Single order soft X-ray diffraction with quasi-random radius pinhole array spectroscopic photon sieves

A novel single order diffraction grating in the soft X-ray region, called quasi-random radius pinhole array spectro- scopic photon sieves （QRSPS）, is proposed in this paper. This new grating is composed of pinholes on a substrate, whose radii are quasi-random, while their centers are regular. Analysis proves that its transmittance function across the grating bar is similar to that of sinusoidal transmission gratings. Simulation results show that the QRSPS can suppress higher-order diffraction effectively. And the QRSPS would still retain its characteristic of single order diffraction when we take the effect of X-ray penetration into account. These properties indicate that the QRSPS can be used in the soft X-ray spectra measurement.     

激光衍射微粒测量中的独立模式反演算法

在用激光衍射法测量微粒直径及其分布时得到的矩阵方程组是一组病态方程 ,无法直接求解。目前大多数求解方法是采用已知模式的拟合算法。但由于在实际中的微粒直径的分布是多种多样的 ,因此难以用一种或几种分布函数去近似描述。试图从微粒衍射的特征着手提出一种未知分布的独立模式的求解方法     

基于光栅分光法的相干衍射成像

提出一种可以通过单次曝光实现 PIE(ptychographic imaging engine)成像的方法, 该方法用正交光栅将入射细光束衍射为传播方向不同的子光束簇以对样品进行照明, 并用CCD同时记录各个子光束所形成的衍射光斑阵列. 该方法很好地克服了现有PIE方法的成像质量易受机械扫描误差影响和数据采集时间过长两个缺点, 具有很好的实用价值. 关键词： 相干衍射成像 相位恢复 显微成像 迭代算法     

高炉渣非晶态含量的定量分析方法研究

通过X-ray衍射方法对高炉渣中非晶态与晶态的含量进行了定量分析研究。定量分析过程包括标准样品制备、配样与衍射以及数据处理分析。数据处理包括非晶态衍射峰及晶态峰在一定衍射角度内的积分、线性拟合与定量系数确定。提出了X-ray衍射方法所用的高炉渣标准样品的制备方法,包括100％非晶态标样和100％晶态标样。提出了由100％非晶态和100％晶态为标准样品时,高炉渣中非晶态含量的测定方法,适用于非晶态含量较高(>80%)的高炉渣的定量分析。结合数学处理和X-ray衍射结果,可得到原始高炉渣中非晶态含量和晶态含量,以及相应的比例系数,适用于非晶态含量高的高炉渣(>90%)。     

基于CCD尺寸测量中图像边缘退化及恢复技术研究

针对直边衍射效应造成的图像边缘退化问题,建立边缘退化模型。从菲涅尔直边衍射理论出发,基于信号与系统理论的图像边缘退化数学描述方法,分析了造成图像边缘退化的原因。通过分析不同光源波长和成像物距下直边衍射强度分布曲线的特点,构造简单函数实现衍射光强分布的近似,进而得到退化系统传递函数;利用退化系统传递函数构造滤波器对获取图像的边缘进行恢复,从而提高尺寸测量精度。实验结果表明:经边缘恢复方法校正后的测量结果误差约为0.02 mm,相对未校正数据的测量结果误差减小0.04 mm,提高了尺寸测量精度。     

Acoustic parameter measurements by acousto-optic diffraction techniques using a light-beam of one acoustic wavelength width

A method is presented for measuring the Raman-Nath parameter by an acoustically diffracted light-beam of one acoustic wavelength width. The diffraction spectrum obtained is not discrete but broadened continuously because of the width of the light-beam itself. The Raman-Nath parameter can be determined from the intensity measurement at the centre of the diffraction pattern. The acoustic wavelength can also be determined by measuring the light-beam width of one acoustic wavelength at which a beating photocurrent, produced by the positive and negative first-order diffraction components, dies out at the centre of the pattern.     

Pixel size and pitch measurements of liquid crystal spatial light modulator by optical diffraction

We present a simple technique for the determination of pixel size and pitch of liquid crystal (LC) based spatial light modulator (SLM). The proposed method is based on optical diffraction from pixelated LC panel that has been modeled as a two-dimensional array of rectangular apertures. A novel yet simple, two-plane measurement technique is implemented to circumvent the difficulty in absolute distance measurement. Experimental results are presented for electrically addressed twisted nematic LC-SLM removed from the display projector.     

Energy resolution of the CdTe‐XPAD detector: calibration and potential for Laue diffraction measurements on protein crystals

The XPAD3S‐CdTe, a CdTe photon‐counting pixel array detector, has been used to measure the energy and the intensity of the white‐beam diffraction from a lysozyme crystal. A method was developed to calibrate the detector in terms of energy, allowing incident photon energy measurement to high resolution (approximately 140 eV), opening up new possibilities in energy‐resolved X‐ray diffraction. In order to demonstrate this, Laue diffraction experiments were performed on the bending‐magnet beamline METROLOGIE at Synchrotron SOLEIL. The X‐ray energy spectra of diffracted spots were deduced from the indexed Laue patterns collected with an imaging‐plate detector and then measured with both the XPAD3S‐CdTe and the XPAD3S‐Si, a silicon photon‐counting pixel array detector. The predicted and measured energy of selected diffraction spots are in good agreement, demonstrating the reliability of the calibration method. These results open up the way to direct unit‐cell parameter determination and the measurement of high‐quality Laue data even at low resolution. Based on the success of these measurements, potential applications in X‐ray diffraction opened up by this type of technology are discussed.     

