掠射法测液体折射率的视场分析

根据薄膜光学理论,分析了掠射法测液体折射率实验的视场.研究结果表明:本实验的视场是分界线附近亮区有明暗相间干涉条纹的准半阴视场;越靠近分界线,条纹间距越小,条纹锐度越大,临界光线对应于最细的亮条纹.进一步准确描述了该实验的实验现象.结合理论分析,测定了自来水的折射率.     

基于两点光源的迈克耳孙实验分析

迈克耳孙实验是大学物理中的一个重要实验.本文从迈克耳孙实验出发,讨论两个点光源在空间光场中产生的非定域干涉和承接光屏放在不同方位上所显示的干涉条纹,用Matlab软件做出干涉条纹图样,并对条纹的形状和光屏位置的关系进行分析,进而通过条纹的形状判断出光源的位置.同时,解释实验中的一些现象,由此加深了对干涉原理和迈克耳孙实验的理解,为下一步更好地学习打下基础.     

干涉亮条纹强度的不均匀分布

建立了低频液体表面声波的激光干涉测量系统,实验上不仅得到了清晰、稳定的干涉条纹,而且首次发现干涉条纹的强度分布具有空间不均匀性,干涉条纹被限定在一定的空间区域内,中心干涉条纹强度最小,向两边强度逐渐增大,在两边界位置达到极大.根据波动光学原理,得到了干涉条纹分布的解析表达式,并给出了低频表面波振幅、波长与干涉条纹空间限度、干涉条纹间距的数学表达式.理论规律与实验结果吻合较好.     

基于Gabor滤波的散斑条纹图平滑方法

提出了一种基于伽博(Gabor)滤波的散斑条纹图平滑方法.通过加窗傅里叶运算提取散斑条纹图的条纹频率和条纹梯度方向,并利用它们确定具有频率和方向选择性的Gabor滤波器对散斑条纹图进行Gabor滤波.数值模拟和实验结果表明,该方法在滤除散斑噪声的同时能够有效的保留散斑条纹图的条纹结构,为从单幅散斑条纹图中进一步提取条纹相位场奠定了良好的基础.     

液面微幅波动的激光干涉测量

对于低频微幅的液面波动,提出了一种激光干涉测量方法.实验上观察到了清晰、稳定的激光干涉图样.干涉图样受到调制,光强在两边界位置达到极大,形成两个极亮条纹.干涉条纹被限制在两个极亮条纹之间的确定区域内.根据光干涉理论推导出了调制干涉条纹光强度、相邻条纹角宽度、干涉区域角宽度与液面波物理参量之间的解析关系,该理论分析与实验...     

光纤温度和应变特性研究实验仪的开发

针对目前光纤传感实验存在的问题, 搭建了光纤干涉实验平台. 利用计算机与摄像头的配合得到干涉 条纹移动数目( 取代传统用肉眼观察白屏的方法) , 利用温度传感器与计算机的结合取代传统的温度计, 可以在计算 机上同时采集到温度和移动条纹数, 实时描绘出温度和条纹移动数目的关系图, 或者应变和条纹移动数目的关系. 所建立的系统稳定可靠, 实验效果好, 更具现代科技气息     

光栅莫尔条纹特性检测仪的研制

介绍一种应用CCD进行测量的光栅莫尔条纹特性检测仪.该检测仪的结构完全开放,检测过程透明.不仅能够检测光栅副相对移动位移和移动方向与莫尔条纹移动数目和移动方向的关系,而且可以检测光栅副夹角变化对莫尔条纹宽度的影响.应用该仪器可以进行"莫尔条纹移动数目与光栅副移动位移关系测定"和"光栅副夹角变化和莫尔条纹宽度变化关系测定"两个实验,实验结果理想.     

低频液体表面波衍射条纹正负级次的不应性

基于声光衍射原理,利用光学方法对低频液体表面波的光衍射特性进行了研究,给出了非对应级数的解析表达式并进行了数值模拟,解释了非对应分布的机理.实验观察到清晰、稳定的衍射图样,且条纹间距具有明显的不对称性;随入射角度增大,正负级衍射条纹具有明显的不对应分布,即正条纹级数多于负条纹级数.研究表明:衍射条纹级数的不对应程度与入射角有关,随入射角的增大,正负级数不对应程度加剧;负级衍射条纹级数存在最大值,超过该最大值的负级衍射条纹缺失;理论分析和实验结果吻合较好.     

基于Arduino单片机的双光纤双向干涉条纹计数器

介绍了一种基于Arduino单片机的双光纤双向干涉条纹计数器.该装置可根据干涉条纹的涌出和陷入实现条纹的双向计数.在干涉法测量金属热膨胀系数实验中,使用此计数器对条纹计数,具有成本低廉、操作简易、计数精度高、抗干扰能力强、反应时间短等优点.     

全息散斑条纹的提取及图像处理

介绍了一种新的全息散斑条纹的提取方法.理论和实验表明:对全息散斑底片逐点再现时,两伴生亮斑条纹是全息散斑底片一级衍射光的杨氏干涉条纹,与中央的杨氏条纹是一致的,有较高的条纹对比度且没有背景光晕的影响.利用计算机数字图像处理技术对伴生散斑条纹进行处理,定量测试了受静载物体的面内位移.     

