加磁场对GZO薄膜结构及光电性能的影响

采用射频磁控溅射法在玻璃基底上制备了Ga掺杂ZnO (GZO)薄膜,在传统磁控溅射系统中引入外加磁场,探究了磁场强度变化对GZO薄膜晶体结构和光电性能的影响.结果表明:所制得的GZO薄膜结构均为六角纤锌结构且在[002]方向沿C轴择优取向;外加磁场强度对薄膜的光电性能具有较大影响,在可见光范围内,薄膜的平均透光率超过93;,并出现了Moss-Burstein效应;薄膜的电学性能得到提升,其电阻率从4.96×10-3 Ω·cm降至3.17×10-4Ω·cm,霍尔迁移率从7.36cm2 ·V-1 ·S-1增至9.53 cm2·V-1·S-1.     

灯丝温度对热丝CVD法制备p型氢化纳米晶硅薄膜微结构与光电性能的影响

本文采用热丝化学气相沉积法在不同灯丝温度(1650 - 1850℃)下沉积了p型氢化纳米晶硅薄膜,研究了灯丝温度对薄膜微结构、光学性能及电学性能的影响.结果表明,随着灯丝温度的升高,薄膜的晶化率先增大后略微减小,最大值是55.5;.载流子浓度和霍尔迁移率先分别从5×1017 cm-3和0.27 cm2/V·s增加到1.32×1020 cm-3和0.43 cm2/V·s后略微减小,同时电导率从0.02 S/cm显著增加到8.95 S/cm,而电导激活能则从271.5 meV急剧减小至25 meV.     

利用直流磁控溅射法在柔性衬底上制备ZnO: Zr新型透明导电薄膜

室温下利用直流磁控溅射法在有ZnO缓冲层的柔性衬底 PET上制备出了可见光透过率高、电阻率低的掺锆氧化锌(ZnO: Zr)透明导电薄膜,研究了厚度对ZnO: Zr薄膜结构及光电性能的影响.结果表明,ZnO: Zr薄膜为六方纤锌矿结构的多晶薄膜.实验获得ZnO: Zr薄膜的最小电阻率为2.4×10-3 Ω·cm,其霍尔迁移率为18.9 cm2·V-1·s-1 ,载流子浓度为2.3×1020 cm-3.实验制备的ZnO: Zr薄膜具有良好的附着性能,其可见光平均透过率超过92;.     

自然掺杂p型ZnO薄膜的螺旋波等离子体辅助溅射沉积

本工作通过调整工作气压,采用螺旋波等离子体辅助射频磁控溅射技术在Al2O3衬底上成功的制备了自然掺杂的p型ZnO薄膜.Hall测量显示在Ar/O2等离子体辅助下,随气压增加所沉积薄膜表现出从n型到p型再到n型的转变.p型ZnO薄膜载流子浓度为1.30×1016cm-3,电阻率为99.68Ω·cm,霍尔迁移率为4cm2·V-1·s-1.X射线衍射和原子力显微镜的分析结果显示ZnO薄膜的导电类型和薄膜的生长特征相关,等离子体中活性粒子载能的减小导致薄膜表面成核几率增加和ZnO晶粒逐渐减小.较高氧活性粒子浓度有利于自然掺杂p型ZnO薄膜生长,而活性氧粒子种类的变化使薄膜生长质量变差,施主缺陷增加,薄膜转化为n型导电.     

薄膜厚度对ZnO:Y薄膜结构及光电特性影响

室温下采用射频磁控溅射法在玻璃衬底上制备出了具有良好附着性、低电阻率和高透过率的新型ZnO∶Y(ZnO掺杂Y2O3,简称ZnO∶Y)透明导电薄膜。研究了薄膜厚度对ZnO∶Y薄膜结构、光电特性的影响。结果表明:不同厚度的ZnO∶Y薄膜均为多晶薄膜,具有ZnO六角纤锌矿结构,最佳取向为(002)方向。随薄膜厚度增加,其电阻率减小,当薄膜厚度增至800 nm时,其电阻率为8.36×10-4Ω.cm,迁移率为15.3 cm2.V-1.s-1,载流子浓度为4.88×1020cm-3。不同厚度的薄膜在可见光范围内平均透过率均为90%以上,当薄膜厚度从200 nm增加到800 nm时,薄膜禁带宽度从3.68 eV减小到3.61 eV。     

