基于倏逝波照明的空间移频超分辨成像技术研究

空间移频超分辨成像技术利用样品表面的微纳结构对照明倏逝波的散射,使其转换为传播波,并将倏逝波携带的高频空间信息转换成低频信息,可被远场的显微物镜所接收,实现超分辨成像.其极限分辨率由照明的倏逝波波长决定,但分辨率仅在倏逝波波矢方向上有提升.在现有的棱镜全反射倏逝波生成方案中,倏逝波的最短波长受棱镜折射率的限制,因此其最高分辨率也受限制;且生成的倏逝波波矢为单一方向,因此分辨率存在方向差异性.为解决上述问题,建立了完整的空间移频超分辨成像仿真模型,并提出了一种新型倏逝波生成方案,可利用微纳结构产生波长更短、具有全方向波矢的倏逝波.结果显示,新方案可产生波长更短的倏逝波,并消除成像分辨率的方向差异性,从而避免现有方案中的多方位成像和图像后处理.空间移频超分辨成像技术具有大视场、高分辨、结构简单、操作方便、无需逐点扫描、可与普通光学显微镜兼容等优点,改进后将具有更广阔的应用空间.     

表面等离子体平面金属透镜及其应用

由于衍射极限的存在,传统光学透镜成像分辨率理论上只能达到入射光波长的一半。通过恢复和增强携带物体细部特征信息的高频倏逝波,基于表面等离子体的平面金属透镜有望突破这种光学衍射极限,实现超分辨成像。本文对平面薄膜式与纳米结构式两类平面金属透镜进行了综述,详细介绍了若干典型平面金属透镜的结构设计、工作机理及其聚焦性能,并对其特点与存在的问题进行了分析与讨论。由于光波在金属中传播时存在一定损耗,如何更高效地增强高频倏逝波信号并转换成传播波,使其参与成像,以更好地实现远场超分辨成像,以及如何进一步增大近场超高分辨率聚焦光斑焦深以及减小远场聚焦光斑尺寸,是表面等离子体平面金属透镜进一步研究的重点。     

源嵌入正折射率传输线介质板内的倏逝波和成像特性

 提出了点源嵌入正折射率介质板进行亚波长成像的新方法,分析了位于负折射率媒质里的正折射率介质板内外的电压倏逝波和电压传播波分布。正和负折射率媒质分别由2维未加载传输线和2维加载电感、电容传输线网络组成。微波电路和数值仿真结果都显示由于板内增大的倏逝场,在正折射率介质板的两个界面附近出现了很大的电压幅度,该结果证实了该正折射率介质板透镜能够恢复电压倏逝波,从而提高像的分辨率。     

含负折射率介质的多层结构中倏逝波传播及隧道效应的分析

研究了倏逝波在含负折射率介质的多层平板结构中的传播特性，解析地分析了倏逝波在不同结构参数下的放大或衰减规律及其原因以及能流的分布，并着重讨论了负折射率介质的损耗对隧道效应的影响，最后通过模拟高斯光束在该结构中的传播和能量储存，形象地给出了负折射率介质的损耗对倏逝波的影响和对光子隧道效应的减弱. 关键词： 负折射率介质 倏逝波 隧道效应     

基于倏逝波界面散射的单个纳米颗粒无标记成像

介绍了一种利用倏逝波界面散射对单个纳米颗粒进行无标记成像的方法。分别使用全内反射(TIR)倏逝波与表面等离激元(SPPs)两种倏逝波与单个纳米颗粒相互作用,激发纳米颗粒极化并发生散射,所产生的界面散射与入射倏逝波发生干涉,形成了纳米颗粒极化场与抛物线形干涉条纹的特征成像。分别对直径为500,200,100nm的聚苯乙烯颗粒进行了单个纳米颗粒无标记成像。比较了两种倏逝波界面散射对单个纳米颗粒成像结果,发现表面等离激元界面散射成像中的单个纳米颗粒极化强度约是全内反射极化强度的10倍,并且接近于暗场成像。因此,表面等离激元界面散射对单个纳米颗粒无标记成像具有更高灵敏度。所提单个纳米颗粒无标记成像方法可以拓展到病毒检测、生物单分子成像等领域。     

光学超振荡与超振荡光学器件

传统光学器件的衍射极限极大地制约了远场超分辨光学系统的进一步发展.如何从光学器件层面突破光学衍射极限瓶颈,实现非标记远场超分辨光学成像,是光学领域面临的巨大挑战.光学超振荡在不依靠倏逝波的条件下,可以在远场实现任意小的亚波长光场结构,这为突破光学衍射极限提供了一条崭新的途径.近年来,光学超振荡现象和超振荡光学器件的相关研究得到了快速发展,在理论和实验上成功地演示了超振荡光场的产生和多种超振荡光学器件,并在实验上展示了超振荡光学器件在非标记远场超分辨光学显微、成像以及超高密度数据存储等应用领域的巨大优势和应用潜力.本文对光学超振荡相关理论、超振荡光学器件设计理论和方法、超振荡光学器件发展现状、超振荡光场测试方法以及超振荡光学器件的应用等方面进行详细介绍和分析.     

