多孔硅的拉曼光谱研究

本文研究了多孔硅的拉曼光谱随激发激光功率的变化 ,发现当激发光的功率较低时 ,多孔硅的拉曼光谱在 5 2 0cm- 1附近为一单峰。随着激光功率的增加 ,该单峰向低波数移动且半高宽增大 ,当继续增大激光功率时 ,该单峰分裂为双峰 ,位于低波数一侧的拉曼峰随着激光功率的增大而进一步向低波数移动。多孔硅的拉曼光谱随着激光功率的变化是一个可逆的过程。这一结果表明 ,低波数拉曼峰的位置既不能作为多孔硅颗粒尺寸的量度 ,也不能只把低波数的拉曼峰作为多孔硅的特征。我们认为激光诱导多孔硅中LO和TO声子模的简并解除是观察到双峰的主要原因。     

拉曼光谱法计算多孔硅样品的温度

利用457.5nm固体激光器作为激发光源，得到了在不同功率激发下的多孔硅样品的拉曼光谱以及一些谱峰参数随功率的变化关系. 在从前的理论研究中，认为是由于激光功率的增大导致样品局域温度升高，从而使样品局域粒径变小，并由此引起了一系列谱峰参数的变化. 分别由520cm^-1和300cm^-1附近得到的随功率变化的拉曼谱图，详细讨论并计算了激光功率对多孔硅样品局域温度的定量影响，为拉曼光谱用于样品温度的定量测量奠定了实验基础. 关键词： 拉曼光谱 多孔硅 激光功率 样品温度     

空间限制与应变对发光多孔硅喇曼光谱的影响

发光多孔硅的喇曼光谱在５２０ｃｍ^－１附近呈现一锐峰，峰位的红移随多孔度的增大而增大采用微晶模型拟合喇曼谱的线形，发现除了光学声子的空间限制效应，硅单晶的应变对峰位的移动也有显著贡献。通过谱形的拟合估算了硅微粒的应变，与已报道的Ｘ射线衍射结果相一致。在多孔硅的喇曼光诸中没有观察到起源于非晶硅的光散射信号。 关键词：     

掺钽钨青铜的制备及光学性能

以TaCl₅和Na₂WO₄为原料,采用水热法在170 ℃制备性能良好的掺钽钨青铜(Ta_<i>xWO₃)纳米线。利用Ｘ射线衍射技术(XRD)、扫描电镜(SEM)、紫外可见漫反射光谱(UV-Vis)及拉曼光谱(Raman)等分析手段,对该材料的结构、形貌及光谱性能进行表征。XRD结果表明：Ta_xWO₃纳米材料为六方相结构氧化钨,当Ta_xWO₃中Ta/W摩尔比小于0.04时,晶胞参数随着掺杂量的增大而逐渐增大,当掺杂量达到大于0.04后保持基本不变。UV-Vis光谱表明,随着钽掺杂量的增大,紫外吸收峰发生红移,即能隙逐渐减小。Raman光谱显示：随钽掺杂量的增大,Raman峰位逐渐向低波数方向移动,同时振动峰逐渐宽化,进一步证明了钽掺杂对氧化钨结构的影响。光催化降解罗丹明B的实验显示,制备的Ta_xWO₃具有较高的光催化活性。     

多孔硅光致发光的温度效应研究

通过对多孔硅光致发光峰随测量温度变化的研究，发现随测量温度的下降，光致发光峰位有两种截然不同的移动方向：发光峰中心波长较长的样品，主峰向低能方向移动(即红移)；而发光峰位波长较短的样品则向高能方向移动(即蓝移).根据多孔硅光致发光峰的温度效应，定性地给出了发光效率随波长变化的模拟曲线，并由此能较好地解释多孔硅光致发光峰位随温度变化而移动的实验现象. 关键词：     

KTN晶体及其熔体结构的高温拉曼光谱研究

测量并研究了不同温度(室温—1573 K)范围内KTN晶体的拉曼光谱及其熔体的高温拉曼光谱,分析了KTN晶体结构随温度变化的规律及其熔体的结构特征.随着温度的升高,KTN晶体的拉曼光谱谱峰都不同程度地向低波数方向移动,同时存在不同程度的展宽,并伴随强度的减弱.观察并解释了温度353 K附近KTN晶体样品的四方—立方转相现象.研究了KTN晶体拉曼光谱中538cm^-1,585cm^-1,835cm^-1和877cm^-1谱峰及其 关键词： 高温拉曼光谱 熔体 KTN晶体     

