原子力显微镜及其对DNA大分子的应用研究

详细讨论了原子力显微镜的基本原理和针尖－样品间相互作用力，大量实验结果表明，ＡＦＭ这个高分辨成像技术对ＤＮＡ大分子进行应用研究是非常适合的，同时我们也讨论了样品制备方法的改进、成像模式和环境选择等因素对ＤＮＡ大分子ＡＦＭ结果的影响以及ＡＦＭ在ＤＮＡ分子结构研究中的一些局限性。     

扫描显微探针

 随着１９８２年世界上第一台原子分辨的隧道扫描显微镜（ＳＴＭ）问世,掀起了对物质表面微结构研究的热潮,而且蔓延到表面化学以及生物大分子等领域．同时对ＳＴＭ原理及检测技术的推广,促使了原子力显微镜（ＡＦＭ）、近场光学显微镜（ＳＮＯＭ）的发明．现在,以ＳＴＭ、ＡＦＭ、ＳＮＯＭ为代表的高分辨显微镜已经形成了一类新的显微成像技术──扫描探针显微术（ＳＰＭ）．ＳＰＭ最显著的特点就是采用一个极微小的探针（针尖一般在纳米尺度）,在样品表面极小的距离内移动,同时获得样品表面信息．当这极小的探针与样品表面的相互作用强烈依赖于极小的距离（大约是指数关系）,仪器的稳定性则是获得理想图像的关键.     

甲壳胺膜中MS(M=Cd,Zn)半导体纳米微粒形成机理的探讨

采用红外光谱（ＩＲ）和原子力显微镜（ＡＦＭ）对甲壳胺中纳米微晶生长过程进行了监测,并对测试结果进行了分析与讨论,提出甲壳胺膜中ＭＳ（Ｍ＝Ｃｄ,Ｚｎ）半导体纳米微晶可能的生长机制。同时还利用ＡＦＭ对甲壳胺中纳米微晶的形貌和尺度进行了测定。     

大尺寸工件视觉测量中的图像拼接方法

为提高大尺寸工件机器视觉测量精度,提出一种基于坐标变换的图像拼接方法,并给出该坐标变换方法的解算模型及求解方法,分析了局部测量误差、重叠区域公共点个数等对坐标变换精度的影响,得到了最佳拼接条件,并通过实验对其进行了验证。实验结果表明,该方法简单易行、结果可靠,对存在平移、旋转以及尺度缩放的图像都具有良好的效果,能有效地解决采用机器视觉进行大尺寸工件精确测量时的坐标归一化问题。     

纳米晶体ZnS∶Mn~(2 )发光寿命异常减缩机理的探讨

纳米晶体ＺｎＳ∶Ｍｎ２＋中Ｍｎ２＋粒子４Ｔ１→６Ａ１的发光寿命比晶体减缩了５个量级，这颇令人费解，因为通常解除自旋禁戒的磁作用远无如此强的效应．假定基质态的自旋不为零，且考虑了Ｍｎ２＋的ｄ电子和基质之间的交换库仑作用．若基质存在比Ｍｎ２＋的４Ｔ１激发态能量略高的某种激发态，则这种交换库仑作用将导致这两种激发态之间的混合，从而可解除发光能级弛豫中的自旋禁戒．这种混合随基质颗粒尺寸的减小而加强．我们并对此机制进行粗略的数值估计，给出了和实验相容的结果．     

