多孔硅镶嵌C102的蓝绿发光特性

利用多孔硅(PS)独特的微孔结构、非常大的比表面积、很强的吸附能力和灵敏的表面光学性质等特点,将激光染料香豆素102(C102)镶嵌在多孔硅中,得到多孔硅镶嵌C102的复合膜。研究复合膜的荧光特性,我们发现：镶嵌在多孔硅中的C102荧光光谱与其在无水乙醇溶液中的荧光光谱相似,主要呈现单体发光特性;通过比较镶嵌在不同孔隙率中的C102荧光光谱,得知镶嵌在不同多孔硅中的染料分子主要以同种形式存在。另外还发现,放置一段时间后的镶嵌复合膜,荧光强度明显增强,对称性提高,保留了激光染料发光的很多优点。多孔硅镶嵌C102的荧光特性展示了多孔硅在发展固体激光器方面有一定的应用,并为实现硅基蓝绿发光打开新的途径。     

氢等离子体气氛中退火多孔硅的表面和光荧光特性

用电化学腐蚀法制备了多孔硅(PS),在氢等离子体气氛中不同温度下对多孔硅样品进行了退火处理,并进行了光致发光(PL)谱和原子力显微镜(AFM)表面形貌的测量。不同退火温度给PS表面形态带来较大变化,也影响了其PL谱特性。在退火的样品中观察到的PL谱高效蓝光和紫光谱带,我们认为主要源于量子限制发光峰和非平衡载流子被带隙中浅杂质能级所俘获而引起的辐射复合所产生的。在420—450℃退火处理的多孔硅的PL谱上观察到了一个未见诸于报道的紫光新谱带(3．24eV,382nm),其发光机理有待于进一步研究。     

退火氧化生成的硅锗低维结构的光致发光性质

用激光辐照辅助电化学刻蚀的方法加工硅锗薄膜样品,30min后,在样品表面形成了多孔状的结构,该结构在724nm处有很强的光致发光(PL)峰。将该多孔状结构的样品置于高温氧化炉中进行不同时间的退火氧化处理后,发现在不同的退火氧化条件下样品的PL光谱发生了明显的变化。通过分析,作者根据量子受限(QC)和量子限制-发光中心(QCLC)模型,建立了新的量子受限-晶体与氧化物界面态综合模型来解释样品PL发光的变化。     

多孔硅激光染料镶嵌膜的荧光光谱研究

本文对以多孔硅为载体，镶嵌激光染料形成复合膜的光致发光进行了研究，比较了镶嵌膜与其他不同状态下染料发光的差异，发现镶嵌染料荧光光谱线型较其他状态下明显趋于对称，同时考察了衬底情况的改变对镶嵌膜发光的影响。通过对实验结果的分析指出，这种硅基镶嵌膜中的染料的发光主要来自单体的荧光发射。     

Rh6G/氧化多孔硅复合膜的荧光光谱

为了发展性能良好的固体染料激光器,多孔介质中镶嵌激光染料是一种可行的途径。将氧化多孔硅作为基质材料,通过浸泡的方式将激光染料Rh6G嵌入其中,形成Rh6G/氧化多孔硅复合膜,对比研究了Rh6G在无水乙醇、多孔硅、多孔氧化硅中的荧光特性。结果表明,经高温氧化后,氧化多孔硅透明度提高,其荧光强度明显变弱,在复合膜中已检测不到其荧光行为。相比于在无水乙醇溶液中,在氧化多孔硅中Rh6G发射光谱的半峰全宽有所展宽,峰值波长略有红移,对称性大为提高,具有类似单体发光特性,这种现象与纳米孔对Rh6G的聚集程度的限制有关。     

多孔硅量子点中的电子局域态

经过激光辐照和高温退火加工能够生成多孔硅样品,在650—780 nm处检测到很强的光致荧光（PL）峰,并且有明显的钉扎和增强效应.实验表明,这种PL发光的强度与样品受辐照和退火的时间短密切相关.通过第一性原理模拟计算发现,样品表面用SiO 双键和Si—O—Si桥键钝化,能隙中会出现电子局域态.激光辐照和高温退火的时间长短决定了样品表面SiO双键和Si—O—Si桥键的密度,而该密度正是影响多孔硅量子点中电子局域态生成的关键. 关键词： 多孔硅量子点 硅氧钝化键 电子局域态     

提高多孔硅传感特性的一种新方法(英文)

研究了多孔硅(PS)吸附有机溶剂分子后对多孔硅荧光谱的淬灭效应。结果表明:淬灭多孔硅发光的有机溶剂分子是极性分子,有机溶剂分子的极性不同对多孔硅发光的淬灭程度也不同,且有些有机溶剂分子吸附氧化多孔硅比吸附多孔硅引起的发光淬灭具有更好的可逆性和选择性;用含有胺基的正丁胺(CH3CH2CH2CH2-NH2)作碳源,用射频辉光放电等离子系统在多孔硅表面沉积c n膜对多孔硅进行钝化处理后发现:其电致发光强度明显增强,发光峰位兰移,且在大气中存放60天后,其电致发光谱强度基本不衰减,峰位不再移动。经钝化处理的器件较未经处理的器件具有小的串联电阻Rs和低的驱动电压。这为提高多孔硅的传感特性提供了一种新方法。     

