γ-Al_2O_3表面担载钒物种的紫外拉曼光谱

本文采用常规的等体积浸渍法制备了不同担载量的V2 O5 γ -Al2 O3担载氧化物催化剂 ,在水气存在的条件下分别使用不同的激发波长得到了相应的可见拉曼光谱和紫外拉曼光谱。结果表明在表面钒物种微弱水合的情况下 ,3 2 5nm波长紫外激光激发的紫外拉曼光谱由于部分的共振拉曼效应 ,仍然可以灵敏的检测到表面钒物种配位结构随担载量增加而发生的变化。低担载时表面钒物种主要以孤立状态存在 ,随担载量增加逐渐向聚合态结构过渡 ,当担载量超过钒在载体表面的单层分散容量时形成体相V2 O5晶体覆盖表面钒物种造成拉曼信号的减弱 ,由此可以从另一个角度判断表面单层分散容量。     

IR光谱分析PEO/V2O5纳米复合材料结构

聚合物溶液直接嵌入法制备 PEO/ V2 O5纳米复合材料。由红外光谱 (IR)表征了 PEO与氧化物层之间的相互作用。V2 O5干凝胶的钒氧双键 (V=O)主要与层间聚合物 PEO中的醚氧键 (Oet)发生作用 ,以Oet…V=O形式存在     

还原氮化对V2O5薄膜SERS效应的影响

探讨还原氮化后对V2O5薄膜SERS效应的影响。以乙酰丙酮氧钒(C10H14O5V)为V源,采用非水解溶胶-凝胶法制备V2O5凝胶,通过氨气还原氮化V2O5薄膜。利用XRD、FE-SEM、UV-VIS-NIR、RAMAN测试薄膜结构、光学性能及SERS效应。结果表明,氮化后V以氮氧化合物的形式存在,随着氮化温度升高,氮元素逐步替代氧元素。随着氮化温度升高,薄膜上晶粒逐渐增大,成板条状,晶体粒径达25 nm。经600℃还原氮化得到的薄膜的紫外可见近红外区域的吸收率最高,且禁带宽度相对于未氮化时的V2O5薄膜较小。利用R6G作为探针分子研究了薄膜的SERS效应,结果表明氮化温度600℃时薄膜具有显著的拉曼增强效应,且高于未氮化时的V2O5薄膜的拉曼增强效果,在620 cm^-1处拉曼信号峰强度达485 cps.     

La,V共掺杂的Bi_4Ti_3O_(12)铁电薄膜的溶胶-凝胶法制备及性能测试

采用溶胶-凝胶(sol-gel)工艺在Pt/TiO2/SiO2/p-Si(100)衬底上制备出Bi4Ti3O12(BIT)和Bi3.25La0.75Ti2.97V0.03O12(BLTV)铁电薄膜,研究了La,V共掺杂对BIT薄膜的晶体结构和电学性能的影响.BIT薄膜为c轴择优取向,BLTV薄膜为随机取向,拉曼光谱分析表明V掺杂降低了TiO6(或VO6)八面体的对称性,也增强了Ti—O键(或V—O键)杂化.BLTV薄膜的剩余极化Pr为25.4μC/cm2,远大于BIT薄膜的9.2μC/cm2,表现出良好的铁电性能.疲劳、漏电流测试显示BLTV薄膜具有优良的抗疲劳特性和漏电流特性,表明La,V共掺杂能有效地降低薄膜中的氧空位.     

MgZnO半导体材料光致发光以及共振拉曼光谱研究

用分子束外延设备在c面蓝宝石衬底上生长得到高质量Mg x Zn1-x O薄膜。X射线衍射显示,当Mg摩尔分数在0~32.7%范围内时,薄膜保持六方结构,(002)衍射峰半高宽为0.08°~0.12°,薄膜结晶质量与现有报道的最高水平相当。随着薄膜中Mg含量的增加,紫外发光峰由378 nm蓝移至303 nm。对Mg0.108Zn0.892O薄膜变温光致发光光谱的研究发现,束缚激子发光随温度变化存在两个不同的猝灭过程。对不同Mg含量薄膜共振拉曼光谱的研究发现,A1(LO)声子模频移与Mg含量在一定范围内呈线性关系,这为确定Mg x Zn1-x O薄膜中的Mg含量提供了一种简单高效的方法。通过拉曼光谱与X射线衍射对比研究发现,拉曼光谱在确定MgZnO材料相变时具有更高的灵敏度。最后,研究了Mg0.057Zn0.943O薄膜的变温共振拉曼光谱,对A1(LO)和A1(2LO)声子模随温度而变化的现象给出了一定的理论解释。     

