GD-MS法和ICP-MS法测定高纯铌中痕量元素

采用辉光放电质谱法(GD-MS)对高纯铌中Ta,Mo,W等痕量杂质元素进行了测试,并对GD-MS工作参数进行了优化,部分元素与采用电感耦合等离子体质谱法(ICP-MS)定量分析的结果进行比较,对某些元素含量差别较大的原因进行了分析,论述了Element GD辉光放电质谱仪的特点及其在痕量杂质分析上的优势。     

GDMS法和ICP-MS法测定太阳能级多晶硅中杂质元素含量

采用辉光放电质谱法(GD-MS)测定太阳能级多晶硅中B,P,Fe,Co,Ni,Cu,Zn等痕量杂质元素,并优化和选择了GD-MS工作参数。考察了在半定量分析的情况下,GD-MS测定痕量杂质的精密度。结果表明,GD-MS对B,P,Na,Al,K,Ca,Fe,Ni,Cu,Co,Zn等元素测定结果的RSD都小于30%。用ICP-MS法进行验证,检出限0.14~2.85 ng/mL,RSD为1.6%~12%,加标回收率85.2%~125%。     

辉光放电质谱法测定高纯材料中痕量硫杂质

准确测定并控制材料中杂质元素含量是发挥高纯材料性能不可或缺的环节。辉光放电质谱法(GDMS)是准确、快速、高灵敏分析高纯材料中痕量及超痕量硫的理想方法。对GDMS分析高纯铜和镍基高温合金中痕量硫的质谱干扰进行了讨论,优化了放电电流和放电电压,采用多种标准物质对硫的相对灵敏度因子(RSF)进行了校准和验证,并与二次离子质谱法(SIMS)进行分析结果比对,验证了GDMS定量分析结果的准确性和可靠性。     

直流辉光放电质谱法测定多晶硅中关键杂质元素的相对灵敏度因子

采用直流辉光放电质谱(dc-GD-MS)测定多晶硅中关键杂质元素的相对灵敏度因子(RSF).标样制作过程中主要是在连续通入氩气条件下将固定量的非标准多晶硅样品熔化,向硅熔体中均匀掺入浓度范围为1～30 μg/g的关键杂质元素(如B和P),采用快速固化法制成标样;再将制成的标准样品加工成一系列适合GD-MS扁平池(Flat Cell)的片状样品(20 mm×20 mm×2mm).采用二次离子质谱法(SI-MS)对标准样品中关键掺杂元素进行多次定量测定,取平均值作为关键杂质元素的精确含量.优化一系列质谱条件后,运用GD-MS对标样中关键掺杂元素的离子强度进行多次测定,计算平均结果,得到未校正的表观浓度,利用标准曲线法计算出关键杂质元素的相对灵敏度因子.     

辉光放电质谱法在高纯材料分析中的应用

高纯材料是现代高新技术发展的基础,在电子、光学和光电子等尖端科学领域发挥着重要作用。采用固体样品直接分析的辉光放电质谱法(GDMS),在高纯金属、高纯半导体材料的痕量和超痕量杂质分析中有着非常广泛的应用。综述了GDMS法对高纯金属、高纯半导体材料进行的元素分析,并对分析过程中工作参数、溅射时间、干扰峰等因素的影响进行了阐述。同时,也详述了应用GDMS法对高纯金属钛、镉,高纯半导体硅,分别进行的痕量杂质元素分析,结果显示放电稳定性良好,典型元素含量的相对标准偏差均在较为理想范围内。GDMS应用前景广泛,未来,GDMS将在除固体样品之外的其他样品类型的分析领域中发挥重要作用。     

磁质谱在核科学领域的研究进展

对磁质谱在核科学领域的研究进展进行了综述。介绍了磁质谱的基本原理，详细论述了扇形磁场电感耦合等离子体质谱、加速器质谱、二次离子质谱、热电离质谱、激光共振电离质谱、辉光放电质谱的电离机理、特征及应用领域。扇形磁场电感耦合等离子体质谱分辨率高，检测限低，在元素和同位素分析中应用最为广泛。加速器质谱通常用于样品中超痕量、长寿命放射性核素的量化分析。TI-MS被认为是元素同位素比值分析最精确的仪器之一，而辉光放电质谱主要运用于高纯材料中杂质的分析。     