多孔硅表面形貌的观测和探讨

一、引言多孔硅室温下较强的光致发光现象给全硅大规模光电集成电路和硅基发光器件的开发带来曙光，但要把它变为现实仍有许多问题要解决，就以发光机理为例，仍有不同意见[1].为此必须深入研究其特性，为探讨发光机理提供依据.已有作者观察到发光畴区[2]，测得多孔硅成分近于二氧化硅[3]，观察到快和慢的发光带[4]以及证实自然氧化引入新的表面态[5]等.但迄今为止测量的均为晾干后的多孔硅，而未深究在空气中贮存干燥过程中形貌的变化.本文对多孔硅在空气中贮存初期表面形貌的变化做了显微观测和探讨.还尝试测量了多孔硅／硅的界面特性.二…     

自然氧化引起的多孔硅光致发光光谱移动问题

多孔硅发光是激发电子通过表面态间接的复合过程。自然氧化引入新的表面态，改变了表面态的分布，从而引起了多孔硅光致发光光谱的移动。 关键词：     

水蒸气退火多孔硅发光性能的正电子谱学研究

使用正电子湮没寿命谱和正电子寿命-动量关联谱对水蒸气和真空条件下退火的多孔硅样品的微观缺陷结构进行表征,结合发射光谱测量结果,对影响多孔硅发光性能的因素进行了讨论.实验结果表明,水蒸气退火后样品孔壁表面的悬挂键减少,并出现新的E′γ和EX类缺陷.水蒸气退火后样品中两种缺陷数量发生变化是导致多孔硅样品发光增强的直接原因;真空退火未使样品中发光相关缺陷发生变化,样品的发光性能没有显著改变.     

White light luminescence from annealed thin ZnO deposited porous silicon

In this study, photoluminescence (PL) properties of annealed ZnO thin films deposited onto a porous silicon (PS) surface by rf-sputtering were investigated. A huge blue shift of luminescence from the ZnO deposited onto the PS surface and a broadband luminescence (white luminescence) across most of the visible spectrum were obtained after the heat treatment at 950 °C in air. The results of Fourier Transform Infrared Spectroscopy (FTIR) analysis suggested that the porous silicon surface was oxidized after ZnO deposition and the broadband luminescence was due to the conversion of Si-H bonds to Si-O-Si bonds on the PS surface. The underlying mechanisms of the broadband PL were discussed by using oxygen-bonding model for the PS and native defects model for ZnO. The experimental results suggested that the heat treatment provides a relatively easy way to achieve white luminescence from thin ZnO deposited porous silicon.     

Luminescence properties of Er in SiN/PS : Er

The decrease in luminescence from host porous silicon (PS) by thermal annealing prevents the optical activation of Er ions. We prepared a SiN layer on erbium-doped porous silicon (PS : Er) as the capping layer by photo-chemical vapor deposition (photo-CVD). After deposition of SiN, the sample was annealed in pure Ar atmosphere for optical activation. We observed an Er-related emission at 1532 nm with a full-width at half-maximum (FWHM) of 10 nm at 18 K from the sample with the SiN layer. In contrast, no emission was observed from the sample without the SiN layer. At 300 K, the peak intensity of Er³⁺-related photoluminescence (PL) for the sample annealed at 1100°C decreased to 40.0% of that observed at 18 K. From these results, it was found that the SiN layer on PS:Er is useful for both host PS and Er-related 1.5 μm luminescences.     

大气中长期存放与长时间热氧化后多孔硅光致发光峰能量的会聚

改变阳极氧化的工艺条件,制备出光致发光峰能量位于1.4—2.0eV范围内的大量多孔硅样品,其中45块样品在大气中存放一年,102块样品在200℃下热氧化(累计达200小时).在上述两种情况下,光致发光峰能量在氧化后都会聚到1.70—1.75eV能量范围.假设在充分氧化的多孔硅中包裹纳米硅的氧化层中,存在发光能量处于～1.70—1.75eV的发光中心,上述实验结果可以用量子限制/发光中心模型解释. 关键词：     

Effect of surface modification by thermally oxidization and HF etching on UV photoluminescence emission of porous silicon

Photoluminescence of porous silicon (PS) is instable due perhaps to the nanostructure modification in air. The controllable structure modification processes on the as-prepared PS were conducted by thermal oxidization and/or HF etching. The PL spectra taken from thermally oxidized PS showed a stable photoluminescence emission of 355 nm. The photoluminescence emission taken from both of PS and oxidized porous silicon (OPS) samples etched with HF were instable, which can be reversibly recovered by the HF etching procedure. The mechanism of UV photoluminescence is discussed and attributed to the transformation of luminescence centers from oxygen deficient defects to the oxygen excess defects in the thermal oxidized PS sample and surface absorbed silanol groups on PS samples during the chemical etched procedure.     

