厚度与应变效应对La0.67 Ca0.33 MnO3薄膜电输运与居里温度的影响

在厚度为25-400nm范围内,系统地研究了(001)SrTiO3(STO),(001)LaAlO3(LAO)衬底上La0.67Ca0.33MnO3(LCMO)薄膜的电输运与居里温度TC随薄膜厚度及衬底的变化.结果表明,随薄膜变薄,电阻率ρ增加,TC降低.对于同一薄膜厚度,LCMO/STO薄膜的ρ大于LCMO/LAO基上的薄膜的ρ.TC与衬底的依赖关系则与ρ相反.分析表明,LCMO薄膜的低温区电阻温度(ρ-T)符合关系式ρ=ρ0+Bωs/sinh2(hωs/2/kBT)+CTn,其中ρ0为剩余电阻;等号右端第二项反映软光学模声子对电子散射的贡献;第三项包括其余可能散射机理在电输运过程中所起的作用;B,ωs(软光学模声子的平均频率)与C都为拟合系数.高温区的电输运则由小极化子跃迁模型ρ=DT×exp(Ea/kBT)描述(Ea为极化子激发能).根据ρ0,ωs,Ea以及TC变化,初步讨论了薄膜中的厚度与应变效应.进一步研究发现ωs,Ea的变化与TC相关,从而说明极化子效应为影响TC变化的主要因素.     

La0.8Ca0.2MnO3/SrTiO3薄膜厚度对其结构及磁学性能的影响

采用多种X射线衍射技术和磁电阻测量技术研究了不同厚度的La_0.8Ca_0.2MnO₃/SrTiO₃ (LCMO/STO)薄膜的应变状态及其对磁电阻性能的影响.结果表明，在STO(001)单晶衬底上生长的LCMO薄膜沿［00l］取向生长.LCMO薄膜具有伪立方钙钛矿结构，随着薄膜厚度的增加，面内晶格参数增加，垂直于面内的晶格参数减小,晶格参数a和b相近，略小于c.LC 关键词： X射线衍射 微结构 应变 物理性能     

La0.67Ca0.33MnO3薄膜中的矫顽力随膜厚与衬底的变化

系统研究了衬底为SrTiO3和LaAlO3上的La0.67Ca0.33MnO3薄膜中的矫顽力随厚度和应变的变化。结构分析表明薄膜为（001）方向织构，而且薄膜中的晶粒尺寸随着薄膜厚度的减小而减小。磁测量表明矫顽力先随着膜厚的减小而增加，在t=10-25nm附近到达一极大值。随后，矫顽力随厚度的减小而降低。还得出矫顽力的大小与测量方向有关：t≥25nm (t≤10nm)时，难磁化方向的矫顽力大于（小于）易磁化方向的矫顽力。据此，我们提出：在厚膜（t≥25nm）中，矫顽力变化由畴壁钉扎机制决定；在超薄膜（t≤10nm）中，则与磁畴的形核机制有关。根据t= 5、10、25、400nm的LCMO/STO薄膜的初始磁化曲线，以及t=5，50nm的LCMO/LAO薄膜的小磁滞回线的测量，我们对薄膜中矫顽力机制作了验证，并且还讨论了钉扎和形核机制发生的非均匀区的尺寸。     

外延PbZr0.4Ti0.6O3薄膜厚度对其铁电性能的影响

从Landau-Devonshire唯象理论出发，考虑到晶格失配导致的NFDA3位错应力场与极化场的耦合，研究了在SrTiO₃衬底上外延生长的PbZr_0.4Ti_0.6O₃薄膜厚度对其自发极化强度、电滞回线的影响. 结果表明，产生刃位错的PbZr_0.4Ti_0.6O₃薄膜临界厚度为～1.27nm，当薄膜厚度大于临界厚度时，在所形成的位错附近，极化强度出现急剧变化，形成自发极化强度明显减弱的“死层”；随着薄膜厚度的减小，位错间距增大，“死层”厚度与薄膜总厚度之比增加. 由薄膜电滞回线的变化情况可知，其剩余极化强度随着薄膜厚度的减小而逐渐减小. 关键词： 铁电薄膜 自发极化强度 电滞回线 位错     

