基于拓扑绝缘体纳米线约瑟夫森结的反常临界超流增强和半整数夏皮洛台阶

基于拓扑绝缘体材料的约瑟夫森结是寻找马约拉纳零能模的候选器件,因而受到拓扑量子计算研究领域的关注.这方面实验的关键之一,是制备具有优质结区的约瑟夫森器件.本工作在三维拓扑绝缘体Bi₂Te₃和Bi₂(Se_xTe_1-x)₃纳米线上制作了约瑟夫森结器件,研究了其结区的超导邻近效应、多重安德列夫反射和超流-相位关系,观测到了约瑟夫森结的临界超流随磁场增大而反常地增大、其交流约瑟夫森效应出现半整数的夏皮洛台阶的实验结果.本文还讨论了这些反常现象的可能来源,特别是与结区界面处超导电极的Ti缓冲层和拓扑绝缘体纳米线中的Te元素形成TiTe铁磁性合金层的关系.     

粗糙界面对Bi2Te3/PbTe超晶格热电优值影响的理论分析

以Bi₂Te₃/PbTe超晶格薄膜为例,分析电子在Bi₂Te₃量子阱中的输运过程,综合了薄膜的经典散射效应和理想量子效应,并以此混合效应为基础,在PbTe障碍层厚度一定时,模拟计算了两种混合效应中量子效应占不同比例时,Bi₂Te₃/PbTe超晶格热电优值的变化.在镜面反射占混合效应的0.3时,得到的热电优值与当前报道的量子阱超晶格的实验值接近. 关键词： 超晶格 粗糙界面 热电优值     

Bi2Te3(111)和Al2O3(0001)衬底对Bi(111)双原子层的电子结构及拓扑性质的影响

晶体铋沿(111)面方向的双原子层及薄膜具有新奇的拓扑性质.在实验生长或者实际应用中,其必然与衬底接触.本文采用紧束缚近似方法与第一性原理计算研究了Bi双原子层及其与Bi₂Te₃和Al₂O₃衬底形成的异质结的电子结构.计算结果表明, Bi双层是具有0.2 eV的半导体.当其与具有拓扑表面态的Bi₂Te₃形成异质结时,两者电子态之间有很强的杂化,不利于Bi(111)双层拓扑电子态的观测.将其放在绝缘体Al₂O₃(0001)时,导带与价带与衬底电子态杂化较小,并且展现出巨大的Rashba自旋劈裂.这是由于衬底诱导Bi(111)双原子层中心反演对称性破缺和自旋-轨道耦合共同作用的结果.进一步采用紧束缚近似计算得到的结果发现,衬底Al₂O₃(0001)对Bi(111)双层的作用等效于一个约为0.5—0.6 V/?(1?=0.1 nm)的外电场.此外, Bi(111)双原子层与衬...     

单轴压力下Ge2X2Te5(X=Sb,Bi)薄膜拓扑相变的第一性原理研究

随着拓扑绝缘体的发现, 材料拓扑物性的研究成为凝聚态物理研究的热点领域. 本文基于第一性原理计算, 研究了化合物Ge₂X₂Te₅ (X=Sb, Bi) 的块体结构和二维单层和双层薄膜结构的拓扑物性, 以及单双层薄膜在垂直方向单轴压力下的拓扑量子相变. 研究发现, A型原子序列排列的这两种化合物都是拓扑绝缘体, 其单层薄膜都是普通金属, 而双层薄膜都是拓扑金属, 单层和双层薄膜在单轴加压过程中都没有发生拓扑量子相变; 这两种化合物的B型原子序列的晶体是普通绝缘体, 其所对应的薄膜, Ge₂Sb₂Te₅单层是普通金属, 双层薄膜和Ge₂Bi₂Te₅的单层和双层薄膜均为普通绝缘体, 但是在单轴加压过程中B 型原子序列所对应的单层和双层薄膜都转变为拓扑金属.     

