共查询到18条相似文献,搜索用时 375 毫秒
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稀土掺杂硅基薄膜的高效发光特性 总被引:1,自引:0,他引:1
测量了在不同离子注入剂量,不同退火条件下的Nd注入Si基晶片室温光致发光谱,结果表明它们均具有蓝、紫发光峰,且发光稳定。在一定范围内发光效率随掺杂浓度的增加而增大,随退火条件的不同而改变。在实验室条件下,对掺杂硅片和单晶硅片进行电化学腐蚀制成多孔硅样片,同时用适当配比的HNO3对以单晶硅为基底的多孔硅进行处理,测试了腐蚀后各类样品的光致发光(PL)谱。发现掺稀土Nd的多孔硅和用HNO3处理的多孔硅的发光效率有显著提高。 相似文献
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在制备出光致发光能量为2.7eV的发射蓝光多孔硅的基础上对它进行了较系统的研究:测量了它的光致发光时间分辨光谱,用傅里叶交换红外光谱分析了其表面吸附原子的局域振动模,研究了γ射线辐照对其发光的影响,并与发红、黄光的多孔硅作了对比,通过空气中长期存放、激光和紫外线照射的方法,研究了光致发光峰能量为2.7eV的多孔硅发光稳定性.我们及其它文献中报道的多孔硅蓝光发射的实验结果与量子限制模型矛盾,但能用量子限制/发光中心模型解释.我们认为多孔硅的2.7eV发光是多孔硅中包裹纳米硅的SiOx层中某种特征发光中心引起的.
关键词: 相似文献
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理论上,采用Bruggeman有效介质近似,研究了有机吸附物对多孔硅微腔的折射率及其光致发光谱的影响.实验上,采用计算机控制的电化学腐蚀法制备了多孔硅微腔样品,并利用机械泵油的蒸气分子与该微腔样品进行相互作用.研究发现,多孔硅微腔发射的窄化光致发光谱对泵油蒸气分子的吸附与脱附很敏感,与之伴随的是该窄化光致发光谱发生明显的峰位移动(可达71nm)和强度变化.结合Bruggeman近似和表面态对多孔硅发光的影响,对实验结果进行了定性解释.实验结果与理论模拟结果符合较好.
关键词:
Bruggeman近似
吸附物
多孔硅微腔
光致发光谱 相似文献
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本文报道了利用离子注入技术制备多孔硅中Er3+的1.54μm光发射发光材料的实验,并对样品的低温光致发光特性进行了实验研究。实验表明多孔硅中的Er3+发光与单晶硅中的Er3+发光(同样注入条件,退火工艺制备)相比,发光强度有成数量级的提高,同时发光峰更宽,伴线更丰富。 相似文献
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为了研究CdS纳米颗粒填充的自支撑多孔硅的光致发光特性,选用电阻率为0.01~0.02Ω·cm的P型硅片,先采用二步阳极氧化法制备自支撑多孔硅,再利用电泳法将CdS纳米颗粒填充入该自支撑多孔硅中.采用扫描电子显微镜、X射线能谱分析、X射线衍射分析、光致发光谱分析对所制备样品的形貌、相结构、组份及发光性能进行研究.实验结果表明:自支撑多孔硅内部成功填充了CdS纳米颗粒,该CdS纳米颗粒衍射峰为(210);CdS纳米颗粒填充的自支撑多孔硅光致发光峰峰位发生红移,且从570nm转移到740nm;电泳时间直接影响CdS纳米颗粒的填充量,导致相关的发光峰强度及发光峰位明显不同. 相似文献
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研究了掺钛水热法制备多孔硅的Raman光谱和光致发光谱.实验发现,当激光功率较低时,多孔硅的Raman光谱在略低于520cm-1附近表现为一锐的单峰,和晶体硅的Raman光谱类似.随激光功率增大,该单峰向低波数移动,Raman和光致发光峰的强度与激光强度的一次方成正比.当激光功率增大到一定值时,该单峰分裂成两个Raman峰,光致发光谱的强度突然增大,与激光强度之间不再满足一次方的关系,位于低波数一侧的Raman峰随激光功率增大进一步向低波数移动.多孔硅Raman光谱随激光功率的变化是
关键词:
多孔硅
Raman光谱
光致发光 相似文献
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多孔硅的光致发光机制 总被引:2,自引:1,他引:1
人们已经提出了许多解释多孔硅发光的理论模型,每个模型都可以针对某些实验现象做出合理的解释,而对其他的实验结果就可能无法解释甚至相悖,因此多孔硅的发光机制至今仍是需要进一步研究和解决的问题。通过改变阳极氧化的条件,制得了一系列样品,其光致发光谱主要有四个峰。随着制备条件的改变,各个峰位的变化不大,但峰值强度比的变化比较大。随着自然氧化时间的延长,各个峰位的变化很小,有红移也有蓝移,有的则基本不变;而峰值强度的减弱幅度较大,但对应于各个峰位幅度的减弱是均衡的。分析实验现象产生的原因,认为多孔硅的发光是多种发光机制共同作用的结果;多孔硅纳米量子线的一定尺寸分布,不仅使光致发光谱存在一定的带宽,而且也是产生多峰现象的原因之一;多孔硅的结构特征对其发光特性起着决定性的作用。 相似文献
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E. S. Demidov I. S. Rassolova O. N. Gorshkov V. K. Vasil’ev M. O. Marychev A. N. Mikhaĭlov D. I. Tetelbaum S. A. Filippov 《Physics of the Solid State》2008,50(8):1565-1569
The effect of combined doping by shallow donor and acceptor impurities on boosting the quantum yield of porous-silicon photoluminescence (PL) in the visible and near IR range was studied using phosphorus and boron ion implantation. Nonuniform doping of samples and subsequent oxidizing annealing were performed before and after porous silicon was formed on silicon single crystals strongly doped by arsenic or boron up to ≈1019 cm?3. The concentration of known Pb centers of nonradiative recombination was controlled by electron paramagnetic resonance. It is shown that there is an optimal joined content of shallow donors and acceptors that provides a maximum PL intensity in the vicinity of the red part of the visible spectrum. According to estimates, the PL quantum yield in the transitional n ++-p + or p ++-n + layer of porous silicon increases by two orders of magnitude as compared to that in porous silicon formed on silicon not subjected to ion irradiation. 相似文献
