横向各向同性柱状复合结构对超声波的散射

首先描述了横向各向同性复合圆柱结构的入射声场、散射声场及内部的驻波声场，然后利用转移矩阵方法导出了求解散射声场的方程组，计算了铝／各向异性界面层／纤维复合结构对斜入射声波的背向散射谱和散射截面积。将柱状复合结构中各向异性界面薄层相应的转移矩阵作渐近展开，建立了模拟这种界面薄层的弹簧模型及界面处广义边界条件。结果表明，模型中劲度常数仅依赖于界面薄层厚度及界面层媒质的弹性常数Ｃｌｌ，Ｃ１２和Ｃ４４，而振子质量与Ｃｌｌ，Ｃ４４，Ｃ１３和Ｃ３３有关。     

单层膜体吸收与界面吸收研究

采用热透镜测量方法进行了SiO₂和HfO₂单层膜的体吸收与界面吸收分离研究.首先推导了光从薄膜侧及基底侧入射时单层膜内的驻波场分布,给出了单一厚度薄膜分离体吸收和界面吸收的计算方程式以及求解薄膜消光系数的方法.利用电子束蒸发工艺制备了半波长光学厚度(λ=1064 nm)的SiO₂和HfO₂单层膜,通过热透镜的测量数据实际分离了两种薄膜的体吸收和界面总吸收.计算结果表明,对于吸收小至10^{-6关键词： 驻波场理论 光热技术 薄膜吸收 消光系数}     

Ce1.66Mg1.34Co3和α″-Fe16N2多层梯度膜磁反转性质的微磁学模拟

为了改善永磁薄膜的磁性能,基于微磁学理论,使用编程软件OOMMF针对Ce_1.66Mg_1.34Co₃和α″-Fe₁₆N₂交换耦合多层梯度膜的磁化过程进行模拟,系统研究磁晶各向异性梯度对多层膜性能的影响,分析体系的剩余磁化强度、矫顽力、磁滞回线和磁化反转过程中的能量变化。研究表明：减小磁晶各向异性梯度或增加界面处磁晶各向异性的差值,可以有效提高薄膜的矫顽力和剩余磁化强度,从而改善磁性能。通过计算磁矩分布发现一种磁涡旋态,这种磁涡旋态的产生过程伴随系统能量的增加。     

基底微缺陷对介质薄膜光学性能影响的理论研究

基于非均匀膜理论提出一种存在微缺陷的介质基底的折射率分层模型，将基底依次分为表面层、亚表面层和体材料层，其中表面层和亚面层分别等效为折射率服从统计分布的非均匀膜，将它们分别再次细分为N₁和N₂个子层，每一子层均视为均匀介质 膜.应用光学薄膜特征矩阵法对其进行理论分析，并对单层介质膜的光学性能进行数值计算. 研究结果表明：基底的表面和亚表面微缺陷改变了薄膜和基底的等效折射率，导致了准Brew ster角和组合反射率与理想情形的偏离.同时这些微缺陷也改变了光在薄膜和基底中的传播 特性，因此反射相移和相位差均偏离理想情形.在研究基底的微缺陷对多层介质膜光学性能 影响的分析和计算时，该模型同样适用. 关键词： 微缺陷 介质薄膜 非均匀膜 光学性能     

基底上覆分层薄膜超声Scholte波特性与薄膜定征

分层薄膜-基底结构广泛应用于微电子器件等诸多领域,但薄膜材料参数超声测量尤其是横波速度的定征是一个困难的问题。本文对液固界面Scholte界面波的频散特性和脉冲激励的声压响应进行了理论分析。结果表明,液固界面Scholte波频散与分层膜-基底结构的速度分布密切相关。薄膜材料各层的厚度和横波速度对界面波频散特性有显著影响。基于Scholte界面波的频散特性,提出了一种多层膜的多参数反演定征方法。首先针对理论信号进行薄膜参数反演,验证了该方法的可行性。后续对不同类型的多层膜材料样品进行了液固界面波激发与采集实验,实验信号的薄膜参数反演结果进一步验证了该方法的可行性和有效性。     

各向异性介质缺陷单负媒质光子晶体的新型缺陷模

电负媒质和磁负媒质组成的一维光子晶体中存在一种几乎不受电磁波入射角和极化影响的零相位能隙.为了能够调节这种能隙的频率,通过在此类光子晶体中心插入一层各向异性媒介,构造出两层电负扣磁负媒质交替的一维光子晶体.采用Berreman 4×4矩阵法计算了该结构的透射谱,结果显示:调节双轴晶体主轴围绕实验坐标系z轴的旋转角度可以改变缺陷模频率的大小,并且该缺陷模的频率不随入射角度的变化而改变.该特性可以用于光波频率可调的单通道窄带滤波器的制作.     

