Surface cosegregationp phenomena on alloys and steels: Structural features and phase transitions

In recent years surface cosegregation phenomena have been studied on various alloy and steel surfaces using surface sensitive techniques such as Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), x-ray photoelectron diffraction (XPD) and low energy electron diffraction (LEED). Surface cosegregation causes the formation of two-dimensional surface compounds which may be stabilized by epitaxy on substrate surfaces of suitable structure and orientation. It has been found that in many cases surface compounds undergo phase transitions which are reviewed in this short report.     

Concepts for chemical state analysis at constant probing depth by lab-based XPS/HAXPES combining soft and hard X-ray sources

The greater information depth provided in hard X-ray photoelectron spectroscopy (HAXPES) enables nondestructive analyses of the chemistry and electronic structure of buried interfaces. Moreover, for industrially relevant elements like Al, Si, and Ti, the combined access to the Al 1s, Si 1s, or Ti 1s photoelectron line and its associated Al KLL, Si KLL, or Ti KLL Auger transition, as required for local chemical state analysis on the basis of the Auger parameter, is only possible with hard X-rays. Until now, such photoemission studies were only possible at synchrotron facilities. Recently, however, the first commercial XPS/HAXPES systems, equipped with both soft and hard X-ray sources, have entered the market, providing unique opportunities for monitoring the local chemical state of all constituent ions in functional oxides at different probing depths, in a routine laboratory environment. Bulk-sensitive shallow core levels can be excited using either the hard or soft X-ray source, whereas more surface-sensitive deep core-level photoelectron lines and associated Auger transitions can be measured using the hard X-ray source. As demonstrated for thin Al₂O₃, SiO₂, and TiO₂ films, the local chemical state of the constituting ions in the oxide may even be probed at near-constant probing depth by careful selection of sets of photoelectron and Auger lines, as excited with the combined soft and hard X-ray sources. We highlight the potential of lab-based HAXPES for the research on functional oxides and also discuss relevant technical details regarding the calibration of the kinetic binding energy scale.     

Electronic Structure of Bis(2,4-pentanedionato-O,O')oxovanadium(IV). A Photoelectron Spectroscopy, Electronic Spectroscopy, and ab Initio Molecular Orbital Study

The electronic structure of the title VO(acac)(2) complex has been investigated using effective core potential configuration interaction ab initio calculations, UV-photoelectron spectroscopy, and electronic spectroscopy. The metal-ligand bonding with the equatorial acac(-) ligands is dominated by sigma interactions involving the filled ligand orbitals and the empty orbitals of the d(1) vanadium(IV) ion. The oxovanadium interactions involve a larger metal-d participation thus resulting in a strong V-O bonding having partial triple-bond character. Additional three-orbital-four-electron stabilizing interactions involving the filled acac(-) MOs and the oxovanadium orbitals further reinforce both the axial and equatorial bonds. The unpaired metal-d electron is completely localized in the nonbonding d(x)()()2(-)(y)()()2 orbital. The low ionization energy of the photoelectron spectrum has been fully assigned on the basis of combined DeltaSCF and configuration interaction calculations. The same theoretical approach has, in addition, provided a good fitting of frequencies associated with "d-d" and charge transfer electronic transitions.     

X-ray and electron induced Auger processes for I2 adsorption on uranium

The accurate determination of the kinetic energy of X-ray induced Auger electrons, which is necessary in XPS experiments, e.g. for calculating the Auger parameter, is sometimes hampered by peak interferences or by the high secondary electron background. The latter is of special importance for low kinetic energy electrons like e.g. the U(OPV) and U(OVV) Auger electrons. These problems can be circumvented by using electron induced Auger transitions (AES). However, since XPS and AES use different reference points for the energy scales, both scales have to be matched. This can be done by measuring the kinetic energy of an appropriate Auger transition in XPS and relating this value to the maximum of the second derivative of the same peak in AES.     

The mechanism of formation and specifics of fragmentation for negative molecular ions of allylsilanes

The processes of formation of negative ions by allylsilane molecules were studied by resonanceelectron-capture mass spectrometry, and photoelectron spectra of these compounds were obtained. It was experimentally found that the overwhelming majority of fragment negative ions are produced in the energy range ～6–10 eV. It was shown that the resonance-electron-capture mass spectrum is almost entirely described by one or two series of intershell resonances due to excitation of an electron successively from several higher occupied orbitals to the lower unoccupied π molecular orbital.     

