碱溶液修饰硅纳米线阵列绒面

提出用碱溶液修饰硅纳米线阵列制作太阳能绒面的方法。实验中首先采用金属催化化学腐蚀法在Si(100)基底上制备了定向排列的硅纳米线阵列,然后将纳米线阵列浸入碱溶液中进行修饰,修饰时间分别为10,30,50,60,90s。通过扫描电子显微镜(SEM)对硅纳米线阵列进行形貌分析,采用太阳能测试系统附带的积分球测量纳米线阵列绒面结构的反射光谱。通过测量和分析发现硅纳线阵列在碱溶液中修饰30s时表面分布均匀,在400～1000nm波段的综合反射率低于4%。结果表明碱溶液修饰纳米线阵列的方法能够有效分散束状硅纳米线阵列,明显降低绒面的反射率,并且初步分析了碱溶液修饰硅纳米线阵列的分散机理。     

太阳电池中新腐蚀液实现纳米黑硅表面的一步腐蚀制备

通过引入添加剂,调节腐蚀溶液的pH值,实现了一步法制备黑硅表面. 在取得低表面反射率的同时,减小了黑硅层的腐蚀深度,对于16 min腐蚀的黑硅层,其表面加权平均反射率可达5%(300～1200 nm),但腐蚀深仅约为200 nm. 减小腐蚀深度能够降低黑硅太阳电池的表面复合速率,从而提高太阳电池性能,尤其是开路电压及填充因子. 以新腐蚀液制备的黑硅为衬底,在常规太阳电池产线上制备大面积p-Si黑硅太阳电池,实现了15.63%的转换效率,具有高的开路电压(624.32 mV)和填充因子(77.88%),改进了大面积黑硅太阳电池的性能.     

基于多孔硅反射谱的农药浓度测量研究

根据多孔硅内浸入液体后其有效折射率发生变化,使其光致发光反射谱峰位发生变化的特性,提出了一种利用多孔硅Bragg反射镜的反射谱来测量克百威溶液浓度的新方法.阐述了多孔硅Bragg反射镜测量农药浓度的原理,利用脉冲腐蚀法制备了多孔硅Bragg反射镜,对多孔硅反射镜和它在不同浓度的克百威溶液中进行了实验,获取了它们的反射光...     

硅尖阵列的制备及其在真空微电子加速度计中的应用（英文）

针对微电子器件,提出了一种简单、低成本、便于批量加工的硅尖阵列制备方法。分析了各向异性和各向同性湿法腐蚀的特点,研究了不同腐蚀液中硅尖的形成机理和腐蚀速率,采用扫描电子显微镜(SEM)观测硅尖形貌。结果表明:在质量分数40%KOH腐蚀液中添加I2和KI,显著减小了削角速率,得到了呈"火箭尖"的硅尖阵列。各向同性腐蚀采用HNA腐蚀液,腐蚀的硅尖呈埃菲尔铁塔形。通过调整腐蚀液配比,氧化锐化后,硅尖尖端曲率半径小于15nm。该硅尖阵列已成功应用于真空微电子加速度计之中。     

声空化物理化学综合法制备发光多孔硅薄膜的微结构与发光特性

声空化所引发的特殊的物理、化学环境为制备高效发光的多孔硅薄膜提供了一条重要的途径.实验结果表明，声化学处理对于改善多孔硅的微结构，提高发光效率和发光稳定性都是一项非常有效的技术.超声波加强阳极电化学腐蚀制备发光多孔硅薄膜，比目前通用的常规方法制备的样品显示出更优良的性质.这种超声的化学效应源于声空化，即腐蚀液中气泡的形成、生长和急剧崩溃，在多孔硅的腐蚀过程中，孔中的氢气泡，由于超声波的作用增加了逸出比率和塌缩，有利于孔沿垂直方向的腐蚀. 关键词： 声空化方法 微结构 发光特性 多孔硅     

多孔硅光致发光峰半峰全宽的压缩

硅发光对于在单一硅片上实现光电集成是至关重要的.目前已有的使硅产生发光的方法有:掺杂深能级杂质、掺稀土离子、多孔硅、纳米硅以及Si/SiO₂超晶格.声空化所引发的特殊的物理、化学环境为制备光致发光多孔硅薄膜提供了一条重要的途径.实验表明,声化学处理对于改善多孔硅的微结构,提高发光效率和发光稳定性都是一项非常有效的技术.超声波加强阳极电化学腐蚀制备发光多孔硅薄膜,比目前通用的常规方法制备的样品显示出更优良的性质.这种超声波的化学效应源于声空化,即腐蚀液中气泡的形成、生长和急剧崩溃.在多孔硅的腐蚀过程中,由于超声波的作用增加了孔中氢气泡的逸出比率和塌缩,有利于孔沿垂直方向的腐蚀,使多孔硅光致发光峰的半峰全宽压缩到了3.8nm.     