Pr0.7(Sr1-xCax)0.3MnO3多晶体系中的小极化子性质

采用基于柠檬酸体系的溶胶-凝胶法制备了Pr0.7(Sr1-xCax)0.3MnO3系列的多晶块材, 同时还用脉冲激光沉积技术(PLD)在SrTiO3(100)衬底上外延生长了同一系列的薄膜, 系统研究了它们的晶格结构和电输运行为. 多晶和薄膜样品都具有正交晶格结构, 电输运行为在居里温度TC以上的高温顺磁相都很好地符合了绝热小极化子模型. 用绝热小极化子模型对两者的电阻率温度曲线进行拟合, 多晶和薄膜样品的拟合结果在定性上是一致的. 随着Ca掺杂量的增加, 极化子跳迁能Ehop变大,ρ0先减小后增大. 实验结果说明, 只要多晶样品制备的质量好, 缺陷、晶界的影响可以大大降低, 多晶样品的电输运行为也能表现出本征的小极化子性质.     

La0.67Sr0.08Na0.25MnO3的奇特输运性质及CMR效应

用固相反应法制备了La_0.67Sr_0.08Na_0.25MnO₃样品.通过磁化强度-温度(M-T)曲线、电阻率-温度(ρ-T)曲线以及ρ-T拟合曲线研究了样品的输运性质及庞磁电阻(colossal magnetoresistance，CMR)效应.结果表明，ρ-T曲线和磁电阻-温度(MR-T)曲线均出现双峰现象；高温峰是伴随顺磁-铁磁(PM-FM)相变出现绝缘体-金属(I-M)相变，低温峰是颗粒界面效应；两个绝缘相输运机理不同：较低温度下(248K<T<274K)，ρ(T)符合极化子的可变程跃迁模型，而在更高温区(330K<T<374K)，ρ(T)符合极化子近邻跃迁模型；两个类金属相输运机理也不同：在低温区(67K<T<186K)，满足ρ-T^2.5关系，输运机理是自旋波散射和电-磁子散射作用，而在高温区(292K<T<304K)，满足ρ-T²关系，输运机理是单磁子散射作用. 关键词： 庞磁电阻 金属-绝缘体转变 晶界效应 输运行为     

Pb(Zr0.3Ti0.7)O3铁电薄膜激光感生电压效应

采用脉冲激光沉积(PLD)技术在LaSrAlTaO₃(LSATO),LaAlO₃(LAO)和SrTiO₃(STO)的单晶倾斜衬底上成功制备了Pb(Zr_0.3Ti_0.7)O₃(PZT)薄膜,在三种倾斜衬底上生长的PZT薄膜中都首次发现了LIV效应.对PZT/LSATO薄膜在a,c轴两种不同取向择优生长下的LIV效应做了研究,发现在薄膜c轴取向择优生长 关键词： 激光感生电压效应 铁电薄膜 薄膜生长取向 原子层热电堆     

分数维方法研究GaAs薄膜中的极化子

本文采用分数维方法, 在讨论Al_0.3Ga_0.7As衬底上GaAs薄膜的分数维基础上, 计算了GaAs薄膜中的极化子结合能和有效质量. 随着薄膜厚度的增加, 极化子结合能和质量变化单调地减小. 当薄膜厚度L_w<70 Å并且衬底厚度L_b<200 Å时, 衬底厚度的变化对薄膜中极化子的结合能和质量变化的影响比较显著, 随着衬底厚度的增加, 薄膜中极化子的结合能和质量变化逐渐变大; 当薄膜厚度L_w>70 Å或者衬底厚度L_b>200 Å时, 衬底厚度的变化对薄膜中极化子的结合能和质量变化的影响不显著. 研究结果为GaAs薄膜电子和光电子器件的研究和应用提供参考. 关键词： 分数维方法 GaAs薄膜 极化子 低维异质结构     

沉积于MgO基片上的La0.7Ca0.3MnO3薄膜的应变弛豫和磁电阻特性

利用90°离轴射频磁控溅射方法将La_0.7Ca_0.3MnO₃(LCMO)沉积于(001)取向的MgO单晶基片上,薄膜厚度变化范围为5nm到200nm. 通过掠入射X射线衍射技术测量了LCMO/MgO薄膜的面内晶格常数, 结合常规X射线衍射研究了LCMO薄膜的晶格应变及其弛豫情况, 用四探针法测量了薄膜的磁电阻特性.结果表明, LCMO/MgO薄膜均为(001)取向生长, 在厚度小于5nm时已经发生应变弛豫, 当薄膜厚度为100nm以上时, 薄膜的微应变接近于完全弛豫, 并表现出与块体材料类似的磁电阻特性, 具有较大的磁电阻和较高的磁电阻峰值温度.     