Study of photoconductivity and photoluminescence of organic/porous silicon complexes

In this paper, time-varying photoconductivity (PC) and the photoluminescence (PL) of different complexes were studied. Due to thick polymer layer hindering light penetrating into porous silicon (PS) layer, intrinsic PS luminescence in polymer/PS system disappeared. The physical origin of PL may be related to the recombination mechanisms involving surface defect states such as silicon oxide, siloxene. Due to carrier transfer controlled by different energy barrier, different devices prepared from different doped Si wafer showed opposite current-voltage characteristic.     

多孔硅在30~180℃温区光致发光谱的研究

对长期存放在空气中的多孔硅样品和即时制备的多孔硅样品分别在室温~180℃下进行了光致发光（PL）温度效应的研究.两类样品的PL呈现不同的变化规律.前者的PL还表现为双峰,且长波PL峰随温度升高蓝移;后者的PL表现为单峰,且PL峰位随温度升高红移.基于量子限制效应对后者进行了解释;而前者难以用分立的量子限制和表面发光中心模型来解释,实验结果表明两种机制之间可能有较复杂的耦合效应发生.     

Electronic-Excitation Energy Transfer between Dye Molecules Adsorbed in One-Dimensional Photonic Crystals

Electronic-excitation energy transfer between molecules of Coumarin 7 (donor) and Rhodamine B (acceptor) have been experimentally investigated in one-dimensional photonic crystals based on oxidized mesoporous silicon and in a similar matrix, which does not possess the properties of a photonic crystal. The efficiencies of excitation transfer between donor and acceptor molecules have been determined based on the donor-fluorescence quenching and sensitized acceptor luminescence. It is established that the efficiency of electronic-excitation energy transfer in a photonic crystal increases in comparison with that for porous silicon.     

Manipulation of Spontaneous Emission Dynamics of Organic Dyes in the Porous Silicon Matrix

The control of the spontaneous emission (SE) rate of dye molecules (4-dicyanomethylene-2-methyl-6-p-dimethylaminostyryl-4H-pyran (DCM) and Coumarin 523 (C523)) embedded in the Porous Silicon (PS) matrix has been studied using picosecond resolved fluorescence decay and polarization studies. We have shown that the SE rates of the two organic dyes embedded in the PS matrix depend on the relative positions of the emission maxima of the dyes with respect to electronic band gap energy of the PS matrix. We have also explored that the electronic band gap of the host PS matrix can easily be tuned by partial oxidation of the PS and the nature of SE of the embedded dyes can be tuned accordingly. The demonstrated retardation or enhancement of the spontaneous photon emission may enable the application of fluorescent organic molecules in PS matrix in several quantum optical devices including the realization of single photon sources.     

Thermal annealing dependence of some optical properties of plasma-modified porous silicon

The photoluminescence and reflectance of porous silicon (PS) with and without hydrocarbon (CH_x) deposition fabricated by plasma enhanced chemical vapour deposition (PECVD) technique have been investigated. The PS samples were then, annealed at temperatures between 200 and 800 °C. The influence of thermal annealing on optical properties of the hydrocarbon layer/porous silicon/silicon structure (CH_x/PS/Si) was studied by means of photoluminescence (PL) measurements, reflectivity and ellipsometry spectroscopy. The composition of the PS surface was monitored by transmission Fourier transform infrared (FTIR) spectroscopy. Photoluminescence and reflectance measurements were carried out before and after annealing on the carbonized samples for wavelengths between 250 and 1200 nm. A reduction of the reflectance in the ultraviolet region of the spectrum was observed for the hydrocarbon deposited polished silicon samples but an opposite behaviour was found in the case of the CH_x/PS ones. From the comparison of the photoluminescence and reflectance spectra, it was found that most of the contribution of the PL in the porous silicon came from its upper interface. The PL and reflectance spectra were found to be opposite to one another. Increasing the annealing temperature reduced the PL intensity and an increase in the ultraviolet reflectance was observed. These observations, consistent with a surface dominated emission process, suggest that the surface state of the PS is the principal determinant of the PL spectrum and the PL efficiency.     

Interaction between rare-earth ions and amorphous silicon nanoclusters produced at low processing temperatures

Temperatures of 1000 °C and higher are a significant problem for the incorporation of erbium-doped silicon nanocrystal devices into standard silicon technology, and make the fabrication of contacts and reflectors in light emitting devices difficult. In the present work, we use energy-filtered TEM imaging techniques to show the formation of size-controlled amorphous silicon nanoclusters in SiO films annealed between 400 and 500 °C. The PL properties of such films are characteristic of amorphous silicon, and the spectrum can be controlled via a statistical size effect—as opposed to quantum confinement—that has previously been proposed for porous amorphous silicon. Finally, we show that amorphous nanoclusters sensitize the luminescence from the rare-earth ions Er, Nd, Yb, and Tm with excitation cross-sections similar in magnitude to erbium-doped silicon nanocrystal composites, and with a similar nonresonant energy transfer mechanism.