Interpretation of the photoelectron spectra of FeS(2)(-) by a multiconfiguration computational approach

The ground states of FeS(2) and FeS(2)(-), and several low-lying excited electronic states of FeS(2) that are responsible for the FeS(2)(-) photoelectron spectrum, are calculated. At the B3LYP level an open, quasi-linear [SFeS](-) conformation is found as the most stable structure, which is confirmed at the ab initio CASPT2 computational level. Both the neutral and the anionic unsaturated complexes possess high-spin electronic ground states. For the first time a complete assignment of the photoelectron spectrum of FeS(2)(-) is proposed. The lowest energy band in this spectrum is ascribed to an electron detachment from the two highest-lying 3dpi antibonding orbitals (with respect to the iron-sulfur bonding) of iron. The next-lowest experimental band corresponds to an electron removal from nonbonding, nearly pure sulfur orbitals. The two highest bands in the spectra are assigned as electron detachments from pi and sigma bonding mainly sulfur orbitals.     

Structure of X-ray photoelectron, emission, and conversion spectra and molecular orbitals of uranium compounds

The fine structure of X-ray photoelectron spectra of uranium compounds in the range of electron binding energies from 0 to ∼50 eV is largely determined by the electrons of the outer and inner valence molecular orbitals arising from the valence atomic shells, including the U6p and Lns low-energy occupied atomic shells. This result is in agreement with the data of the electronic structure calculations of these compounds and confirmed by the nuclear electron (conversion) and X-ray emission spectroscopic investigations. It is shown that the fine structure of X-ray photoelectron spectra associated with the electrons of inner valence molecular orbitals makes it possible to judge the participation of the electrons of the occupied atomic shells in chemical bonding, the structure of the nearest environments of the atom, and the bond lengths in the compounds. The overall contribution of the electrons of these molecular orbitals to the absolute value of binding energy may prove to be comparable to the contribution of the electrons of the outer valence molecular orbitals to atomic bonding. This is a new and important fact in chemistry. Translated fromZhurnal Strukturnoi Khimii, Vol. 39, No. 6, pp. 1037–1046, November–December, 1998.     

Intensity calibration for monochromated Al Kα XPS instruments using polyethylene

We describe a method for the intensity calibration of XPS instruments using polyethylene as the reference material. Previous methods have employed noble metals, such as gold, silver, and copper. Polyethylene has a number of advantages over these. It has far fewer photoelectron and Auger electron peaks than such metals, ie, the spectrum largely comprises inelastic background over a wide and continuous range of kinetic energies. The XPS spectrum can be described by a mathematical function enabling simple and noise-free implementation of the reference spectrum. Polyethylene can be cleaned ex situ using a sharp knife or razor blade to remove trace oxygen and, due to its chemical composition, should not be affected by adventitious carbon contamination. Thus, an ion source for sputter cleaning is not required, although an electron flood source for charge compensation is required. The drawback to using polyethylene is that the photoelectron yield is far lower than gold or silver, and this necessitates longer acquisition times and removal of dark noise. Longer acquisition times carry the risk of damaging the polyethylene surface, and we show that, even if damage does occur, it has a negligible effect on the XPS background intensity. The reference spectrum is valid for monochromated Al Kα XPS instruments with a monochromator-sample-analyser angle close to 60°.     

A review of auger photoelectron coincidence spectroscopy

The application of coincidence detection techniques produces a dramatic increase in the information obtained from particle and photon scattering studies. A clear illustration of this is given by Auger Photoelectron Coincidence Spectroscopy (APECS). By coincident detection of the ejected photoelectron and the resulting Auger electron during x-ray excited Auger spectroscopy, it is possible to distinguish the true origin of peaks and satellites within the Auger spectra. For example, it becomes possible to separate standard Auger processes from those occurring in conjunction with Coster-Kronig transitions and from those either followed or preceded by shake-off or shake-up transitions. In addition, the technique often allows the separation of overlapping series of Auger peaks, thus permitting the study of individual elements within compounds and alloys. These possibilities will be illustrated primarily by reference to APECS studies of 3d transition metal elements.     

