基于扫描电子显微镜的碳纳米管拾取操作方法研究

碳纳米管场效应管是未来纳米器件的发展方向,而制造纳米器件的前提是拾取碳纳米管,基于扫描电子显微镜(SEM)的微纳机器人操作系统能够实现碳纳米管拾取操作.本文建立拾取操作中碳纳米管与原子力显微镜(AFM)探针间范德瓦耳斯力力学模型,不同接触状态下范德瓦耳斯力越大越有利于拾取碳纳米管.在SEM视觉反馈图像中建立相对坐标系,首先提出倾角变值方法检测碳纳米管与AFM探针的接触状态,然后运用动态差值方法识别碳纳米管与AFM探针空间位姿并校正碳纳米管位姿,最后自下而上拾取碳纳米管.实验结果表明:拟合直线倾角变值较大时碳纳米管与AFM探针发生接触,动态差值变化为零时碳纳米管与AFM探针为空间线接触,在完全线接触模型下选择合适的接触角度、接触长度和拾取速度能够成功拾取碳纳米管.     

多壁碳纳米管中的多通道弹道输运特性

借助于扫描电子显微镜中可移动金属探针的测量系统,实现了探针电极与W衬底上生长的单根多壁碳纳米管一端的完美接触.研究了单根多壁碳纳米管室温下的电输运特性,发现多壁碳纳米管具有非常高的电流承载能力.对于直径100nm的碳纳米管,其电阻为34.4Ω,流经碳纳米管的最大电流可达7.27 mA,对应的电导为 460-490G0 .这一实验结果表明,大直径的多壁碳纳米管在室温下可以实现多通道弹道输运,是未来纳电子器件与电路的理想互联导线.     

ZnO纳米线场效应管的制备及I-V特性研究

采用静电探针和原子力探针技术,将化学气相沉积工艺制备的,长度为30-200μm,直径80-750 nm的单根半导体ZnO纳米线搭接在Au,Zn,Al不同功函的金属隔离沟道两端,构建出了最基本的ZnO纳米线绝缘栅场效应管.研究了沟道类型、纳米线直径、退火温度和外加栅压对ZnO纳米线场效应管I-V特性的影响.利用半导体与金属材料的肖特基接触、欧姆接触的产生机理及电子输运理论,对结果进行了分析和讨论.     

径向压缩碳纳米管的电子输运性质

研究径向压缩形变对碳纳米管电子输运性质的影响对搭建微纳碳基电子器件具有重要意义.本文利用分子动力学模拟方法研究了碳纳米管与金属界面接触构型,得出碳纳米管径向压缩形变的规律.模拟结果表明:碳纳米管在水平接触金属表面后,其稳定状态下的径向压缩形变大小会受接触长度、管径大小、金属种类和片层数量的影响.基于紧束缚密度泛函理论和非平衡格林函数结合的第一性原理,系统地研究了不同直径、手性、片层、径向压缩形变碳纳米管的电子输运性质.研究表明:金属性单壁碳纳米管的电流呈线性增长趋势,且电流-电压的大小只与偏压有关,与直径大小无关;当其存在径向压缩形变时,电流在大偏压下增长趋势减缓,甚至会出现平台效应.半导体性单壁碳纳米管的导通电流随着径向压缩形变的增加而减小,电流-电压曲线逐渐从半导体特性向金属特性转变.随着径向压缩形变的增加,双壁碳纳米管的电流-电压曲线变化规律与金属性单壁碳纳米管的电流-电压曲线变化规律一致,但在相同偏压下,双壁碳纳米管的电流比单壁碳纳米管的电流高1倍;三壁碳纳米管的电流-电压曲线存在较大的振荡波动.     

ZnO纳米线场效应管的制备及I-V特性研究

采用静电探针和原子力探针技术,将化学气相沉积工艺制备的,长度为30—200 μm,直径80—750 nm的单根半导体ZnO纳米线搭接在Au,Zn,Al不同功函的金属隔离沟道两端,构建出了最基本的ZnO纳米线绝缘栅场效应管. 研究了沟道类型、纳米线直径、退火温度和外加栅压对ZnO纳米线场效应管I-V特性的影响. 利用半导体与金属材料的肖特基接触、欧姆接触的产生机理及电子输运理论,对结果进行了分析和讨论. 关键词： ZnO纳米线 场效应管 I-V特性')" href="#">I-V特性     

碳纳米管网络导电特征的导电型原子力显微镜研究

利用导电型原子力显微镜对大范围碳纳米管（CNT）网络的导电性能进行成像观察.研究发现：在几十微米的成像范围内,每根CNT本身的电阻远小于CNT之间的接触电阻,以致于在电压偏置的网络中不同的CNT呈现电位不同的等位体;CNT的导电性能虽不因与其他CNT的交叠接触而改变,但是如果缠绕成束,则半导体性CNT趋于呈现金属性CNT的导电特征. 关键词： 导电型原子力显微镜 碳纳米管网络 碳管纳米电导     