超振荡及其远场聚焦成像研究进展

带限函数在某区间内的振荡速度超过其最高傅里叶分量的特殊性质被称为超振荡.基于超振荡原理的微纳光子学器件可在不依赖倏逝波条件下于远场处突破衍射极限,因此在超分辨成像、纳米光刻及高密度光存储等领域具有重要应用.简要介绍了超振荡原理,重点归纳了几种超振荡微结构器件的设计及其聚焦成像性能,并指出了这些器件的不足及未来的研究重点.     

基于数字全息术的近场成像与应用

近场是指局域在物体表面附近亚波长范围内的空间区域。倏逝波存在于近场区域,可利用其与物质的相互作用特性对位于近场区域的某些介质样品进行高分辨率成像,及对样品物性变化进行高灵敏度测量,其中,基于全内反射和表面等离子体共振的近场成像与测量方法已在许多领域获得广泛应用。将数字全息术与这类近场测量方法相结合,可进一步有效解决自近场区域反射光波的相位分布的高精度全场动态测量问题。重点介绍基于全内反射数字全息术和表面等离子体共振全息显微术的近场成像方法与测量应用研究进展。     

一种增强LED光提取效率的新方法

本文从分析全内反射中的近场倏逝波出发,提出了在近场倏逝波衰减长度内置一金属Ag光栅的LED结构模型,同时基于时域有限差分(FDTD)方法计算了此模型的光谱特性,分析了此LED模型的光提取效率。结果表明置入的金属Ag光栅在特定的波段可以将近场倏逝波耦合为传播波模式辐射出去,从而有效地增强了LED的光提取效率。     

金属薄膜亚波长近场成像特性研究

采用基于等离子体物理模型的时域有限差分方法模拟了金属薄膜近场成像特性;采用薄膜传输矩阵方法计算了金属薄膜对倏逝波分量的放大作用.实现了周期为1μm的Cr光栅的成像实验,验证了平板金属薄膜的模拟成像特性. 关键词： 时域有限差分 金属薄膜 近场亚波长成像 传输矩阵方法     

Guided wave topological imaging of isotropic plates

Topological imaging is a recent method. So far, it has been applied to bulk waves, and high resolution has been demonstrated for imaging scatterers even with a single ultrasonic insonification of the inspected medium. This method consists of (i) emitting waves and measuring the response of the medium; (ii) solving two propagation problems: the direct problem, where the experimental source is simulated, and the adjoint problem, where the source is the time-reversed difference between the measured wave field and that obtained from the direct problem; (iii) computing the image by simply multiplying both wave fields together in the frequency domain, and integrating over the frequency. The speed of the method depends only on the cost of the field computations that are performed in the defect-free medium. The present work deals with the application of topological imaging to plate guided waves. Combining modal theory and Fourier analysis, the computations are performed in a very short time. In the investigated cases, two-dimensional in-plane imaging is based on propagation of the single S0 Lamb mode. Despite very high dispersion of that mode, scatterers are accurately located and the spatial resolution is equal to about one wavelength.     

基于宽带立体超透镜的远场超分辨率成像

为突破传统衍射极限实现远场超分辨率成像,提出了一种微波频段宽带立体超透镜用于目标远场超分辨率成像.该透镜可将携带着目标超分辨率信息的凋落波分量转换为传播波分量辐射到远场,进而可在远场接收这些信息并用于超分辨率成像.分别从频域和时域两方面对该透镜的超分辨率特性进行验证.在频域,利用多重信号分类算法对借助于该结构的扩展目标实现了λ/12的远场超分辨率成像,大幅度提升了成像效果.在时域,结合时间反演技术,验证了带宽提升对空间超分辨率聚焦特性带来的明显优势.     