包含硅量子点的富硅SiNx 薄膜结构与发光特性

采用等离子体增强化学气相沉积法, 以NH₃与SiH₄为反应气体, n型单晶硅为衬底, 低温(220 ℃)沉积了富硅氮化硅(SiN_x)薄膜. 在N₂氛围中, 于500–1100 ℃ 范围内对样品进行了热退火处理. 采用Raman 光谱技术分析了薄膜内硅量子点的结晶情况, 结果表明, 当退火温度低于950 ℃时, 样品的晶化率低于18%, 而当退火温度升为1100 ℃, 晶化率增加至53%, 说明大部分硅量子点都由非晶态转变为晶态. 实验通过Fourier 变换红外吸收(FTIR)光谱检测了样品中各键的键合结构演变, 发现Si–N键和Si–H键随退火温度升高向高波数方向移动, 说明了薄膜内近化学计量比的氮化硅逐渐形成. 实验还通过光致发光(PL)光谱分析了各样品的发光特性, 发现各样品中均有5个发光峰, 讨论了它们的发光来源, 结合Raman光谱与FTIR光谱表明波长位于500–560 nm的绿光来源于硅量子点, 其他峰则来源于薄膜内的缺陷态. 研究了硅量子点的分布和尺寸对发光带移动的影响, 并根据PL峰位计算了硅量子点的尺寸, 其大小为1.6–3 nm, 具有良好的限域效应. 这些结果有助于制备尺寸不同的硅量子点和基于硅量子点光电器件的实现. 关键词： 硅量子点 氮化硅薄膜 光致发光 Fourier 变换红外吸收     

脉冲功率对含硅量子点SiCx薄膜物相结构及光谱特性的影响

基于硅量子点（Si-QDs）的全硅叠层太阳电池被认为是最有潜质的高效太阳电池之一。目前所报道的硅量子点薄膜存在硅量子点数密度低、缺陷多等问题,限制了硅量子点太阳电池的光电转换效率。微波退火(microwave annealing, MWA)被认为是一种有益于制备纳米结构材料的方法。微波退火的非热效应可以降低形核能,改善薄膜的微结构和光电性能。因此,采用磁控共溅射技术并结合微波退火工艺,在不同的脉冲功率下制备了含硅量子点SiC_x薄膜;采用掠入射X射线衍射(GIXRD)、拉曼(Raman)光谱、紫外-可见-近红外分光光度计和光致发光(PL)光谱表征薄膜的物相结构及光谱特性;研究不同脉冲功率对硅量子点数密度和性能的影响,进而改进磁控共溅射工艺,制备硅量子点数密度较高和性能良好的薄膜。样品的GIXRD谱和Raman谱均显示其中存在硅量子点,其强度先增大后减小;通过谢乐(Scherrer)公式估算出硅量子点尺寸呈现先增大后减小的规律,脉冲功率为80 W时尺寸达到最大(8.0 nm）。在Raman光谱中还观察到中心位于511 cm-1处出现硅量子点Si-Si横向光学振动模式的拉曼峰,其强度也呈现先增大后减小的趋势;对拉曼光谱做最佳高斯(Gauss)分峰拟合,得出薄膜的晶化率均高于62.58%,脉冲功率为80 W时制备的薄膜具有最高的晶化率(79.29%)。上述分析表明薄膜中均有硅量子点的形成,且数量先增加后减小,脉冲功率为80 W时硅量子点数量最多。通过测量样品的透射率T、反射率R等光学参数,利用Tauc公式估算出薄膜的光学带隙,发现带隙值随溅射功率的增加先减小后增大,在脉冲功率为80 W时最小(1.72 eV)。硅量子点尺寸与光学带隙成反比,说明薄膜中的硅量子点具有良好的量子尺寸效应。通过PL光谱分析样品的发光特性,对其做最佳高斯拟合,发现样品中均有6个发光峰。结合Raman光谱的分析结果,可以得出波长位于463~624 nm的发光峰源于硅量子点的作用;而波长位于408和430 nm的发光峰则源于薄膜内部的缺陷态,峰位没有偏移,但强度有变化。根据发光峰对应的波长可计算其能带分布,从而确定缺陷态类型：408 nm的发光峰归因于≡Si°→E_v电子辐射跃迁,430 nm的发光峰则归因于≡Si°→≡Si-Si≡的缺陷态发光。还研究了硅量子点的尺寸对发光峰移动的影响。结果表明,随硅量子点尺寸变小（大）,发光峰蓝移（红移）。综上,溅射功率为80 W时制备的含硅量子点SiC_x薄膜性能最佳。研究结果为硅量子点太阳电池的后续研究奠定了基础。     