辉光放电质谱法测定超高纯铜溅射靶材中痕量杂质元素及其相对灵敏度因子的求取北大核心CSCD

通过选择合适的同位素及分辨率,提出了辉光放电质谱法(GDMS)测定超高纯铜溅射靶材中39种痕量杂质元素的分析方法。对辉光放电过程中的参数进行了优化,条件如下:放电气体流量为450 mL·min^(-1),放电电流为2.00 mA,预溅射时间为20 min。由于高纯铜的GDMS标准样品极难获得,为提高痕量杂质元素的检测准确度,在现有的标准样品条件下,利用高纯铜标准样品只获得了与基体匹配的21种杂质元素的相对灵敏度因子(RSF),其余18种杂质元素的RSF只能按照仪器自带的标准RSF进行计算。参照美国材料与试验协会的标准ASTM F1593-08(2016)的TypeⅢ中的第2种方法计算33种杂质元素的检出限,而其他6种主要杂质元素因其含量高于仪器噪声水平而无法用此法得到检出限。用GDMS对超高纯铜溅射靶材样品进行了检测,主要杂质元素为硅、磷、硫、氯、铁、银,检出量为0.015~0.082μg·g^(-1),杂质总量小于1μg·g^(-1)。除锌、碲、金的检出限在10 ng·g^(-1)级外,其余元素的检出限能够达到ng·g^(-1)级,其中钍、铀的检出限甚至达到了0.1 ng·g^(-1)级,说明方法能够满足GB/T 26017-2010中的6N(99.9999%)超高纯铜溅射靶材的检测要求。     

辉光放电质谱法测定纯锡中24种杂质元素和锡记忆效应的消除

采用辉光放电质谱法(GDMS)测定了纯锡中24种杂质元素,分析方法为无标定量分析。分析前纯锡样品须依次用乙醇、水及乙醇冲洗以除去表面的灰尘颗粒,凉干后用于分析。本工作对辉光放电过程中的三项关键因素,即辉光放电电压、放电电流及放电气流三者在辉光放电溅射/电离时的相互关系及其对总离子流强度的影响进行了试验和讨论,并确定了仪器在最佳状态时辉光放电的优化条件为:放电电压590V,放电电流30mA,放电气流450mL·min~(-1)。为排除各元素测定中质谱(MS)干扰的影响,选择了在不同的分辨模式(中/高)下用相对丰度较高、干扰较少的质量数进行分析。所测定元素测定结果的相对标准偏差(n=5)均小于15%。各元素的检出限(3s)为0.003～0.174μg·g~(-1)之间。本方法所得测定结果与电感耦合等离子体原子发射光谱法(ICP-AES)或电感耦合等离子体质谱法(ICP-MS)的测定结果基本一致。经试验,通过更换GDMS的阳极帽、导流管、采样锥和透镜等4种耗材,可完全消除锡的记忆效应。     

激光剥蚀电感耦合等离子体质谱法测定碳化硅器件中杂质元素

采用激光剥蚀电感耦合等离子体质谱法(LA-ICP-MS),以NIST玻璃标准物质制作校准曲线,29Si为内标,相对灵敏度因子(RSF)校准标样和样品间的基体效应,对碳化硅陶瓷器件中9种痕量元素(B,Ti,Cr,Mn,Fe和Ni等)进行定量测定。选择线性扫描方式,激光剥蚀孔径为150μm,氦气和氩气流量为0.7 L/min时,信号稳定性和灵敏度最佳。经内标校准后,各元素标准曲线的线性有较大改善,线性相关系数为0.9981~0.9999。以建立的方法对碳化硅标准参考物质(BAM-S003)中的痕量元素进行测定,并与标准参考值进行对比,结果一致,证实了LA-ICP-MS方法应用于碳化硅样品检测的准确性和有效性。采用本方法定量测定碳化硅器件中痕量元素,结果与辉光放电质谱法(GD-MS)测定的结果比较一致。元素B,Ti,Cr,Mn,Fe,Ni,Cu,Sr和La的检出限为0.004~0.08 mg/kg,相对标准偏差(RSD)小于5%。     

一种辉光放电质谱法检测金属中痕量杂质元素含量的方法

<正>申请公布号:CN106198712A申请公布日:2016.12.07申请人:锦州市国家光伏材料质量监督检验中心摘要本发明提供了一种辉光放电质谱法检测金属中痕量杂质元素含量的方法。该方法包括以下步骤:(1)将金属样品加工成片状或针状,置于硝酸溶液中进行超声清洗,烘     

Determination of trace elements and correction of mass spectral interferences in superalloy analyzed by glow discharge mass spectrometry

Mass spectral interference was investigated systematically during the determination of trace elements in superalloy by glow discharge mass spectrometry (GD-MS); moreover the main mass spectral interference and interference level of isotopes were provided in detail. According to the mass spectral interference of elements, different methods were selected for interference correction. The effects of mass spectral interference were removed efficiently by using correction methods such as selecting isotopes without interference, matching sample matrices and deducing interference with multivariable linear regression. The determination results of three superalloy samples show that trace elements such as B, Mg, Ga, As, Ag, In, Sn, Sb, Te, Tl, Pb and Bi were determined successfully after interference correction.     

