三维电子散斑干涉载频调制及其在柴油机上的应用

将电子散斑干涉场的三维载波调制技术应用到三维物体变形测量中.用水平方向、竖直方向及垂直试件表面的三路相干光分别照明物体，在水平和竖直方向通过控制反射镜的微小偏转引入载波，实现位移场干涉条纹的调制；利用物体的微小偏转实现离面位移场干涉条纹的调制；结合傅里叶变换法，分别解调出变形场的位相，从而实现了物体三维变形场的精确测量.将该技术应用到柴油机油泵的三维位移测量上，成功测量了油泵的三维位移场.     

涡旋光的干涉特性及其在变形测量中的应用

将涡旋光应用于电子散斑干涉,测量变形物体的离面位移.把传统的电子散斑干涉测量技术与液晶空间光调制器相结合,将所获得的涡旋光作为参考光或者物光进行变形测量.推导出物光为平面光、参考光为涡旋光,和参考光、物光均为涡旋光时物体变形后的干涉强度公式,模拟计算了变形后的干涉图样,分析了变形图样的特征.运用四步相移方法得到了物体的变形相位公式,通过解包裹得到了物体的变形相位.模拟计算得到的三维相位分布图与物体离面位移的变形相位理论值的三维分布图相吻合.模拟实验结果表明,涡旋光可以应用于物体的变形测量,为变形测量提供新的途径.     

数字散斑干涉术和时空三维相位解包裹用于非连续表面动态变形测量（英文）

为解决传统相位解包裹法不能够用于非连续表面的动态变形测量的缺点,在详细阐述基于时空三维相位解包裹技术的数字散斑干涉术的工作原理和测量步骤基础上,应用数字散斑干涉术和时空三维相位解包裹测量非连续表面动态变形.实验证明,当采用每秒70帧的普通相机拍照时,可实现最快形变速率为25.12μm/s的非连续表面动态变形测量.本文所提方法扩展了数字散斑干涉术的测量范围,增强其应用能力.     

剪切散斑干涉技术及应用研究进展

剪切散斑干涉技术是一种非接触测量物体变形缺陷的光学无损测量方法,其通过计算物体变形前后的散斑图中的相位获取被测物的应变缺陷信息。近年来该技术在航空、航天等工业无损检测领域得到了广泛的应用。本文从系统关键技术、散斑图像处理技术两方面介绍了剪切散斑干涉技术的研究进展,详细论述了多种剪切装置实现大视角测量、空间载波实现动态测量、多种图像处理算法的一系列剪切散斑干涉技术;最后介绍了剪切散斑干涉技术的国内外应用进展,展望了剪切散斑干涉技术在动态测量、光滑表面测量及定量反算形变量等方面的发展趋势。     

数字散斑法在局域剪切带三维变形研究中的应用

在适当的温度、应变率和预变形下,合金材料的拉伸试验中,将会出现伴随应力锯齿形跌落的雪崩式剪切变形带,即波特文-勒夏特利埃(Portevin-Le Chatelier,PLC)效应。利用高速数字摄像系统(分辨力1000 frames/s)并结合数字散斑干涉法(Digital speckle pattern interferometry,DSPI)和数字散斑相关法设计了一套光学变形测量系统,实现了拉伸试验中对试件表面三维变形的实时、精确测量。利用该光学系统对铝铜合金试件在拉伸试验中产生的跳跃传播的局域剪切带瞬态成核过程进行捕捉。通过结合数字散斑相关法得到的面内变形定量结果和数字散斑干涉法得到的表现离面变形的条纹图,再现了剪切变形带成核和传播瞬间的三维变形过程。     

一种利用散斑干涉和灰度等级测量纳米级位移的新方法

为了解决散斑干涉计量中亚波长位移测量的困难，相移技术被广泛使用，但相移技术有其固有缺点，应用非常麻烦。这里提出一种不同于已往相移技术的全新微小位移测量方法。即把灰度等级法和散斑干涉计量相结合以实现对亚波长位移或变形的测量。克服了散斑干涉计量中变形或位移小于半个波长不产生完整条纹时计量困难的缺点,论述了其测量原理并进行了实验。实验结果很好地证明了上述方法的可行性。为精密散斑干涉计量提供了一种更简单有效的方法。     

双波长剪切散斑干涉法在复合材料缺陷检测中的应用

为使剪切散斑干涉能适用于物体大变形的测量,选用双波长激光照射和彩色相机,用傅里叶变换法对干涉图进行频谱分离,用红色波长相位减去绿色波长相位,得到合成波长相位,经频域滤波和相位解包裹,得到连续相位.理论计算表明合成波长相位条纹数是单波长相位条纹数的0.189倍.合成波长参与计算可以有效减小相位条纹密度,解决剪切散斑干涉在物体离面位移测量中由于变形条纹过于密集而导致欠采样的问题,同时降低对干涉条纹滤波和相位解包裹难度,增强图像处理可靠度,提高了测量准确度.给出了合成波长与单波长相位幅度的比较以及相同外力下二者相位条纹密度的对比,实验验证了所提方法的有效性、准确性和可靠性,实现了剪切散斑干涉对复合材料大变形的测量,扩展了剪切散斑干涉工程应用的范围,为新型剪切散斑干涉测量系统的设计提供了参考.     

