基于亚像素扫描的超分辨技术在高分辨X射线显微镜中的应用

在不改变现有硬件条件的情况下,开展超分辨扫描重建方法,可以在不增加系统成本的基础上提高高分辨X射线显微镜的成像性能.设计了基于亚像素扫描的超分辨扫描模式,按照设计的调制方式进行亚像素位移的移动,采集多幅具有互补信息的低分辨率图像;然后基于系统的点扩散函数,对高分辨率图像进行复原;最后结合POCS超分辨重建算法重建出高分辨图像.实验结果表明,10倍光耦探测器下的衬度噪声比提高了20%左右,空间分辨力提高了0.2μm(约15%),细节分辨能力超过探测器像素尺寸1.35μm的限制,可以看到在低分辨率图像中看不到的细节.实验说明用超分辨技术提高高分辨X射线显微镜的分辨率是有意义的.     

适用于激光聚变实验的短焦距高放大倍率Wolter显微镜设计

围绕内爆压缩及阻滞阶段相关物理实验的诊断需求,提出了一种满足阿贝正弦条件的短焦距高放大倍率Wolter-Ⅲ型X射线显微镜的光学设计。详细介绍了Wolter-Ⅲ型显微镜的结构特点和设计方法,与Wolter-Ⅰ型相比可以通过将主平面向靠近物点方向移动的方式减小系统焦距,从而获得更大的放大倍数,实现显微镜与探测器的像质匹配,提高诊断系统的空间分辨。由光线追迹可以得出,在±190 μm的视场范围内,空间分辨率优于3 μm;在±240 μm范围内分辨率优于5 μm;在±300 μm范围内分辨率优于8 μm,几何集光立体角约为5×10?6 sr。     

共焦扫描光学显微镜的高分辨率

讨论了共焦扫描光学显微镜的高分辨率性质,指出共焦扫描显微镜由于采用点探测器,因而视场大大减小,信噪比大大提高,同时每幅图像逐点扫描形成,在光学系统信息能力不变的前提下,系统的空间域通带宽度增加和时域通带宽度减小。因而可成高分辨率的像,特别是其独特的深度分辨率特性使得可以实现光学断层扫描成像。给出了所研制的共焦扫描荧光显微镜所获得光学断层扫描图像     

KBA显微镜成像系统的成像模拟及X光成像实验的研究

KBA显微镜是一种非轴对称、非共轴的掠入射成像系统。其结构复杂,调节精度要求很高,在实际成像实验操作中难以掌握其成像特性。利用光学设计软件模拟其成像,对系统的调节和成像分析提供有益的参考。利用光学设计软件ZEMAX模拟了KBA显微镜对点源的成像过程,给出了KBA显微镜成像系统的焦深约为1 mm,景深为50 mm左右。并且由模拟可知,掠入射角对成像的影响很大。对像素尺寸约10μm的探测设备,模拟得出KBA成像系统的空间分辨力上限为3μm左右。基于星光Ⅱ装置对周期为20μm的网格靶成像,获得了KBA显微镜较为清晰的X光图像。该项工作为进一步开展掠入射成像系统的研究奠定了基础。     

X射线高空间分辨多色显微成像系统研制及应用

在激光间接驱动惯性约束聚变(ICF)领域中,获得具有极高空间分辨率(优于5μm)的X射线辐射图像,是研究烧蚀不稳定性、内爆流线等关键物理过程的数据基础。基于掠入射反射式成像原理的Kirkpatrick-Baez(KB)显微成像系统作为一种具有高空间分辨率和集光效率的X射线显微诊断设备,目前已成为国际ICF装置的X射线关键诊断设备。在神光Ⅱ和神光Ⅲ原型装置条件上开展了KB诊断技术及设备的研究,在KB系统的光学设计、光学元件和物镜与系统装调技术等方面取得了许多重要进展,研制了大视场KB、多色KB等高分辨率X射线显微成像系统。这些系统已应用于我国的ICF内爆芯部发光和流线测量、流体不稳定增长测量等实验中,为关键物理量的测量提供了高空间分辨率的清晰图像。     

ICF用Kirkpatrick-Baez型显微镜光学设计

 提出了直接针对惯性约束聚变（ICF）诊断目标的X射线Kirkpatrick-Baez型显微镜的像差校正和光学设计方法。在校正掠入射细光束像散的基础上,推导了内爆压缩区全视场范围内的垂轴像差表达式,进而构建了系统的空间分辨率预测模型。基于对空间分辨率和集光立体角两个关键指标的分析,结合ICF的实验要求,得到了系统的初始结构参数确定原则和光学设计流程。实例表明,该方法克服了传统的轴上球差评价的不足,设计结果能够同时满足内爆压缩区的视场、分辨率和集光效率的要求。     

基于探针光调制的皮秒分辨X-ray探测方法与实验

高能密度物理研究中涉及许多单次皮秒现象的诊断测量, 然而对单次X-ray脉冲形状、X-ray与激光脉冲的皮秒精度同步依然是极具挑战的课题. 传统行波选通分幅相机受电子渡越时间限制, 难以突破40 ps时间分辨极限. 本文围绕半导体中光学探针光的全光调制效应, 提出一种以低温GaAs材料为基础, 实现皮秒时间分辨X-ray探测的新方法, 详细阐述了该探测器的工作机理、器件参数设计和时间分辨能力. 通过飞秒激光打靶实验, 验证了其概念设计的正确性. 结果表明该探测器具有约1.5 ps时间响应和10 ps时间分辨能力, 通过材料优化可将时间分辨提升 至1 ps以内.     

