紫外光表面处理对ZnO纳米粒子的晶体结构与光学性质的影响

利用溶胶凝胶法制备了ZnO纳米粒子,用紫外光照射对其进行表面处理.探讨了表面处理对ZnO纳米粒子晶体结构与光学性质的影响.结果显示:在晶体结构方面,紫外光照射会降低ZnO纳米粒子的团聚现象,缩短晶格常数,使其所受应力由压缩应力释放变为伸张应力,增大表面能,使能量最佳化并稳定而导致ZnO纳米粒子形成再构.在光学性质方面,紫外光照射会使ZnO纳米粒子表面产生较多的氧空位,而氧空位又会使其表面容易吸附羟基,使得ZnO纳米粒子变得更加亲水.     

掺Ti对ZnO纳米颗粒的微观结构与光学特性的影响

本研究利用溶胶凝胶法制备了Ti_xZn_(1-x)O纳米粒子,并且分析了Ti掺杂对ZnO纳米粒子晶体结构与光学特性的影响.微观结构分析得知Ti掺杂会使ZnO结晶较差,晶格常数与压缩应力增大,但可使晶粒缩小至5 nm左右.光致发光(PL)光谱分析得出Ti掺杂会造成氧空位缺陷减少,近带边发光(NBE)峰值蓝移,但NBE峰值强度增幅变化却不大.拉曼光谱分析表明Ti_xZn_(1-x)O的结晶品质不佳且NBE峰值强度的增幅未完全依循多声子模态信号减弱而增强的规律,其原因是NBE峰值强度除受多声子模态信号影响外还受其它因素的影响.TC(002)值越高时样品的多声子模态信号会越弱,而NBE峰值强度增幅越大.     

表面结构对SnO2半导体纳米粒子荧光性质的影响

本文利用荧光光谱对ＳｎＯ２纳米粒子水溶胶及其有机溶胶的光学性质进行了研究。发现粒子的表面结构对其光学性质具有极大的影响。水溶胶的荧光发射是由氧空位控制的,其发射强度工;有机溶胶由于表面活性剂的作用,改变粒子的表面结构,得到较强的荧光发射。     

聚氧化乙烯表面修饰对ZnO光学性质的影响

利用聚氧化乙烯(PEO)对ZnO表面进行修饰,研究有机包覆对ZnO光学性质的影响。用吸收光谱和光致发光光谱来表征和研究PEO包覆对ZnO纳米粒子光学性质的影响。吸收光谱结果表明随着ZnO薄膜中PEO含量的增加,激子吸收峰逐渐向低能侧方向移动。光致发光光谱是由紫外发射和与氧空位有关的深能级缺陷发光组成,且随着ZnO薄膜中PEO含量的增加,紫外发射与深能级发光强度之比逐渐增大,当ZnO薄膜中的PEO达到最大值时,其比值为31．5,远远大于纯ZnO薄膜的紫外发射与深能级发光强度之比1．04。由此可见,ZnO被PEO包覆后,提高了紫外发光效率,改善了ZnO薄膜的质量。     

CdS/ZnO纳米复合结构的制备、表征及其光催化活性的改善

利用简单的水热法在ZnO纳米棒表面合成CdS纳米粒子.用扫描电镜(SEM)和X射线衍射(XRD)对CdS/ZnO异质结构进行表征.实验结果表明,在生长CdS的过程中ZnO被逐渐地腐蚀.选择CdS/ZnO纳米复合材料作为光催化剂在紫外光和绿光照射的条件下降解甲基橙(MO).CdS/ZnO纳米复合材料纳米棒作为光催化剂降解...     

包埋Pt纳米粒子对金属-半导体-金属结构ZnO紫外光电探测器性能的影响

利用射频磁控溅射设备制备ZnO薄膜, 最终制备ZnO/Pt纳米粒子/ZnO 结构的金属-半导体-金属型紫外光电探测器. 研究了Pt纳米粒子处在ZnO薄膜层中的不同深度对金属-半导体-金属型紫外光电探测器响应性能的影响. 结果表明, 探测器的响应度随着Pt纳米粒子在ZnO薄膜层中所处深度的增大而升高. 在60 V偏压下, 包埋Pt最深的探测器在波长365 nm处取得响应度最大值1.4 A·W^-1, 包埋有Pt探测器的响应度最大值为无Pt 纳米粒子探测器响应度最大值的7倍. 结合对ZnO薄膜表面的表征及探测器各项性能的测试, 得出包埋Pt纳米粒子增强器件的响应性能可归因于表面等离子体增强散射.     