单参考束型全息-散斑干涉术

本文提出了一种三维变形分离测量技术——单参考束型全息-散斑干涉术,给出了理论分析及实验结果。     

载频调制大剪切电子散斑干涉系统

大剪切电子散斑干涉技术不需要引入参考光，具有条纹质量好等特点。提出将干涉场的载频调制技术引入到大剪切电子散斑干涉中，可形成具有载频调制功能的新的电子散斑干涉系统。该系统具有对测量环境的隔振振动要求低，能方便定量求解物体的变形场等优点。首先讨论大剪切载频的调制机理，然后利用中心加载、周边固定的圆盘进行典型实验，设计了可用计算机控制且可对参考物进行精确偏转的步进电机系统，进而实现了对电子散斑干涉场的自动控制调制。最后，利用傅里叶变换法对调制条纹进行解调，解调出变形场的相位，并通过相位与位移的转换计算，得到精确的物体变形场。实验结果证明，该系统能够调制电子散斑干涉场，求解物体的位移场。     

时间序列动态散斑相关跟踪测量原理及其应用

在对散斑场的特性进行研究与分析的基础上,提出了时间序列动态散斑相关跟踪测量法,它弥补了一般散斑相关法不适合大变形测量的缺点,扩大了散斑相关法的应用范围.运用这种方法不仅可以测量大动态范围的面内变形,而且可以测量分析面内动态变形过程和变形速度.     

Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations

Electronic speckle pattern interferometry(ESPI) and digital speckle pattern interferometry are wellestablished non-contact measurement methods. They have been widely used to carry out precise deformation mapping. However, the simultaneous two-dimensional(2D) or three-dimensional(3D) deformation measurements using ESPI with phase shifting usually involve complicated and slow equipment. In this Letter, we solve these issues by proposing a modified ESPI system based on double phase modulations with only one laser and one camera. In-plane normal and shear strains are obtained with good quality. This system can also be developed to measure 3D deformation, and it has the potential to carry out faster measurements with a highspeed camera.     

Measurement of non-monotonous phase changes in temporal speckle pattern interferometry using a correlation method without a temporal carrier

Recently, a phase evaluation method was proposed to measure nanometric displacements by means of digital speckle pattern interferometry when the phase change introduced by the deformation is in the range [0,π) rad. This method is based on the evaluation of a correlation coefficient between two speckle interferograms generated by both deformation states of the object. In this paper, we present a novel technique to measure non-monotonous displacements in temporal speckle pattern interferometry using a correlation method without a temporal carrier. In this approach, the sign ambiguity is resolved automatically due to the introduction of a function that determines the correct sign of the displacement between two consecutive speckle interferograms. The rms phase errors introduced by the proposed method are determined using computer-simulated speckle interferograms. An application of the phase retrieval method to process experimental data is also presented.     

利用电子散斑相移技术测量物体三维面形的方法

为了获得准确的面形测量,提出了一种相移电子散斑干涉技术测量物体面形的测量方法.利用电子散斑干涉产生载波条纹,该载波条纹受到物体表面高度的调制变得弯曲,引起载波条纹相位的变化,可运用相移技术提取物体的相位信息,最后根据高度和相位之间的关系得到物体的面形.介绍了该方法的原理,利用该方法对球冠物体进行了面形测量,证明该方法测量物体面形是可行性的.由于是采用散斑干涉的方法产生干涉条纹,因此该方法测量物体面形具有灵敏度高的优点.     

Continual deformation analysis with scanning phase method and time sequence phase method in temporal speckle pattern interferometry

If a laser beam illuminates a continual deformation object surface, it will lead to a temporal speckle pattern on the observation plane. Recording this time-dependent speckle pattern the deformation of the surface of an object can be obtained. Two methods, scanning phase method (SPM) and time sequence phase method (TSPM), have been introduced for measuring the displacement caused by the deformation in temporal speckle pattern interferometry (TSPI). Their principle is that by capturing a series of speckle interference patterns related to the object deformations, the fluctuations in the intensity of the interference patterns can be obtained. Through scanning these fluctuations and estimating both the average intensity and modulation of the temporal speckle interference patterns, the phase maps for whole-field displacements are calculated. In this way one is capable of quantitatively measuring continual displacements simply using a conventional electronic speckle pattern interferometry (ESPI) system without phase shifting or a carrier. The elaboration on the new methods is given in this paper and experiments are performed to demonstrate their performance with a conventional ESPI system.     