硅—二氧化硅界面过渡区的XPS研究

本文报道了用X射线光电子能谱的角度效应研究硅-二氧化硅界面过渡区的结果。样品为(111)取向的硅单晶片上低温(700℃)氧化生成的超薄氧化膜,膜的厚度不大于50?。氧化膜与单晶衬底中Si_2p光电子谱峰之间的化学位移(δ)和强度比(I_0x/I_si)随光电子发射角(θ)的变化明显地偏离理想界面所预期的结果,表明在硅-二氧化硅的界面处存在化学比为SiO_x(0yO_4-y(0≤y≤4)型四面体。比较实验曲线与随机成键模型的计算结果,估计出过渡区的宽度不大于20?,小于Si_2p光电子在二氧化硅中的平均逃逸深度。对改变氧化时间结合Ar⁺刻蚀制得的氧化膜厚度不同的样品所作的测量,得到与角度实验相一致的结果。 关键词：     

分子动力学研究表面缺陷对硅纳米线杨氏模量的影响

硅纳米线因受量子尺寸效应与表面效应的影响而具有奇特的力、电及其耦合特性,成为了纳米电子器件的核心构件.然而在硅纳米线的制备过程中,表面产生缺陷不可避免.因此本文采用分子动力学方法着重研究了表面缺陷浓度对不同横截面形状(正方形、六角形和三角形)的[110]晶向和[111]晶向硅纳米线杨氏模量的影响.研究结果表明,当硅纳米线仅有单一表面缺陷时,不同晶向硅纳米线的杨氏模量均随表面缺陷浓度增加而迅速单调减小.当表面缺陷浓度为10%时,杨氏模量的减小幅度在10%-20%之间,减小幅度的差异与硅纳米线的晶向以及横截面形状密切相关.当存在多个表面缺陷时,杨氏模量随着缺陷浓度的增加表现出了不同程度的波动趋势.三角形截面硅纳米线的杨氏模量波动幅度最大,正方形截面的波动较小,即表面缺陷分布的不同对正方形截面硅纳米线的杨氏模量影响较小,这表明表面缺陷的影响与其分布及硅纳米线的横截面形状密切相关.通过与实验结果对比,本文的研究结果揭示了表面缺陷是导致硅纳米线杨氏模量实验值变小的重要因素,因此在表征硅纳米线的力学性能时,需要考虑表面缺陷的影响.     

热退火、激光束和电子束等作用对纳米硅制备及其局域态发光特性的影响

在纳米晶体硅制备的过程中, 晶化处理是影响和提高纳米硅发光效率的重要制备环节. 热退火、激光退火和电子束辐照是使纳米硅样品晶化的不同方式. 实验表明: 选取适当的晶化方式和参量对制备纳米硅晶体结构至关重要, 特别是在制备硅量子点和量子面的过程中控制好参量, 可以得到较高的发光效率. 有趣的是, 在实验中发现: 当晶化时间较短(如低于20 min)时, 可以获得较好的纳晶硅结构(如量子点结构), 对应于较好的纳晶硅光致发光(PL)和掺杂局域态发光; 当晶化时间较长(如超过30 min)时, 纳米晶体硅结构被破坏, 致使PL谱逐渐减弱与消失. 结合热退火、激光退火和电子束辐照对纳米硅晶化过程, 本文建立起晶化时间对纳米硅局域态发光影响机理的物理模型, 解释了晶化时间对纳米硅局域态发光的影响.     

氧化镁薄膜的腐蚀速率研究

研究了以氧化镁（MgO）为牺牲层材料制作热成像阵列器件过程中MgO膜层在磷酸溶液中的湿法腐蚀特性，包括横向腐蚀速率和纵向腐蚀速率，获得了MgO膜层的腐蚀速率随磷酸溶液浓度和温度变化的关系曲线，并得到了用于制作图形和制作悬空结构的较好工艺参量.     

白光和红绿蓝光LED可调光源研制

为了提高LED光源色温和亮度的调节精度和准确度,结合色温由低向高变化时光色所呈现的渐变特点,提出了一种低色温白光LED灯珠、高色温白光LED灯珠加红绿蓝光LED灯珠补偿式调光的方法.将色温分成三个部分进行调节,每个部分选用不同的LED灯珠组合来进行调光.实验结果表明:不同组合情况下的LED光源的初始输出色温相对于目标值的偏差范围在1％以内;亮度可以在保证色温不变的情况下独立进行调节,初始输出值与目标值的偏差范围在1％以内;经过微调之后可以达到目标值;达到了色温和亮度独立调节的要求;光源发光稳定,不会因为长时间工作而影响调节精度.     

Visualization and interferometry for cylindrical and spherical sample tomography and profilometry

A technique combining image processing and laser interferometry for visualizing and detecting the deformation of transparent cylindrical and spherical sample is proposed. This deformation includes geometric deformation such as volume transition in profilometry and physical deformation such as refractive index change in tomography. Phase contour lines are used for quantitative analysis and graphical representation of the deformation. This method allows us to visually detect the spatial variation of the deformation field and to evaluate the test quality such as misalignment of optical system. A theoretical analysis using phase contour map to characterize the deformation field is described in detail. A method using phase contour map to qualify the interferometric test is proposed. Analysis of test examples is carried out. Suggestions on using phase contour line method to ameliorate test system design are finally discussed.     

