基于白光干涉测试技术的改进Carré相移算法

为了减小白光相移干涉法测量物体微观形貌时产生的误差,对极值法的搜索路径进行优化后与Carré相移算法相结合,提出一种基于白光干涉测试技术的改进Carré相移算法.该算法减小了光源扰动及电荷耦合元件散粒噪声带来的影响,且对相移器的线性误差不敏感,免去了相位解包裹过程,提高了运算效率.采用单刻线样块对扫描步距进行校准实现了光源中心波长的在线修正,减小了由于光源特性及环境扰动误差带来的影响.采用不同算法对标准粗糙度样块进行三维形貌恢复以及表面粗糙度的重复性测量实验,结果表明:该算法对表面粗糙度的测量结果较传统白光干涉算法准确度提高,测量重复性优于1%.     

一种提高干涉相位识别精度的方法

针对开环相移驱动下的单色光干涉测量,提出一种满足四步法的高精度相位识别的方法。首先选取干涉场中存在适当相位差的两像素点,建立相移驱动单周期内两像素点灰度序列值之间的干涉方程组。运用椭圆拟合获取相应干涉方程组参数,然后通过反算序列相位确定逐点驱动步长或序列相位信息。结合序列相位信息,运用Lagrange抛物插值算法,设计计算满足四步法的4幅干涉图,并计算各像素点的初相位。最后,运用多波长算法计算表面形貌并进行误差分析。实验表明:计算得到的方波多刻线样板的Ra值为0.439 0 m,测量误差为0.23%,此方法降低了对测量条件的硬件与环境要求,满足表面形貌高精度测量的要求。     

基于白光干涉的ICF靶丸表面缺陷测量方法

针对激光惯性约束聚变实验中的靶丸等微球表面缺陷的真实高度测量问题,为解决现有测量方法存在的缺陷跃变处2π整数倍相位缺失问题,提出一种基于垂直扫描白光干涉技术的零位显微干涉测量方法。该方法采用白光球面零位干涉思想,通过垂直扫描球面干涉获取全视场白光干涉图,然后运用七步移相算法及蝙蝠翼校正算法实现靶丸表面缺陷的形貌计算,最后将白光干涉测量法与激光干涉测量法进行对比实验。结果表明,白光干涉法能够有效解决激光干涉法在缺陷跃变处的2π整数倍相位缺失问题,实现靶丸表面缺陷的真实高度测量,从而扩展靶丸类微球表面缺陷的测量范围。     

基于SVMD-HD去噪的白光干涉解调算法

垂直扫描白光干涉法（VSWLI）是一种非接触式三维表面轮廓测量方法。蝙蝠翼作为VSWLI当中一种固有的缺陷，尤其在被测样品的台阶高度小于光源的相干长度时，台阶边缘处的蝙蝠翼尤为显著。相移干涉法不存在这种缺陷，但是存在相位模糊的问题。提出一种将Carré等步长相移算法与快速傅里叶变换（FFT）相干峰值检测技术相结合的白光干涉解调算法。该算法基于逐次变分模态分解（SVMD）与Hausdorff距离（HD）联合去噪。分别以高度为500 nm和1 200 nm的连续台阶器件和高度为10μm的标准台阶作为测试样品，进行实验测量验证。所提出的算法能够有效地抑制台阶高度跳变处的蝙蝠翼，克服相位模糊问题。     

用特征多项式构造相移干涉相位提取算式

用相移干涉术测量物体表面形貌时，各种误差因素特别是相移器移相误差的影响使得表面形貌的测量偏离了实际值，甚至会产生形貌失真的现象。采用傅里叶分析的方法对相位提取算式作了理论分析，并根据特征多项式设计分析理论构造了新的、对移相误差不敏感的相位提取算式。经实验验证，该算法有效地提高了相移干涉仪测量表面形貌的Ra值，重复测量精度达5倍以上，使测量结果更接近实际值。     

一种四波长轮换的表面形貌干涉测量系统

针对相移干涉法测量表面三维形貌时深度测量范围受波长限制这一问题,提出一种四波长表面形貌干涉测量系统。通过滤波片的轮换,将白光LED光源的光切换出4个不同波长的光源,并依次进行单波长干涉。为解决多波长干涉图像数据处理,采用基于椭圆拟合的算法,在逐帧逐点的相位计算条件下,运用大小尺度相结合的算法实现高精度宽范围的表面形貌测量。实验结果表明:在深度测量范围扩大到约41倍的条件下,测量经中国计量科学研究院采用粗糙度国家基准校准的方波多刻线样板,得到的表面粗糙度数据与校准数据相比,相对误差为4.09%。说明在一定的深度范围内,该系统能够实现表面形貌的高精度测量。     

利用电子散斑相移技术测量物体三维面形的方法

为了获得准确的面形测量,提出了一种相移电子散斑干涉技术测量物体面形的测量方法.利用电子散斑干涉产生载波条纹,该载波条纹受到物体表面高度的调制变得弯曲,引起载波条纹相位的变化,可运用相移技术提取物体的相位信息,最后根据高度和相位之间的关系得到物体的面形.介绍了该方法的原理,利用该方法对球冠物体进行了面形测量,证明该方法测量物体面形是可行性的.由于是采用散斑干涉的方法产生干涉条纹,因此该方法测量物体面形具有灵敏度高的优点.     