石墨烯/Bi0.5Sb1.5Te3柔性热电薄膜及其面内散热器件的设计制备与性能评价

基于柔性热电薄膜制冷的面内散热技术有望为电子器件高效面内散热提供解决方案,但柔性热电薄膜电输运性能太低和面内散热器件结构设计困难严重制约了该技术在电子元器件散热中的应用.本文通过在环氧树脂/Bi_0.5Sb_1.5Te₃柔性热电薄膜中掺入具有同时调控电热输运行为功能的石墨烯,发现不仅有助于Bi_0.5Sb_1.5Te₃晶粒沿(000l)择优取向,而且还提供了载流子快速传输通道,石墨烯/Bi_0.5Sb_1.5Te₃柔性热电薄膜的载流子浓度和迁移率同时显著增大;石墨烯掺入量为1.0%的柔性热电薄膜室温最高功率因子达到1.56 mW/(K~2·m),与环氧树脂/Bi_0.5Sb_1.5Te₃柔性热电薄膜相比提高了71%,其最大制冷温差提高了1倍.利用这种高性能石墨烯/Bi_0.5Sb_1.5Te_3...     

拓扑绝缘体(Bi0.5Sb0.5)2Te3薄膜中的线性磁阻

本文报道了拓扑绝缘体(Bi_0.5Sb_0.5)₂Te₃薄膜中线性磁阻问题的系统性研究工作. 此体系中, 线性磁阻在很宽的温度和磁场范围内出现: 磁场高达18 T时磁阻仍没有饱和趋势, 并且当温度不高于50 K时, 线性磁阻的大小对温度的变化不敏感. 栅压调控化学势可明显改变线性磁阻的大小. 当化学势接近狄拉克点时, 线性磁阻最为显著. 这些结果说明电荷分布的不均匀性是引起该材料线性磁阻的根源.     

Femtosecond Fiber Laser Based on BiSbTeSe2 Quaternary Material Saturable Absorber

Topological insulator materials, including Bi₂Te₃, Sb₂Te₃, Sb₂Te₃, and Bi₂Se₃, have attracted some attention due to their narrow band gaps, high carrier mobility, wide spectral absorption ranges and other characteristics.We report a new multi-compound topological insulator material BiSbTeSe₂ that, compared with the traditional topological insulator composed of two elements, can integrate the physic...     

Bi-Sb-Te基热电薄膜温差电池离子束溅射制备与表征

本文采用离子束溅射Bi/Te和Sb/Te二元复合靶,直接制备n型Bi₂Te₃热电薄膜和p型Sb₂Te₃热电薄膜.在退火时间同为1 h的条件下,对所制备的Bi₂Te₃薄膜和Sb₂Te₃薄膜进行不同温度的退火处理,并对其热电性能进行表征.结果表明,在退火温度为150 ℃时,制备的n型Bi₂Te₃关键词： 薄膜温差电池 2Te₃薄膜')" href="#">Sb₂Te₃薄膜 2Te₃薄膜')" href="#">Bi₂Te₃薄膜 离子束溅射     

SrRuO3超薄膜制备条件和拓扑霍尔效应的关联

使用激光分子束外延在SrTiO₃(001)衬底上生长SrRuO₃薄膜,并研究激光能量密度、生长温度和靶材表面烧蚀度等生长参数对于SrRuO₃表面形貌、基本磁电性质以及拓扑霍尔效应的影响.当在最优条件下生长SrRuO₃薄膜时,样品表面平整、台阶清晰,具有最低的金属-绝缘体转变温度,电阻率最低,且具有最显著的拓扑霍尔效应;而改变生长参数生长的SrRuO₃薄膜由于存在更多的缺陷,其表面较粗糙,金属-绝缘体转变温度增大,或表现出绝缘体行为,而拓扑霍尔效应会变弱甚至消失.     