高温氧化多孔硅的电子束辐照效应

通过高温氧化处理得到的多孔硅,其阴极射线发光谱呈现明显的三峰结构。峰强随电子束辐照时间而下降。对光致发光很弱的样品,电子束辐照后光致发光明显地增强。红外透射谱及Raman谱分析表明样品基本上成为SiO_x.进一步分析指出三峰可能来源于SiO_x中的缺陷中心发光。电子束辐照在SiO_x禁带中引进了一些缺陷能级,通过这些能级使得紫外线可激发样品发光,出现光致发光增强的现象。     

LiB3O5晶体高温拉曼光谱研究

研究了LiB₃O₅晶体在不同温度下(在300—1173K的温度范围)的拉曼光谱,分析了LBO晶体结构随温度变化的规律.随着温度的升高,LBO晶体的拉曼光谱谱峰都不同程度地向低波数方向移动,也存在不同程度的展宽,同时强度减弱.发现晶体在1100K存在明显相变,与LBO晶体的相图给出的1107K的相变温度基本相符. 关键词： 3O₅晶体')" href="#">LiB₃O₅晶体 高温拉曼光谱 相变     

Comparative investigation of photoluminescence of silicon wire structures and silicon oxide films

Photoluminescence spectra and their dependence on temperature as well as Raman scattering spectra and Atomic Force Microscopy investigations have been used to study the peculiarities of the red photoluminescence band in low-dimensional Si structures, such as porous silicon and silicon oxide films. It has been shown that the red photoluminescence band of porous silicon is complex and can be decomposed into two elementary bands. It was discovered that elementary band intensities depend very much on surface morphology of porous silicon. The same positions of the photoluminescence bands are also observed in silicon oxide films for different oxide composition. Comparative investigation of the PL temperature dependences in porous silicon and silicon oxide films indicates that silicon-oxide defect related mechanisms of some elementary photoluminescence bands are involved.     

Luminescence centers in porous silicon

Photoluminescence studies on porous silicon show that there are luminescence centers present in the surface states. By taking photoluminescence spectra of porous silicon with respect to temperature, a distinct peak can be observed in the temperature range 100–150 K. Both linear and nonlinear relationships were observed between excitation laser power and the photoluminescence intensity within this temperature range. In addition, there was a tendency for the photoluminescence peak to red shift at low temperature as well as at low excitation power. This is interpreted as indicating that the lower energy transition becomes dominant at low temperature and excitation power. The presence of these luminescence centers can be explained in terms of porous silicon as a mixture of silicon clusters and wires in which quantum confinement along with surface passivation would cause a mixing of andX band structure between the surface states and the bulk. This mixing would allow the formation of luminescence centers.     

入射激光功率对硅纳米线拉曼光谱及荧光光谱的影响

一维纳米材料硅纳米线是目前重要的光电材料之一,采用化学气相沉积法制备了硅纳米线,实验研究了不同功率532 nm激光激发下的拉曼光谱和荧光光谱,随着入射激光功率的增加,一阶拉曼光谱出现红移和非对称加宽,而且红移同入射激光功率成正比,光致荧光光谱出现蓝移和双峰结构。使用声子限域效应、应变效应和激光非均匀加热效应对实验结果进行了分析,并采用matlab模拟了入射激光功率同拉曼频移的理论关系曲线,结果表明激光非均匀加热效应是引起拉曼光谱和光致荧光光谱变化的主要原因。     

Optical Analysis of Nanocrystalline ZnO Films Coated on Porous Silicon by Radio Frequency (RF) Magnetron Sputtering

Zinc oxide thin films have been deposited onto porous silicon (PSi) substrates at high growth rates by radio frequency (RF) sputtering using a ZnO target. The advantages of the porous Si template are economical and it provides a rigid structural material. Porous silicon is applied as an intermediate layer between silicon and ZnO films and it contributed a large area composed of an array of voids. The nanoporous silicon samples were adapted by photo electrochemical (PEC) etching technique on n-type silicon wafer with (111) and (100) orientation. Micro-Raman and photoluminescence (PL) spectroscopy are powerful and non-destructive optical tools to study vibrational and optical properties of ZnO nanostructures. Both the Raman and PL measurements were also operated at room temperature. Micro-Raman results showed that the A₁(LO) of hexagonal ZnO/Si(111) and ZnO/Si(100) have been observed at around 522 and 530 cm^–1, re- spectively. PL spectra peaks are distinctly apparent at 366 and 368 cm^–1 for ZnO film grown on porous Si(111) and Si(100) substrates, respectively. The peak luminescence energy in nanocrystalline ZnO on porous silicon is blue-shifted with regard to that in bulk ZnO (381 nm). The Raman and PL spectra pointed to oxygen vacancies or Zn interstitials which are responsible for the green emission in the nanocrystalline ZnO.     

