非线性左手材料的时域研究

 分析了非线性左手材料模型，推导了非线性左手材料中的时域有限差分法及完美匹配层的计算式。数值模拟了具有Kerr非线性效应的左手材料平板中的电磁波。观察到该材料同样具有电磁聚焦特性。对比线性左手材料，其聚焦点的幅度和位置都会发生偏移。同时改变波源的强度及其到平板边界距离，讨论了不同距离情况下该非线性左手材料平板对电磁波分布的影响。当波源距离材料平板足够远，通过非线性左手材料聚焦的电场强度几乎集中在其外表面。     

可多重聚焦电磁能量的左手材料结构

 功分器在微波工程中广泛应用。基于有损耗的Lorentz模型的时域有限差分(FDTD)方法，分析模拟了左手材料(LHM)的平板结构和环状结构对电磁波源的不同聚焦特性。每个左手材料边界均可以对波源发出的波进行聚焦。同时通过比较，在对称结构中，每个聚焦点的电磁场幅度都相同。说明该左手材料结构可以对电磁波源进行多点聚焦。     

左手材料平板对傍轴高斯光束聚焦特性分析

在傍轴近似下,推导出了左手材料平板聚焦系统的传输矩阵,并利用ABCD定律得到了高斯光束在左手材料中和经过平板透镜聚焦后的传输公式。高斯光束在左手材料内部和像空间的传输公式的研究表明:像高斯光束和物高斯光束束腰大小一致,即左手材料平板透镜实际上对高斯光束没有聚焦作用。研究同时表明左手材料平板对高斯光束的聚焦与几何光学成像规律完全一致,而不存在一般透镜聚焦时的焦移效应。     

激光通过不同厚度的强散射介质的聚焦

通常情况下,激光光束经过散射介质后会产生无序的散斑。基于波前相位调制技术,利用连续序列算法结合四步相移法对入射激光的波面进行相位调制,使其通过散射介质在目标位置处形成聚焦。实验着重研究激光经过不同厚度的强散射片样品的聚焦,讨论散射介质的厚度与聚焦点光强增长因子的关系。实验结果表明,透过的散射介质越厚,聚焦光斑尺寸越小,目标位置处聚焦点的光强增长因子也越小。     

PML-FDTD法在分析负折射率材料中的应用

将时域有限差分(FDTD)法引入了对负折射率材料物理现象的仿真研究.给出了二维TM波在负折射率材料中的时域差分方程,并且在吸收边界处使用了理想匹配层(PML).为了避免在迭代过程中出现的不稳定现象,在差分方程的推导中引入了Drude模型, 并对Pendry提出的由负折射率材料构成的平板透镜具有的完美成像现象进行了数值仿真验证.由仿真结果发现,完美成像现象只在平板透镜的折射率n=－1时出现,当n≠－1时则会出现近轴聚焦效应.     

双曲余弦高斯光束在左手平板材料中的传输特性

为了研究双曲余弦高斯光束在左手平板材料中的传输特性,运用广义惠更斯-菲涅耳衍射积分公式,推导出双曲余弦高斯光束在左手平板材料中的一般传输解析表达式。利用此表达式数字模拟了左手平板材料工作频率的变化对光束传输特性的影响。结果表明:双曲余弦高斯光束的中心光强、横向光强和光斑尺寸都可以用左手平板材料的工作频率来调控。随传输距离的增加,中心光强逐渐加强;在同一传输面上工作频率越大,中心光强越强。横向光强随工作频率的增大而增加,并且出现空心分布,光斑尺寸在加速扩展。     

一种新颖的表面光波导型原子(或分子)分束器

提出了一种采用二元π位相板与柱面透镜组合而构成表面光波导型原子（或分子）分束器及其Mach-Zehnder干涉仪与X-分束器列阵的新方案，介绍了本方案的物理思想与基本原理，导出了光强分布、强度梯度、分束距离和分束路径的宽度与光学系统参数间的解析关系，并分析和讨论了本方案的潜在应用及其可行性. 研究表明，本方案设计新颖、光路简单，便于与其他元件组合构成具有表面微结构的集成原子（或分子）光学元器件及其全光型原子（或分子）芯片. 关键词： 原子（或分子）光波导 原子（或分子）分束器 原子（或分子）芯片 二元π位相板     