n型Bi2–xSbxTe3–ySey基化合物的缺陷结构调控与电热输运性能

Bi₂Te₃基化合物是目前室温附近性能最好的热电材料,但其存在着大量复杂的缺陷结构,缺陷工程是调控材料热电性能的核心手段,因此理解和有效地调控缺陷形态和浓度是获得高性能Bi₂Te₃基热电材料的关键.本文系统地研究了四元n型Bi_2-xSb_xTe_3-ySe_y基化合物的缺陷演化过程及其对热电输运性能的影响规律.Sb和Se的固溶引入的带电伴生结构缺陷使得材料的载流子浓度发生了巨大变化,在Bi_2-xSb_xTe_2.994Cl_0.006样品中,Sb的固溶降低了反位缺陷Sb_Te2形成能,诱导产生了反位缺陷Sb_Te2,使得少数载流子空穴浓度从2.09×10¹⁶ cm^-3增加至3.99×10¹⁷ cm^-3,严重劣化了...     

Effects of post-annealing on crystalline and transport properties of Bi_2Te_3 thin films

A well-established method is highly desirable for growing topological insulator thin films with low carrier density on a wafer-level scale. Here, we present a simple, scalable method based on magnetron sputtering to obtain high-quality Bi_2 Te_3 films with the carrier density down to 4.0 × 10~(13) cm~(-2). In contrast to the most-used method of high substrate temperature growth, we firstly sputtered Bi_2 Te_3 thin films at room temperature and then applied post-annealing. It enables the growth of highly-oriented Bi_2 Te_3 thin films with larger grain size and smoother interface. The results of electrical transport show that it has a lower carrier density as well as a larger coherent length(～ 228 nm, 2 K). Our studies pave the way toward large-scale, cost-effective production of Bi_2 Te_3 thin films to be integrated with other materials in wafer-level scale for electronic and spintronic applications.     

用正电子湮没研究纳米碲化铋的缺陷及其对热导率的影响

利用水热法合成了Bi₂Te₃纳米粉末, 并在300–500 ℃的温度范围内对其进行等离子烧结. X射线衍射测试表明制得的Bi₂Te₃粉末是单相的. 对于300–500 ℃范围内烧结的样品, 扫描电子显微镜观察发现随着烧结温度的升高样品颗粒明显增大, 但是根据X射线衍射峰的宽度计算得到的样品晶粒大小并没有明显的变化. 正电子湮没寿命测试结果表明, 所有的样品中均存在空位型缺陷, 而这些缺陷很可能存在于晶界处. 正电子平均寿命随着烧结温度的升高而单调下降, 说明较高的烧结温度导致了空位型缺陷浓度的降低. 另外, 随着烧结温度从300 ℃升高到500 ℃, 样品的热导率从0.3 W·m^-1·K^-1升高到了2.4 W·m^-1·K^-1, 这表明在纳米Bi₂Te₃中, 空位型缺陷和热导率之间存在着密切的联系.     

Structural and optical properties of thermally evaporated Bi2Te3 films

Bi₂Te₃ films were prepared by thermal evaporation technique. X-ray diffraction analysis for as-deposited and annealed films in vacuum at 150 °C were polycrystalline with rhombohedral structure. The crystallite size is found to increase as the film thickness increases and has values in the range 67–162 nm. The optical constants (the refractive index, n, and absorption index, k) were determined using transmittance and reflectance data in the spectral range 2.5–10 μm for Bi₂Te₃ films with different thicknesses (25–99.5 nm). Both n and k are independent on the film thickness in the investigated range. It was also found that Bi₂Te₃ is a high refractive index material (n has values of 4.7–8.8 in the wavelength range 2.5–10 μm). The allowed optical transitions were found to be direct optical transitions with energy gap  eV. The optical conductivities σ₁ = ƒ(hν) and σ₂ = f(hν) show distinct peaks at about 0.13 and 0.3 eV, respectively. These two peaks can be attributed to optical interband transitions.     