应变增强Nb掺杂SrTiO3薄膜热电性能

高性能热电材料的发展有望帮助解决未来能源危机,且随着可穿戴器件的发展与应用,热电材料和器件除了要具备更高的热-电转化性能以外,还必须具有良好的柔性.将热电材料制成薄膜既可以为微型器件供电,也有潜力应用于柔性器件.本文使用脉冲激光沉积方法,在商用SrTiO₃ (STO)和La_0.3Sr_0.7Al_0.65Ta_0.35O₃ (LSAT)衬底上制备得到了不同厚度的高质量铌掺杂钛酸锶薄膜(Nb:STO),并对薄膜的表面形貌、结构以及热电性能进行表征与测试.结果显示,使用LSAT作为衬底可以对薄膜施加面内压应变,随着薄膜厚度的增大,应变逐渐释放并接近于块体Nb:STO.随着厚度的增大,薄膜的热电性能逐渐提升,在STO衬底上生长的208 nm厚样品的室温功率因子相比于52 nm样品提升了187%.此外, 144 nm厚度的Nb:STO/LSAT薄膜室温塞贝克系数达到了265.95 μV/K,这是由于衬底应变导致薄膜样品的能带变化.本工作表明通过应变工程调控铌掺杂钛酸锶薄...     

Off-axis electron holography of manganite-based heterojunctions:Interface potential and charge distribution

The interfacial electrical potentials and charge distributions of two manganite-based heterojunctions, i.e.,La_(0.67)Ca_(0.33)MnO_3/SrTiO_3:0.05 wt% Nb(LCMO/STON) and La_(0.67)Ca_(0.33)MnO_3/LaMnO_3/SrTiO_3:0.05 wt% Nb(simplified as LCMO/LMO/STON), are studied by means of off-axis electron holography in a transmission electron microscope.The influences of buffer layer on the microstructure and magnetic properties of the LCMO films are explored. The results show that when a buffer layer of LaMnO_3 is introduced, the tensile strain between the STON substrate and LCMO film reduces, misfit dislocation density decreases near the interfaces of the heterojunctions, and a positive magnetoresistance is observed. For the LCMO/STON junction, positive and negative charges accumulate near the interface between the substrate and the film. For the LCMO/LMO/STON junction, a complex charge distribution takes place across the interface, where notable negative charges accumulate. The difference between the charge distributions near the interface may shed light on the observed generation of positive magnetoresistance in the junction with a buffer layer.     

La0.67Ca0.33MnO3纳米多晶环的时效现象

利用脉冲激光沉积(PLD)方法在多孔Al2O3模板上制备了纳米结构La0.67Ca0.33MnO3(LCMO)多晶膜.温度为80K时,LCMO纳米多晶环样品的电阻随时间连续下降,表现出明显的时效特征.时效后,样品具有保持低电阻状态的性质.该时效行为可用扩展的指数函数拟合.通过拟合可以得到相应条件下的样品平衡态电阻、样品的特征驰豫时间等信息.利用Core-Shell模型以及自旋玻璃相的存在对观察到的时效行为及拟合结果进行了解释.     

低能离子注入E.coli K12的 HRS/IRR效应及recA 基因在其诱发中的作用

以MG1655（野生型）, LE392（recA-）和DH5α（recA-）3株E.coliK12菌株为材料, 研究了30 keV N+离子注入E.coli K12时HRS/IRR效应的诱发情况及recA 基因在其诱发中的作用。 结果显示: 小于10×1014ions/cm2低剂量离子注入大肠杆菌可诱发HRS/IRR效应; 30 keV N+离子注入MG1655, LE392菌株都可诱发HRS/IRR效应, 而在DH5α菌株中无法诱导 IRR效应。 recA-与HRS/IRR 效应相斥性表明recA 基因在HRS/IRR效应的诱发中发挥了重要作用。 The HRS/IRR in Escherichia coli had been investigated withE.coli K12 wild strain MG1655 irradiated by the 30 keV N+. The curve of the dose survival effect showed the 30 keV N+ ion could induce the HRS/IRR at the dose less than 10×1014 ions/cm2. Moreover, the effect of recA gene in HRS/IRR inducement had been researched with three E.coli K12 strains, wild strain MG1655, LE392 (recA+) and DH5α(recA-). The results showed the IRR was disappeared in recA- DH5α strain, but the HRS/IRR appeared in wild strain MG1655 and recA+ LE392, which suggested that recA  gene and the DNA damages & their repairs including recA gene were essential element in HRS/IRR inducement.     