Mirau相移干涉法测量微透镜阵列面形

基于Mirau相移干涉法，在实验室环境下对微透镜阵列的微表面形貌进行了轮廓测量.实验使用He-Ne激光器作为光源，干涉成像系统由Mirau干涉物镜和其他光学元件组成.在实验中使用压电陶瓷执行器作为相移器，通过5步相移法计算待测表面形貌.实验结果表明，基于Mirau相移干涉法对微透镜阵列面形的测量，水平分辨率达到1.1 μm，垂直测量准确度达到6.33 nm，垂直测量范围为5 μm.对于微透镜阵列的面形测量，通过将微透镜阵列划分为若干微小区域以保证局部面形最大高度小于5 μm，然后辅以精密平移机构进行若干次5步相移法测量局部面形，再利用相位重建所得的数据进行拼接和3D轮廓重建，最终得到整个微透镜阵列的精确微表面形貌.     

基于相位展开及拼接算法的一种高精度大量程宽光谱干涉显微术

宽光谱干涉显微术广泛应用于高精密检测领域, 它测量样品形貌通常采用垂直扫描干涉术对亚微米至毫米级特征进行测量,以及相移干涉术对纳米级特征进行测量。其中,相移干涉术精度可达纳米级,但量程有限,高度变化对应的相位需限制在区间内。采用包裹相位展开算法可以扩展相移干涉术的量程,也仅适用于平滑表面,当高度起伏超出焦深或者光源相干长度的限定范围时,干涉条纹模糊或对比度丧失,所解算的结果将产生较大误差甚至错误。提出一种基于相位展开及拼接算法的高精度、大量程宽光谱干涉显微测量方法,以干涉条纹调制度量化条纹质量,条纹对比度高、成像清晰的区域对应调制度较高,定义当前焦面条纹调制度高于阈值的区域为理想区域,定义焦面条纹调制度低于阈值的区域为问题区域。以相位展开算法获得理想区域中的样品相位分布,问题区域的包裹相位不进行展开。使用微位移结构纵向移动物镜焦平面,选择合理的步长,使相邻焦面位置理想区域展开后的真实相位保持部分区域重合,根据重合区域的相位值均差可以实现不同焦面位置的高精度相位拼接,最终获得扩展量程的高精度真实相位结果,进而可以恢复样品完整的表面形貌分布。该算法通过对理想区域的筛选,避免了相位在问题区域展开带来的误差,可以得到精确的测量结果。通过模拟计算和实验验证,证明了该方法不仅保持了宽光谱干涉显微术中相移干涉术的纳米级高精度,还可将其量程从数百纳米拓展到数微米。而且,该方法精度不依赖于位移部件,理论上量程可以拓展到显微物镜的全工作距离。     

高精度动态白光干涉测量方法

白光干涉测量技术具有精度高和非接触式测量的优点,是超精密加工领域中的一项重要测量手段。针对白光干涉测量技术容易受环境振动影响的问题,提出了一种动态垂直扫描干涉测量方法(DVSI)。该方法将白光干涉光路分为两个成像通道,得到与白光干涉图同步移相的准单色光干涉图。通过相位-倾斜迭代方法(PTI)对准单色光干涉图进行处理得到实际的移相扫描位置,对白光干涉信号进行相干峰位置的定位,并计算出粗糙的形貌分布,之后利用局部最小二乘方法(LLS)计算出精细的相位分布,将粗糙形貌以及精细相位相结合来复原出待测件的三维形貌。本研究通过数值仿真和实验对比对该方法进行了验证,结果表明本方法具有较好的抗振性能。     

Sinusoidal phase-modulating laser diode interferometer for real-time surface profile measurement

A sinusoidal phase-modulating (SPM) laser diode (LD) interferometer for real-time surface profile measurement is proposed and its principle is analyzed. The phase signal of the surface profile is detected from the sinusoidal phase-modulating interference signal using a real-time phase detection circuit. For 60 × 60 measurement points of the surface profile, the measuring time is 10 ms. A root mean square (RMS) measurement repeatability of 3.93 nm is realized, and the measurement resolution reaches 0.19 nm.     