结合边缘信息和图像特征信息的曲波域遥感图像融合

曲波变换是一种更适合于图像处理的多尺度几何分析方法,具有比小波变换更强的方向选择和辨识能力,而且对图像边缘的表达更优于小波.结合色度-饱合度-亮度变换将其应用于合成孔径雷达图像和多光谱图像融合可以更好地表示图像中的有用特征.首先对多光谱图像进行色度-饱合度-亮度变换,得到亮度分量I,对雷达图像和I分量进行曲波变换得到粗尺度系数和细节尺度系数;将雷达图像的粗尺度系数和细节尺度系数进行叠加,计算归一化的曲波系数直方图,定义边缘有效因子,利用合成孔径雷达图像的特征信息将曲波变换系数分为均匀区、非均匀区和亮点目标区.然后采用相应的融合规则对融合图像的粗尺度系数进行处理,对细节尺度系数采用简单的直接取大方法,逆变换后得到新的亮度分量.用新的亮度分量替代原亮度分量进行逆色度-饱合度-亮度变换得到最终融合结果,利用统计类指标对融合结果进行评价.实验结果表明,该方法在保持光谱信息和提高空间分辨率上都有较好的效果.     

结合边缘信息和图像特征信息的曲波域遥感图像融合

曲波变换是一种更适合于图像处理的多尺度几何分析方法,具有比小波变换更强的方向选择和辨识能力,而且对图像边缘的表达更优于小波.结合色度-饱合度-亮度变换将其应用于合成孔径雷达图像和多光谱图像融合可以更好地表示图像中的有用特征.首先对多光谱图像进行色度-饱合度-亮度变换,得到亮度分量Ⅰ,对雷达图像和Ⅰ分量进行曲波变换得到粗尺度系数和细节尺度系数;将雷达图像的粗尺度系数和细节尺度系数进行叠加,计算归一化的曲波系数直方图,定义边缘有效因子,利用合成孔径雷达图像的特征信息将曲波变换系数分为均匀区、非均匀区和亮点目标区.然后采用相应的融合规则对融合图像的粗尺度系数进行处理,对细节尺度系数采用简单的直接取大方法,逆变换后得到新的亮度分量.用新的亮度分量替代原亮度分量进行逆色度-饱合度-亮度变换得到最终融合结果,利用统计类指标对融合结果进行评价.实验结果表明,该方法在保持光谱信息和提高空间分辨率上都有较好的效果.     

Pd-Mo-K/Al2O3催化剂的结构及合成醇性能

采用ＸＲＤ、ＥＸＡＦＳ技术研究了不同Ｐｄ含量的Ｐｄ－Ｍｏ－Ｋ／Ａｌ２Ｏ３催化剂结构,并关联其合成低碳混合醇性能。结果表明,在氧化态Ｍｏ－Ｋ／Ａｌ２Ｏ３催化剂体系中添加Ｐｄ后,“Ｋ－Ｍｏ”物相晶粒变小,分散度提高,说明钯可能和钾钼物种发生了较强的相互作用。经硫化还原处理后,发生了氧硫交换,钼主要以ＭｏＳ２物种形式存在,其粒度随着Ｐｄ含量的增加而明显减小。尺寸的显著变化可能导致ＭｏＳ２与载体作用形式的     

粒子场数字全息诊断中的再现算法研究

 粒子场的数字全息诊断中,良好的再现算法能够在较短的时间内给出高质量的再现像。利用标准粒子板模拟单层面的粒子场,使用大面阵CCD实现同轴数字全息记录,得到了大尺寸的数字全息图。针对4种数字全息再现算法,本文从再现图像的质量、再现全息图的大小和计算速度3个主要方面进行了比较研究,结果表明角谱算法(FFT-AS)具有再现图像背景均匀,再现结果中无物理图像压缩,可以再现大尺寸的全息图且具有较快计算速度的优点,适合于粒子场同轴数字全息图的再现计算。     

中子引起的单粒子反转截面的Monte Carlo模拟计算

单粒子效应是蠹民粒子在电子元器件中通过时，靠民电子元器件的电离损伤，导致电子元器件的记录出错。考虑了１０－２０ＭｅＶ中子与硅反应的主要反应道，利用Ｍｏｎｔｅ Ｃｑｒｌｏ方法对中子射入硅器件器中引起的单粒子反转进行模拟，得到质子、α粒子的能量、角度分布。考虑带电粒子在硅片中引起的电离 损伤，对不同临界电荷在１６Ｋ动态ＲＡＭ硅片中有一个灵敏单克发生反转时，中子入射注量及相应在的单粒子反转截面，给出了反     

