非负矩阵与有向图的谱半径

本文给出非负矩阵的谱半径的上界、下界,由此给出有向图的谱半径的界.     

反对称正交对称矩阵反问题

本文讨论一类反对称正交对称矩阵反问题及其最佳逼近．研究了这类矩阵的一些性质，利用这些性质给出了反问题解存在的一些条件和解的一般表达式，不仅证明了最佳逼近解的存在唯一性，而且给出了此解的具体表达式．     

Bounds for the Least Laplacian Eigenvalue of a Signed Graph

A signed graph is a graph with a sign attached to each edge. This paper extends some fundamental concepts of the Laplacian matrices from graphs to signed graphs. In particular, the relationships between the least Laplacian eigenvalue and the unbalancedness of a signed graph are investigated.     

随机化交通灯的二维元胞自动机交通模型

元胞自动机交通模型以简单的规则反映交通系统中的多种因素，可以分析各种交通现象，且可在计算机上方便、高效地运作·Ｂｉｈａｍ－Ｍｉｄｄｌｅｔｏｎ－Ｌｅｖｉｎｅ模型（ＢＭＬ模型）实现了二维交通问题的元胞自动机模型的模拟研究·本文对ＢＭＬ模型作了改进，解除了该模型中关于交通灯同步变化的限制·在新模型中，每个路口的交通灯可以自由选定起始工作时间和变化节奏，于是可以更全面、准确地反映交通灯对交通系统性能的影响·本文还对新模型中出现的若干新效应作了解释·     

The projective method for solving linear matrix inequalities

Numerous problems in control and systems theory can be formulated in terms of linear matrix inequalities (LMI). Since solving an LMI amounts to a convex optimization problem, such formulations are known to be numerically tractable. However, the interest in LMI-based design techniques has really surged with the introduction of efficient interior-point methods for solving LMIs with a polynomial-time complexity. This paper describes one particular method called the Projective Method. Simple geometrical arguments are used to clarify the strategy and convergence mechanism of the Projective algorithm. A complexity analysis is provided, and applications to two generic LMI problems (feasibility and linear objective minimization) are discussed.     

Paul阱内的压缩效应与量子跃迁

处理一个一维Ｐａｕｌ阱系统中的压缩现象与量子跃迁现象，对于阱内的最强压缩态和共振跃迁（一种极不稳定状态）之间的关系作了阐述，并对利用压缩性质在阱内进行精密测量的可能性作了讨论     

矩阵对角相似的图论判别法

本文证明了任意两个ｎ阶复矩阵Ａ和Ｂ为对角相似的充要条件是：它们有相同的伴随有向图，并且以此有向图为基础有向图，以Ａ和Ｂ的对应非零元素比值为弧权值的赋权有向图满足“无向圈平衡条件”。我们还给出了矩阵对角相似条件在非负矩阵谱理论研究中的一个应用。     

具有奇异值分解性质的代数

设F为一个域,R为一个带有对合的F-代数,如果R上每一个矩阵都有奇异值分解(简称SVD),则称R为一个有SVD性质的F-代数.本文指出:R为一个有SVD性质的F-代数的充要条件是:R同构于R~+,或R~+上二次扩域,或R~+上四元数体((-1,-1)/R~+),其中R~+为R的对称元集合,并且R~+为一个Galois序闭域.     

Time-resolved synchrotron X-ray study of crystalline phase transition in poly(aryl ether ketone ketone) containing alternated terephthalic/isophthalic moieties

Unique crystallization and melting behavior in poly(aryl ether ketone ketone) containing alternated terephthalic and isophthalic moieties were studied by time-resolved synchrotron x-ray methods. Recently, this material has been shown to exhibit three polymorphs (forms I, II, and III). In this work, we further investigated their distinctive thermal properties and found that form I is the dominating and the most thermally stable phase while form II is favored by fast nucleation conditions and is the least stable phase. On the other hand, form III represents a minor intermediate phase that usually coexists with form I and can be transferred from form II and to form I. Structural and morphological changes in form I have been followed by simultaneous wide-angle x-ray diffraction (WAXD)/small-angle x-ray scattering (SAXS) measurements during cold- or melt-crystallization and subsequent melting. In all cases, a larger dimensional change was found in the crystallographic a-axis than the b-axis during heating and cooling. This may be due to the greater lateral stress variation with respect to temperature along the a direction of the primary lamellae which is induced by either the formation of secondary lamellae or the preferential chain-folding direction in poly(aryl ether ketone ketone)s. During the phase transitions of form II ← III in the cold-crystallized specimen and form III ← I in the melt-crystallized samples, lamellar variables (long period, lamellar thickness, and invariant) obtained from SAXS remain almost constant. This indicates that the density distribution in the long spacing is independent of the melting in form II or III. For melt-crystallization, the corresponding changes in unit-cell dimensions and lamellar morphology during the annealing-induced low endotherm are most consistent with the argument that these changes are due to the melting of thin lamellar population. © 1995 John Wiley & Sons, Inc.