基于双鱼网结构的可见光波段超材料

基于双鱼网左手模型的思想,使用模板辅助化学电沉积的方法制备出不同结构周期的金属银纳米网格,并进一步实现了可见光波段的双鱼网结构超材料.随着结构周期的减小,金属银纳米网格透射通带位置出现蓝移.使用周期为420 nm的金属银纳米网格组装成双鱼网结构,样品在610 nm处出现透射增强及平板聚焦效应.倘若使用结构周期更小的模板,有望实现更短波长,甚至蓝光波段的双鱼网结构超材料. 关键词： 超材料 双鱼网结构 可见光 平板聚焦     

高斯光束经过负球差透镜的聚焦

本文讨论高斯光束经过负球差透镜的聚焦，得到了聚焦光场轴上点的光强分布的表示式，并对其进行数值计算。数值计算结果表明，在负球差的情况下，得到光强的最大点位置（最佳聚焦点）相对于无球差情况，往透镜方向移动，并且，最佳聚焦点的光强较无球差时大，当Ｎｗ＝１，Ｎａ＝５，ｋＳ１＝－０．２时，得到的最佳聚焦点的光强是无球差时的１．３４倍。本文还讨论了透镜的菲涅尔数对聚焦光场分布的影响。结果表明，当透镜的菲涅尔数小于１时，球差对高斯光束的聚焦的影响可以忽略。     

左手材料的反射特性与负折射率行为

利用平板波导法研究了不同入射角度下周期排列开口谐振环负磁导率材料、周期排列金属杆负介电常数材料以及左手材料微波反射特性，并利用劈尖法研究了左手材料的负折射特性.实验结果表明：负磁导率材料反射率曲线形成反射峰，其对应的反射峰频率与材料的谐振频率一致；负介电常数材料反射率接近0dB；左手材料出现单个反射较小的反射峰，其峰值反射率随入射角度的增大而变大，即反射能力增强，且反射峰与透射峰有相对频移.劈尖法测量还表明，左手材料在9800MHz频率附近出现负折射现象，其折射率n为-0.796. 关键词： 左手材料 反射 负折射率     

Finite-size effects of a left-handed material slab on the image quality

The characteristics of an imaging system formed by a left-handed material (LHM) slab of finite length are studied, and the influence of the finite length of the slab on the image quality is analyzed. Unusual phenomena such as surface bright spots and negative energy stream at the image side are observed and explained as the cavity effects of surface plasmons excited by the evanescent components of the incident field. For a thin LHM slab, the cavity effects are found rather sensitive to the length of the slab; the bright spots on the bottom surface of the slab may stretch to the image plane and degrade the image quality.     

Research of electromagnetic field in different length left-handed material slab

Finite-difference time-domain （FDTD） method is used to simulate the propagation of electromagnetic wave in left-handed material slab （LHMs） with cold plasma model The effects of optical propagation in the left-handed material compared to convex lens are discussed. The wider the LHMs is, the stronger electric field of focusing image in left-handed material slab is confirmed by the simulation with various slab length. However, the outer image point location would slightly moves to the LHMs side when the length of LHMs is reduced.     

Dispersion characteristics of broadside coupled dielectric image guide at millimeter wave frequencies

Dispersion characteristics and wave impedance for the even and odd modes of the broad side coupled dielectric image guides are computed by using mode matching techniques. Dispersion curves for broadside image guide are plotted for various dielectric materials and dimensional parameters as a function of frequency. Normalized electric field for dominant electric field component E of TM even and odd modes for various half spacings between two dielectric slabs of broadside coupled image guide have been plotted. Polysterene ( r=2.56) and Stycast ( r=3.4) have been used as dielectric materials in fabricating broadside coupled image guide. This broadside coupled dielectric guide is very convenient as compared to the other dielectric guides. Since in case of broadside coupled image guide the dielectric slab can be bonded to the side metallic walls using some low loss adhesive material, while in other coupled dielectric guides the dielectric slab have to be supported by some low dielectric constant material (Eccofoam with r=1.02) to maintain the proper distance of side metallic walls from the dielectric slab. Since this structure is symmetrical, this configuration can be analysed in terms of even and odd mode phase velocities. The difference in these even and off mode phase velocities can be used to determine the coupling between coupled dielectric slab. Various couplers in this configuration can be realised.     