Modeling of surfaces of constant force above a lattice of close-packed atoms in the repulsive mode

Surfaces of constant force (force contours) are calculated for the scanning of an AFM tip over a lattice of close-packed atoms in the repulsive mode. It is shown that discontinuities are observed on the force contours in the regions between the atoms of the surface lattice for sufficiently small initial scanning heights of a tip with a single atom at its end. A cluster model of the tip end, which ensures continuity of the scanning at arbitrary initial heights, is constructed. The dependence of the AFM images on the orientation of the cluster on the tip end relative to the crystallographic axes of the surface is investigated for both an unperturbed lattice of close-packed atoms and a lattice containing point defects. The diagnostic possibilities of the findings are discussed. Zh. Tekh. Fiz. 67, 77–85 (June 1997)     

Theoretical Study on the Capillary Force between an Atomic Force Microscope Tip and a Nanoparticle

Considering that capillary force is one of the most important forces between nanoparticles and atomic force microscope （AFM） tips in ambient atmosphere, we develop an analytic approach on the capillary force between an AFM tip and a nanoparticle. The results show that the capillary forces are considerably affected by the geometry of the AFM tip, the humidity of the environment, the vertical distance between the AFM tip and the nanoparticle, as well as the contact angles of the meniscus with an AFM tip and a nanoparticle. It is found that the sharper the AFM tip, the smaller the capillary force. The analyses and results are expected to be helpful for the quantitative imaging and manipulating of nanoparticles by AFMs.     

The influence of a probe on topographical images in atomic force microscopy

Examples of the errors that arose under the studies of metric characteristics of micro- and nanoobjects with atomic force microscopy (AFM) are presented. Degradation of the tip of the probe both under successive scanning of the same part of a sample surface and in the course of a single scan is revealed. AFM images acquired with the probe having twin apexes located at different levels are demonstrated.     

Imaging characterization of carbon nanotube tips modified using a focused ion beam

A carbon nanotube (CNT) tip, which assembled on the sharp end of a Si tip by dielectrophoresis, was structurally modified using focused ion beam (FIB). We described the imaging characterization of the FIB-modified CNT tip in noncontact AFM mode in terms of wear, deep trench accessibility, and imaging resolution. Compared to a conventional Si tip, the FIB-modified CNT tip was superior, especially for prolonged scanning over 10 h. We conclude that modified CNT tips have the potential to obtain high-quality images of nanoscale structures.     

Chaos in atomic force microscopy

Chaotic oscillations of microcantilever tips in dynamic atomic force microscopy (AFM) are reported and characterized. Systematic experiments performed using a variety of microcantilevers under a wide range of operating conditions indicate that softer AFM microcantilevers bifurcate from periodic to chaotic oscillations near the transition from the noncontact to the tapping regimes. Careful Lyapunov exponent and noise titration calculations of the tip oscillation data confirm their chaotic nature. AFM images taken by scanning the chaotically oscillating tips over the sample show small, but significant metrology errors at the nanoscale due to this "deterministic" uncertainty.     

Kinetic contrast in atomic force microscopy

The mechanism of the formation of phase contrast in atomic force microscopy (AFM) is studied for various conditions of an oscillating tip interacting with the surface. A phase shift is detected in oscillations of the resonating AFM tip during its interaction with the substrate surface when the AFM tip moves over the surface. We substantiate kinetic mechanism of the formation of phase contrast in AFM, which is initiated when the velocity of the AFM tip moving over the substrate surface increases as a result of increasing friction force. A dependence of the kinetic contrast in AFM on the effective roughness of the surface is discovered. Images of the distribution of copper impurity over the silicon surface under atmospheric conditions are obtained using the method of kinetic phase contrast in AFM.     