用于平面靶X射线诊断的1维KBA显微镜

对用于神光Ⅱ装置4.75 keV能点平面靶成像诊断的1维KBA显微镜进行了实验研究。基于空间分辨力和工作环境要求,设计了1维KBA显微镜的光学结构,并与传统KB显微镜的成像性能进行了对比分析。设计和制备了可同时工作于8 keV和4.75 keV能点的双能点多层膜KBA物镜,解决了系统装调问题。利用神光Ⅱ装置第九路激光打击Ti靶产生的X射线作为背光源照射1 500目金网,进行了4.75 keV网格成像实验,结果表明:在整个背光源照明区域内,系统的实际分辨力约为4 m,系统的有效视场受背光源大小的限制。     

周期多层膜Kirkpatrick-Baez显微镜成像性质分析

 分析了Kirkpatrick-Baez（KB）显微镜的成像性质与周期多层膜元件间的关系。基于分辨力和集光效率要求,设计了KB显微镜的光学结构,模拟了KB系统的成像质量,用W/B4C周期多层膜反射镜进行了X射线成像实验,在±100 μm视场内得到优于5 μm的空间分辨力结果。实验与模拟结果的对比表明,加工精度和球差是影响中心视场分辨力的关键因素,有效视场的大小受多层膜角度带宽的限制。     

Improved axial resolution in confocal fluorescence microscopy using annular pupils

The axial image of a thick fluorescent layer is studied in a confocal microscope consisting of either circular or annular pupils. The response for circular pupils is sharper than that for annular pupils if a small pinhole detector is used. But when the size of the pinhole is larger than a certain value, the response in the latter case can become sharper than that in the former. This result implies that for a given detector of finite size, axial resolution in confocal fluorescence microscopy can be improved when an annular lens is used. Our experimental results qualitatively demonstrate the theoretical prediction. The strength of optical sectioning and the axial cross-section of the three-dimensional optical transfer function are also derived from the measured data.     

High-resolution through-focus metric with two-pitch grating target

Through-focus focus-metric is a method that is used to analyze images on a fixed plane with the help of focus-metric values when the target moves through the focus. In this study, an optical microscope having a magnification of 250× is constructed. A two-pitch grating target is imaged on a CCD detector and through-focus image data are measured. In addition, the optical field on the CCD detector is simulated using the boundary element method and physical optics propagation. By comparing the measured focus-metric signatures with the simulated signatures, information regarding the linewidth is obtained. The results show that the through-focus focus-metric method is a very sensitive method that can be used for measuring parameters such as the linewidth. Thus, a nanoscale resolution can be achieved.     

基于辅助光学系统的KB显微镜瞄准方法

 研究了利用辅助可见光系统精确瞄准KB显微镜物点的方法。设计了工作能点8 keV的周期多层膜KB显微镜系统,通过光线追迹和X射线成像实验,得到5 μm空间分辨率所对应的视场和景深,进而计算出诊断实验对应的指向和景深要求。基于KB系统的物像关系和精度要求,设计了辅助的可见光成像系统,实现了可见光系统与X射线KB系统间的等效瞄准,利用耦合好的系统进行了瞄准和X射线成像实验。实验结果表明:辅助光路可以实现±20 μm的垂轴面和±300 μm的轴向定位精度,满足KB显微镜的瞄准要求。     

红外光谱图像技术及其在生物学研究中的应用

文章介绍了红外光谱图像技术;介绍了用焦平面阵列检测器、步进扫描傅里叶变换光谱仪、红外显微镜、分束器构成的红外光谱图像硬件系统及信息提取的软件方法;给出了用红外光谱图像分析猴脑组织中蛋白质和磷左异、残留在人胸部组织中的硅酮、水稻叶片等３个在生物学研究中的应用实例;指出了经外光谱图像技术进一步的发展方向是采用同步辐射作为光源、依靠数学算法提高分辨率和发展空间化学计量学来提取空间信息。     

闪光X射线衍射成像系统设计及实验方法

为实现材料在冲击加载下微观动力学响应测量,基于小型闪光X射线源开展衍射成像系统设计.利用直流X光机及高纯锗探测器实现系统衍射光路的精确调节,克服了闪光X射线瞬时强度高及连续辐射本底强导致的衍射角度确定困难,并采用Scandiflash AB公司TD-450S和成像板建立了衍射成像系统.应用该系统在冲击加载实验中获得了LiF单晶单脉冲的Mo-Kα线静态及动态衍射图像.该闪光X射线衍射系统时间分辨率可达25ns,为冲击压缩实验中材料瞬时结构变化测量提供了新的实验方法.     

