Xe54+离子与Xe原子碰撞过程中的辐射电子俘获及退激发辐射的理论研究

基于多组态Dirac-Fock理论方法和冲量近似, 对Xe⁵⁴⁺与Xe在197 MeV/u碰撞能量下, 炮弹离子的俘获及退激发过程进行了理论研究. 计算了炮弹离子从中性靶原子俘获一个电子到nl (n=1, 2, 3, 4, 5; l=s, p, d) 轨道上的辐射电子俘获截面和相应的辐射光子能量, 以及俘获末态退激发辐射跃迁的能量和概率. 结合这些计算结果, 进一步模拟了碰撞产生的炮弹离子的退激发X射线谱的结构, 并与兰州重离子加速器装置上的最新实验观测结果进行了比较, 符合得很好.     

180keV O6+离子与锥形玻璃毛细管相互作用研究

实验研究了强流（几个nA/mm2）180 keV O6+离子穿越微米尺度锥形玻璃毛细管的聚焦效应.结果表明,毛细管出口处束流密度比入口处束流密度增加了6~7倍,且出射离子保持原有的电荷态及能量.此外我们发现,当毛细管倾斜一定角度时,离子出射方向偏向毛细管管轴方向.基于自组织充电模型对上述实验结果进行了讨论.     

用紧耦合方法研究C4+和O6+与He原子碰撞

用双中心原子轨道紧耦合方法计算了C4+-He以及O6+-He碰撞的单俘获总截面,入射离子的能量范围为10～100keV/amu,所得计算结果在实验误差范围内与实验值很好符合.对满壳层入射离子,研究了单俘获截面随入射离子电荷态的变化,并讨论了原子轨道展开波函数数目对计算结果的影响.p     

Na离子和Cl离子引起He原子直接多重电离过程的研究

利用2～8 MeV的Naq+、Clq+(q=2,3,4,5)轰击氦原子,对碰撞的直接多重电离过程进行研究.实验采用反冲离子-散射离子飞行时间符合技术,通过反冲离子飞行时间谱区分不同价态反冲离子;利用静电偏转和位置灵敏探测技术区分不同电荷态散射离子;结合CAMAC-PC多参数获取系统得到一定价态散射离子所对应的反冲离子电荷态分布谱;经分析该谱得到直接多重电离截面与直接单电离截面之比R21.讨论了R21随入射离子速度和电荷态的变化关系.     

氧离子与氦、氖原子碰撞中转移电离过程的研究

采用位置灵敏探测和散射离子-反冲离子飞行时间测量技术,测量了氧离子与氖和氦原子碰撞过程中转移电离截面与单电子俘获截面之比.通过比较发现测量结果与文献结果的趋势一致,并对测量结果进行了讨论.     

Transfer ionization cross-sections measured in collisions of highly charged argon ions with neon target

: Multiple electron transfer processes are studied for Arq+n- Ne (q= 8, 9, 11, 12) collisions by using multi-parameter coincidence techniques. Various electron transfer processes are identified experimentally and the related cross-sections are measured. The dependence of transfer ionization cross-sections on the recoil charge states is compared with the results from the modified molecular classical overbarrier model. It is found that the modified model described the experimental results reasonably.     

低电荷态离子原子碰撞过程中的转移电离机理的研究

介绍了使用位置灵敏技术和飞行时间方法研究中低能低电荷态离子-原子碰撞过程中转移电离与单电子俘获过程.对于确定的入射离子电荷态,通过理论分析及与实验数据对比给出了转移电离与单电子俘获截面比R_TS随着入射离子速度V_P的变化规律和转移电离过程中电离的电子主要来自靶原子的最外亚壳层. 关键词： 转移电离 逃离半径 电离半径 俘获半径     

Influence of core property on multi-electron process in slow collisions of isocharged sequence ions with neon

Influence of core property on multi-electron process in the collisions of q=6-9 and 11 isocharged sequence ions with Ne is investigated in the keV/u region.The cross-section ratios of double-,triple-,quadruple-and total multi-electron processes to the single electron capture process as well as the partial ratios of different reaction channels to the relevant multi-electron process are measured by using position-sensitive and time-of-flight techniques.The experimental data are compared with the theoretical predictions including the extended classical over-barrier model,the molecular Columbic barrier model and the semi-empirical scaling law.Results show a core effect on multi-electron process of isocharge ions colliding with Neon,which is consistent with the results of Helium we obtained previously.     

刻槽绝缘平行板对电子束的导向效应研究

采用不同材质的刻槽绝缘平行板,包括高纯度石英玻璃、聚四氟乙烯（Teflon）、酚醛树脂（电木）和聚甲醛板（赛钢板）,并在15 pA/mm2 ~14.3 nA/mm2范围内改变入射流强,利用1 500 eV电子束入射上述绝缘平行板,实验研究了上述平行板对电子束的导向行为。实验发现,上述电子束通过上述平行板时存在明显的导向现象,其导向行为与束流流强和绝缘材质无关。据此,可排除绝缘平行板内表面沉积电荷自组织充放电过程中,以绝缘材料的面电阻和体电阻对地泄放的线性形式放电过程。Adopting several grooved parallel plates made by different insulators, such as high-purity fused quartz, Teflon, Bakelite and POM (Polyformaldehyde), and further adjusting the electron beam current in a wide range (tens of pA~tens of nA), the discharging mechanism in the self-organizing charge and discharge processes of electron guiding was investigated and discussed by using 1 500 eV incident electron beam. The present results show that, the electron guiding behaviors are obviously existing when such electron beam is transmitted through the above grooved insulating parallel plates, which are independent on beam current and insulators. Our results suggest that, the possibilities of the accumulated charges on inner-surface of grooved parallel plates linearly discharging through surface and bulk resistances of plates into the ground should be excluded.     

1.0 MeV电子碰撞引起Ta 和Au 内壳电离截面的测量

无论对深入理解电子-原子的作用机制,还是在材料等领域的实际应用,电子轰击原子的内壳电离截面都具有重要意义。当前电子碰撞引起原子内壳电离的实验数据多集中在几十keV 入射能量和中小Z 靶原子,其它数据相对比较缺乏。本工作以能量为1.0 MeV电子轰击Ta 和Au 靶,通过测量靶原子特征X射线的产额,获得其K壳电离截面分别为13.3 和10.1 b,L 壳电离截面分别为554 和338 b。并将实验结果和相应的理论进行了对比,结果显示,本实验测得的K壳电离截面与Casnati、Hombourger 理论值、L 壳电离截面与Scoeld和Born-Bethe 的理论值相符。Accurate experimental data for atomic inner-shell ionization cross-sections by electrons are of basic importance both in understanding inelastic electron-atom interaction and its application. Up to now, most of available data on this process were mainly concentrated on the low and medium Z atoms by the bombardment of low energy electrons. In present experiments K-shell and L-shell ionization cross-sections of Ta and Au in collisions with 1.0 MeV eleltron were determined by measuring the characteristic X-rays emitted from the target atoms. For the present collision systems the K-shell ionization cross-sections were found to be 13.3 and 10.1 b,and the L-shell ionization cross sections were 554 and 338 b, respectively. The measured K-shell ionization cross sections are in reasonable agreement with the theoretic predictions of Casnati and Hombourger, while L-shell ionization cross sections are consistent with the theoretical results of Soc eld and Born-Bethey.