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采用双极脉冲磁控反应溅射法在不同参数条件下制备了一系列氮化硅薄膜。利用数字式显微镜和紫外-可见光光谱仪研究了沉积薄膜的表面形貌及其光学带隙,利用共焦显微拉曼光谱仪比较了硅衬底、氮化硅薄膜退火前后的拉曼光谱。结果表明,氮气流量对薄膜的光学带隙影响较大,制备的薄膜主要为富硅氮化硅薄膜。原沉积薄膜的拉曼光谱存在明显的非晶硅和单晶硅峰,退火处理后非晶硅峰减弱或消失,表明薄膜出现明显的结晶化;单晶硅峰出现频移现象,表明薄膜中出现硅纳米颗粒,平均尺寸约为6.6 nm。 相似文献
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Yb:YAG晶体中的荧光浓度猝灭现象 总被引:4,自引:0,他引:4
在Yb:YAG晶体中发现浓度猝灭现象,对猝灭机制进行了分析研究,指出退火前晶体的荧光浓度猝灭现象主要由Yb^2+、色心和由此产生的晶格畸变所致高掺杂浓度时痕量稀土杂质离子的存在也将导致浓度猝灭,确定了Yb:YAG晶体中Yb^3+的理想掺杂浓度。 相似文献
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To more in depth understand the doping effects of oxygen on Si Ge alloys, both the micro-structure and properties of O-doped Si Ge(including: bulk,(001) surface, and(110) surface) are calculated by DFT + U method in the present work.The calculated results are as follows.(i) The(110) surface is the main exposing surface of Si Ge, in which O impurity prefers to occupy the surface vacancy sites.(ii) For O interstitial doping on Si Ge(110) surface, the existences of energy states caused by O doping in the band gap not only enhance the infrared light absorption, but also improve the behaviors of photo-generated carriers.(iii) The finding about decreased surface work function of O-doped Si Ge(110) surface can confirm previous experimental observations.(iv) In all cases, O doing mainly induces the electronic structures near the band gap to vary, but is not directly involved in these variations. Therefore, these findings in the present work not only can provide further explanation and analysis for the corresponding underlying mechanism for some of the experimental findings reported in the literature, but also conduce to the development of μc-Si Ge-based solar cells in the future. 相似文献
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硅基薄膜叠层太阳能电池中间层的光学设计与计算 总被引:1,自引:0,他引:1
叠层结构是提高硅基薄膜电池效率和稳定性的有效方法,然而子电池电流不匹配使其效率的提升受到限制。为了提高叠层电池的子电池电流匹配度,需选择合适的中间层材料。通过硅基薄膜叠层电池的中间层的光学设计和理论计算,获得了材料折射率与厚度的匹配关系:中间层材料折射率n选取范围为1.59~3.1,中间层厚度d的制备范围为125/n~175/n nm,最佳厚度d为150/n nm。最优中间层材料的折射率和厚度应为:n约为1.59,d约为94.3nm,采用这一条件可最大限度地提高硅基薄膜叠层电池的子电池电流匹配度。从叠层电池中间层的光学特性方面入手为实验研究提供了设计指导。 相似文献
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