花状的氧化锌纳米结构的制备及其光学性能

以氢氧化钠和六水合硝酸锌为反应物,在未使用任何表面活性剂的简单反应体系中制得了玫瑰花状ZnO纳米结构,采用X射线衍射(XRD)、扫描电子显微镜(SEM)和室温荧光光谱对产物的晶体结构、形貌和发光性质进行了表征和分析.测试结果表明,所得产物为六方纤锌矿结构ZnO纳米材料,产物结晶完整,尺寸较均匀.这种简单水热法制备的ZnO纳米材料仅在384nm处具有一个较强的紫外发光峰,而在黄绿区几乎没有发光峰,进一步证明了所得样品结晶良好,没有缺陷和空位.以上结果表明所制备的氧化锌纳米材料具有优异的紫外光发射能力.     

低能质子辐照对ZnO白漆光学性能退化的影响

 通过光致荧光光谱解谱和X射线光电子能谱（XPS）分析,研究了ZnO白漆经受能量低于200 keV低能质子辐照过程中氧空位缺陷的形成与演化过程。XPS解析表明质子辐照后晶格氧减少,光致荧光光谱解析表明锌空位减少,说明ZnO白漆中氧空位数量增加,且双电离氧空位能够捕获价带中的电子转变为单电离氧空位,使单电离氧空位逐渐成为辐照产生的主要缺陷。质子辐照使ZnO白漆中氧空位数量增加,而氧空位易捕获电子形成色心,从而导致光学性能下降。     

室温生长ZnO薄膜晶体管的紫外响应特性

在室温下采用射频磁控溅射法制备了以ZnO薄膜为沟道层的薄膜晶体管(TFTs).研究表明ZnO薄膜在紫外区具有较高的吸收率,并且ZnO-TFTs对紫外光照射较为敏感.因此,进一步深入研究了ZnO-TFTs紫外光照下的输出和转移特性,结果表明,紫外光照将引起较为明显的光响应电流,且经过光照的器件在光源移除7天后,ZnO沟道层中仍能观察到残余电导现象,其原因可以归结为紫外光辐射在ZnO沟道层中引入了一定数量的氧空位施主态缺陷.     

纳米ZnO的表面化学修饰及其分析表征

采用水溶性羟丙基甲基纤维素HPMC对无机纳米ZnO粒子进行物理吸附处理 ,获得了核为无机纳米ZnO ,外壳为水溶性高分子HPMC的粒子。然后在其上进行了甲基丙烯酸甲酯的接枝聚合。采用红外光谱、差热分析的方法对复合粒子进行了表征 ,并采用透射电镜观察了粒子的形貌。红外光谱表明在纳米ZnO的表面吸附了HPMC并接枝了PMMA ,差热分析表明HPMC ,HPMC g PMMA和ZnO/HPMC g PMMA的热稳定性逐渐提高 ,透射电镜观察表明 ,在纳米ZnO的表面粘附了一层聚合物 ,成功地实现了纳米粒子的表面修饰。     

Effect of preheating temperatures on microstructure and optical properties of Na-doped ZnO thin films by sol–gel process

The chemical composition, crystalline structure, surface morphology and photoluminescence spectra of Na-doped ZnO thin films with different heat treatment process were investigated by X-ray photoelectron spectroscopy, X-ray diffraction, atomic force microscopy and a fluorescence spectrometer. The results show that preferred orientation, residual stress, average crystal size and surface morphology of the thin films are strongly determined by the preheating temperature. The effects of preheating temperature on microstructure and surface morphology have been discussed in detail. The photoluminescence spectra show that there are strong violet & UV emission, blue emission and green emission bands. The violet & UV emission is ascribed to the electron transition from the localized level below the conduction band to the valence band. The blue emission is attributed to the electron transition from the shallow donor level of oxygen vacancies to the valence band, and the electron transition from the shallow donor level of interstitial zinc to the valence band. The green emission is assigned to the electron transition from the level of ionized oxygen vacancies to the valence band.     