Evanescent waves of an annular left-handed material lens

The imaging system formed by an annular left-handed material （LHM） lens as well as the evanescent waves in the lens are simulated numerically with a finite-difference time-domain （FDTD） method. For b - a 〉 λ （a and b are respectively the inner and outer radii of the annular lens, and λ is the wavelength）, when a point source is placed at an internal grid point, we demonstrate that the evanescent waves are produced around the internal interface, and cannot propagate outwards. As for b - a 〈λ ）,, the evanescent waves appear around both the internal and the external interfaces, which remarkably implies the coupling between the two interfaces. Hence it can be inferred that the evanescent waves around the external interface participating in the super-resolution imaging result from the coupling of the evanescent waves around the interface. Moreover, the partly uncomprehended properties of the evanescent waves in the LHM slab are also disclosed. It is conducive to understanding the evanescent waves in the LHMs further.     

Resolution of objects within subwavelength range by using the near field of a dipole

We analyze the far-field resolution of apertures that are illuminated by a point dipole located at subwavelength distances. It is well known that radiation emitted by a localized source can be considered a combination of traveling and evanescent waves, when represented by the angular spectrum method. The evanescent wave part of the source can be converted to propagating waves by diffraction at the aperture; thereby it contributes to the far-field detection. Therefore one can expect an increase in the resolution of objects. We present explicit calculations showing that the resolution at the far zone is improved by decreasing the source-aperture distance. We also utilize the resolution enhancement by the near field of a dipole to resolve two closely located apertures. The results show that without the near field (evanescent field) the apertures are not resolved, whereas with the near field of the dipole the far zone intensity distribution shows improved resolution. This method eliminates the requirements of near-field techniques such as controlling and scanning closely located tip detectors.     

Subdiffraction light focusing on a grating substrate

We describe a way to generate subdiffraction light spots that can be moved over a surface without resorting to near-field manipulation, nonlinear effects, or negative index materials. We use a periodically patterned substrate that converted efficiently, through scattering, the impinging propagative waves into evanescent ones. Then we optimize the wave front of the incident propagative beam so that the grating-scattered evanescent waves interfere constructively at the focal point. Numerical simulations show that focus spots as small as one-sixth of a wavelength can be obtained at any point on the substrate. One foreseen application is high resolution surface imaging.     

Ag-SiO_2复合材料“完美透镜”的微粒尺寸效应

银金属在特定波长范围内的负折射率性质可以放大倏逝波,在近场成像中能够保留次波长信息,因此是制造"完美透镜"的优良材料。由银金属和其他介质组成的复合材料能够通过其调整体积分数来改变"完美透镜"的工作波长,使其在可见光和近红外范围内实现完美成像。除体积分数外,复合材料中金属颗粒的大小和形状也会对透镜的工作波长和成像质量有影响。在考虑尺寸效应修正的基础上,通过分析尺寸对成像性质的影响发现:减小金属颗粒尺寸会使工作波长发生蓝移,当银颗粒尺寸减小到10nm时,会显著降低成像质量。     

Superoscillatory diffraction-free beams

It is theoretically shown that by superimposing diffraction-free solutions of the Helmholtz equation, one can construct localized diffraction-free beams that pass through predetermined points on subwavelength distances. These beams are based on the phenomenon of superoscillations and thus do not contain any evanescent waves. The effect of an aperture and noise is examined in specific examples where truncated beams with λ/3 subwavelength features can propagate into the far field.     

A hyperlens-based device for nanoscale focusing of light

To resolve the problem of missed evanescent waves in a beam focusing system,a hyperlens-based beam focusing device is proposed in this letter.This device can convert the evanescent waves into propagating waves,and then a super-resolution spot is formed at the center of the hyperlens.The working principle of the device is presented,and the way in which the material and structural parameters of the hyperlens affect the resolution and transmission is analyzed in detail.A multibeam focusing device is optimally designed,and the simulated results verify that a nanoscale spot with a diameter of 15.6 nm(corresponding toλ0/24,whereλ0 is the working wavelength in vacuum)is achieved,which is far less than the diffraction limited resolution with a value of 625 nm(1.7λ0).The device is expected to find numerous applications in optical data storage and nano-photolithography,among others.     

Efficient and wide spectrum half-cylindrical hyperlens with symmetrical metallodielectric structure

We propose a half-cylindrical hyperlens with symmetrical metallodielectric structure which consists of five periods of the symmetrical GaP/Ag/GaP films. Such hyperlens can transfer subwavelength information to the output surface (about one wavelength) due to the flat dispersion. Compared with the half-cylindrical hyperlens composed of the resonant Ag/GaP structure, the symmetrical GaP/Ag/GaP metallodielectric structure shows higher transmission and resolution for the propagating waves and evanescent waves, which is also confirmed by the transfer matrix method. In addition, subwavelength imaging can be realized when the incident wavelength varies from 550 nm to 650 nm.