磷酸铝(AlPO4)晶体中缺陷的X射线形貌研究

用X射线衍射形貌法研究了AlPO₄晶体中的微观缺陷。在所研究的晶体中,主要晶体缺陷是生长层,沉淀物和位错。位错密度在晶体表面附近最大,晶体中部较低。位错主要起源于热应力和由沉淀物或生长层所造成的晶格畸变。多数位错的柏氏矢量是b=(a+c)<1123>型,部分的是b=a[2110]。分析了晶体缺陷与生长条件之间的关系。控制生长过程中的温度波动,特别是晶体出炉时的冷却速度,对提高晶体完美性是重要的。 关键词：     

β—SiC外延层中晶体缺陷的观察

用腐蚀法研究了β-SiC外延层中的晶体缺陷。腐蚀剂为熔融氢氧化钾。三角形尖底蚀坑对应于位错。在β-SiC中的全位错为立方晶系的73°位错和60°位错。不同堆垛方式的β-siC生长层相遇时将形成{111}交界层错,其腐蚀图象为平行于<110>方向的直线。60°位错可分解为两个1/6<112>SchockLey不全位错,并夹着一片{111}层错构成扩展位错。三个1/6<110>压杆位错与三片{111}层错可构成层错锥体。正、反堆垛的β-SiC可形成尖晶石律双晶,双晶面为(111)。腐蚀法和X射线劳厄法证实了这种双晶的存在。 关键词：     

LiNbO3晶体中包裹物和位错的X射线形貌研究

用X射线透射扫描形貌方法研究了LiNb0₃晶体中的包裹物和位错。在实验中发现了包裹物的相应于不同衍射矢量的X射线形貌与基于各向同性理论预言的形貌之间存在分歧,这被解释为弹性各向异性效应。同时还观察到Burgers矢量为最短点阵平移矢量1/3的纯刃型位错和次短点阵平移矢量1/3<0111>的纯螺型位错,以及由该螺型位错组成的纯扭转晶界。 关键词：     

退火直拉硅单晶中氧沉淀和诱生缺陷的电子显微镜研究

本文用超高压透射电子显微镜研究退火的高氧含量无位错直拉硅单晶中氧沉淀和诱生缺陷。在750—1050℃范围内氧沉淀是球状的α方英石。除了球状氧沉淀粒子之外还有一些具有{001}惯习面的方片状氧沉淀物。在950℃以上沿〈110〉方向从氧沉淀发射出冲压式棱柱位错环。这些位错环的柏氏矢量为α/2〈110〉、环面法线为〈110〉,它们是间隙型的位错环。这些位错环是从方片状氧沉淀物或从球伏氧沉淀粒子的聚集团发射出来的。当它们遇到障碍物时可能产生比较复杂的位错组态。实验中观察到由于层错攀移形成的台阶。热处理温度在850℃以下时,未观察到体内层错。 关键词：     

人工水晶缺陷的X射线形貌术观察

对z向生长的人工水晶中的缺陷进行了X射线形貌术观察和离子探针成份分析,发现除了位错线外,还存在一些过去未曾观察到的层错。对这些层错和位错线的形态、Burgers矢量以及成因作了简要的分析。 关键词：     

面心立方晶体外延膜沉积生长中失配位错的结构与形成过程

用分子动力学方法对5%负失配条件下面心立方晶体铝薄膜的原子沉积外延生长进行了三维模拟.铝原子间的相互作用采用嵌入原子法(EAM)多体势计算.模拟结果再现了失配位错的形成现象.分析表明，失配位错在形成之初即呈现为Shockley扩展位错，即由两个伯格斯矢量为〈211〉/6的部分位错和其间的堆垛层错组成，两个部分位错的间距、即层错宽度为1.8 nm,与理论计算结果一致；外延晶体薄膜沉积生长中，位错对会发生滑移，但其间距保持稳定.进一步观察发现，该扩展位错产生于一种类似于“局部熔融-重结晶”的表层局部无序紊乱- 关键词： 失配位错 外延生长 薄膜 分子动力学 铝     

镍铬合金中的位错运动与位错反应

对镍铬合金中单一滑移面内和两个滑移面间的位错反应,特别是动态下的反应,进行了透射电子显微镜观察,并对其中的一些位错组态进行了衍衬分析。1.六角位错网络主要是单一滑移面内柏氏矢量相差120°的两组位错间反应的结果;2.与螺型位错一样,刃型或混合型位错也能在两个滑移面间交滑移;3.两个滑移面间的位错反应有时在其截线方向生成不滑动的位错(如L.C.位错锁)并不能完全阻挡住这两个滑移面上的位错运动;4.在含铝、钛的镍铬合金中,超点阵位错的反应与不含铝、钛的合金或无序固溶体中的位错反应相似。 关键词：     