SiO2阻挡层对直流磁控溅射制备AZO薄膜性能的影响

在AZO薄膜制备温度下,浮法玻璃衬底中的杂质可能会引入"掺杂"效应而导致薄膜迁移率的降低。为了提高薄膜的迁移率,增加载流子在薄膜中的输运能力,本实验提出SiO2/AZO复合薄膜制备技术。SiO2薄膜与普通玻璃相比,具有纯度高、透过率高的特点,本实验通过SiO2/AZO复合结构提高薄膜的迁移率。采用SiO2/AZO复合结构溅射制备AZO薄膜,使薄膜的载流子迁移率由19.8 cm2.V-1.s-1提高到57.1 cm2.V-1.s-1。     

磁控溅射法制备硒化银薄膜及其磁电阻效应研究

采用磁控溅射后退火的方式成功制备了硒化银薄膜,膜厚约为310 nm.X射线粉末衍射分析表明所制备薄膜为单相正交结构,伴随择优取向;比较不同退火温度的效果后发现300℃退火后的薄膜样品结晶最好.扫描电子显微镜、X射线能谱分析表明300℃退火后样品均匀致密,元素组分接近原始比例,是较为适宜的退火温度.低温磁电阻测试显示薄膜样品具有明显的正磁电阻效应,90K附近达到最大磁电阻值7.3;.霍尔系数测量得到薄膜样品室温载流子浓度与霍尔迁移率分别为2.2×1019 cm-3与221 cm2·V-1·s-1.     

热丝CVD法制备a-Si1-xCx薄膜的光电性能研究

本文以硅烷、乙炔和氢气为气源,采用热丝CVD法制备了非晶碳化硅薄膜.通过FITR、紫外-可见光分光光度计、四探针仪、台阶仪和霍尔效应测试仪对薄膜的光学和电学性能进行了系统的研究.结果表明,随着乙炔气体流量的增加,薄膜中碳含量和薄膜光学带隙呈现逐渐递增的趋势,其中光学带隙由1.7 eV上升到2.1 eV.同时还发现B掺杂薄膜的空穴浓度随着B2H6与硅烷流量比的增大而显著增大,而霍尔迁移率的变化趋势则与空穴浓度的变化趋势相反,与二者对应的总体效果是薄膜的电阻率首先显著下降,然后缓慢下降至最小值1.94Ω·cm,此后电阻率略有上升.     

ITO薄膜的厚度对其光电性能的影响

氧化铟锡(indium-tin oxide, ITO)具有在可见光范围内高度透明的特性和优良的电学特性,通常当作透明电极,被广泛应用于太阳电池和发光元器件上.本研究中用电阻加热反应蒸发的方法制备ITO薄膜,测试了膜的厚度、电阻率、可见光透过率、载流子浓度和迁移率,讨论薄膜的厚度对薄膜光电性能的影响.实验中制备的ITO薄膜,透过率良好,电阻率可达6.37×10-4Ω·cm,载流子浓度和迁移率可分别达到1.91×1020cm-3和66.4cm2v-1s-1.将实验中制备的ITO作为nip太阳能电池透明电极,其短路电流为10.13mA/cm2,开路电压为0.79V,填充因子为0.648,效率可达到5.193;.     

pH值对溶胶-凝胶法制备的掺铝氧化锌薄膜光电性能的影响

采用溶胶-凝胶法在普通载玻片上制备出c轴择优取向的ZnO: Al(ZAO)透明导电薄膜,研究了溶胶pH值对其结构、表面形貌、电学和光学性能的影响.结果表明:随着pH值的降低晶粒尺寸增大;当溶胶pH值从8.4降低到6.8时,薄膜的电阻率先降低而后略有升高,当pH值为7.2时其电阻率达到最小值2.6×10-3 Ω·cm,进一步分析表明,溶胶pH值的变化影响了薄膜晶界散射,而后者又使载流子迁移率发生了变化;薄膜的透光率在可见光部分随着pH值的降低而升高,而禁带宽度则从3.36 eV降到3.32 eV.     

Relationship of Morphological Types of Dynamic Forms of Crystals

Crystallography Reports - The relationship of morphological spectra (sets of data on the morphological types of real polyhedral crystals and their probabilities under current physicochemical...     