高斯波束在双负媒质中的传播特性分析

 提出了一种基于Drude色散媒质模型的2维TM模时域有限差分法，数值模拟了高斯波束从自由空间垂直入射和斜入射到双负媒质(介电常数和磁导率同时为负)平板后的折射现象，并给出了平板内外的电场强度分布。模拟结果显示：垂直入射时，双负媒质平板对高斯波束具有汇聚作用，通过改变媒质的折射率，可以控制高斯波束通过组合平板的传播时间而不发生衰减；斜入射时，折射波束与入射波束均位于法线的同一侧，高斯波束在双负媒质与空气交界面处发生了负折射。     

源嵌入正折射率传输线介质板内的倏逝波和成像特性

 提出了点源嵌入正折射率介质板进行亚波长成像的新方法,分析了位于负折射率媒质里的正折射率介质板内外的电压倏逝波和电压传播波分布。正和负折射率媒质分别由2维未加载传输线和2维加载电感、电容传输线网络组成。微波电路和数值仿真结果都显示由于板内增大的倏逝场,在正折射率介质板的两个界面附近出现了很大的电压幅度,该结果证实了该正折射率介质板透镜能够恢复电压倏逝波,从而提高像的分辨率。     

Study of scattering patterns and subwavelength scale imaging based on finite-sized metamaterials

A metamaterial slab, used as a superlens in a subwavelength imaging system, is frequently assumed homogeneous. It is the bulk properties of the metamaterial which are responsible for the resolution of the transferred information in the image domain, as a result of high transverse wave-vector coupling. However, how in a discretized metamaterial, individual meta-atoms (i.e., the meta-elements composing a negative index metamaterial slab) contribute to the imaging process is still actively studied. The main aim of this paper is to investigate the consequences of using only a few meta-atoms as a negative index slab-equivalent for subwavelength scale imaging. We make a specific choice for a meta-atom and investigate its resonant scattering patterns. We report on how knowledge of these 3D scattering patterns provides a means to understand the transfer of high spatial frequencies and assist with the design an improved negative index slab.     

Negative refraction makes a perfect lens

With a conventional lens sharpness of the image is always limited by the wavelength of light. An unconventional alternative to a lens, a slab of negative refractive index material, has the power to focus all Fourier components of a 2D image, even those that do not propagate in a radiative manner. Such "superlenses" can be realized in the microwave band with current technology. Our simulations show that a version of the lens operating at the frequency of visible light can be realized in the form of a thin slab of silver. This optical version resolves objects only a few nanometers across.     

Imaging Properties of a Rectangular-Lattice Metallic Photonic-Crystal Slab

We report the imaging properties of a two-dimensional rectangular-lattice photonic crystal （PC） slab consisting of rectangular metallic rods immersed in a dielectric background. By simulating the electromagnetic wave propagation through such a PC slab with the finite-difference time-domain method, we find that a point source placed in the vicinity of the PC slab can form a good-quality image through the slab. The frequency region where a good-quality image is formed can be controlled by choosing the direction along which the PC slab surface normal is placed.     

金属-电介质多层膜结构亚波长成像特性分析(英文)

分析了由Ag和Si3N4多层纳米薄膜组成的特异材料的模式特性,使用本征模展开法(EME)结合完全匹配层(PML)边界条件模拟了该结构的亚波长成像行为,在法布里-珀罗(Fabry-Perot)条件(结构的长度是半波长的整数倍)条件下,研究发现邻近系统的点源会在另一侧成实像,这种成像基于自准直而并不是负折射.研究结果证实了金属-电介质多层膜结构可以在光波段实现近场成像.