Growth of InGaAs-capped InAs quantum dots characterized by Atomic Force Microscope and Scanning Electron Microscope

Atomic force microscopy (AFM) is typically used to measure the quantum dot shape and density formed by lattice mismatched epitaxial growth such as InAs on GaAs. However, AFM images are distorted when two dots are situated in juxtaposition with a distance less than the AFM tip width. Scanning electron Microscope (SEM) is much better in distinguishing the dot density but not the dot height. Through these measurements of the growth of In_xGa_1-xAs cap layer on InAs quantum dots, it was observed that the InGaAs layer neither covered the InAs quantum dots and wetting layer uniformly nor 100% phase separates into InAs and GaAs grown on InAs quantum dots and wetting layer, respectively.     

Atomistic simulations of fluid structure and solvation forces in atomic force microscopy

We describe results of atomistic molecular dynamics simulations modelling an atomic force microscope (AFM) tip immersed in a fluid. Both the tip and the surface are modelled by rigid arrays of atoms. The tip is pyramidal and the surface is the (100) face of a fcc crystal. The focus is on the solvation forces acting on the tip and on the surface and their relation to the structural and dynamic properties of the fluid. Fluid particles in the neighborhood of the tip-surface junction are found to be highly ordered compared to the bulk, as shown by localized variations in the average fluid density. The atomistic nature of the model gives rise to several effects related to the discrete sizes of the fluid, tip, and surface particles which are not observed in continuum-based theories. A number of simulated force-distance curves are presented, along with an analysis of the effect of changing fluid particle size, tip (lateral) position, tip shape, and the lyocompatability of the tip and surface materials. The atomic-scale distribution of fluid-surface forces is examined for various positions of the tip, and the extent to which the fluid can act as a “cushion” by increasing the effective area of the tip-surface interaction is studied. The effect of a fluid on AFM imaging is investigated by generating “fluid images”, which are shown to be comparable in magnitude to the direct tip-surface interaction in the noncontact mode. We compare images generated by defective and defect-free surfaces, and analyse the fluid-tip forces acting in a lateral direction. An image formed from fluid forces acting in the direction of the surface normal does not show the presence of a vacancy, but an image formed from lateral fluid forces does.     

NANOBUBBLES AT THE LIQUID/SOLID INTERFACE STUDIED BY ATOMIC FORCE MICROSCOPY

Bubbles on the nanometer scale were produced by a special method on solid surfaces. Atomic Force Microscopy (AFM) was used to detect these bubbles. It shows that nanobubbles can be seen clearly in the interfaces of liquid/graphite and liquid/mica. In AFM images, the nanobubbles appeared like bright spheres. Some of the bubbles kept stable for hours during the experiments. The bubbles were disturbed under high load during AFM imaging. The conformation of the bubbles is influenced by the atomic steps on the graphite substrate. In addition, a shadow was found around the bubbles, which was due to the interactions between a bubble adhered to the tip and a bubble on the substrate.     

Distance dependence of noncontact-AFM image contrast on Si(111) × –Ag structure

Atomic resolution imaging of the Si(111) × R30°–Ag surface was investigated using a noncontact atomic force microscopy (NC-AFM) in ultrahigh vacuum. NC-AFM images showed three types of contrasts depending on the distance between an AFM tip and a sample surface. When the tip–sample distance was about 1–3 Å, the images showed the honeycomb arrangement with weak contrast. When the tip–sample distance was about 0–0.5 Å, the images showed the periodic structure composed of three bright spots with relatively strong contrast. On the other hand, the contrasts of images measured at the distance of 0.5–1 Å seemed to be composed of the above-mentioned two types of contrasts. By comparing the site of bright spots in the AFM images with honeycomb-chained trimer (HCT) model, we suggested the following models: when the tip is far from the sample surface, tip–sample interaction force contributing to imaging is dominated by physical bonding interaction such as Coulomb force and/or van der Waals (vdW) force between the tip apex Si atoms and Ag trimer on the sample surface. On the other hand, just before the contact, tip–sample interaction force contributing to imaging is dominated by chemical bonding such as the force due to hybridization between the dangling bond out of the tip apex Si atom and the orbit of Si–Ag covalent bond on the sample surface.