不同氧气含量下镍铬系平板集热器选择性吸收薄膜的制备和性能表征

采用双极脉冲磁控溅射系统,在不同氧气含量的氩氧混合气体中制备了单层镍-铬金属-电介质复合光谱选择性吸收薄膜。采用X射线衍射仪(XRD)、激光共焦显微拉曼光谱仪、椭偏仪和紫外-可见-近红外分光光度计分别对薄膜的物相结构和光学特性进行了表征。结果表明:实验获得了由金属镍和镍、铬的氧化物(NiO、Cr2O3)组成的复合膜,薄膜对300~1 200 nm波段的太阳光有较强的吸收,而对波长大于1 200 nm的太阳光则吸收较弱,具有良好的光谱选择性,可用作高效太阳光谱选择性吸收涂层。     

金属氧化物薄膜在中波红外光谱区内光学常数色散特性

基于金属氧化物薄膜材料在中波红外波段应用的需求,研究了含水状态的TiO2、HfO2、Ta2O5和Y2O34种金属氧化物薄膜在中波红外波段内(2.5~5μm)光学常数的色散特性。利用电子束蒸发沉积技术,在超光滑的硅表面制备了4种氧化物薄膜,基于洛仑兹振子介电常数色散模型,通过透射率光谱反演计算了4种氧化物薄膜的光学常数。研究结果表明:4种氧化物均有少量的水分子、羟基,水含量从少到多的薄膜依次为TiO2、HfO2、Ta2O5和Y2O3,在远离水吸收的位置,消光系数从小到大的薄膜分别为TiO2、HfO2、Ta2O5和Y2O3;在电子束蒸发沉积工艺条件下,为了降低水的影响,TiO2和HfO2是中红外波段较为理想的金属氧化物薄膜材料。     

溶胶-凝胶VO2薄膜转换特性研究

利用溶胶凝胶法在SiO2Si衬底上沉积高取向的V2O5薄膜,在压强低于2Pa,温度高于400℃的条件下,对V2O5薄膜进行真空烘烤,获得了电阻率变化3个数量级以上、弛豫宽度为62℃的VO2多晶薄膜.以X射线衍射(XRD)、扫描电子显微镜(SEM)图和电阻率转换特性等实验结果为依据,详细分析了溶胶凝胶薄膜在真空烘烤时从V2O5向VO2的转化,它经历了从VnO2n+1(n=2,3,4,6)到VO2的过程.实验证明,根据选择合适的成膜热处理条件和真空烘烤条件是实现溶胶凝胶V2O5结构向VO2结构成功转换的关键 关键词： 溶胶-凝胶法 氧化钒薄膜 VO2膜转换特性     

现场拉曼光谱研究多种铂氧化物还原过程及其对甲醇氧化的影响

采用原位拉曼光谱技术研究方波电位循环氧化还原 (ORC)过程中产生的铂氧化物的还原过程 ,其中过氧化物和超氧化物消失的电位在 0 2V左右 ,晶格氧化物和氧化铂则分别消失在 0V和 -0 2 5V左右。我们还初步探讨了不同还原电位下形成的铂电极表面纳米微粒对甲醇电催化活性的影响     

纳米VO2/ZnO复合薄膜的热致变色特性研究

为提高VO₂薄膜的热致变色性能,采用纳米结构和复合结构二者相结合的方法,通过磁控溅射技术先在玻璃衬底上制备高(002)取向ZnO薄膜,再在ZnO层上室温沉积钒金属薄膜,最后经热氧化处理获得纳米结构VO₂/ZnO复合薄膜.利用变温拉曼光谱观察分析了VO₂/ZnO薄膜相变前后的晶格畸变和键态的演变过程,讨论了薄膜的结构与热致红外开关特性和相变温度的内在关系.结果显示,与相同条件获得的同厚度的单层VO₂薄膜相比,纳米VO关键词： ZnO 2')" href="#">VO₂ 纳米复合薄膜 热致变色 拉曼光谱     

脉冲溅射V2O5薄膜结构和性能研究

V2O5薄膜具有很好的离子注入/退出可逆性,是最有潜力的锂离子储存层的候选材料之一,它的电学特性与制备方法、化学计量比、结构和取向等有直接关系,仔细控制工艺参量是制备出在锂电池上应用的V2O5薄膜关键。研究中采用脉冲磁控反应溅射方法,通过精确地控制氧分压、基底温度等关键工艺参量,在石英玻璃和硅片上制备V2O5薄膜。利用X射线衍射和X射线光电子谱,分析了薄膜的成分、相结构、结晶和价态情况,用原子力显微镜表征了薄膜的微观结构,用分光光度计测量从200—2500nm波段V2O5薄膜纯度高、相结构单一、结晶度好。高低温电阻变化2个量级,薄膜的光学能隙为2.46eV。     

New counter electrode prepared as vanadium oxide and V/Ce oxide films: preparation and characterization