The effect of sub-band gap photon illumination on the properties of GaN layers grown on Si(111) by MBE

Nanostructured GaN layers are fabricated by laser-induced etching processes based on heterostructure of n-type GaN/AlN/Si grown on n-type Si(111) substrate. The effect of varying laser power density on the morphology of GaN nanostructure layer is observed. The formation of pores over the structure varies in size and shape. The etched samples exhibit dramatic increase in photoluminescence intensity compared to the as-grown samples. The Raman spectra also display strong band at 522 cm⁻¹ for the Si(111) substrate and a small band at 301 cm⁻¹ because of the acoustic phonons of Si. Two Raman active optical phonons are assigned h-GaN at 139 and 568 cm⁻¹ due to E2 (low) and E2 (high), respectively. Surface morphology and structural properties of nanostructures are characterized using scanning electron microscopy and X-ray diffraction. Photoluminance measurement is also taken at room temperature by using He–Cd laser (λ = 325 nm). Raman scattering is investigated using Ar⁺ Laser (λ = 514 nm).     

Laser-induced etching of silicon

Conventional fabrication method of porous silicon is anodisation of single crystal silicon in hydrofluoric acid. In this report, we show that it is possible to fabricate porous silicon by laser-induced etching. An earlier report by us has demonstrated the dependence of porous silicon photoluminescence characteristic on the etching laser wavelength [1]. Here we used 780 nm line from a diode laser as the etching source, and the optimum etching conditions were obtained. A simple model was proposed to explain the etching process. Scanning Electron Microscope (SEM) images of the samples support the proposed process.     

Peculiarities of photoluminescence of porous silicon with luminescent liquid crystal fillers

Photoluminescence spectra of porous silicon filled by luminescent liquid crystals 5CB and H109 were investigated. It was observed that there were photoluminescence bands corresponding to both porous silicon and liquid crystal in experimental spectra. In addition, the band corresponding to porous silicon increases in comparison with photoluminescence of porous silicon without the filler. Experimental results are explained by the radiating and nonradiating energy transfer from liquid crystal to porous silicon.     

Quantum confinement and disorder in porous silicon: Effects on the optical and transport properties

Summary The striking optical properties of porous silicon (PS) show a twofold aspect typical of an ordered and a disordered material, respectively. Raman, electron microscopy, and resonant photoluminescence studies indicate that the light emission originates from crystalline regions. On the contrary, several features, like the non-exponential decay of photoluminescence (PL), the broad emission spectrum, the photoluminescence fatigue under light exposure etc. are typical of a disordered material and reminiscent of similar effects founde.g. in amorphous semiconductors. These twoapparently conflicting aspects have for a long time hindered the understanding of the basic light emission mechanism. In this paper we report new optical data showing that disorder in porous silicon leads to strong carrier localisation. Light emission in PS is suggested to occur through transitions involving localized states. Paper presented at the III INSEL (Incontro Nazionale sul Silicio Emettitore di Luce), Torino, 12–13 October 1995.     

基于硅波导的喇曼光放大器

在硅波导上添加反向偏压的PIN结构,当波导产生受激喇曼散射时,可以将波导中双光子吸收(TPA)产生的光生自由载流子扫出波导,降低了波导的非线性损失,极大地提高了硅波导中泵浦光对信号光的喇曼增益。为了应用已经非常成熟的硅工艺,并且应用硅波导使器件小型化,根据法布里-帕罗(F-P)腔和行波放大器理论,在硅波导两端的解理面蒸镀增透膜,应用这种波导的喇曼效应设计了一种光放大器,即基于硅波导的喇曼光放大器。建立了计算放大器增益的方程,给出了不同波导长度和输入功率情况下的放大器增益,得出适当增加波导长度和泵浦光功率可以得到较高喇曼增益的结论。基于硅的光放大器有较高的饱和功率且没有泵浦源的限制,通过调整泵浦激光的波长可以放大不同波长的信号光。