MoO3在Al2O3薄膜表面扩散的研究

氧化物和盐类在高比表面载体上的单层分散现象已被大量实验所证实［１］．ＭｏＯ_３在γ－Ａｌ_２Ｏ_３等高比表面载体上的分散已经研究很多,近来的研究证实ＭｏＯ３等在α－Ａｌ２Ｏ３等小比表面载体上也能自发单层分散［２］,但是分散的过程仍然缺乏直接的观察研究．本工作通过多种表面分析方法首次研究了ＭｏＯ３在平整无定形的Ａｌ２Ｏ３薄膜上的扩散过程以及影响因素．发现除温度升高外、水汽的存在对该扩散过程也有促进作用．１实验部分１．１样品的制备采用ＳＳ－３２００真空磁控溅射镀膜机,通入Ａｒ－Ｏ２作为反应气,直流磁控…     

ICP-AES法测定环境水样中的微量镉铬铜镍铅锌

应用ＩＣＰ－ＡＥＳ法对环境水样中Ｃｄ、Ｃｒ、Ｃｕ、Ｎｉ、Ｐｂ、Ｚｎ等６种微量元素进行直接测定。考察了环境水样中钙、镁离子对的影响。通过对国标样品及实际样品的测定,加标回收实验,建立了简便、快速、准确、稳定、重现性较好的ＩＣＰ－ＡＥＳ法测定环境水样中６种微量元素的分析方法。     

Quantitative AES and XPS: convergence between theory and experimental databases

Experimental spectral databases have been recorded for AES and XPS using fully calibrated instruments. These instruments have been calibrated so that the spectra have the true shape and peak area intensities may be integrated to give absolute yields for AES and relative yields for XPS. Removal of all the backgrounds requires care but may be completed by using information from both databases. The resultant yields may be compared with theory. The correlations for AES are the more complex and involve the total intensities for all transitions originating in each shell. The correlations are excellent using significant changes to the traditional approach. These involve the use of the Casnati et al. ionisation cross section and the restriction of the number of electrons for use in the inelastic mean free path calculations to electrons of 14 eV or less binding energy in the s, p or d sub-shells. The average ratio of experiment to theory is 1.04 with a standard uncertainty of the mean of 4%. Results for XPS are excellent using Scofield’s ionisation cross section together with the above rules for the inelastic mean free path calculations. Improvements for certain elements are still needed for removing the inelastically scattered Auger and photoelectrons in both databases. To assist analysts in using such databases a simpler measure of Auger electron intensity is developed involving differential spectra broadened with a Gaussian function of 15–20 eV width. The peak-to-peak intensities from these broadened spectra are reasonably closely related to the peak area of the direct spectra except in a few exceptional cases. The unbroadened differential spectra show strong contributions from the spectrometer resolution and changes in the chemical state which are avoided by the spectral broadening. To simplify calculations for the analyst when studying homogeneous materials by AES and XPS, the relative sensitivity factors are re-defined to be for an average matrix instead of the pure element. This leads to a matrix-less equation for calculating compositions from the spectra.     

PSO萃取色层分离原子发射光谱测定氧化钇中十四个稀土杂质

本将石油亚砜浸渍在一种特制的吸附树脂上,用ＰＳＯ为固定相的萃取色层法分离氧化钇中痕量稀土杂质,可以分析６－７Ｎ级的氧化钇样品,加入试验的回收率为６７－１２０％,相对标准偏左为±４－１９．４％。     

ICP—AES法中稀土元素间的相互干扰研究

稀土元素的谱线较复杂,相互间存在着不同程度的干扰。本文着重研究了ＩＣＰ－ＡＥＳ法中,它们间的干扰情况,并用几种校正方法进行了比较。     

ICP-AES法测定金属硅中的Al、B、Ba、Ca、Cr、Cu、 Fe、Mg、Mn、Ni、Sr、Ti、V和Zn杂质元素

本文提供了一种测定金属硅中Ｂ,Ｆｅ,Ａｌ,Ｃａ,Ｍｎ等１４个杂质元素的ＩＣＰ－ＡＥＳ方法,在样品处理过程中,加入适量体积的甘露醇能够抑制Ｂ的挥发。用本方法测定了一个国家地球化学标准样（ＧＳＲ－４）,结果令人满意。     

光谱法研究钢铁表面彩色Mo-S-Fe簇合物膜

研究MoS4^2-在钢铁表面发生配位反应形成的具有装饰效果的多种彩色Mo-S-Fe簇合物膜。FT-IR、F-IR、FT-Raman、XPS和AES分析表明,簇合物膜以Fe(Ⅲ)、Mo(Ⅵ)状态存在,膜内层以Fe(Ⅱ)、Mo(Ⅳ)和Mo(Ⅵ)共存,S和O都-2价,膜表面含少量 4、 6价硫。从AES深度分布曲线的组成恒定区求得各组成元素的相对原子百分比浓度和膜层厚度,反应时间越长,膜越厚,膜为多分子层结构。加热后膜层所含元素种类及价态不变,但元素分布有所改变。     

SEM–EDX and SAM–AES Investigations on Rochow Contact Masses

Appropriate Rochow contact masses have been investigated by the spatial resolution techniques SEM–EDX and SAM–AES. The results gave evidence of the existence and the catalytic action of (X-ray)-amorphous copper–silicon (Cu–Si) surface species, i.e. extremely highly dispersed particles or two-dimensional species. The well-known Rochow promoter zinc seems to act as a moderator rather than as a real accelerator. It ensures a stable rate for the reaction by neutralizing the detrimental action of silicon impurities. The silicon impurities make the whole of the silicon surface reactive and in this way cause a general blockade of the silicon surface by inactive copper species. Zinc localizes the reaction. The silicon surface remains partly free, and active Cu–Si surface species can be formed by lateral diffusion of copper onto the silicon surface that is still free. © 1997 by John Wiley & Sons, Ltd.     

CVG-ICP-AES法测定饮用天然矿泉水中痕量铅和汞

自制化学蒸气发生器并建立了KBrO3KBr K3Fe(CN)6HCl KBH4的CVG ICP AES同时直接测定饮用天然矿泉水中痕量铅和汞的方法,该方法提高了灵敏度,改善了检出限。方法的检出限分别为0.7μg·L-1(Pb220.353nm),0.1μg·L-1(Hg184.950nm),相对标准偏差分别为0.8%～7.8%(Pb)和0.5%～6.2%(Hg);回收率分别为90.0%～100.0%(Pb)和92.8%～108.0%(Hg)。方法完全能满足饮用天然矿泉水中痕量铅和汞的分析。     

Chemical bond formation during laser bonding of Teflon FEP and titanium

Teflon^® FEP (fluorinated ethylene propylene) is resistant to most chemical solvents, is heat sealable and has low moisture uptake, which make this polymer attractive as a packaging materials for electronics and implantable devices. Teflon^® FEP/Ti microjoints were fabricated by using focused infrared laser irradiation. Teflon^® FEP/Ti interfaces were studied by using X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and scanning electron microscopy coupled with energy dispersive spectroscopy (SEM-EDS). The XPS results give evidence for the formation of Ti-F bonds in the interfacial region. The AES and SEM-EDS results show that the chemical bond formation occurs only in the actual bond area. No evidence for chemical bond formation was found in the heat affected zone surrounding the laser bonds.