Quantum and Classical Disparity and Accord

Discrepancies and accords between quantum (QM) and classical mechanics (CM) related to expectation values and periods are generally found for both the harmonic oscillator (SHO) and a free particle in a box (FPB), which may apply generally. These indicate non-locality is expected throughout QM. The FPB energy states violate the Correspondence Principle. Previously unexpected accords are found and proven that 〈x ²〉 _CM =〈x ²〉 _QM and τ _CM =τ _QMb (beat period i.e. beats between the phases for adjoining energy states) for the SHO for all quantum numbers, n. However, for the FPB the beat periods differ at small n. It is shown that a particle’s velocity in an infinite square well varies, no matter how wide the box, nor how far the particle is from the walls. The quantum free particle variances share an indirect commonality with the Aharonov-Bohm and Aharonov-Casher effects in that there is a quantum action in the absence of a force. The concept of an “Expectation Value over a Partial Well Width” is introduced. This paper raises the question as to whether these inconsistencies are undetectable, or can be empirically ascertained. These inherent variances may need to be fixed, or nature is manifestly more non-classical than expected.     

黑克、布劳、及伯曼-温采尔代数的诱导及分导系数和量子经典李代数的耦合与重新耦合系数

本文总结了计算黑克、布劳、及伯曼 温采尔代数在各种工数链下诱导及分导系数的线性方程方法(LEM)。特别强调了关于A,B,C,D型李代数及其量子情形与其中心代数之间的舒尔 魏尔 布劳双关性关系。这一关系使我们能够利用相应中心代数的诱导及分导系数计算出经典李代数及其量子情形的耦合与重新耦合系数。讨论了从该方法得到B,C,D型李代数不可约表示克罗内克积分解的应用。基于LEM还得到了处理对应于置换群CG系列问题的黑克代数张量积的方法。     

Spectroscopy and Photophysics of Iso- and Alloxazines: Experimental and Theoretical Study

We present a systematic study of the effect of methyl substitution on iso- and alloxazines in acetonitrile solutions. Substitution patterns have profound effects on both spectral and photophysical properties, with fluorescence quantum yields varying by more than an order of magnitude. TD-DFT calculation were used for the first time to correlate electronic structure changes with the substitution patterns, with good agreement between calculated and theoretical band positions and oscillator strengths. Both n-pi* and pi-pi* states in these compounds are predicted, with the oscillator strengths indicating that only the pi-pi* states should be observable in the absorption spectra. Substitution patterns are shown to be responsible for energy order inversion between these states.     

国外超导材料技术研究政策和方向

超导材料技术是21世纪具有战略意义的高新技术,极具发展潜力和市场前景。世界各发达国家纷纷制定研发计划,给予高度重视和大力支持,加快超导材料技术的基础研究和产业化发展。主要从美国、日本、欧洲国家、韩国等国家的相关研发计划、政策以及主要科研机构的研发概况出发,阐明目前国外超导材料技术的研究政策和方向。     

Geometry and Elasticity of Strips and Flowers

We solve several problems that involve imposing metrics on surfaces. The problem of a strip with a linear metric gradient is formulated in terms of a Lagrangian similar to those used for spin systems. We are able to show that the low energy state of long strips is a twisted helical state like a telephone cord. We then extend the techniques used in this solution to two–dimensional sheets with more general metrics. We find evolution equations and show that when they are not singular, a surface is determined by knowledge of its metric, and the shape of the surface along one line. Finally, we provide numerical evidence by minimizing a suitable energy functional that once these evolution equations become singular, either the surface is not differentiable, or else the metric deviates from the target metric.     

Rapid and flexible laser marking and engraving of tilted and curved surfaces

We present a novel method for rapid and flexible laser marking and engraving of tilted, curved and freeform work-piece surfaces. The method is based on integrating a three-dimensional (3D) laser measurement system into a 3D laser marking system. We use the same laser source and optics for measurement and processing with a minimum of additional hardware components. A low power CW laser regime is used to measure the 3D shape of a work-piece surface while a high-peak power-pulsed laser regime is used for processing. The acquired 3D surface data are used to determine the 3D trajectory of the processing beam focus. Neither the 3D shape of the work-piece nor its orientation needs to be known in advance as long as the processed surface lies within the working range of the 3D laser processing system. This eliminates the need for exact work-piece positioning before processing and substantially improves processing flexibility (allowing, e.g. variations in work-piece shape or/and orientation from mark to mark). This paper discusses key issues concerning an implementation of the method and presents typical examples of markings and engravings, which demonstrate the advantages of the method with respect to the existing industrial 2D and 3D laser marking and engraving methods. The method can also be applied to flexible laser structuring and microprocessing of curved surfaces.     

激光与计量基准

激光以它的良好的物理性质（单色性好、方向性强、能量大等）而被广泛应用到科学与技术许多领域。激光应用于计量科学和利用激光变更计量基本单位的定义和复现其定。都为计量科学的发展起到革命性的作用，文章介绍了激光与米定义及其复现，激光与秒定义，激光与国际温标，激光与质量自然基准和一系列激光在计量测试中的应用。