Response of the electrical resistivity and magnetoresistance of La<Subscript>0.67</Subscript>Ca<Subscript>0.33</Subscript>MnO<Subscript>3</Subscript> films to biaxial tensile strains

The structure, electrical resistivity, and magnetoresistance of (50-nm)La_0.67Ca_0.33MnO₃ epitaxial films grown on a [(80 nm)Ba_0.25Sr_0.75TiO₃/La_0.3Sr_0.7Al_0.65Ta_0.35O₃] substrate with a substantial positive lattice misfit have been studied. The tensile biaxial strains are shown to account for the increase in the cell volume and in the relative concentration of Mn⁺³ ions in the manganite films as compared to those for the original material (33%). The peak in the temperature dependence of the resistivity ρ of La_0.67Ca_0.33MnO₃ films was shifted by 30–35 K toward lower temperatures relative to its position in the ρ(T) graph for a manganite film grown on (001)La_0.3Sr_0.7Al_0.65Ta_0.35O₃. For T < 150 K, the temperature dependences of ρ of La_0.67Ca_0.33MnO₃/Ba_0.25Sr_0.75TiO₃/La_0.3Sr_0.7Al_0.65Ta_0.35O₃ films could be well fitted by the relation ρ = ρ₀ + ρ₁T^4.5, where ρ₀ = 0.35 mΩ cm and the coefficient ρ₁ decreases linearly with increasing magnetic field. In the temperature interval 4.2–300 K, the magnetoresistance of manganite films was within the interval 15–95% (μ₀H = 5 T).     

Effect of Terraces at the Interface on the Structural and Physical Properties of La_(0.8)Sr_(0.2)MnO_3 Thin Films

Employing atomic force microscopy,transmission electron microscopy and the second harmonic generation technique,we carefully explore the structural properties of 6-unit-cell-thick La_(0.8)Sr_(0.2)MnO_3 films grown on SrTiO_3 with atomically flat TiO_2-terminated terraces on the surface.The results clearly demonstrate that the terraces on the surface of TiO_2-terminated SrTiO_3 can improve the layer-by-layer epitaxial growth of the manganite films,which results in uniform film coverage at the beginning of growth and thus reduces the substrate-induced disorder at or near the interface.Comparing the magnetic and transport properties of La_(0.8)Sr_(0.2)MnO_3 films with the thicknesses varying from 6 unit cells to 80 unit cells grown respectively on as-received SrTiO_3 and TiO_2-terminated SrTiO_3,it is found that these atomically flat terraces on the surface of TiO_2-terminated SrTiO_3 can greatly enhance the Curie temperature and conductivities of the ultrathin La_(0.8)Sr_(0.2)MnO_3 films with thickness less than 50 unit cells,while no obvious difference is detected in the magnetic and transport properties of the 80unit-cell thick films.     

Electrical resistivity and magnetoresistance of nonuniformly mechanically strained films (30 nm) of the La0.67Ca0.33MnO3 manganite

The structure, electrical resistivity, and magnetoresistance of predominantly oriented La_0.67Ca_0.33MnO₃(30 nm)/LaAlO₃ films are investigated after partial relaxation of biaxial mechanical stresses. The negative magnetoresistance MR of the films reaches a maximum at T = 235–240 K. The full width at half-maximum of the peak in the curve MR(T) for a film is five to six times greater than that for a manganite layer grown on a substrate with a small lattice mismatch. For T < 150 K, the temperature dependence of the electrical resistivity ρ of the films is fitted well by the relationship ρ = ρ₀ + ρ₁ (H)T ^4.5, where ρ₀ ≡ ρ(T = 4.2 K) and ρ₁(H) is a parameter that is independent of temperature but dependent on the magnetic field H. The parameter ρ₁(H = 0) for the La_0.67Ca_0.33MnO₃(30 nm)/LaAlO₃ films is several times larger than that for thin manganite layers only weakly strained by the substrate. The electrical resistivity ρ₁ decreases almost linear as the quantity μ₀ H increases in the field range 1–5 T.     