Enhancement of intensities in glow discharge mass spectrometry by using mixtures of argon and helium as plasma gases

Glow discharge mass spectrometry (GD-MS) is an excellent technique for fast multi-element analysis of pure metals. In addition to metallic impurities, non-metals also can be determined. However, the sensitivity for these elements can be limited due to their high first ionization potentials. Elements with a first ionization potential close to or higher than that of argon, which is commonly used as discharge gas in GD-MS analysis, are ionized with small efficiency only. To improve the sensitivity of GD-MS for such elements, the influence of different glow-discharge parameters on the peak intensity of carbon, chlorine, fluorine, nitrogen, phosphorus, oxygen, and sulfur in pure copper samples was investigated with an Element GD (Thermo Fisher Scientific) GD-MS. Discharge current, discharge gas flow, and discharge gas composition, the last of which turned out to have the greatest effect on the measured intensities, were varied. Argon–helium mixtures were used because of the very high potential of He to ionize other elements, especially in terms of the high energy level of its metastable states. The effect of different Ar–He compositions on the peak intensity of various impurities in pure copper was studied. With Ar–He mixtures, excellent signal enhancements were achieved in comparison with use of pure Ar as discharge gas. In this way, traceable linear calibration curves for phosphorus and sulfur down to the μg kg⁻¹ range could be established with high sensitivity and very good linearity using pressed powder samples for calibration. This was not possible when pure argon alone was used as discharge gas. This contribution is based on a presentation given at the Colloquium for Analytical Atomic Spectroscopy (CANAS ’07) held March 18–21, 2007 in Constance, Germany.     

Calibration of double focusing Glow Discharge Mass Spectrometry instruments with pin-shaped synthetic standards

Calibration of two commercially available glow discharge double focusing mass spectrometers, the VG 9000 and Element GD, is described using synthetic pin standards pressed from solution doped copper and zinc matrices. A special pressing die was developed for this purpose and optimal results were obtained with the highest possible pressures, i.e., 95 kN·cm^? 2. This calibration approach permits the determination of trace element mass fractions down to μg·kg^? 1 with small uncertainties and additionally provides traceability of the GD-MS results in the most direct manner to the SI (International System of Units). Results were validated by concurrent measurements of a number of compact copper and zinc certified reference materials. The impact of the sample pin cross-section (circular or square) was investigated with the use of a new pin-sample holder system for the Element GD. The pin-sample holder was designed by the manufacturer for pin-samples having circular cross-section; however, samples with square pin cross-section were also shown to provide acceptable results. Relative Sensitivity Factors for some 50 analytes in copper (VG 9000, Element GD) and zinc matrices (VG 9000) are presented. The field of applicability of GD-MS may be considerably extended via analysis of pin geometry samples based on their ease of preparation, especially with respect to the accuracy and traceability of the results and the enhanced number of analytes which can be reliably calibrated using such samples.     

人体血清微量元素与环境中，微量元素相关关系研究

运用灰色系统理论中的关联度分析方法，研究了人体血清微量元素与土壤，水、辕食(小麦)中微量元素关联度的大小．结果表明，血清微量元素与土壤中微量元素的关联程度最大．     

On the role of major, minor and trace elements in provenancing ceramic material. A case study: Roman terra sigillata from Augusta Praetoria

Summary Forty-five sherds of Roman terra sigillata were analysed for seven major and minor elements by inductively coupled plasma emission spectroscopy and for thirty trace elements by instrumental neutron activation analysis. Autoscaling, cluster analysis and principal component analysis were performed on the analytical data to obtain separate classifications of the sherds by accounting for major and minor elements, on the one side, and for trace elements, on the other. The ability of each element in discriminating between the obtained groups was determined by accounting for either Fisher weights or mutual correlations. The results obtained indicated that some major and minor elements display a greater discriminating capability than trace elements, and that the latter allow recognition of a greater number of compositional groups just because they greatly outnumber major and minor elements.     

铁、锌、锰、钙在出血性脑卒中患者脑脊液中的含量变化及临床意义探讨

对正常对照组与出血性脑卒中患病组脑脊液的微量元素含量的变化作了比较分析。结果表明 ,测定的五种元素中 ,患病组中铁、锌、锰、钙含量均显著上升 (P <0 0 1 )。脑脊液微量元素含量的改变 ,有助于脑卒中类型的鉴别诊断和提出新的临床治疗方法。     

头发诊断儿童孤独症

儿童孤独症的诊断主要依据病史及临床表现，头发元素分析可望成为孤独症的另一类诊断工具。本文简述了微量元素的神经化学和神经生理学作用，孤独症患者的头发元素含量异常，以及孤独症的微量元素诊断。附6表。14篇参考文献。     

聚乙烯乙二胺丙酰胺肟大孔螯合树脂的合成及其富集分离微量元素的应用研究

本文以大孔聚氯乙烯树脂为原料,合成聚乙烯乙二胺丙酰胺肟螯合树脂,建立了利用该螯合树脂富集分离20余种微量元素的ICP化学光谱法,讨论了其富集各待测元素的性能和机理,进行了螯合树脂的红外光谱等结构分析及样品中微量元素的富集和测定,结果较满意。