用于液晶电光特性计算的无奇异点2×2矩阵研究

Berreman的矩阵法是研究和计算液晶光学特性的通用方法.为了减少计算量,近年来许多学者致力于简化其方法以提高计算速度,本文根据各向异性介质中光传播的电磁场理论以及光学折反射定律,在保证其准确性的同时,推出了新的矩阵方法.这种2×2矩阵公式表示相当简单.理论研究结果表明,该方法减少了以往的计算量,快速简洁,结果准确.     

各种晶体界面上的全反射

本文研究了晶体界面上的全反射.我们如何计算迅衰波的复折射率、复折射角和复电场矢量.还研究了全反射时的反射和透射系数.这一方法既能应用于晶体-晶体界面,也能应用于各向同性媒质-晶体界面.晶体可以是双轴的,也可以是单轴的.晶体主轴的方位可以是任意的.所以它是研究晶体界面上全反射的一般方法.     

电磁偏置各向异性石墨烯界面的传播矩阵

基于电磁场边界条件和相位匹配,推导出电、磁偏置下呈各向异性的石墨烯导电界面的传播矩阵,并进一步给出各向异性石墨烯界面的反透射系数解析解;该传播矩阵耦合了基本的横电波和横磁波极化,并包括偏置电、磁场的影响.将跨石墨烯界面传播矩阵嵌入各向同性分层介质传播矩阵,获得的新传播矩阵可用于解析分析平面电磁波以任意角度入射含各向异性石墨烯界面层状介质时的传播和反透射特性,并且为分层介质与各向异性导电界面复合结构的相关分析和设计提供了一种非常简单的工具.     

倾斜入射薄膜滤光片偏振控制的优化算法

利用多层膜的特征矩阵关系式和有效界面法,推导出间隔层的厚度和有效折射率与两个偏振分量的中心波长差值和通带半宽差值之间的三个隐函数表达式.通过调整薄膜滤光片间隔层的厚度和有效折射率,控制两个偏振分量中心波长的相对位置.模拟计算表明:改变间隔层的有效折射率和厚度,可以调整中心波长差值和通带半宽差值,实现两个偏振分量截止偏振不分离或中心波长偏振不分离.优化算法可以实现对倾斜入射薄膜滤光片的偏振控制.     

Photoinduced linear and/or circular birefringences from light propagation through amorphous or smectic azopolymer films

The self-induced rotation of the azimuth of elliptically polarized light passing through birefringent azopolymer thin films is investigated. The experiments were carried out on thin films of the amorphous p(DR1M-co-MMA) and p(DR1M) azopolymer samples and of the p(6MAN) derivative in its glassy and liquid-crystalline phases. In fact, using various controlled input light ellipticities, linear birefringence (LB) and/or circular birefringence (CB) measurements were performed separately and in conjunction with polarization analyses of the transmitted pump beam. According to a general theoretical analysis based on Jones’ matrix formalism, it is thus shown that the induced rotation angle through the films depends mainly on the ellipticity of the input light, on the generated LB level and, to a lesser extent, on the CB photoinduced in the liquid-crystalline phase. In the latter case, it is concluded that irradiation with circularly polarized light does induce a chiral arrangement in the polymer film, although the photosensitive chromophores do not contain any optically active group. Received: 22 April 2002 / Revised version: 28 May 2002 / Published online: 25 September 2002 RID="*" ID="*"Corresponding author. Fax: +33-5/5684-8402; E-mail: csouri@morgane.lsmc.u-bordeaux.fr     

Equilibrium and kinetic surface segregation in binary alloy thin films

A general theoretical analysis of the effect of film thickness on equilibrium and kinetic surface segregation in binary alloy thin films is presented. In this analysis, a constrained condition that represents the finite size of thin film system has been introduced to the modified Darken model, which has been used to describe both equilibrium and kinetic surface segregation in bulk materials. Simulation of surface segregation for alloy thin films can be carried out for all composition ranges and all film thicknesses if only knowing the surface segregation parameters for bulk materials. Simulations of equilibrium and kinetic surface segregation in Cu(1 1 1)Ag binary alloy thin film are presented.     

Simple system for evaluating retardation of liquid crystal cells using grating type liquid crystal polarization splitters

We propose a unique optical system for measuring the retardation of birefringent films using a pair of liquid crystal (LC) gratings; that is, the examined birefringent films are inserted between two LC gratings. Because the LC grating functions as a polarization beam splitter for circularly polarized light, the proposed system is optically equivalent to the measurement system using a pair of two circular polarizers. First, the polarization splitting performance of the LC grating is discussed. It is found that a sufficiently high voltage (such that the retardation is less than a half wavelength) has to be applied for the almost pure circularly polarized diffracted light. Next, the measurement of the retardation of a homogeneous LC cell as an examined birefringent film was demonstrated using the proposed method. The proposed method is revealed to have the same measurement performance as that of the conventional method using a pair of linear polarizers and has an advantage that there is no need for the optic axis of the test birefringent specimen to be set at a specific angle.     

