排序方式: 共有77条查询结果,搜索用时 187 毫秒
1.
应用相位移法的二维光栅测量 总被引:4,自引:0,他引:4
本文介绍了二种二维位移测量的光栅方法。测试系统采用CCD摄象系统记录正交光栅图象,通过调整摄象机变焦镜头的放大倍数来控制采样的空间频率。采样后用数字信号处理的方法,通过软件手段实现水平向和垂直向光栅信号的分离,然后运用了相位移技术及载波—相位移技术得到二维位移。所开发的测试系统除具有高精度、高灵敏度的特点外,还具有较高的空间分辨率。 相似文献
2.
本文研究了一种自动获得全场等差线级数与等倾线参数角的方法.该方法是根据“相移”思想,利用数字图像处理技术,对光弹等差线图与等倾线图进行位相检测,经过去包裹处理,确定出全场各点的等差条纹级次与主应力方向角.最后通过典型实验,考核了这种方法的正确性与处理精度。 相似文献
3.
用矩形栅自动相移法测量三维物体形状 总被引:5,自引:0,他引:5
本文介绍了一种自动测量物体三维形状的新方法。该方法将矩形栅投影于三维物体表面,利用图像处理系统自动产生云纹和自动实现云纹相移,实现了三维物体形成恢复。本文通过实验验证了该方法的正确性下处理精度。方法容易实现,能较好消除多种系统误差,抗干扰能力强,精度和自动化程度高。 相似文献
4.
A new type of phase-shifting interferometer was presented by rotating an azo-polymer film with photo-induced optical anisotropy in the light path of orthogonal polarization interferometry. By changing the angle of the optical axis of the azo-polymer film, four phase-shifted fringe patterns were obtained, from which phase difference between orthogonal polarized light could be calculated. The polarization states and the formation of the interferograms were analyzed theoretically using Jones matrix calculations and the experimental verification of the proposed method was also given. This method has a simple optical configuration which utilizes commercially available polarization devices and anisotropic azo-polymer film of low cost. The phase-shifting interferometer also demonstrates a new application of azo-polymer film. 相似文献
5.
The nonlinear response of the experimental system and the saturation of fringe patterns can induce the fluctuating phase error in the projection grating phase-shifting profilometry. Two major factors of the fluctuating phase error are discussed by simulation. The fluctuating phase error caused by the nonlinear response of the system is four times the frequency of the fringe pattern when the conventional four-frame phase extracting algorithm is used. However, such error can be decreased by five-frame algorithm. On the other hand, the fluctuating phase error caused by the fringe saturation is five times the frequency of the fringe pattern by using conventional five-frame phase extracting algorithm. A novel phase recovering algorithm is used to decrease the phase error caused by the saturation. Furthermore, the applicability range of the proposed phase recovering algorithm is analyzed by simulation and experiments with different saturation degree of the fringe pattern and nonlinearity of the measurement system. 相似文献
6.
In order to gauge the reliability of electronic packages, it is valuable to analyze thermally induced displacements and strains around bimaterial corners and within interconnections. The increased demand for computing performance has created increasingly complex electronic packages with miniaturized features, making it increasingly difficult to extract these quantities. Often, material properties at these length scales are not fully known, making modeling and simulation problematic. Thus, determining displacements and strains experimentally is attractive. In this study, an advanced flip-chip package with fine interconnection features was analyzed using phase-shifting moiré interferometry (PSMI) in conjunction with image analysis software developed for this purpose. Before the analysis, PSMI was qualified using an isotropic solid undergoing uniform thermal contraction, which yielded a displacement precision of ±4 nm. Then a high-magnification, high-resolution displacement and strain analysis was performed for a small cross-sectional region of the flip-chip package containing 20–100 μm sized features. The analysis quantifies these results and gives displacements and strains obtained by differentiating the displacement data using a strain-energy-based finite element formulation. 相似文献
7.
8.
针对基于剪切干涉原理的光刻投影物镜波像差检测设备中相移测量的需求,设计了一种移相装置.该装置采用了桥式放大机构,获得了较大放大比和相对紧凑的结构.从原理上对桥式放大机构进行了分析和讨论,得到了输入位移与其放大比之间的函数关系,并得到了其关系曲线.经过非线性有限元分析,对该装置的变形、受力和模态特性进行了验证.验证结果满足检测平台移相要求. 相似文献
9.
为了获得准确的面形测量,提出了一种相移电子散斑干涉技术测量物体面形的测量方法.利用电子散斑干涉产生载波条纹,该载波条纹受到物体表面高度的调制变得弯曲,引起载波条纹相位的变化,可运用相移技术提取物体的相位信息,最后根据高度和相位之间的关系得到物体的面形.介绍了该方法的原理,利用该方法对球冠物体进行了面形测量,证明该方法测量物体面形是可行性的.由于是采用散斑干涉的方法产生干涉条纹,因此该方法测量物体面形具有灵敏度高的优点. 相似文献
10.