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自从Canham观察到多孔硅(PS)的可见光致发光后,由于其可望成为可与Ⅲ—Ⅴ族半导体材料相媲美的新型光电子材料而引起了科学界极大的兴趣.目前,制备多孔硅一般都采用电化学腐蚀方法. 相似文献
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We study the influence of the wavelength of picosecond excitation pulses on the properties of photoluminescence (PL) in a series of samples of silicon nanocrystals prepared by ion implantation into silica matrix. We observed a gradual change in the behaviour of the PL fast component (spectral shape, decay times, pump-intensity dependence) when tuning the excitation wavelength from 355 to 532 nm. We interpret the results in terms of an interplay between the PL originating from volume states of nanocrystals containing two photoexcited carrier pairs, and the PL due to the silicon oxide states. We discuss also the role of the implant fluence on the PL properties of samples. 相似文献
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采用离子注入法研究了Co离子注入ZnO晶体的光致发光效应。 对离子注入后的样品在Ar气保护下进行退火处理, 退火温度为700 ℃, 退火时间为10 min, 在其光致发光谱中观察到了406和370 nm的紫光发射峰。 对比了Co, Cu离子分别注入的ZnO晶体的光致发光谱, 观测到二者的光致发光谱类似。 同时, 研究了Co离子注入剂量对样品发光性质的影响, 结果表明随注入剂量的增加绿色发光中心逐渐向低能边偏移, 分析认为绿色发光中心的偏移与离子注入后ZnO晶体的禁带宽度发生改变相关。 In this paper, ion implantation techniques were used to study the photoluminescence(PL) of the Co implanted crystal ZnO. After Co ion implanted, the samples were annealed at 700 ℃ for 10 min in Ar gas flow. It was observed violet emission peak of 406 and 370 nm in the PL spectrum. The PL spectra of the ZnO crystal samples which were implanted by Co ions and Cu ions, respectively, have been compared and observed that the PL spectrum of the Co implanted ZnO is similar to that of the Cu implanted ZnO. We studied the influence of implantation dose on the PL of the Co implanted ZnO and found that the green luminescence centre shifted with increasing of implantation dose. It is concluded that the shift of the green luminescence centre is related to the change of ZnO band gap which was caused by ion implantation. 相似文献
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S. Prucnal M. Turek A. Drozdziel K. Pyszniak S. Q. Zhou A. Kanjilal W. Skorupa J. Zuk 《Applied physics. B, Lasers and optics》2010,101(1-2):315-319
InAs quantum dots (QDs) were successfully formed in single-crystalline Si by sequential ion implantation and subsequent milliseconds range flash lamp annealing (FLA). Samples were characterized by μ-Raman spectroscopy, Rutherford Backscattering Spectrometry (RBS) high-resolution transmission electron microscopy (HRTEM) and low temperature photoluminescence (PL). The Raman spectrum shows two peaks at 215 and 235 cm?1 corresponding to the transverse optical (TO) and longitudinal optical (LO) InAs phonon modes, respectively. The PL band at around 1.3 μm originates from the InAs QDs with an average diameter 7.5±0.5 nm and corresponds to the increased band gap energy due to the strong quantum confinement size effect. The FLA of 20 ms is sufficient for InAs QDs formation. It also prevents the out-diffusion of implanted elements. Moreover, the silicon layer amorphized during ion implantation is recrystallized by solid-phase epitaxial regrowth during FLA. 相似文献
