PEG聚合度＞固含量＞粘结剂添加量.以优选参数PEG6000、添加量为4wt;、固含量为80wt;,制备了性能优良的氧化铝喷雾造粒粉.     

Ni-ZrO2纳米复合电铸层的制备及纳米颗粒分布均匀性研究

研究了在复合电铸过程中,当其它工艺参数一定时,复合电铸层的沉积速率及其厚度随时间的变化趋势, 以及复合电铸层表面微观形貌随电沉积时间的变化趋势.测定了复合电铸层的组织成分,并就纳米颗粒在复合电铸层表面和横截面上分布的均匀性进行了评价.结果表明,复合电铸层表面平整,组织均匀致密,其组成主要是镍和所复合的纳米颗粒,纳米颗粒较为均匀地分散在复合电铸层中.     

前驱物合成条件对锰锌铁氧体结构和性能的影响

采用共沉淀-热处理工艺合成了尖晶石型锰锌铁氧体粉末,利用正交试验优化了制备工艺。利用X射线衍射仪(XRD)扫描电子显微镜(SEM)和振动样品磁强计(VSM)对粉体的显微结构和静磁性能进行了研究。结果表明:热处理温度为1350℃、保温时间为3.5 h、进料比为1.5时,若前驱物的pH值为6,制备的样品的主晶相为锰锌铁氧体;若前驱物的pH值为7 9,则形成单相尖晶石型锰锌铁氧体,样品的饱和磁化强度先增大后减小,矫顽力逐渐增大。pH值为7时,配方为Fe∶Mn∶Zn=68.4816∶17.1368∶14.381,进料比为1.5,滴加时间为40 min,反应温度为50℃,不加表面活性剂时得到的样品具有较高的饱和磁化强度。     

Effect of alumina on enthalpy of mixing of mixed alkali silicate glasses

The enthalpy of mixing of mixed alkali (Na₂O and K₂O) silicate glasses containing various concentrations of alumina was determined using an ion-exchange equilibrium method. For glasses with a constant alkali concentration, the enthalpy of mixing was found to become less negative with alumina addition. Consistent with our previous results on the enthalpy of mixing of alumina-free mixed alkali silicate glasses, the magnitude of enthalpy of mixing exhibited a good correlation with the molar volume mismatch of the corresponding two single alkali glasses as well as with the extent of conductivity mixed alkali effect, e.g. excess activation energy of conductivity, ΔE. The reduction of the magnitude of the enthalpy of mixing with alumina addition can be attributed to the reduction of non-bridging oxygen and ionic field strength. Combining the present results with results obtained earlier, the magnitude of the enthalpy of mixing for all mixed alkali (Na₂O and K₂O) silicate glasses with and without alumina was expressed by a simple function of a modified Tobolsky parameter, which takes into account the alkali concentration and the difference in cation-to-effective anion distances. The enthalpy of mixing data of the mixed alkali glasses was then compared with reported experimental data on the conductivity of mixed alkali aluminosilicate glasses. What appears to be conflicting experimental data can be understood in terms of the magnitude of the enthalpy of mixing and we can conclude that the mixed alkali effect is closely correlated with the negative enthalpy of mixing.     

近化学计量比铌酸锂晶体组分测定与缺陷观察

采用助熔剂提拉法生长得到近化学计量比LiNbO3晶体.用多种方法测定了晶体组分,结果表明生长得到的晶体中[Li2O]含量为49.80;摩尔分数;对晶体缺陷的研究表明晶体质量有待提高,并分析了晶体中出现包裹物的原因.