光栅成像反射莫尔干涉术

利用光栅成像效应可构成一种光栅成像反射干涉仪。配合莫尔技术,在自成像平面可获得表征镜状表面试件离面位移一阶偏导等值线的反射莫尔条纹。并给出了这种干涉术的理论分析及实验例证。     

光栅莫尔条纹特性检测仪的研制

介绍一种应用CCD进行测量的光栅莫尔条纹特性检测仪.该检测仪的结构完全开放,检测过程透明.不仅能够检测光栅副相对移动位移和移动方向与莫尔条纹移动数目和移动方向的关系,而且可以检测光栅副夹角变化对莫尔条纹宽度的影响.应用该仪器可以进行"莫尔条纹移动数目与光栅副移动位移关系测定"和"光栅副夹角变化和莫尔条纹宽度变化关系测定"两个实验,实验结果理想.     

用于多参数同时测量的散斑干涉仪

本文描述了一种新的散斑干涉仪,它可以同时对表面应变物体的面内位移、离面位移、位移梯度和莫尔曲率进行测量;由于利用了取向滤波方法,在滤波系统输出平面同时得到了与这些参数对应的散斑条纹.还利用散斑空间运动规律较好地解释了散斑干涉与散斑剪切干涉之间的关系.     

基于双光栅的纳米测量方法

针对两个物体或平面的相对位移和间隙的纳米级变化量,提出并研究了一种光栅测量方法.采用两组周期接近的微光栅重叠可以产生一组周期分布的条纹,条纹的周期相对于两光栅周期被大幅度放大,并将光栅间的位移反应在条纹的相位信息中.建立了关于双光栅产生叠栅条纹的复振幅分布的近似理论模型.基于该模型设计了一种能够测量两个平行平面相对位移和间隙的方法.针对光栅移动产生相应条纹的过程进行了数值计算.结果表明,两个平行平面的相对微位移将引起相应条纹的大位移,并且该方法最终能在纳米级以内分辨两平面(物体)的相对位移或者间隙变化量.     

双光栅在不同夹角下测量杨氏模量的实验研究

根据莫尔条纹的位移放大原理,利用在光栅栅距恒定时栅线夹角与莫尔条纹的宽度在小角度情况下成反比的关系,对钢丝杨氏弹性模量进行测量.通过对测量数据及计算结果的分析,得出结论:莫尔条纹的宽度随夹角增大而减小;测量误差随着光栅夹角增加而增大,但小于5%.并将实验值与理论值相比较,确定莫尔条纹法测量杨氏模量的可行性.     

High accuracy calculation of the hydrogen negative ion in strong magnetic fields

Using a full configuration-interaction method with Hylleraas-Gaussian basis function, this paper investigates the 1¹0⁺, 1¹(–1)⁺ and 1¹(–2)⁺ states of the hydrogen negative ion in strong magnetic fields. The total energies, electron detachment energies and derivatives of the total energy with respect to the magnetic field are presented as functions of magnetic field over a wide range of field strengths. Compared with the available theoretical data, the accuracy for the energies is enhanced significantly. The field regimes 3 < γ < 4 and 0.02 < γ < 0.05, in which the 1¹(–1)⁺ and 1¹(–2)⁺ states start to become bound, respectively, are also determined based on the calculated electron detachment energies.     

纵向莫尔条纹在自准直仪中的应用

为了提高自准直仪的分辨力,将纵向莫尔条纹引入到光路中,用长光栅代替传统单狭缝,将长光栅成像在CCD检测器上,CCD作为标尺光栅,通过两个光栅叠加形成的莫尔条纹的变化可以将成像位移分辨率提高到亚像元,进而将自准直仪的角度分辨率提高到毫秒级.实验结果表明,相对于直接检测狭缝边缘的方法,莫尔条纹法的分辨力提高了25倍.     