Simulation of photodetection using finite-difference time-domain method with application to near-field subwavelength imaging based on nanoscale semiconductor photodetector array

Simulation of detecting photoelectrons using multi-level multi-electron (MLME) finite-difference time-domain (FDTD) method with an application to near-field subwavelength imaging based on semiconductor nanophotodetector (NPD) array is reported. The photocurrents from the photodiode pixels are obtained to explore the resolution of this novel NPD device for subwavelength imaging. One limiting factor of the NPD device is the optical power coupling between adjacent detector pixels. We investigate such power coupling in the presence of absorbing media as well as the spatial distributions of the electric field and photoelectron density using the MLME FDTD simulation. Our results show that the detection resolution is about one tenth of the operating wavelength, which is comparable to that of a near-field scanning optical microscope based on metal clad tapered fiber.     

激光等离子体球面晶体光谱成像

 利用自聚焦原理,研制了一种新型的球面弯晶谱仪。晶体分析器采用云母材料,其弯曲半径为380 mm,布拉格角为51°。利用成像板接收光谱信号,其有效面积为30 mm×80 mm,从等离子体源经晶体到成像板的光程长为980 mm。物理实验在中国工程物理研究院激光聚变研究中心20 J激光装置上进行,入射激光能量为6.78 J,成像板获得了铝激光等离子体X射线的光谱空间分辨信号。球面云母弯晶谱仪的光谱分辨率达到1 000～1 500,在相同环境放置的PET平晶的光谱分辨率为50～100。结果表明：球面弯晶具有较高的光谱分辨率和信噪比,适合于激光等离子体X射线的光谱学研究。     

CCD detector for high time resolution experiments with SR beams

A detector for fast diagnostics of particle beams in storage rings using an optical component of synchrotron radiation (SR) is developed. The detector records a limited series of one-dimensional or small two-dimensional images at a rate of (1?10) × 10⁶ frames/s. It can also be used for investigating fast processes in X-ray SR beams. In particular, matched with a structured scintillation screen (with low deexcitation time), this detector provides a recording with an SR flash rate of shadowgraph images (for axially symmetric objects, initial data for tomograms) or a record of the distribution of small-angle X-ray scattering. It is also possible to apply this detector as a dispersion-free image spectrometer; this would make it possible to perform pulsed X-ray diffraction studies with ??white?? SR beams. In the single-flash mode this would provide a record of the formation and behavior of crystalline phases in shock and detonation waves with a time resolution of up to 1 ns.     

Scintillation and optical behavior of GaN nanowires in the presence of low-energy X-ray photons: A Geant4 simulation

GaN nanowires were studied as a possible candidate for use in the future development of X-ray scintillator detectors with high spatial resolution using a Monte Carlo simulation. The assessment was performed from the optical response perspective. The ability of such a nanowire to act as scintillating fibers was simulated using Geant4 code. The optimal dimensions of the nanowire (considering practical limitations) to achieve the best optical guiding effect were also determined. Moreover, the energy response of the nanowire was investigated for the design of a suitable external photodetector. To more accurately study the proposed structure, a scintillating screen containing approximately 2,000,000 nanowires was simulated in a porous anodized alumina membrane (PAAM) with a hexagonal arrangement. Using these specifications, the spatial resolution and efficiency of the detector were precisely calculated. The results showed that the spatial resolution and efficiency of the detector were <1 μm and ∼17%, respectively.     

基于非周期多层膜的X射线成像研究

设计了惯性约束聚变（ICF）诊断实验用X射线Kirkpatrick-Baez（KB）显微镜，给出了系统的结构参量.使用ZEMAX光学软件对KB型显微镜进行了性能模拟，结果表明：在8 keV能点，放大率为8倍时，轴上点的最佳空间分辨率小于2 μm，200微米视场的空间分辨率优于10μm.采用磁控溅射方法制备了W/B4C非周期多层膜，经X射线衍射仪（XRD，工作能量8 keV）测量，其反射率为20％，带宽为0.3°，达到了KB型显微镜成像系统的要求.使用Cu靶X射线管进行了成像实验，得到了放大倍数分别为1倍和2倍的一维X射线像.     

Improved sectioning in a slit scanning confocal microscope

We describe a simple implementation of a slit scanning confocal microscope to obtain an axial resolution better than that of a point-scanning confocal microscope. Under slit illumination, images of a fluorescent object are captured using an array detector instead of a line detector so that out-of-focus light is recorded and then subtracted from the adjacent images. Axial resolution after background subtraction is 2.2 times better than the slit confocal resolution, and out-of-focus image suppression is calculated to attenuate with defocus faster by 1 order of magnitude than in the point confocal case.