Speckle interferometry for measurement of continuous deformations

Improvements of a method for measurement of continuous displacements and deformations with digital phase shifting speckle pattern interferometry are presented. The method is based on an algorithm that, with the knowledge of the initial phase, only needs one image at a time to evaluate continuos phase changes due to object deformations. In the improved method, the initial random phase of the speckle pattern is evaluated using a number of phase-shifted images before the deformation under study. This is used for increasing the accuracy of the initial phase estimation and reducing influences from image noise and other measurement disturbances. The phase-shifted speckle patterns are used as references for comparison with the speckle patterns of the deformed object, thereby increasing the reliability and accuracy of the phase estimations of the deformed patterns. The technique can be used for measuring deformations such as transients and other dynamic events, heat expansion as well as other phenomena where it is difficult to accomplish phase shifting during deformation.     

电子散斑干涉载频调制形貌测量方法的分析

根据电子散斑干涉载频调制测量物体形貌的基本原理,物体表面的微小偏转可引入包含物体高度信息的载波干涉条纹。将物体的偏转视为变形,对物体变形与载波干涉条纹之间的关系进行了讨论,得出了离面位移引入载波和面内位移引入含有物体高度信息相位的结论。发现利用典型电子散斑干涉系统测量物体形貌效果最好,并通过实验得到了验证。     

融合散斑干涉技术的阵列式洛伦兹力微颗粒探测方法

提出了一种阵列式洛伦兹力微颗粒探测法,该方法结合了散斑干涉技术的全场位移测量、分辨率高等特性与洛伦兹力微颗粒探测法中探测量为矢量、可探测内部缺陷等优势,探索了一种实时、在线、原位的缺陷检测方法.针对阵列式洛伦兹力微颗粒探测法中阵列式排布的多个悬臂梁位移测量问题,设计了大剪切数字散斑干涉系统,使来自于被测悬臂梁和安装悬臂梁的横梁的反射光发生干涉,形成剪切干涉,通过对相位差进行分析获得悬臂梁的绝对位移,并且以洛伦兹力及悬臂梁末端的位移量为中间量建立了散斑干涉相位差与缺陷体积之间的关系.本文通过实验成功获得了悬臂梁全场位移量以及缺陷的体积,通过散斑干涉的方法测量悬臂梁位移量理论分辨率可达30 nm,这使洛伦兹力微颗粒探测法具备了微米级缺陷的探测能力.     

时间序列散斑干涉场中相位函数的计算

散斑干涉或电子散斑干涉计量应用于连续运动或变形物体时,就会产生一个时变的散斑干涉场,通过摄像系统连续地采集这一时变散斑场,可获得一系列时间序列散斑干涉图,通过对序列散斑图上各点在时间轴上光强值的变化进行分析,提出了一种基于时间序列的分析方法,用以提取干涉场的相位值,进而获得物体全场变形信息。     

A comparative study of phase-shifting algorithms in digital speckle pattern interferometry

Digital speckle pattern interferometry (DSPI) is a tool for making qualitative as well as quantitative measurements of deformation of objects. Phase-shifting algorithms in DSPI are useful for extracting quantitative deformation data from the system. Comparative studies of the different phase-shifting algorithms in DSPI for object deformation measurement are presented. Static and quasi-dynamic deformation of the object can be measured using these algorithms. Error compensating five-step phase-shifting method is used for the algorithms.     

Speckle interferometry

Illumination of a rough surface by a coherent monochromatic wave creates a grainy structure in space termed a speckle pattern. It was considered a special kind of noise and was the bane of holographers. However, its information-carrying property was soon discovered and the phenomenon was used for metrological applications. The realization that a speckle pattern carried information led to a new measurement technique known as speckle interferometry (SI). Although the speckle phenomenon in itself is a consequence of interference among numerous randomly dephased waves, a reference wave is required in SI. Further, it employs an imaging geometry. Initially SI was performed mostly by using silver emulsions as the recording media. The double-exposure specklegram was filtered to extract the desired information. Since SI can be configured so as to be sensitive to the in-plane displacement component, the out-of-plane displacement component or their derivatives, the interferograms corresponding to these were extracted from the specklegram for further analysis. Since the speckle size can be controlled by the F number of the imaging lens, it was soon realized that SI could be performed with electronic detection, thereby increasing its accuracy and speed of measurement. Furthermore, a phase-shifting technique can also be incorporated. This technique came to be known as electronic speckle pattern interferometry (ESPI). It employed the same experimental configurations as SI. ESPI found many industrial applications as it supplements holographic interferometry. We present three examples covering diverse areas. In one application it has been used to measure residual stress in a blank recordable compact disk. In another application, microscopic ESPI has been used to study the influence of relative humidity on paint-coated figurines and also the effect of a conservation agent applied on top of this. The final application is to find the defects in pipes. These diverse applications demonstrate the power of this technique.