计算电容中Fabry-Perot干涉仪测量位移的相位修正方法

计算电容是复现电学阻抗单位的基准装置, 利用计算电容值和量子霍尔电阻值可以准确计算出精细结构常数α. 计算电容的本质是通过高准确度地测量屏蔽电极的位移, 实现对电容量值的测量. 因此, 基于Fabry-Perot干涉仪的精密电极位移测量系统是计算电容装置中最为核心和关键的部分. 在Fabry-Perot干涉仪测位移过程中, 由于高斯激光束存在轴向Gouy相位, 该附加相位将会引起相邻干涉条纹对应位移的变化(大于或者小于λ/2), 导致位移的测量值与实际值存在偏差. 本文阐述了高斯激光场的传播特性, 利用高斯激光束在自由空间和透过薄透镜复振幅的变换关系, 建立了计算电容装置中Fabry-Perot干涉仪透射光束的传输模型; 通过对不同腔长的Fabry-Perot干涉仪透射光场相位的分析, 获得了高斯激光束轴向Gouy相位修正与传输距离的关系. 结果表明, 当腔长从111.3 mm移动至316.3 mm时, 在接收距离为560 mm的情况下, 高斯光束轴向Gouy 相位引起的位移修正的绝对值最小为0.7 nm, 其相对相位修正量|δL|/|ΔL| = 3.4×10^-9.     

数字图像处理技术在等高莫尔法三维形貌测量中的应用

在阐述叠加莫尔方法测量物体三维形貌基本原理的基础上,导出正弦光栅照射法等高莫尔条纹检测的数学模型。并对实测三维物体的等高莫尔图进行了灰度均匀、图像增强、细化处理等一系列处理,得到了物体等高莫尔条纹的轮廓线。     

基于级联光栅的X射线相衬成像实验研究

为避免小周期高宽比吸收光栅的制作,提出了由泰伯-劳干涉仪和逆泰伯-劳干涉仪组成的级联光栅X射线相衬成像装置,该装置利用泰伯-劳干涉仪的自成像作为逆泰伯-劳干涉仪的源.通过实验验证了该方法的有效性,得到了成像系统的莫尔条纹和强度振荡曲线.条纹最高对比度为17.4%,随着吸收光栅偏离零点位置,条纹对比度逐渐降低,但是在其位置跨越从-17mm到12mm的范围内,条纹对比度仍保持在10%以上.实验讨论了样品位置对成像灵敏度的影响,结果表明当样品位置靠近相位光栅两侧时,其成像灵敏度最高.本文的研究可应用于生物医学成像的大视场X射线相衬成像系统的设计.     

A novel approach to high-sensitivity grating interferometry

The authors propose a new approach for obtaining information about in-plane and out-of-plane displacements of an object tested using high-sensitivity grating interferometry. The interferences of each of the specimen grating diffraction orders with a reference beam are recorded separately. Computer addition and subtraction of the phase functions calculated from the interferograms give the in-plane and out-of-plane displacement values, respectively. The authors present their experimental work, and then compare their results with those obtained using a conventional grating interferometry approach.     

光栅扭矩动态测量系统设计及实现

机械主轴在各种载荷和工作环境下的扭矩测量，国内外一直没有比较好的解决方案。针对这一现状，提出通过在主轴2端安装圆光栅及指示光栅，采用对光栅莫尔条纹计数及细分的方法实现主轴扭矩非接触式动态直接测量。其方法是在将莫尔条纹进行光电转换后，采用集成可编程模拟器件对信号进行放大、滤波和比较，然后利用软核微处理器实现数据采集、处理和控制，从而取代FPGA＋MCU的方式。实验中，测量系统采用1200条刻线的圆光栅，在主轴转速为0～1500r/min的范围内测量其扭矩，扭转角精度小于0.001°。实验结果表明，采用圆光栅莫尔条纹可以达到主轴扭矩高精度测量的要求，为机械主轴测量提供了一种新的非接触式测量方法。     

The measurement of residual stresses by sandwich holographic interferometry

Sandwich holographic interferometry was first proposed by Prof. N. Abramson in 1974. There are many advantages in using this method. One of its most important virtues is that it can compensate for rigid body displacements between the two exposures and is very convenient in practical operation. The authors have already made a detailed theoretical analysis of in-plane and out-of-plane displacements. This paper describes experimental measurements of the residual stresses in welds, by studying the curvature or the second-order derivative of the fringes of in-plane or out-of-plane displacements, using sandwich holographic interferometry. The stresses are obtained quantitatively, and are verified by an experiment involving measurements of the stresses of a flat plate.     