X-ray and electron-energy-loss spectra of Bi, Sb, Te and Bi2Te3, Sb2Te3 chalcogenides

The valence region of Bi and Sb semimetals, of Te, and of their chalcogenides (Bi₂Te₃ and Sb₂Te₃) are explored by means of X-ray photoelectron Spectroscopy to find in their p, s and d-like orbital distributions a useful reference for interpreting the interband transitions present in the measured electron-energy-loss spectra. Their common reticular distortion (rhombohedral D₃) and their similar electronic structure justify a discussion of these compounds as a series. Our experimental data are discussed in terms of the calculated band structures.     

Ac Josephson effect in Corbino-geometry Josephson junctions constructed on Bi2Te3 surface

Recently, a Corbino-geometry type of Josephson junction constructed on the surface of topological insulators has been proposed for hosting and braiding Majorana zero modes. As a first step to test this proposal, we successfully fabricated Corbino-geometry Josephson junctions (JJs) on the surface of Bi₂Te₃ flakes. Ac Josephson effect with fractional Shapiro steps was observed in the Corbino-geometry JJs while the flux in the junction area was quantized. By analyzing the experimental data using the resistively shunted Josephson junction model, we found that the Corbino-geometry JJs exhibit a skewed current—phase relation due to its high transparency. The results suggest that Corbino-geometry JJs constructed on the surface of topological insulators may provide a promising platform for studying Majorana-related physics.     

Topological Dirac surface states in ternary compounds GeBi2Te4, SnBi2Te4 and Sn0.571Bi2.286Se4

Using high-resolution angle-resolved and time-resolved photoemission spectroscopy, we have studied the low-energy band structures in occupied and unoccupied states of three ternary compounds GeBi₂Te₄, SnBi₂Te₄ and Sn_0.571Bi_2.286Se₄ near the Fermi level. In previously confirmed topological insulator GeBi₂Te₄ compounds, we confirmed the existence of the Dirac surface state and found that the bulk energy gap is much larger than that in the first-principles calculations. In SnBi₂Te₄ compounds, the Dirac surface state was observed, consistent with the first-principles calculations, indicating that it is a topological insulator. The experimental detected bulk gap is a little bit larger than that in calculations. In Sn_0.571Bi_2.286Se₄ compounds, our measurements suggest that this nonstoichiometric compound is a topological insulator although the stoichiometric SnBi₂Se₄ compound was proposed to be topological trivial.     

Leaky photorefractive surface waves in Bi12TiO20 and Bi12SiO20 crystals

Consistent experimental and numerical simulation studies of photorefractive surface wave propagation in Bi₁₂TiO₂₀ and Bi₁₂SiO₂₀ crystals are presented. We induce the photorefractive surface wave with a Gaussian beam of small diameter and show that light leakage from the surface wave takes the form of multiple beam reflection from the crystal surface. The efficiency of surface wave excitation is proved to be much higher for the divergent Gaussian beam than for the convergent one.     

The role of Bi2O3 as a network modifier and a network former in xBi2O3 · (1 − x)LiBO2 glass system

The effect of Bi₂O₃ on the glass transition temperature, electrical conductivity and structure of LiBO₂ glass has been investigated. T_g vs. composition curve shows three different linear regions, while there is an overall decrease in T_g with the increase in Bi₂O₃ content. The slope of these three straight lines is in a decreasing order. These results are interpreted in terms of the increase in the number of non-bridging oxygen atoms, substitution of Bi-O bond in place of B-O bond and change in Li⁺ ion concentration. The conductivity vs. composition curve exhibits two maxima which are interpreted in terms of the structural modification effect of Bi₂O₃ on LiBO₂ network and mixed-former effect, respectively. Results obtained from the XPS studies of the samples of composition x 0.005, have shown that the number of non-bridging oxygen atoms from B-O bond increases with the increase in Bi₂O₃ content. It has a maximum value at x = 0.003 where the conductivity has also exhibited a maximum value. Further increase of Bi₂O₃ content causes decrease in it. For higher Bi₂O₃ content (x * > 0.005), O 1s spectra of Bi₂O₃ has been separated out from that of Bi₂O₃. Bismuth ions have been substituted for boron ions as network former ions.