外加轴向磁场下碳纳米管场效应晶体管的电学性质

在紧束缚理论的基础上推导出轴向磁场下碳纳米管的能带公式,研究外加磁场下碳纳米管场效应晶体管的电学特性.说明磁场可使碳管的导电性质在金属型和半导体型之间转变,转变的磁场周期为0.5₀.进一步应用场效应晶体管Natori理论模拟计算了外加磁场对碳纳米管场效应晶体管的电流-电压特性的影响,研究结果显示zigzag管和armchair管的电流随外电压和磁场都有振荡行为,而且两类管的振荡行为有明显差别. 关键词： 碳纳米管 紧束缚理论 费米能 能带结构     

原子力显微技术研究ZnO纳米棒的压电放电特性

在原子力显微镜的接触扫描模式下,研究了半导体ZnO纳米棒的压电放电特性.采用两步湿化学法制备沿c轴择优生长的ZnO纳米棒阵列;利用镀Pt探针接触扫描ZnO纳米棒获得峰值达120 pA电流脉冲,脉冲持续时间可达30 ms,电流脉冲与纳米棒的形貌存在对应关系.镀Pt探针与ZnO纳米棒接触形成肖特基二极管,I-V特性研究表明放电的ZnO纳米棒压电电势必须大于03 V,以驱动肖特基二极管并输出电流;放电时肖特基二极管的结电阻达吉欧(GΩ)量级,是影响压电电势输出的主要因 关键词： ZnO 纳米棒 压电放电 肖特基接触     

钯金属吸附对半导体性碳纳米管电输运的影响

利用物理蒸发技术,在半导体性的碳纳米管上沉积钯金属,利用导电原子力显微镜检测钯吸附对碳纳米管电输运的影响.结果表明:沉积的钯在碳纳米管上形成纳米颗粒,随着钯颗粒密度的增加,半导体性碳纳米管逐渐向金属性转变.利用第一性原理计算了吸附有钯原子的半导体性单壁碳纳米管的能带结构.研究发现,钯的覆盖率越高,其禁带宽度越窄,直至为零,定性说明了实验结果的合理性. 关键词： 单壁碳纳米管 钯纳米颗粒 导电原子力显微镜 第一性原理计算     

印刷制作的双半导体底层碳纳米管薄膜阴极的稳定电子发射

应用带保护气进行烧结的方法,制作了一种双半导体底层碳纳米管薄膜阴极.利用烧结的银浆形成条形银电极,在条形银电极表面制作了具有相同宽度且平行排列的ZnO掺杂底层和TiO2掺杂底层,在掺杂底层上面制备了碳纳米管膜层.由于保护气的防氧化屏蔽,碳纳米管膜层中的碳纳米管未受损害,ZnO粒子和TiO2粒子也在烧结过程中得到了很好地保护,双半导体底层碳纳米管薄膜阴极获得更优的电子发射特性,且电子发射稳定性也得到有效增强.与普通条形银电极碳纳米管阴极相比,双半导体底层碳纳米管薄膜阴极能够将开启电场从2.09V/μm降低到1.91V/μm,将最大电子发射电流从1 653.5μA提高到2 672.9μA.在2.69V/μm电场作用下,普通条形银电极碳纳米管阴极的电子发射电流仅为421.1μA,而双半导体底层碳纳米管薄膜阴极的电子发射电流能够达到723.5μA.从发射电流稳定性实验曲线可以看出,双半导体底层碳纳米管薄膜阴极实现了稳定的电子发射,表明ZnO掺杂底层和TiO2掺杂底层能够应用于真空环境.利用数码相机获得了具有良好质量的发射图像,验证了双半导体底层碳纳米管薄膜阴极制作的可行性和适用性.     

Electrostatic and van der Waals forces in the air contact between the atomic force microscope probe and a conducting surface

Electrostatic and van der Waals forces of interaction between commercial probes of atomic force microscopes (AFMs) and conducting surfaces under atmospheric conditions are measured using contact atomic force microscopy. An algorithm of statistical processing of the initial photocurrent-displacement dependences is developed, which makes it possible to transform these dependences into the force-distance dependences. The Hamaker constant at the platinum (probe)-graphite (sample) contact is determined. It is shown that the measurement of electrostatic forces makes it possible to determine geometrical parameters of the AFM probe and to independently calibrate the stiffness of the cantilever.     

Characterization of English ivy (<Emphasis Type="Italic">Hedera helix</Emphasis>) adhesion force and imaging using atomic force microscopy

English ivy (Hedera helix) is well known for its ability to climb onto and strongly adhere to a variety of solid substrates. It has been discovered that the ivy aerial rootlet secretes an adhesive composed of polysaccharide and spherical nanoparticles. This study aims to characterize the mechanical properties of the nanocomposite adhesive using atomic force microscopy (AFM). The adhesive was first imaged by AFM to visualize the nanocomposite. Mechanical properties were then determined at various time points, from secretion to hardening. The experimental results indicate that the ivy adhesive exhibited strong adhesion strength and high elasticity. There was a decrease in adhesive force over time, from 298 to 202 nN during the 24-h study. Accompanying with it were the limited changes in extension length and Young’s modulus. The limited curing process of the ivy adhesive helps fill gaps in the attaching surface, leading to more intimate contact and increased van der Waals interactions with the surface. However, study based on a mechanical model indicated that van der Waals force alone is not significant enough to account for all of the measured force. Other chemical interactions and cross linking likely contribute to the strong adhesion strength of ivy.     