A review of measurement of thermophysical properties of silicon melt

Measurements of thermophysical properties of Si melt and supplementary study of X-ray scattering/diffraction by the authors' group were reviewed. The values obtained differed variously from those of literature. Density was 2–3% larger, surface tension 20–30% smaller, viscosity up to 40% larger, electrical conductivity 8% smaller, spectral emissivity more or less in good agreement with literature values, and thermal diffusivity a few percent larger. An anomalous density jump was found near the melting point. Surface tension and viscosity also showed anomaly. A strange time-dependent change of density was observed over 3 h after melting. X-ray analyses suggested a slight change in local atom ordering, but showed no sign of cluster formation. An addition of 0.1 at% gallium caused the density jump to disappear, while that of boron caused no change. An EXAFS study of the former melt indicated a strong interaction between Ga and Si atoms as if molecules of GaSi₃ existed. The implications of the measured properties are a possibility of soft-turbulence in an Si melt in a relatively large crucible, a more complicated manner of intake of oxygen depleted molten Si from the free surface region to underneath the growing crystal, and a relaxation of the melt after melting arising from trapped gas species.     

Generation of crystal structures of heteromolecular compounds by the method of discrete modeling of packings

Within the method of discrete modeling of packings, an algorithm of generation of possible crystal structures of heteromolecular compounds containing two or three molecules in the primitive unit cell, one of which has an arbitrary shape and the other (two others) has a shape close to spherical, is proposed. On the basis of this algorithm, a software package for personal computers is developed. This package has been approved for a number of compounds, investigated previously by X-ray diffraction analysis. The results of generation of structures of five compounds—four organic salts (with one or two spherical anions) and one solvate—are represented.     

Development of Pauling's concepts of geometric characteristics of atoms

The evolution of the geometric characteristics introduced by Pauling and their dependence on the specific features of the structure and chemical bonds have been considered. The values of the covalent and van der Waals radii are given as well as their relationships and mutual transitions.     

Investigation of the Mechanism of Influence of Stress Corrosion on the Development of Macroplastic Instabilities of Aluminum–Magnesium Alloy

Crystallography Reports - Macroscopic jumps of plastic deformation (few percent in amplitude) on creep curves of aluminum–magnesium alloy, caused by a local effect of concentrated solution of...     

Dependence of the parameters of equations of viscous flow on chemical composition of silicate melts

The temperature dependence of viscosity of silicate melts is discussed in the framework of the Avramov–Milchev (AM) equation. The composition is described by means of two parameters: the molar fraction, x, and the “lubricant fraction”, l. The molar fraction is the sum of the molar parts x_i of all oxides dissolved in SiO₂, the molar fraction of the latter being 1 ? x. It is shown that, with sufficient precision, two of the parameters of the AM equation can be presented as unique functions of the molar fraction. On the other hand, x is not sufficient to determine properly the reference temperature T_r , at which viscosity is η_r = 10¹³ [dPa.s]. Therefore, additional parameter, “lubricant fraction” l, is introduced. For each of the components, l_i is a product of molar part x_i and a specific dimensionless coefficient 0 ≤ k_i ≤ 1 accounting for the specific contribution of this component to the increased mobility of the system. It is demonstrated that, for l > 0, the reference temperature is related to the “lubricant fraction” l through the reference temperature T_r,SiO2 of pure SiO₂.     

Comparative analysis of two methods of calculation of the orientation of domain walls in ferroelastics

Two types of domain-wall equations are analyzed: the equations derived by the Sapriel method and the equations obtained by interface matching of the thermal-expansion tensor. It is shown that, for W-type domain walls, these methods yield the same equations. For W′-type domain walls, the equations obtained by different methods coincide for proper ferroelastics and differ for improper ferroelastics.     

Mechanism of thermal expansion of structural modifications of zinc pyrovanadate

Crystal chemical characteristics of the α and β modifications of Zn₂V₂O₇ are calculated based on in situ high-temperature X-ray measurements. The expansion of the structure is found to be strongly anisotropic up to the negative volumetric thermal expansion of the α-Zn₂V₂O₇ unit cell in the temperature range of 300–600°С, α _V =–17.94 × 10^–6 1/K. The transformations of the “hard” and “soft” sublattices with an increase temperature and at the phase transition are considered in detail. It is shown that the negative volumetric thermal expansion of α-Zn₂V₂O₇ is due to the degeneracy of the zigzag-like shape of zinc–oxygen columns at constant distances between their vertices.     

A SAXS study of kinetics of aggregation of silica sols

SAXS in situ experiments on the evolution of TMOS solutions during hydrolysis and polycondensation lead to power laws with scaling exponents ≈ 2. It is suggested that this could be the result of the polydispersity of the samples and that only an apparent fractal dimension can be obtained in this way. Kinetic studies tend to indicate that agglomeration in the sol is the result of a diffusion-controlled process.