Vanadium oxide and mixed V/Ce-oxide films at 78, 55, 38, 32 atomic % of V were prepared via the sol-gel route from an aqueous colloidal solution of inorganic precursors. The influence of the added cerium precursor on their electrochemical, optical and structural properties was investigated by cyclic voltammetry (CV), X-ray analysis, IR spectroscopy and UV-VIS techniques. The electrochemical stability of films was tested by CV measurements in 1 M LiClO₄ in propylene carbonate electrolyte. The addition of CeO₂ improved the poor stability of vanadium oxide films and enhanced their ion-charge capacity up to 30 mC/cm² for thicknesses about 300 nm. The intercalation of Li⁺ ions in vanadium oxide and V/Ce-oxide films was followed by FT-IR spectroscopy performed at near-grazing incidence angle (NGIA) conditions in combination with CV measurements at potentials of −1.5 V and +2.0 V (vs. Ag/AgCl). The observed shift of V–O_v vibrations in the IR spectra confirmed the intercalation of Li⁺ ions.     

Metal–insulator phase transition in hydrogenated thin films of V<Subscript>2</Subscript>O<Subscript>3</Subscript>

Temperature dependences of the electrical conductivity of thin vanadium sesquioxide V2O3 films obtained by using the laser sputtering technique have been studied. A significant decrease (by four–five orders of magnitude) in the electrical conductivity has been observed below 150 K as a result of a metal–insulator phase transition. It is shown that hydrogenation of films lowers the temperature of this phase transition.     

XRD and XPS analysis of laser treated vanadium oxide thin films

In this work, we present X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) analysis of laser treated vanadium oxide sols. The films were also observed by transmission electron microscopy (TEM) and scanning electron microscopy (SEM) to reveal how the original xerogel structure changes into irregular shaped, layer structured V₂O₅ due to the laser radiation. XRD revealed that above 102 W/cm² the original xerogel structure disappears and above 129 W/cm² the films become totally polycrystalline with an orthorhombic structure. XPS spectra showed O/V ratio increment by using higher laser intensities.     

用离子束增强沉积从V2O5粉末制备高热电阻温度系数VO_2薄膜

采用了一种用离子束增强沉积从V2O5粉末直接制备VO2薄膜的新方法,将纯度为997%的V2O5粉末压成溅射靶,在用Ar离子束溅射的同时,用氩氢混合束对沉积膜作高剂量离子注入,使沉积膜中V2O5的V—O键断裂,进而被注入的氢还原,退火后获得热电阻温度系数(TCR)高达4%的VO2薄膜.高剂量的氩氢混合束注入对薄膜引入应力,使薄膜的转换温度降低、电阻温度曲线斜率变大,是薄膜TCR增大的原因 关键词： 离子束增强沉积 VO2薄膜 热电阻温度系数     

Vanadium-Al2O3 nanostructured thin films prepared by pulsed laser deposition: Optical switching

The formation and optical response of VO_x nanoparticles embedded in amorphous aluminium oxide (Al₂O₃) thin films by pulsed laser deposition is studied. The thin films have been grown by alternate laser ablation of V and Al₂O₃ targets, which has resulted in a multilayer structure with embedded nanoparticles. The V content has been varied by changing the number of pulses on the V target. It is found that VO_x nanoparticles with dimensions around 5 nm have been formed. The structural analysis shows that the vanadium nanoparticles are oxidized, although probably there is not a unique oxide phase for each sample. The films show a different optical response depending on their vanadium content. Optical switching as a function of temperature has been observed for the two films with the highest vanadium content, at transition temperatures of about −20 °C and 315 °C thus suggesting the presence of nanoparticles with compositions V₄O₇ and V₂O₅, respectively.     

Planar vanadium oxide clusters: two-dimensional evaporation and diffusion on Rh(111)

The formation of novel vanadium oxide cluster molecules by oxidative two-dimensional evaporation from vanadium oxide nanostructures is reported on a Rh(111) metal surface. The structure and stability of the planar V6O12 clusters and the physical origin of their 2D evaporation process have been elucidated by high-resolution scanning tunneling microscopy (STM) and ab initio density functional theory calculations. The surface diffusion of the clusters has been followed in elevated-temperature STM experiments, and the diffusion parameters have been extracted, indicating diffusion by hopping of the entire surface stabilized cluster units.     

Influence of the geometric structure on the V L3 near edge X-ray absorption fine structure from vanadium phosphorus oxide catalysts

We present the V L₃ near edge X-ray absorption fine structure (NEXAFS) of a vanadium phosphorus oxide (VPO) catalyst. The spectrum is related to the V3d–O2p hybridised unoccupied states. The overall peak position at the V L₃-absorption edge is determined by the formal oxidation state of the absorbing vanadium atom. Details of the absorption fine structure are influenced by the geometric structure of the compound. Empirically we found a linear relationship between the energy position of several absorption resonances and the V–O bond length of the participating atoms. This allows identification of the contribution of specific V–O bonds to the near edge X-ray absorption fine structure. The bond length/resonance position relationship will be discussed under consideration of relations between geometric structure and NEXAFS features observed in X-ray absorption experiments and theory.