Measurement of surface profile in vibrating environment with instantaneous phase shifting interferometry

In-process measurement has been the requirement of the precision industries, but due to vibrations while manufacturing, in-process measurement has been difficult to achieve. There is little work on in-process measurement using phase shifting interferometry, as phase shifting is extremely sensitive to vibrations. In this work, the advantage of the developed non-mechanical and instantaneous phase shifting interferometry is felt while measuring surface profile of large flat surfaces under vibrating conditions which can be extended for in-process measurement of surface profile. A near common path optical configuration is achieved and the effect of the environment is reduced. Moreover, the measurement of phase is instantaneous which increases the versatility of this technique for measuring vibrating objects. Profile measurements were carried out on a smooth mirror surface excited with vibrations of different frequencies and the technique was found to be immune to vibrations of up to 1000 Hz.     

Phase-shifting interferometric profilometry with a wavelength-tunable diode source

A phase-shifting interferometer with a tunable external-cavity laser diode has been constructed for forming three-dimensional (3-D) phase profiles. The interference phase is shifted equally in four steps by varying the source wavelength. Profilometry is achieved by measuring the phase shifts that are extracted by the Carré algorithm. The linear regression of the distance measurement from 40 μm to 13mm has been experimentally demonstrated by phase-shifting interferometry. A laser-diode interferometer has been applied to 3-D profile measurement for a step-mirror object at a deep depth.     

Polarization shifting interferometric profilometer

A phase sensitive Michelson interferometer based on interference microscope configuration with a polarization adjustment approach is proposed to determine the two-dimensional (2-D) surface profile of optical grating with real time capability. In the proposed method, nonlinear behavior of a PZT phase shifter is avoided by use of polarization stepping and a phase map is developed with the four-bucket algorithm. The phase map is unwrapped to give the true surface profile of the sample. A close agreement of measurements is found between the measured result determined by the proposed method and that determined by an atomic force microscope (AFM). We also analyzed the estimated uncertainty of measurement in the nanometer range for the random fluctuations of the experimental parameters.     

Real-time surface profile measurement using a feedback type of sinusoidal phase modulating interferometer

In this paper, we propose a sinusoidal phase modulating (SPM) interferometer that is insensitive to external disturbances, and its measuring principle is analyzed theoretically. In the SPM interferometer, the interference signal is detected by a high-speed image sensor based on a low-speed CCD and a signal processing circuit is used to obtain the phase of each point on the surface. Therefore, the surface profile can be measured real-time. The experiments measuring the surface profile of a wedge-shaped optical flat show that the measurement time of the SPM interferometer is less than 10 ms, the repetitive measurement accuracy is 4.2 nm. The results show that the impacts of nonlinear distortion of the piezoelectric transducer (PZT) and part external disturbance are removed.     

用于动态测量的双通道光学相位测量轮廓术

提出了利用编码光两个采样值实现相位测量轮廓术的原理。设计了一种偏振分光双通道测量系统，实现了两个采样值的同时记录，因而实现了动态测量，拓展了相位测量轮廓术的应用范围。文中给出了实验结果。     

大动态范围形变测量

本文对激光散斑物体轮廓及形变测量和相移轮廓测量原理进行类比,首次提出大动态范围物体三维轮廓及形变测量方法。该方法具有测量原理简单、系统操作简便、测量精度高、测量动态范围大等特点,形变测量范围从亚微米级到毫米级。另外本文还推导了基于减模式激光散斑物体轮廓及形变测量的相位值计算公式。     

Scanning moiré and spatial-offset phase-stepping for surface inspection of structures

In order to develop a high-speed and accurate surface inspection system of structures such as tunnels, a new surface profile measurement method using linear array sensors is studied. The sinusoidal grating is projected on a structure surface. Then, the deformed grating is scanned by linear array sensors that move together with the grating projector. The phase of the grating is analyzed by a spatial offset phase-stepping method to perform accurate measurement. The surface profile measurements of the wall with bricks and the concrete surface of a structure are demonstrated using the proposed method. The change of geometry or fabric of structures and the defects on structure surfaces can be detected by the proposed method. It is expected that the surface profile inspection system of tunnels measuring from a running train can be constructed based on the proposed method.     

周期性多层膜合金化制取的TiNi形状记忆薄膜的室温微结构特征

用掠入射X射线衍射及X射线反射对磁控溅射制取的等原子比Ni／Ti周期性多层膜晶化热处理 后的TiNi形状记忆薄膜室温微结构进行了研究.TiNi形状记忆薄膜在深度方向的相分布和元 素分布是不均匀的，都是一种多层结构.室温下其微结构特征为最外层是Ti氧化膜，再下层 是Ti₃Ni₄,B19’马氏体相和少量的B2奥氏体相的三相混合物，靠近 基体为主要相成分马氏体，最后是Ni和Si界面反应层.X射线反射率的拟和结果显示薄膜微结 构的分析是合理的.薄膜中相深度分布的不均匀性主要是动力学因素决定的. 关键词： 相深度分布 形状记忆 TiNi 多层膜