Investigation of Cu Doping,Morphology and Annealing Effects on Structural and Optical Properties of ZnO:Dy Nanostructures

Dysprosium (Dy) doped ZnO nanosheets and nanorods were synthesized by hydrothermal method. Effects of Cu doping, morphology and annealing in Oxygen ambient on structural and optical properties of ZnO nanostructures were investigated using X–ray diffraction (XRD), scanning electron microscopy (SEM), diffuse reflectance spectra (DRS) and photoluminescence (PL) spectroscopy. This study recommends that both of intrinsic and extrinsic defects facilitate energy transfer (ET) from the ZnO host to Dy³⁺ ions and consequently have an effective role on producing intense Dy emissions at indirect excitation. The results also revealed that annealing process improved the crystal structure of ZnO nanorods due to decrease of surface; however decreased ET and Dy emissions because of diminishing in oxygen vacancy. In addition, as a result of increasing of surface area in nanorods compared to nanosheets, the oxygen vacancies and ET were enhanced. Moreover the results exhibited that electrical and optical properties of ZnO:Dy can be tuned by various amount of Dy concentrations and also Cu doping.     

Ti-incorporated ZnO films synthesized via magnetron sputtering and its optical properties

Undoped and Ti-doped ZnO films were deposited using radio frequency reactive magnetron sputtering at various sputtering powers. The crystal structures, surface morphology, chemical state and optical properties in Ti-doped ZnO films were systematically investigated via X-ray diffraction (XRD), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS) and ultraviolet visible (UV–Vis) spectrophotometer. Results indicated that titanium atoms may replace zinc atomic sites substitutionally or incorporate interstitially in the hexagonal lattices, and a moderate quantity of Ti atoms exist in the form of sharing the oxygen with Zn atoms and hence improve the (0 0 2) orientation. The photoluminescence (PL) spectra of the Ti-doped ZnO films contain one main blue peak, whose intensity increased with the increase of sputtering power. Our results indicated that a higher compressive stress in Ti-doped ZnO films results in a lower optical band gap and a lower transmittance, and various Ti impurities can affect the concentration of the interstitial Zn and O vacancies.     

Effect of XeCl laser irradiation on the defect structure of Nd:YAG crystals

This paper presents the effect of XeCl laser irradiation on Nd:YAG single crystal samples with various number of pulses at different repetition rates and laser fluences. Effects of the irradiation on the optical and structural properties of the crystal are analyzed by UV–vis-NIR spectroscopy. Annihilation of some point defects of the crystal structure is observed following laser irradiation at a fluence of 100 mJ cm⁻² with 100 and 500 pulses. Increasing the laser fluence and pulse numbers leads to saturation and new defects are found to be formed in the crystal. Additional absorption spectra of the irradiated samples show that oxygen vacancies in the Nd:YAG crystals are removed during the low-dose irradiation. The laser irradiation is compared to the thermal annealing process for Nd:YAG crystal modification. Additional absorption spectrum of an annealed sample reveals that induced negative absorption band at 236 nm is correlated with the annihilation of the oxygen vacancy center. Our results also demonstrate that XeCl laser treatment has several advantages upon annealing at high temperatures in the Nd:YAG crystal quality improvement. Thus, the present work can give a new approach to modify Nd:YAG crystals to be used in a wide variety of solid-state laser engineering.     