A cohesive law for multi-wall carbon nanotubes

We have established the cohesive law for carbon nanotube (CNT) walls in multi-wall CNTs. The interactions between CNT walls are characterized by the van der Waals force. The tensile cohesive strength and cohesive energy are given in terms of the area density of CNT and parameters in the van der Waals force. For an infinitely long CNT, the shear cohesive stress between CNT walls vanishes, and the tensile cohesive stress depends only on the opening displacement. For a finite CNT, the tensile cohesive stress remains the same, but the shear cohesive stress depends on both opening and sliding displacements, i.e. the tension/shear coupling. The simple, analytical expressions of the cohesive law are useful to study the interaction between walls in multi-wall CNTs.     

Force spectroscopy in noncontact mode

We have analyzed the possibility of using noncontact scanning force microscopy (NCAFM) to detect variations in surface composition, i.e., to detect a ‘spectroscopic image' of the sample. This ability stems from the fact that the long-range forces, acting between the AFM tip and sample, depend on the composition of the AFM tip and sample. The long-range force can be magnetic, electrostatic, or van der Waals forces. Detection of the first two forces is presently used in scanning force microscopy technique, but van der Waals forces have not been used. We demonstrate that the recovery of spectroscopic image has a unique solution. Furthermore, the spectroscopic resolution can be as good as lateral one.     

Exact solution of the frequency shift in dynamic force microscopy

The exact frequency shift of an AFM non-uniform probe with an elastically restrained root, subjected to van der Waals force, is derived. The original distributed system is considered and then its exact fundamental solutions and the general frequency equation are derived. Results are compared with those by the force gradient method and the perturbation method. The effects of several parameters on the sensitivity of measurement are investigated. Results show that the interpretation of frequency shift by using the force gradient method is unsatisfactory. The smaller the amplitude of oscillation and the tip–surface distance are, the larger the frequency shift. The design of a taper beam is recommended for increasing the sensitivity of measurement.     

Dynamic mechanism for encapsulating two HIV replication inhibitor peptides with carbon nanotubes

Encapsulation of biomolecules inside a carbon nanotube(CNT) has attracted great interest because it could enable the delivery of nanoscale pharmaceutical drugs with CNT-based devices.Using a molecular dynamics simulation,we investigate the dynamic process by which human immunodeficiency virus(HIV) replication inhibitor peptides(HRIPs) are encapsulated in a water solution contained inside a CNT.The van der Waals attraction between the HRIPs and the CNT and the root-mean-square deviation are used to analyse the evolution of the encapsulation.It is found that the interaction between the HRIPs and the CNT is the main driving force for the encapsulation process,which does not cause an obvious conformational change to the HRIPs.     

Non-Contact to Contact Transition： Direct Measurements of Interaction Forces between a Solid Probe and a Planar Air-Water Interface

The interaction force between a solid probe and a planar air-water interface is measured by using an atomic force microscope. It is demonstrated that during the approach of the probe to the air-water interface, the force curves decline all the time due to the van der Waals attraction and induces a stable profile of water surface raised. When the tip approaches very close to the water surface, force curves jump suddenly, reflecting the complex behaviour of the unstable water surface. With a theoretical analysis we conclude that before the tip touches water surface, two water profiles appear, one stable and the other unstable. Then, with further approaching, the tip touches water surface and the non-contact to contact transition occurs.     

Application of atomic force microscopy to microbial surfaces: from reconstituted cell surface layers to living cells.

The application of atomic force microscopy (AFM) to probe the ultrastructure and physical properties of microbial cell surfaces is reviewed. The unique capabilities of AFM can be summarized as follows: imaging surface topography with (sub)nanometer lateral resolution; examining biological specimens under physiological conditions; measuring local properties and interaction forces. AFM is being used increasingly for: (i) visualizing the surface ultrastructure of microbial cell surface layers, including bacterial S-layers, purple membranes, porin OmpF crystals and fungal rodlet layers; (ii) monitoring conformational changes of individual membrane proteins; (iii) examining the morphology of bacterial biofilms, (iv) revealing the nanoscale structure of living microbial cells, including fungi, yeasts and bacteria, (v) mapping interaction forces at microbial surfaces, such as van der Waals and electrostatic forces, solvation forces, and steric/bridging forces; and (vi) probing the local mechanical properties of cell surface layers and of single cells.     

Sliding velocity dependence of adhesion in a nanometer-sized contact

The influence of sliding velocity on the adhesion force in a nanometer-sized contact was investigated with a novel atomic force microscope experimental setup that allows measuring adhesion forces while the probe is sliding at continuous and constant velocities. For hydrophobic surfaces, the adhesion forces (mainly van?der?Waals forces) remain constant, whereas for hydrophilic surfaces, adhesion forces (mainly capillary forces) decrease linearly with a logarithmic increase of the sliding velocity. The experimental data are well explained by a model based on a thermally activated growth process of a capillary meniscus.