Polarization Fizeau interferometer based on birefringent thin film

A polarization Fizeau interferometer based on birefringent thin film is presented. The interferometer adopts a birefringent thin film to obtain orthogonally polarized and strictly common-path reference and test beams. Advantages include ease of implementation on large-aperture interferometer, measuring test optics from long distance, and achieving high fringe visibility. The phase shift is obtained by combining a quarterwave plate and an analyzer. The concepts illustrated are verified experimentally.     

Electric field generated solitons,disclinations and vortical flows in freely suspended nematic 8CB

We present the results of optical studies on the instabilities in a substrate-free nematic 8CB film, subject to an in-plane electric field. The initial director field involves a −1/2 strength disclination loop, separating the central pseudoisotropic zone from the splay-bend (SB) birefringent boundary. Three regimes of sample thickness are distinguishable on the basis of field-induced instabilities. Thick (∼75 μm) films display growth of SB zones (independently of disclination movement), wall-formation, and reversible transition between walls and disclinations. Moderately thick films, a few μm in the central part, exhibit distinctive undulations at the border of advancing SB layers. Submicron thin films, with smectic-like homeotropic central plateau, show spectacular isotropic vortex-pairs at either end of this plateau. Further, the end regions of the birefringent zone exhibit both electro-convective flows and reorientational effects. The latter are associated with the formation of open and closed walls, and loop-wall emission. The final high field instability involves jet-like flows at the two ends of the film.     

金属微粒-介质复合薄膜(Au-BaO,Cu-BaO)的光吸收

对真空沉积方法制备的贵金属微粒(Au,Cu)与介质(BaO)构成的复合薄膜做了近紫外—可见光吸收光谱分析.两种薄膜的吸收谱有明显不同，Au-BaO薄膜的吸收谱图可观察到等离激元共振吸收和带间跃迁吸收，而Cu-BaO薄膜在可见光波段有几个吸收峰，这是因为Cu微粒在薄膜生长中形成了非常小的颗粒.当贵金属含量不同时，吸收谱有不同的特征. 关键词：     

薄膜的光谱发射率

本文讨论了薄膜内的多次反射对低吸收薄膜光谱发射率的影响。这里推导出的薄膜发射率的表达式与薄膜厚度d和其光学常数n(λ）和k(λ）有关。在d→∞的特殊情况下，薄膜发射率与大块材料发射率相等。给出了实际数值评价及发射率与d、n(λ）和k(λ)相互关系的更为精确的数值结果。     

Thickness transitions in thin films: The equilibrium

The thermodynamic and thickness equilibria of planar solid, liquid or gaseous thin films are described in terms of the film excess chemical potential μ_ex. A general formula is given which relates μ_ex to the short- and/or long-range surface forces associated with the two film surfaces and the dependence of the film specific surface free energy σ on the film thickness h is expressed through μ_ex. The conditions under which the thin films are in stable or metastable thermodynamic equilibrium are analyzed and it is shown that the metastable thin films are subject to thickness transitions involving abrupt changes of h. The thin film thickness equilibrium, i.e. the coexistence between two films of different thickness, is also considered and the film equilibrium chemical potential characterizing this equilibrium is determined by means of μ_ex and σ.     

Accuracy of Determining the Optical Parameters of Thin Films by the Method of the Reflectance-Spectrum Extrema Envelopes

A technique to evaluate the accuracy with which the optical parameters of thin films are determined by the method of reflectance-spectrum extrema envelopes is presented. The general case of s-polarized light impinging obliquely on a weakly absorbing thin film formed on an absorbing substrate is discussed. Rather simple analytical expressions are derived which can easily be used in program realization on computers for calculating errors. On the basis of the error analysis, a procedure for determining the optical constants and thickness of thin films is proposed, which allows one to reach the maximum accuracy in solving the inverse problem of spectrophotometry. The optical constants and the thicknesses of the films of perylenetetracarboxylic acid and 2-[4-(4-aminophenyl)phenyliminomethyl]phenol formed on silicon substrates are found by the developed technique in the spectral range 550–900 nm.     

10.6μm激光辐照下光学薄膜的微弱吸收测量

 建立了表面热透镜技术测量光学薄膜微弱吸收的实验装置，对10.6μm CO₂激光辐照下镀制在Ge基底上的不同厚度的单层ZnS，YbF₃薄膜，以及镀制在Ge基底上不同膜系的（YbF₃/ZnSe）多层分光膜的弱吸收进行了测量，并对实验结果作了分析和讨论。实验结果表明，利用本实验系统已测得的待测样品的最低吸收为2.87×10^-4，测量系统的灵敏度为10^-5。