硅外延层解理面缺陷腐蚀坑的观察及初步分析

本文叙述用Wright腐蚀剂对<111>取向的硅外延片解理面进行择优腐蚀的观察结果。腐蚀后,硅外延片剖面上显示出层错、位错、S(Saucer)坑以及其它蚀坑。并观察到一些隐埋在外延层内的层错结构。 关键词：     

有限温度下位错环的脱体现象

在FCC单晶铜中构造了滑移面为（111）,伯格矢量为b=［112］/6的圆形不完全位错环．采用分子动力学方法模拟了该位错环在0—350 K温度区间内的自收缩过程．模拟结果发现：零温度下,位错不能跨越Peierls-Nabarro势垒运动,迁移速度为0;50　K温度下,螺型和刃型位错具有基本相同的迁移速度;随温度增加,刃型位错具有较大迁移速度;温度较高时,位错核宽度进一步增加;小位错环周围的局部应力,引起4个脱体位错环;脱体位错环在原位错的应力作用下逐渐生长,原位错消失后,在自相 关键词： 单晶铜 位错环 分子动力学 位错源     

LiNbO3晶体中缺陷的X射线形貌研究

用X射线透射扫描形貌方法观察了直拉法生长LiNbO₃晶体中各种类型点阵缺陷,诸如铁电畴壁、生长层、位错、亚晶界和胞状组织等;用不同衍射矢量对[001]和[210]方向生长的晶体的形貌消象规律,结合X射线铁电异常散射效应和光学显微观察,讨论了晶体中180°铁电畴和生长层的衬度及其分布,并研究了LiNbO₃晶体中180°畴壁形成及其相互关系。 关键词：     

On the shearing mechanism of γ′ precipitates by a single ( a /6)⟨112⟩ Shockley partial in Ni-based superalloys

The weak-beam technique of transmission electron microscopy has been used to analyse a new shearing configuration of γ′ precipitates after creep at 700°C of a Ni-based superalloy for gas turbine discs. The shearing configurations are made up of superlattice extrinsic stacking faults, matrix stacking faults and individual (a/6)?112? Shockley dislocations. This mechanism is initiated by the decorrelated movement of the two Shockley partials of a single (a/2)?110? matrix dislocation. The propagation of the leading partial creates this shearing process. This phenomenon that occurs in small γ channels owing to the flexibility of dislocations can be used to evaluate microstructural evolutions during ageing in the alloy.     

Dislocation and stacking fault core fields in fcc metals

Atomistic models were used to determine the properties of dislocation core fields and stacking fault fields in Al and Cu using embedded atom method (EAM) potentials. Long-range, linear elastic displacement fields due to nonlinear behaviour within dislocation cores, the core field, for relevant combinations of Shockley partial dislocations for edge, screw, and mixed (60° and 30°) geometries were obtained. Displacement fields of stacking faults were obtained separately and used to partition the core field of dissociated dislocations into core fields of partial dislocations and a stacking fault expansion field. Core field stresses were derived from which the total force, including the Volterra field plus core field, between dislocations for several dislocation configurations was determined. The Volterra field dominates when the distance between dislocations exceeds about 50b but forces due to core fields are important for smaller separation distances and were found to affect the equilibrium angle of edge dislocation dipoles and to contribute to the force between otherwise non-interacting edge and screw dislocations. Interactions among the components of a dissociated dislocation modify the equilibrium separation for Shockley partials suggesting that methods that determine stacking fault energies using measurements of separation distances should include core fields.     

Interface dislocation structures at the onset of coherency loss in nanoscale Ni–Cu bilayer films

We have performed a transmission electron microscopy study, using weak beam imaging, of the interface dislocation arrays that form initially at the (001) Ni–Cu interface during coherency loss. Interface dislocations were absent in the 2.5?nm Ni/100?nm Cu bilayers, but were present in the 3.0?nm Ni samples, indicating that the critical Ni film thickness for coherency loss is between 2.5 and 3?nm. The key features of the interface dislocation structure at the onset of coherency loss are: (i) the majority of interface dislocations are 60° dislocations, presumably formed by glide of threading dislocations in the coherently stressed Ni layer, and have Burgers vector in the {111} glide plane; (ii) the interface contained approximately 5% Lomer edge dislocations, with Burgers vector in the {001} interface plane, and an occasional Shockley partial dislocation and (iii) isolated segments of interface dislocations terminating at the surface are regularly observed. Possible mechanisms that lead to these dislocation configurations at the interface are discussed. This experimental study shows that near the critical thickness, accumulation of interface dislocations occurs in a somewhat stochastic fashion with favourable regions where coherency is first lost.     