XPS- and AES-investigations of electron and ion beam induced effects on SK16 glass surfaces

Summary Electron beam induced effects in the near surface region of SK16 glass samples (44% SiO₂, 25% B₂O₃, 28% BaO, 3% other) have been studied using Auger electron spectroscopy (AES) with 3 keV primary electrons at different current densities (4.7 mAcm^–2–75 mAcm^–2). It was found that the SiO₂ and B₂O₃ constituents dissociate during electron bombardment to form binding structures which are characteristic for elemental Si and B, respectively. To investigate the influence of the ion beam irradiation on the binding structure, the glass samples were bombarded with Ar⁺ ions of different kinetic energies (0.5 keV–5 keV), followed by XPS analysis. In comparison to the XPS signal of a virgin SK16 surface from a sample fractured in situ under UHV conditions, the FWHM of the photoelectron peaks were found to increase with the bombarding ion energy. Subsequent Auger spectra revealed that the ion bombardment also caused a dissociation of the SiO₂ and B₂O₃ components. Depending on the ion energy, a constant ratio between elemental and oxidized binding form is obtained.     

Effect of phosphorus concentration on the electronic structure of nanocrystalline electrodeposited Ni–P alloys: an XPS and XAES investigation

A surface analysis has been conducted on a series of electrodeposited nickel‐phosphorus (Ni–P) alloys containing from 6 to 29 at.% phosphorus, using X‐ray photoelectron spectroscopy (XPS) and X‐ray excited Auger electron spectroscopy (XAES). No changes in core‐level binding energies, Ni2p3/2 and Ni2p1/2, P2p, P2s, or X‐ray excited NiLMM and PKLL Auger lines were observed regardless of phosphorus concentration. The only systematic differences observed concerned: (i) the binding energy of the Ni2p satellite peak, (ii) the fine structure of the NiLMM Auger lines, (iii) the percentage of the satellite in the total Ni2p3/2 spectrum and (iv) the valence band density of states in the Ni3d electrons region, all related to the electronic structure of the Ni–P alloys. For the first time, it has been possible to describe and rationalise the influence of (phosphorus) ligand concentration on the electronic structure of nickel‐based alloys, using a screening model proposed in the literature for clarifying the role of substituents on the electronic structure of conductor compounds of nickel. As the phosphorus content increases, the number of non‐bonding Ni3d electrons decreases. Thus the d‐type core‐hole screening is less pronounced and the binding energy of the satellite for the final state with a filled Ni4s shell increases. Copyright © 2008 John Wiley & Sons, Ltd.     

Characterization of Ni?B amorphous alloys with x‐ray photoelectron and secondary ion mass spectroscopy

Amorphous Ni? B alloys with nominal compositions 30 at.% B and 50 at.% B were produced via electrodeposition on pure Ni polycrystalline substrates. The surfaces of the alloys were characterized with x‐ray photoelectron spectroscopy (XPS) and dynamic secondary ion mass spectrometry (DSIMS). Information on the compositional variation with depth was acquired with XPS both non‐destructively, in angle‐resolved mode (ARXPS), and destructively with argon ion etching, as well as with DSIMS. Boron oxide dominates the outermost surface of the alloys. Its presence also in the bulk of the alloys is attributed to oxidation during processing, whereas the presence of hydrogen detected with SIMS is attributed to adsorption occurring during processing. The Auger parameter concept and information from the primary and secondary structure of the XPS spectrum were employed to probe the electronic changes occurring upon alloying. It is suggested that the main electronic changes occurring are hybridization of the Ni spd states with the B sp states and an apparent increase of the electron density around the Ni sites. Copyright © 2005 John Wiley & Sons, Ltd.     

Study on the Chemistry and Structure of (Na(1−x)Bix)(Nb(1−y)Mny)O3 Ceramics by XPS, AES and EPMA

The (Na_1–xBi_x)(Mn_yNb_1–y)O₃ ceramics are new compounds, obtained for the first time, on the base of sodium niobate with substitution of bismuth manganite. It was shown that the solubility limit for Mn ions in sodium niobate lattice does not exceed 1% at. Therefore, the co-doping with Bi ions was proposed to increase this limit. Bismuth ions are expected to replace Na ions and to ensure charge compensation in the formed compound, thus enhancing possibility of accumulation of the Mn ions in solution without losing the appropriate electrical and optical properties. To study the morphology of produced ceramic four methods of sample characterization were used: X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), electron microprobe analysis (EPMA) and Scanning Electron Microscopy (SEM).     