三维显示中基于彩色叠栅条纹的视差障栅参数设计

为确定三维显示中视差障栅(PB)的最优参数,提出一种基于彩色叠栅条纹的PB参数设计方法。液晶显示器(LCD)和PB简化为相应参数的黑白光栅模型,而具有特定参数的特定辐射光栅作为周期和倾角变化的PB模型,通过序数方程和傅里叶分析方法分析特定辐射光栅和LCD单色等效黑白光栅的叠加图样,由此推断出不同PB周期的低频主导条纹频率组项,然后利用傅里叶理论的部分和提取方法(PSE)分析不同PB周期的低频主导叠栅条纹的强度轮廓,得出PB的最佳节距和相应倾斜角度。实验结果表明,所设计的PB三维显示系统没有出现降低像质的叠栅条纹,具有较好的三维显示效果。     

基于双朗奇光栅的焦距测量技术研究

随着中长焦距光学元件在光学遥感、高功率激光器和天文望远镜等系统中的广泛应用,对这类光学元件焦距的高精度测量提出要求。在双光栅干涉焦距测量技术的基础上,提出了一种新的改进算法。该算法通过Moiré条纹倾斜角度与待测元件焦距之间的函数关系得到焦距计算公式,并利用入射平面波时Moiré条纹的理想状态优化了该计算公式,解决了Moiré条纹倾角基准线的确定问题,提高了Moiré条纹角度求解精度。采用2块周期为20 μm的朗奇光栅搭建了长焦距测量装置。实验测得的透镜焦距为36.690 m,测量重复精度达0.382‰。     

Holographic reverse shearing interferometry with high measurement sensitivity

The possibility of studying phase objects by reverse shearing interferometry with high measurement sensitivity is demonstrated. Phase objects are studied in two stages. In the first stage, holographic reverse shear interferograms are measured with and without an object under nonlinear conditions with tuning to frequent reference fringes. In the next stage, these interferograms are optically processed to obtain two interference patterns. The behavior of the interference fringes is the same as in the case of conventional double-beam interferometry with a standard reference wave. The increase in the measurement sensitivity in the thus-obtained interference patterns is due to the use of higher diffraction orders reconstructed from the holographic interferograms. A possibility of controlling the width of interference fringes is considered. The results of experimental approval of this technique are presented.     

Experimental and numerical investigations of resonant vibration characteristics for piezoceramic plates.

Electronic speckle pattern interferometry (ESPI) is a full field, non-contact technique for measuring the surface displacement of a structure subjected to static loading or, especially, to dynamic vibration. In this article we employ an optical system called the amplitude-fluctuation ESPI with out-of-plane and in-plane measurements to investigate the vibration characteristics of piezoceramic plates. Two different configurations of piezoceramic plates, namely the rectangular and the circular plates, are discussed in detail. As compared with the film recording and optical reconstruction procedures used for holographic interferometry, the interferometric fringes of AF-ESPI are produced instantly by a video recording system. Because the clear fringe patterns will be shown only at resonant frequencies, both the resonant frequencies and the corresponding mode shapes are obtained experimentally at the same time by the proposed AF-ESPI method. Excellent quality of the interferometric fringe patterns for both the in-plane and out-of-plane vibration mode shapes is demonstrated. The resonant frequencies of the piezoceramic plates are also measured by the conventional impedance analysis. From experimental results, we find that the out-of-plane vibration modes (type A) with lower resonant frequencies cannot be measured by the impedance analysis and only the in-plane vibration modes (type B) will be shown. However, both the out-of-plane (bending) and in-plane (extensional) vibration modes of piezoceramic plates are obtained by the AF-ESPI method. Finally, the numerical finite element calculations are also performed, and the results are compared with the experimental measurements. It is shown that the numerical calculations and the experimental results agree fairly well for both the resonant frequencies and the mode shapes.     

Automatic analysis of three-dimensional displacement field using ESPI

Electronic speckle pattern interferometry (ESPI) has been used to study the in-plane and out-of-plane displacements of the object. In order to improve the accuracy, a Fourier filtration algorithm has been used to remove the speckle noise and get the holographic-quality ESPI fringe pattern. The processing steps of this method are described in detail in this paper. In addition, a phase shifter, which is easily used with simplified structure and high stability, is also presented. It can be applied to various coherent arrangements in experiments to obtain phase shifted fringe patterns. Experiments of determining the 3D displacement field of a circular fixed plate with a uniform load have been carried out using these methods. The results presented in this paper indicate that the accuracy of this method is satisfactory.     

Three-directional structural characterization of hexagonal packed nanoparticles by hexagonal digital moiré method

We present the hexagonal digital moiré method for three-directional structural characterization of hexagonal packed nanostructures. A mismatch between a three-way grating and a nanoparticle assembly is shown to produce hexagonal moiré fringes due to the interference between three groups of parallel moiré patterns. The measuring principles of the pitches and the orientations of the three 1D arrays of the nanoparticles are presented. The structural information on a silica nanoparticle assembly is analyzed.