利用透射光栅寻找迈克耳孙干涉仪的白光干涉条纹

介绍了借助透射光栅调整迈克耳孙干涉仪的白光干涉条纹的方法和原理，并讨论了其中的有关现象．     

High sensitivity micro-displacement homodyne interferometry北大核心CSCD

Interferometry is widely used in nano-scale micro-topography measurement. In order to improve its accuracy and sensitivity, a high-sensitivity homodyne interferometry based on white light interference and laser secondary interference was proposed. A high-sensitivity homodyne interferometry system was designed, and the zero point of the laser secondary interference was used to locate the dark striation of white light interference, so that it could reach the maximum slope when optical path difference was zero. The signals of white light and laser were analyzed by using the wave principle and intensity formula of interference fringes, and a sensitivity calculation method based on the combination of white light and laser interference signal was proposed. The system and its sensitivity were simulated. Finally, the optical path was built, and the white light interference fringes were adjusted to the dark striations position, so as to locate the zero position of laser secondary interference and carry out the data acquisition. It is showed that the sensitivity of the measurement method is at least 1 832 times higher than that of the laser secondary interference, and the corresponding measurement uncertainty is only ±0.288 7 mV. The measurement system can effectively solve the problem of large amount of calculation in traditional interferometry, and has high sensitivity, stability and reliability. Copyright ©2022 Journal of Applied Optics. All rights reserved.     

非接触法自动测量薄膜厚度

根据白光等厚干涉原理,基于单片机改造的迈氏干涉仪用于自动测量透明薄膜厚度,采用非接触性测量法。当迈克尔逊干涉仪静镜形成的虚像与动镜相交所成的夹角很小时,在光屏上看到彩色干涉条纹,插入薄膜后,光程差改变,彩纹消失。步进电机带动微调手轮转动,当彩纹再次出现,即可得出透明薄膜厚度。     

斜率和曲率的显色云纹及其级数识别

本文提出了用白光获得板面曲率的显色云纹方法。理论和实验分析说明，曲率和斜率的显色云纹可用于其级数的自动识别。本方法具有不必经过计算，实时确定条纹级数的优点，对于曲率和斜率测量方法和系统的完善具有实际意义。     

Growth and properties of wide spectral white light emitting diodes

Wide spectral white light emitting diodes have been designed and grown on a sapphire substrate by using a metal-organic chemical vapor deposition system. Three quantum wells with blue-light-emitting, green-light-emitting and red-light-emitting structures were grown according to the design. The surface morphology of the film was observed by using atomic force microscopy. The films were characterized by their photoluminescence measurements. X-ray diffraction θ/2θ scan spectroscopy was carried out on the multi-quantum wells. The secondary fringes of the symmetric ω/2θ X-ray diffraction scan peaks indicate that the thicknesses and the alloy compositions of the individual quantum wells are repeatable throughout the active region. The room temperature photoluminescence spectra of the structures indicate that the white light emission of the multi-quantum wells is obtained. The light spectrum covers 400-700 nm, which is almost the whole visible light spectrum.     

迈克耳孙干涉仪测平行玻片折射率实验的进一步研究

用迈克耳孙干涉仪测平行玻片折射率的实验中,干涉条纹的位置和形状出现许多与常规不同的现象。本文对此作一理论分析,并与实验结果相比较。     

Influence of out-of-plane deformation and its elimination in white light speckle photography

The aim of this paper is to present the white light speckle method as a practical tool in metrology and to search for the optimum conditions for its application. In particular, the study provides evidence that the white light speckle technique is not exclusively sensitive to the in-plane components of displacement. Consequently, the interpretation of the Young's fringes as pure in-plane fringes is prone to inaccurate measurements. The errors so introduced are systematically analysed for various optical parameters. Some practical considerations are then pointed out to aid in the design of an error-tolerance limited white light displacement measurement system to suit a particular need. two complementary techniques are next proposed which promise to eliminate the influence of the out-of-plane movements on the measurement of the lateral components of displacement. The proposed methods not only allow an increase in the accuracy of in-plane measurements, but also permit mapping of the out-of-plane movements undergone by the object surface. The techniques presented, apply equally to coherent speckle photography where the same problems are manifest, and should pave the way for the application of these methods to concrete engineering problems.     

Simple spatial filtering for shearograms

The spatial frequency spectrum of shearographic speckle patterns is analysed. Shearogram reconstruction with high contrast fringes is possible using spatial filters adapted to the spectrum. This filtering is not only possible in Fourier processing set-ups, but also can be easily realized with a camera and a white light source.     

基于白光扫描干涉法的光纤折射率分布的测量

提出了一种光纤折射率分布的测量方法,采用白光扫描干涉技术,并在参考镜上构造与光纤样品相同的结构来克服白光相干长度短的限制,优化了光路,提高了干涉条纹间的对比度。采用与白光干涉信号的包络线呈高斯分布的Morlet小波作为小波变换的母小波进行拟合处理,得到光纤与已知折射率的匹配液之间的相对高度。通过计算获得光纤的折射率分布,并对获得的数据采用光纤折射率分布的经典函数进行拟合,得到多模光纤和单模光纤的决定系数分别为0.997 2和0.996 4。最后将实验获得的结果与官方参数进行比较,误差为0.01%,表明该种方法测量的精度较高,完全可以用来测量光纤的折射率。     

白光LED光斑均匀性的改进

用于照明领域的白光LED,其出射光斑的色度均匀性对于产品性能有着更加重要的意义.介绍了目前工业上制作白光LED主要采用的荧光粉灌封点胶工艺.并在目前主流灌封点胶工艺的基础上通过改善荧光粉层结构形状,以提高白光LED器件的出射光斑均匀性.并通过九点法对不同工艺结构下LED出射光斑的空间色度分布进行了测量和分析.通过分析,虽然采用不同的粉层结构,能够一定程度上改善白光光斑的色度均匀性.但总体上,采用这种传统的点胶工艺制作的器件的白光光斑性能不好,现有的荧光粉层灌封点胶工艺存在很大的弊端.荧光粉层的可控性是影响色度均匀性(即光斑均匀性)的主要因素,包括单个器件内的光斑和器件之间的颜色一致性都不理想.