Spectra of Highly Ionized Sulfur below 200 ^。A

Spectra of carbon-,boron-,beryllium-,lithium-,helium-,and hydrogen-like sulfur ions were obtained and studied for the wavelengths below 200 ^。A and the energy of 8O Me V by using beam-foil method.Thirty-five lines have been identified,in which 15 lines are newly accurately measured.The spectra were analysed based on the theoretical results and other experimental data.     

记录媒体用薄膜材料及相关靶材的技术和发展

 信息化时代随着计算机技术的普及来到我们面前,其突出表现是信息总量和信息交换的剧增,因此,发展海量存储技术日趋重要。随着信息及计算机技术的不断发展,对其作为主要工具的记录媒体的需求越来越大,要求越来越高。记录媒体中大多数磁盘、磁光盘、光盘是以相关靶材磁控溅射而成的,因此,为满足信息记录媒体的高密度化、小型化和低价格化,需要对其相关靶材的成分、制造工艺、性能和溅射工艺做进一步研究。目前,随着新材料的开发和记录媒体的发展,磁光盘、光盘用靶材市场在不断增长。尤其近几年CD、VCD、DVD市场的迅速扩大,其相关靶材的前景也日益被看好。     

CHBr薄膜制备的初步研究

碳氢（cH）及其掺杂材料常被用作ICF实验靶丸烧蚀层材料。制备CH薄膜及其掺杂材料的方法有很多，诸如：离子束辅助沉积、离子溅射沉积、低压等离子体化学气相沉积（LPPCVD）等。近年来，详细研究了LPPCVD法制备CH薄膜的制备方法与工艺，形成了比较成熟的技术路线与工艺路线，并为“神光”实验提供了一系列实验靶丸。     

锗基底7～11.5μm高性能红外宽带减反射膜的研究

为了提高锗基底的透过率和膜层的机械强度，对锗基底上高性能的红外宽带减反射膜的设计与制备工艺进行了研究。介绍了红外宽带减反射膜的膜料选择、膜系设计以及采用 离子束辅助沉积该膜系的过程。给出了用该方法制备的7～11.5μm波段宽带减反射膜的实测光谱曲线，其峰值透过率高达99.5％以上，在设计波段范围内平均透过率大于97.5％， 膜层附着性能好，光机性能稳定。这对于红外光学系统的应用具有十分重要的意义。     

Measurement of hyperfine structure and isotope shifts in the 580.56nm line of 142－145,146,148,150Nd+

Isotope shifts and hyperfine spectrum of singly ionized neodymium ion was measured by collinear fast-ion-beam laser spectroscopy. The hyperfine A constants and B constants are obtained for the (23230)9/2^0 level and 4f^45d ^6K9/2 level, respectively. The optical isotope shifts between seven isotopes in the 580.56 nm of^142-145,146,148,150Nd^ line are determined. The configuration admixtures for (23230)9/2^0 level were quantitatively analysed to be 4f^46p, 4f^35d^2, and 4f^35d6p with mixing coefficients of 67%, 5%, and 28%, respectively.     

直流磁控溅射沉积含He钛膜的研究

研究了用He/Ar混合溅射气体的直流磁控溅射制备钛膜中，He的掺入现象.分析结果表明，大量的He原子（He/Ti原子比高达56%）被均匀地引入到Ti膜中，其He含量可由混合溅射气体的He分量精确控制.通过调节溅射参数，可实现样品中He的低损伤引入.研究还发现，溅射沉积的含氦Ti膜具有较高的He成泡剂量和高的固He能力，这可能是溅射沉积形成了纳米晶Ti膜所致.纳米晶Ti膜较粗晶材料具有很高浓度的He捕陷中心，使He泡密度增大而泡尺寸减小.随He引入量的增加，Ti膜的晶粒尺寸减小，He引起的晶体点阵参数和X射线衍射峰宽度增大，晶体的无序程度增加.Helium trapping in the Ti films deposited by DC magnetron sputtering with a He/Ar mixture was studied. He atoms with a surprisingly high concentration (He/Ti atomic ratio is as high as 56%)incorporate evenly in deposited film. The trapped amount of He can be controlled by the helium partial amount. The introduction of the helium with no extra damage(or very low damage) can be realized by choosing suitable deposition conditions. It was also found that because of the formation of nanophase Ti film a relative high He flux for bubble formation is needed and the amount of the retain He in sputtering Ti films is much higher than that in the coarse grain Ti films. The nanophase Ti film can accommodate larger concentration of trapped sites to He, which results in a high density and small size of the He bubbles. With the increasing He irradiation flux, the grain size of Ti film decreases and the lattice spacing and width of the X ray diffraction peak increase due to the He introduction, and the film tends to amorphous phase.     

强流脉冲离子束辐照靶材烧蚀效应二维数值研究

对强流脉冲离子束(IPIB)辐照Ti靶的烧蚀效应进行了二维数值研究.得到了表面烧蚀物质随脉冲时间的变化关系.得出TEMP Ⅱ 型加速器产生的脉冲束流辐照靶材时引起的汽、液化均是从表面开始、并且汽化过程中表面物质被层层烧蚀的结论.同时，得到中心区的平均烧蚀速度为10m/s 数量级，它远小于产生的烧蚀等离子体的喷发速度.得到脉冲期间靶材内部不同位置烧蚀斑痕形状的时间演化过程，以及束流中含有的离子种类分额不同时IPIB辐照过程产生的不同效果. 关键词： 强流脉冲离子束 靶 烧蚀过程 二维数值模拟     

高功率离子束在漂移管中的中性化传输

 介绍了“闪光二号”加速器产生的高功率离子束在漂移管中的传输实验。对比了采用中性化措施前后的传输情况，分析了中性化措施对离子束束斑半径、束流均匀性的影响。根据实测的二极管电压模拟得到了传输一定距离后的束流波形，与实测结果符合较好。采取适当的中性化措施后，高功率离子束可以有效传输80 cm以上，束流发散得到抑制，束流均匀性得到改善。     

强流脉冲离子束辐照靶及其喷发的数值研究

利用拟合实测的TEMP Ⅱ型加速器磁绝缘二极管(MID)电压波形及其焦点附近束流密度曲线，建立了Gaussian分布模型，据此计算了与靶作用的离子的能量及数量，采用Monte Carlo(MC)方法计算了沉积在靶内的能量.并以此作为热源，与流体动力学(HD)模型相结合，对不同的靶状态采用相应的状态方程，模拟计算了靶内压力演化情况; 同时对烧蚀产生的等离子体采用理想气体状态方程, 结合HD方程组, 模拟计算了喷发过程中压力的空间演化过程. 关键词： 强流脉冲离子束 Gaussian模型 HD方程 数值研究     

Single Cell Element of Chalcogenide Randoul Access Memory Fabricated with the Focused Ion Beam Method

A singie cell element of chalcogenide random access memory was fabricated by using the focused ion beam method.The contact size between the Ge2Sb2Te5 Phase change film and the top electrode film is about 600nm (diameter) and the contact area is caiculated to be 0.28μm^2.The thickness of the phase change film is 83nm.The current-voltage characteristics of the cell element are studied using the home-made current-voltage tester in our laboratory.The minimum threshold current of about 0.6mA is obtained.