Monte Carlo simulation of full energy spectrum of electrons emitted from silicon in Auger electron spectroscopy

A Monte Carlo simulation including surface excitation, Auger electron‐ and secondary electron production has been performed to calculate the energy spectrum of electrons emitted from silicon in Auger electron spectroscopy (AES), covering the full energy range from the elastic peak down to the true‐secondary‐electron peak. The work aims to provide a more comprehensive understanding of the experimental AES spectrum by integrating the up‐to‐date knowledge of electron scattering and electronic excitation near the solid surface region. The Monte Carlo simulation model of beam–sample interaction includes the atomic ionization and relaxation for Auger electron production with Casnati's ionization cross section, surface plasmon excitation and bulk plasmon excitation as well as other bulk electronic excitation for inelastic scattering of electrons (including primary electrons, Auger electrons and secondary electrons) through a dielectric functional approach, cascade secondary electron production in electron inelastic scattering events, and electron elastic scattering with use of Mott's cross section. The simulated energy spectrum for Si sample describes very well the experimental AES EN(E) spectrum measured with a cylindrical mirror analyzer for primary energies ranging from 500 eV to 3000 eV. Surface excitation is found to affect strongly the loss peak shape and the intensities of the elastic peak and Auger peak, and weakly the low energy backscattering background, but it has less effect to high energy backscattering background and the Auger electron peak shape. Copyright © 2014 John Wiley & Sons, Ltd.     

MoS2的水热合成及其润滑性能

利用水热合成法在相对较低的反应温度(200 ℃)和较短的反应时间(24 h)内合成了MoS2.采用透射电子显微镜(TEM)、X射线光电子能谱(XPS)和X射线衍射(XRD)分析了合成的纳米MoS2的结构.同商品MoS2（平均颗粒直径为3～5 μm）进行了摩擦学性能对比，并利用俄歇电子能谱(AES)深度剖析和XPS分析了MoS2作为润滑剂在钢磨损表面的粘着成膜作用及润滑机理.结果表明,该水热合成的产品具有较商品MoS2更低的摩擦系数，适合在大载荷、长时间工作状况下使用.     

Changes in a surface of polycrystalline aluminum upon bombardment with argon ions

The interaction between argon ions and a natural oxide layer of polycrystalline aluminum is studied via Auger electron (AE) and electron energy loss (EEL) spectroscopy. It is found that bombardment with argon ions whose energy is lower than the Al₂O₃ sputtering threshold results in the accumulation of bombarding ions in interstitial surface voids, thus forming a supersaturated solid solution of target atoms and bombarding ions of argon and nitrogen entrapped by the ion beam from the residual gas of the working chamber of the spectrometer.     

The chemical state of arsenic in minerals of environmental interest--an XPS and an XAES study

A systematic analytical study using X-ray photoelectron spectroscopy (XPS) and X-ray induced Auger electron spectroscopy (XAES) has been carried out to characterize the chemical state of arsenic in complex environmental samples. The conventional approach, which relies on the chemical shift of the core levels As3d, provides ambiguous results in determining the chemical environment of arsenic. A more accurate approach, based on the Auger parameter and on the Wagner (Chemical State) plot, which combines AsLMM kinetic energy and As3d binding energy, was adopted. This novel method for determining the chemical state of arsenic was employed to completely characterize arsenic in complex environmental samples.     

Quantitative surface analysis by Auger and x-ray photoelectron spectroscopy

Recent developments in quantitative surface analysis by Auger (AES) and x-ray photoelectron (XPS) spectroscopies are reviewed and problems relating to a more accurate quantitative interpretation of AES/XPS experimental data are discussed. Special attention is paid to consideration of elementary physical processes involved and influence of multiple scattering effects on signal line intensities. In particular, the major features of core-shell ionization by electron impact, Auger transitions and photoionization are considered qualitatively and rigorous approaches used to calculate the respective transition probabilities are analysed. It is shown that, in amorphous and polycrystalline targets, incoherent scattering of primary and signal Auger and photoelectrons can be described by solving analytically a kinetic equation with appropriate boundary conditions. The analytical results for the angular and energy distribution, the mean escape depth, and the escape probability as a function of depth of origin of signal electrons as well as that for the backscattering factor in AES are in good agreement with the corresponding Mote Carlo simulation data. Methods for inelastic background subtraction, surface composition determination and depth-profile reconstructions by angle-resolved AES/XPS are discussed. Examples of novel techniques based on x-ray induced photoemission are considered.