Theoretical study on the improvement of the doping efficiency of Al in 4H-SiC by co-doping group-IVB elements

The p-type doping efficiency of 4H silicon carbide (4H-SiC) is rather low due to the large ionization energies of p-type dopants. Such an issue impedes the exploration of the full advantage of 4H-SiC for semiconductor devices. In this study, we show that co-doping group-IVB elements effectively decreases the ionization energy of the most widely used p-type dopant, i.e., aluminum (Al), through the defect-level repulsion between the energy levels of group-IVB elements and that of Al in 4H-SiC. Among group-IVB elements Ti has the most prominent effectiveness. Ti decreases the ionization energy of Al by nearly 50%, leading to a value as low as ~0.13 eV. As a result, the ionization rate of Al with Ti co-doping is up to ~5 times larger than that without co-doping at room temperature when the doping concentration is up to 10¹⁸ cm^-3. This work may encourage the experimental co-doping of group-IVB elements such as Ti and Al to significantly improve the p-type doping efficiency of 4H-SiC.     

基于碳化硅衬底的宽禁带半导体外延

宽禁带半导体具备禁带宽度大、电子饱和飘移速度高、击穿场强大等优势,是制备高功率密度、高频率、低损耗电子器件的理想材料。碳化硅(SiC)材料具有热导率高、化学稳定性好、耐高温等优点,在SiC衬底上外延宽禁带半导体材料,对充分发挥宽禁带半导体材料的优势,并提升宽禁带半导体电子器件的性能具有重要意义。得益于SiC衬底质量持续提升及成本不断降低,基于SiC衬底的宽禁带半导体电子市场占比呈现逐年增加的态势。在SiC衬底上外延生长高质量的宽禁带半导体材料是提高宽禁带半导体电子器件性能及可靠性的关键瓶颈。本文综述了近年来国内外研究者们在SiC衬底上外延SiC、氮化镓(GaN)、氧化镓(Ga₂O₃)所取得的研究进展,并展望了SiC衬底上宽禁带半导体外延的发展及应用前景。     

磨料形貌及分散介质对4H碳化硅晶片研磨质量的影响研究

研磨作为4H碳化硅(4H-SiC)晶片加工的重要工序之一，对4H-SiC衬底晶圆的质量具有重要影响。本文研究了金刚石磨料形貌和分散介质对4H-SiC晶片研磨过程中材料去除速率和面型参数的影响，基于研磨过程中金刚石磨料与4H-SiC晶片表面的接触情况，推导出简易的晶片材料去除速率模型。研究结果表明，磨料形貌显著影响4H-SiC晶片的材料去除速率，材料去除速率越高，晶片的总厚度变化(TTV)越小。由于4H-SiC中C面和Si面的各向异性，4H-SiC晶片研磨过程中C面的材料去除速率高于Si面。在分散介质的影响方面：水基体系研磨液的Zeta电位绝对值较高，磨料分散均匀，水的高导热系数有利于控制研磨过程中的盘面温度；乙二醇体系研磨液的Zeta电位绝对值小，磨料易发生团聚，增大研磨过程的磨料切入深度，晶片的材料去除速率提高，晶片最大划痕深度随之增大。     

TiO_2薄膜的硼掺杂对TiO_2/p~+-Si异质结器件电致发光的增强

利用磁控溅射在重掺硼硅(p+-Si)衬底上分别沉积TiO2薄膜和掺硼的TiO2(Ti O2∶B)薄膜,并经过氧气氛下600℃热处理,由此形成相应的TiO2/p+-Si和TiO2∶B/p+-Si异质结。与Ti O2/p+-Si异质结器件相比,TiO2∶B/p+-Si异质结器件的电致发光有明显的增强。分析认为:TiO2∶B薄膜经过热处理后,B原子进入TiO2晶格的间隙位,引入了额外的氧空位,而氧空位是TiO2/p+-Si异质结器件电致发光的发光中心,所以上述由B掺杂引起的氧空位浓度的增加是TiO2∶B/p+-Si异质结器件电致发光增强的原因。     

锂离子电池用α-Fe2O3-Ag复合纳米棒负极材料的制备及储锂性能

采用FeOOH纳米棒为前驱体,通过层层自组装法及随后的热处理过程制备出α-Fe2O3-Ag复合纳米棒.采用透射电子显微镜(TEM)、高分辨透射电子显微镜(HRTEM)和电化学性能测试对样品的形貌、结构及电化学性能进行了表征.结果表明,Ag纳米颗粒均匀地分布在α-Fe2O3纳米棒的表面.作为锂离子电池负极材料,α-Fe2O3-Ag复合纳米棒表现出了较好的循环性能和较高的比容量.180个循环后,其比容量高达549.8 mA.h/g.     

