碳纳米管网络导电特征的导电型原子力显微镜研究

利用导电型原子力显微镜对大范围碳纳米管（CNT）网络的导电性能进行成像观察.研究发现：在几十微米的成像范围内，每根CNT本身的电阻远小于CNT之间的接触电阻，以致于在电压偏置的网络中不同的CNT呈现电位不同的等位体；CNT的导电性能虽不因与其他CNT的交叠接触而改变，但是如果缠绕成束，则半导体性CNT趋于呈现金属性CNT的导电特征. 关键词： 导电型原子力显微镜 碳纳米管网络 碳管纳米电导

Using conductive atomic force microscope on carbon nanotube networks

Conductive atom force microscopy observations have been performed on carbon nanotube networks. The results indicate that within an imaging range of several tens of micrometers the resistance of a carbon nanotube is much smaller than the contact resistance between two crossed carbon nanotubes and so the potential difference hardly appears along a carbon nanotube if the carbon nanotube network is electrically biased. Besides, if several semiconducting carbon nanotubes wind into a bundle, they tend to appear like metallic carbon nanotubes.