Investigation of V-shaped extended defects in a 4H–SiC epitaxial film

Abstract

We investigated two types of V-shaped extended defects on the basal plane in epitaxial 4H-SiC by synchrotron X-ray topography, photoluminescence imaging/spectroscopy and transmission electron microscopy (TEM). One is the (2, 5) stacking fault (in Zhdanov notation) bounded by two partial dislocations with the Burgers vector b ± 1/4[0?0?0?1]; the other is the (2, 3, 3, 5) stacking fault bounded by partial dislocations with b = ±1/4[0?0?0?1]. The core of the partial dislocations associated with the (2, 3, 3, 5) fault has an out-of-plane component (Frank component) and three in-plane components (Shockley components); the three Shockley components are cancelled out in total. The electronic structures of the (2, 5) and (2, 3, 3, 5) stacking faults were further examined by photoluminescence spectroscopy and first-principles calculations. It is suggested that the (2, 5) and (2, 3, 3, 5) stacking faults both have an interband state at a similar energy level, although they differ structurally.     

Contrast analysis of Shockley partial dislocations in 4H-SiC observed by synchrotron Berg–Barrett X-ray topography

Shockley partial dislocations in 4H-SiC were observed using monochromatic synchrotron X-ray topography with a grazing-incidence Bragg-case geometry, that is, Berg–Barrett topography. The contrast of partial dislocations at the edges of Shockley-type stacking faults is discussed in terms of whether they have C- or Si-core edge components, or screw components. The dissociated state of basal-plane dislocation is discussed on a basis of the stacking sequence for basal-planes in the 4H-SiC crystal structure. It is expected that the results obtained in this study will be useful for characterizing Shockley-type stacking faults in Berg–Barrett topography.     

Dislocation content of geometrically necessary boundaries aligned with slip planes in rolled aluminium

Previous studies have revealed that dislocation structures in metals with medium-to-high stacking fault energy, depend on the grain orientation and therefore on the slip systems. In the present work, the dislocations in eight slip-plane-aligned geometrically necessary boundaries (GNBs) in three grains of near 45° ND rotated cube orientation in lightly rolled pure aluminium are characterized in great detail using transmission electron microscopy. Dislocations with all six Burgers vectors of the ½?1?1?0? type expected for fcc crystals were observed but dislocations from the four slip systems expected active dominate. The dislocations predicted inactive are primarily attributed to dislocation reactions in the boundary. Two main types of dislocation networks in the boundaries were identified: (1) a hexagonal network of the three dislocations in the slip plane with which the boundary was aligned; two of these come from the active slip systems, the third is attributed to dislocation reactions (2) a network of three dislocations from both of the active slip planes; two of these react to form Lomer locks. The results indicate a systematic boundary formation process for the GNBs. Redundant dislocations are not observed in significant densities.     

Morphology of single Shockley-type stacking faults generated by recombination enhanced dislocation glide in 4H–SiC

Morphology of single Shockley-type stacking faults (SFs) generated by recombination enhanced dislocation glide (REDG) in 4H–SiC are discussed and analysed. A complete set of the 12 different dissociated states of basal-plane dislocation loops is obtained using the crystallographic space group operations. From this set, six different double rhombic-shaped SFs are derived. These tables indicate the rules that connect shapes of SFs with the locations of partial dislocations having different core structures, the positions of slip planes in a unit cell, and the Burgers vectors of partial dislocations. We applied these tables for the analysis of SFs generated by the REDG effect reported in the past articles. Shapes, growing process of SFs and perfect dislocations for origins of SFs were well analysed systematically.     

镍铬合金中不全位错的透射电子显微镜观察

对镍铬合金(20％Cr,1％Al,2.5％Ti)中层错边界处及共格孪晶界面上的不全位错进行了观察和分析,结果是:1.用g·b_p=±2/3或±1/3作为不全位错是否显示衍衬是可行的,但不够严格。为此,应尽量选择{220}或{311}类型衍射成像,这时g·b_p或者等于零,或者等于整数,比较容易确定不全位错的柏氏矢量。2.共格孪晶界面上有不全位错,大多数是全位错分解的产物,成对出现。3.平行滑移面上的层错在运动中可以相互重迭。重迭层错中内禀层错与外禀层错之间的不全位错,在g·b_p=±2/3时无衍衬(在层错条纹的较强背景下是亮线),而在g·b_p=±1/3时显示衍衬(暗线)。 关键词：