Magnetoresistance of La<Subscript>0.67</Subscript>Sr<Subscript>0.33</Subscript>MnO<Subscript>3</Subscript> epitaxial films grown on a substrate with low lattice mismatch

The structure, electrical resistivity, and magnetoresistance of La_0.67Sr_0.33MnO₃ heteroepitaxial films (120-nm thick) practically unstrained by lattice mismatch with the substrate were studied. A strong maximum of negative magnetoresistance of ≈27% (for μ₀H = 4 T) was observed at T ≈360 K. While the magnetoresistance decreased monotonically in magnitude with decreasing temperature, it was still in excess of 2% at 150 K. For T < 250 K, the temperature dependence of the electrical resistivity ρ of La_0.67Sr_0.33MnO₃ films is fitted well by the relation ρ = ρ₀ + ρ ₁(H)T^2.3, where ρ₀ = 1.1×10^?4 Ω cm, ρ₁(H = 0) = 1.8×10^?9 Ω cm/K^2.3, and ρ₁(μ₀H = 4 T)/ρ₁(H = 0) ≈0.96. The temperature dependence of a parameter γ characterizing the extent to which the electrical resistivity of the ferromagnetic phase of La_0.67Sr_0.33MnO₃ films is suppressed by a magnetic field (μ ₀H = 5 T) was determined.     

Magnetic Anisotropy Induced by Orbital Occupation States in La_(0.67)Sr_(0.33)MnO_3 Films

Interface engineering is an effective and feasible method to regulate the magnetic anisotropy of films by altering interfacial states between films.Using the technique of pulsed laser deposition,we prepared La_(0.67)Sr_(0.33)MnO_3(LSMO) and La_(0.67)Sr_(0.33)MnO_3/SrCoO_(2.5)(LSMO/SCO) films on(110)-oriented La_(0.3)Sr_(0.7)Al_(0.65)Ta_(0.35)O_3 substrates.By covering the SCO film above the LSMO film,we transformed the easy magnetization axis of LSMO from the [001] axis to the [110] axis in the film plane.Based on statistical analyses,we find that the corresponding Mn-Mn ionic distances are different in the two types of LSMO films,causing different distortions of Mn-O octahedron in LSMO.In addition,it also induces diverse electronic occupation states in Mn~(3+) ions.The eg electron of Mn~(3+)occupies 3 z~2-r~2 and x~2-y~2 orbitals in the LSMO and LSMO/SCO,respectively.We conclude that the electronic spin reorientation leads to the transformation of the easy magnetization axis in the LSMO films.     

Electrical resistivity and magnetotransport in La<Subscript>0.67</Subscript>Ba<Subscript>0.33</Subscript>MnO<Subscript>3</Subscript> films asymmetrically biaxially compressed by an NdGaO<Subscript>3</Subscript>(001) substrate

The La_0.67Ba_0.33MnO₃(40 nm) films are quasi-coherently grown on an NdGaO₃(001) substrate with an orthorhombic unit cell distortion of ～1.4%. The biaxial compressive stresses generated during nucleation and growth lead to a decrease in the unit cell volume of the grown layers. This, in turn, results in a decrease (by ～35 K) in the temperature of the maximum in the dependence of the electrical resistivity ρ of the layers on the temperature. For T < 150 K, the electrical resistivity ρ of the films increases in proportion to ρ₂ T ^4.5 and the coefficient ρ₂ decreases almost linearly with increasing magnetic field H. The negative magnetoresistance (≈?0.17 for μ₀ H = 1 T) reaches a maximum at temperatures close to room temperature. The response of the electrical resistivity ρ of the La_0.67Ba_0.33MnO₃(40 nm) films to the magnetic field depends on the crystallographic direction of the film orientation and the angle between H and I (where I is the electric current through the film).     

La2/3Ca1/3MnO3超薄膜应力弛豫过程及性质研究

锰氧化物庞磁电阻材料超薄膜的应力弛豫特性的研究对理解这一强关联体系的特性及应用都具有重要的意义.为此,我们研究了不同温度退火的La2/3Ca1/3MnO3/LaAlO3超薄膜的形貌、结构、电输运特性等.发现退火导致的应力弛豫对薄膜的性质有很强的调制作用,其电输运性质及结构呈现明显的阶段性变化过程,我们提出了一个高温应力弛豫模型对所观察到的实验现象进行了解释.实验中观察到的规则的自相似网状纳米结构,显示了薄膜应力弛豫过程中自组织生长的分形特征.