ZnO单晶的微区光致发光特性研究

ZnO单晶材料以其优良的综合性能在光电子器件方面掀起了研究热潮,因此对ZnO单晶的研究具有重要的理论和实践意义。采用激光辐照的方式,对ZnO单晶进行了光致发光(photoluminescence, PL)光谱实验,分析研究了ZnO单晶在不同温度(低温)和不同激光能量强度照射下其光致发光特性。研究结果表明,ZnO单晶内存在少量杂质及表面氧缺陷,这些结构对其发光特性有一定的影响;在低温条件下,ZnO单晶具有良好的发光特性,且随着温度的提高,发光光谱峰的位置会向长波长方向移动,但强度会减小;当激光光源的强度增大,ZnO单晶的PL发射光谱的强度也会随之增大,且峰的位置和相对强度不变。结合拉曼(Raman)光谱实验,从分子及原子振动、转动类型验证了纤锌矿ZnO单晶的六方晶系结构;配合X射线衍射(X-ray diffraction, XRD)技术,得出ZnO单晶良好的结晶特性以及晶轴取向。     

质子辐照ZnO白漆光学退化的慢正电子湮没分析

 采用慢正电子湮没光谱研究低能质子辐照下ZnO白漆的光学退化。研究结果表明,随质子辐照注量的增加, 多普勒展宽谱的S参数逐渐减小,W参数逐渐增大。质子辐照下S-W参数拟合曲线的斜率发生改变。S参数的减小可以归结为锌空位含量的减少以及准正电子素的形成。准正电子素{单电离氧空位（捕获一个电子）+正电子}的形成,能够降低正电子湮没的速率,导致S参数减小。S参数的减小证实了质子辐照导致ZnO白漆中单电离氧空位数量的增加。S-W参数拟合曲线斜率的变化可以归结于质子辐照下双电离氧空位向单电离氧空位的转变。     

Photoluminescence and positron annihilation spectroscopic investigation on a H(+) irradiated ZnO single crystal

Low temperature photoluminescence and room temperature positron annihilation spectroscopy have been employed to investigate the defects incorporated by 6?MeV H(+) ions in a hydrothermally grown ZnO single crystal. Prior to irradiation, the emission from donor bound excitons is at 3.378?eV (10?K). The irradiation creates an intense and narrow emission at 3.368?eV (10?K). The intensity of this peak is nearly four times that of the dominant near band edge peak of the pristine crystal. The characteristic features of the 3.368?eV emission indicate its origin as a 'hydrogen at oxygen vacancy' type defect. The positron annihilation lifetime measurement reveals a single component lifetime spectrum for both the unirradiated (164?±?1?ps) and irradiated crystal (175?±?1?ps). It reflects the fact that the positron lifetime and intensity of the new irradiation driven defect species are a little higher compared to those in the unirradiated crystal. However, the estimated defect concentration, even considering the high dynamic defect annihilation rate in ZnO, comes out to be ～4?×?10(17)?cm(-3) (using SRIM software). This is a very high defect concentration compared to the defect sensitivity of positron annihilation spectroscopy. A probable reason is the partial filling of the incorporated vacancies (positron traps), which in ZnO are zinc vacancies. The positron lifetime of ～175?ps (in irradiated ZnO) is consistent with recent theoretical calculations for partially hydrogen-filled zinc vacancies in ZnO. Passivation of oxygen vacancies by hydrogen is also reflected in the photoluminescence results. A possible reason for such vacancy filling (at both Zn and O sites) due to irradiation has also been discussed.     

Effect of irradiating ion fluence on optical properties of ZnO1−x:Nx thin films

Swift heavy ion (SHI) irradiation is an effective technique to modify the optical properties of the materials. In the present investigation, the effect of 100?MeV?Ag⁷⁺ SHI irradiation fluence on the optical properties of ZnO_1?x:N_x thin films was studied. The post irradiation spectroscopic characterizations such as UV–VIS reflectance spectroscopy, Raman spectroscopy and photoluminescence (PL) spectroscopy analysis were carried out. The studies imply that when the SHI passes through the solid, the higher electronic stopping power of ions can weaken oxygen bonds in ZnO, resulting in the formation of donor defects such as oxygen vacancies and zinc interstitials. The formation of donor defects has been acknowledged through the increase in bandgap with irradiating ion fluence. The blue shift observed from the Raman spectra for the 3?×?10¹³ ions/cm² fluence-irradiated films implies the existence of compressive stress in the films. The PL analysis acknowledges the formation of donor defects upon irradiation. Furthermore, it conveys that the presence of N atoms in ZnO lattice leads to the formation of a less number of defects as compared with undoped ZnO while irradiation.