Minority Carrier Lifetime in As-Grown Germanium Doped Czochralski Silicon

The minority carrier lifetime of as-grown germanium-doped Czochralski （GCZ） silicon wafers doped with germanium concentrations [Ge]=10^16-10^18 cm^-3 is investigated in comparison with conventional CZ silicon samples. It is found that the lifetime distribution along the ingot changes with the variation of[Ge]. There is a critical value of [Ge] = 10^16 cm^-3 beyond which Ge can obviously influence the lifetime of as-grown ingots. This phenomenon is considered to be associated with the competition or combination between the oxygen related thermal donors （TDs） and electrically active Ge-related complexes. The related formation mechanisms and distributions are also discussed.     

Quantum confinement and surface chemistry of 0.8–1.6 nm hydrosilylated silicon nanocrystals

In the framework of density functional theory(DFT), we have studied the electronic properties of alkene/alkynehydrosilylated silicon nanocrystals(Si NCs) in the size range from 0.8 nm to 1.6 nm. Among the alkenes with all kinds of functional groups considered in this work, only those containing –NH2and –C4H3S lead to significant hydrosilylationinduced changes in the gap between the highest occupied molecular orbital(HOMO) and the lowest unoccupied molecular orbital(LUMO) of an Si NC at the ground state. The quantum confinement effect is dominant for all of the alkenehydrosilylated Si NCs at the ground state. At the excited state, the prevailing effect of surface chemistry only occurs at the smallest(0.8 nm) Si NCs hydrosilylated with alkenes containing –NH2and –C4H3S. Although the alkyne hydrosilylation gives rise to a more significant surface chemistry effect than alkene hydrosilylation, the quantum confinement effect remains dominant for alkyne-hydrosilylated Si NCs at the ground state. However, at the excited state, the effect of surface chemistry induced by the hydrosilylation with conjugated alkynes is strong enough to prevail over that of quantum confinement.     

39 函数的奇偶性

３９函数的奇偶性２４６４０１安徽省太湖二中杨德仁（本专栏特邀伯祥老师主持，稿件请寄：３１６００４浙江舟山师专）心理学家关于概念形成与概念获得的研究，还正在深入进行之中．迄今的各种理论则千秋有别，举数例述要如下：杜威：（概念是怎样产生的）概念不是从现成...     

3—（9—芴甲氧基羰基）—四氢噻唑—2—硫酮振动光谱的简正坐标分析

本文采用简化一般价力场对３－（９－芴甲氧基羰基）－四氢噻唑－２－硫酮（简称Ｆｍｏｃ－ＴＴＴ）分子的振动光谱做了简正坐标分析计算，得到了一套合理的精化力常数。并对Ｔｍｏｃ－ＴＴＴ分子的振动频率进行了指认。其计算频率与实验频率的平均百分误差为０．６９１。     

脉冲激光沉积法制备的ZnO薄膜的低阈值电抽运紫外随机激射

分别采用直流反应溅射法和脉冲激光沉积法在硅衬底上沉积ZnO薄膜, 用X射线衍射、扫描电镜、光致发光谱等手段对两种方法沉积的ZnO薄膜的结晶状态、 表面形貌和光致发光等进行了表征. 进一步对比研究了以上述两种方法制备的ZnO薄膜作为发光层的金属-绝缘体-半导体结构器件的电抽运紫外随机激射. 结果表明, 与以溅射法制备的ZnO薄膜作为发光层的器件相比, 以脉冲激光沉积法制备的ZnO薄膜为发光层的器件具有更低的紫外光随机激射阈值电流和更高的输出光功率. 这是由于脉冲激光沉积法制备的ZnO薄膜中的缺陷更少, 从而显著地减少了紫外光在光散射过程中的光损耗. 关键词： 随机激射 ZnO薄膜 脉冲激光沉积 溅射