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The photoluminescence and reflectance of porous silicon (PS) with and without hydrocarbon (CHx) deposition fabricated by plasma enhanced chemical vapour deposition (PECVD) technique have been investigated. The PS samples were then, annealed at temperatures between 200 and 800 °C. The influence of thermal annealing on optical properties of the hydrocarbon layer/porous silicon/silicon structure (CHx/PS/Si) was studied by means of photoluminescence (PL) measurements, reflectivity and ellipsometry spectroscopy. The composition of the PS surface was monitored by transmission Fourier transform infrared (FTIR) spectroscopy. Photoluminescence and reflectance measurements were carried out before and after annealing on the carbonized samples for wavelengths between 250 and 1200 nm. A reduction of the reflectance in the ultraviolet region of the spectrum was observed for the hydrocarbon deposited polished silicon samples but an opposite behaviour was found in the case of the CHx/PS ones. From the comparison of the photoluminescence and reflectance spectra, it was found that most of the contribution of the PL in the porous silicon came from its upper interface. The PL and reflectance spectra were found to be opposite to one another. Increasing the annealing temperature reduced the PL intensity and an increase in the ultraviolet reflectance was observed. These observations, consistent with a surface dominated emission process, suggest that the surface state of the PS is the principal determinant of the PL spectrum and the PL efficiency. 相似文献
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Ersin Kayahan 《Journal of luminescence》2010,130(7):1295-1299
In this study, photoluminescence (PL) properties of annealed ZnO thin films deposited onto a porous silicon (PS) surface by rf-sputtering were investigated. A huge blue shift of luminescence from the ZnO deposited onto the PS surface and a broadband luminescence (white luminescence) across most of the visible spectrum were obtained after the heat treatment at 950 °C in air. The results of Fourier Transform Infrared Spectroscopy (FTIR) analysis suggested that the porous silicon surface was oxidized after ZnO deposition and the broadband luminescence was due to the conversion of Si-H bonds to Si-O-Si bonds on the PS surface. The underlying mechanisms of the broadband PL were discussed by using oxygen-bonding model for the PS and native defects model for ZnO. The experimental results suggested that the heat treatment provides a relatively easy way to achieve white luminescence from thin ZnO deposited porous silicon. 相似文献