夫朗和费近似与夫朗和费衍射测量的准确度

较详细地讨论了夫朗和费衍射的本质、夫朗和费近似的准确含义以及倾斜因子对衍射花样的影响。从不同的角度导出了单缝夫朗和费衍射的光强公式和测量公式 ,指出了这些公式之间的区别与联系以及傅里叶光学中作近似分析时存在的问题。认为文献 [1]、[3 ]得出错误结论的深层次原因是错误地理解了夫朗和费近似的概念。当用夫朗和费衍射测量微小物体的尺寸时 ,只要正确地应用测量公式 ,便能得到准确的测量结果。测量的准确度原则上与衍射角的大小及被测物的尺寸无关 ,最小可测尺寸仅由标量理论的成立范围决定     

太阳辐射计的衍射效应修正

太阳辐射测量是研究太阳活动与地球气候演变的重要方式之一,对人类社会的可持续发展具有重要意义。衍射效应作为测量过程中系统误差的主要来源之一,有必要进行精确的修正,从而提高测量数据的精度。首先,对衍射效应理论进行研究,从Kirchhoff衍射理论出发,在高斯光学近似下,逐步确定点与点,点与面,面与面之间的能量传输关系,推导出了衍射效应的一般公式;接着,根据衍射效应的渐近性质,得到了一种简化的计算方法;然后,用简化的方法计算太阳辐照绝对辐射计(SIAR)的衍射效应以及衍射修正因子,最后,根据衍射修正结果,计算相对于世界辐射基准(WRR)的定标系数。结果显示:SIAR的衍射效应以及衍射修正因子分别约为1.002 742和0.997 265。经过衍射修正后,SIAR对WRR的定标系数更接近于1,表明衍射修正降低了系统误差,提高了辐射测量的准确度。     

A new high P-T cell for neutron diffraction up to 7 GPa and 2000 K with measurement of temperature by neutron radiography

Abstract

This paper reports developments to enable neutron diffraction at simultaneous high temperatures and pressures using the Paris-Edinburgh cell. These include a new design of a cell assembly with internal heating. One of the novel features of our system is the use of neutron radiographic methods for measurement of temperature. Fully refinable neutron diffraction patterns obtained by time of flight technique with our apparatus are found to be of comparable quality to previous high-pressure studies at ambient temperatures. In this paper we describe the procedures for the generation and measurement of pressure and temperature and illustrate the quality of the data which can be obtained. The present system may be used on a routine basis for experiments up to 7 GPa and temperature approaching 2000 K. Current attempts are discussed for extending these measurements to a wider domain of pressures and temperatures.     

Geometrical theory of diffraction

Geometrical theory of diffraction (GTD) is an alternative model of diffraction propounded first by Thomas Young in 1802. GTD has a long history of nearly 150 years over which many eminent people enriched this model which has now become an accepted tool in the calculation of diffraction patterns. In the conventional Helmholtz-Kirchhoff theory the diffracted field is obtained by computing the net effect of the waves emitted by all points within the area of the aperture. But GTD reduces this problem to one of computing the net effect of waves from a few points on the boundary of the aperture or obstacle, thus simplifying considerably the labour involved in computations. Also the theory can easily be modified to include polarization effects. This has been done specifically by Keller (1962) who exploited the Sommerfeld solution of diffraction of electromagnetic waves at a half plane, making the theory more versatile than the Kirchhoff scalar wave theory. Interestingly the geometry of difffracted rays is predictable from a generalized Fermat principle. According to this the total path chosen by light from the source to the point of observation via the diffracting boundary is an extremum. Historically it should be stated that many of the salient features of GTD were established by a school led by Raman which was active from 1919–1945. Later when Keller (1962) revived GTD independently, he and others who followed him rediscovered many of the results of the Raman school. We have stressed wherever necessary the contributions of the Indian School. We have also discussed certain geometries where GTD can be effectively used. We get some new and interesting results, which can be easily understood on GTD, but are difficult to interpret on the conventional theory of diffraction.     

A simple white beam neutron diffraction technique

White beam neutron diffraction by time-of-flight (TOF) technique has been studied over a number of years as it is believed to be the most convenient method to investigate solids in a fixed geometry. This technique needs a pulsed neutron source and a suitable multichannel, analysing system. The entire system is in general, mechanically quite intricate and expensive. We have investigated an alternative technique to achieve the end result of a constant geometry around the diffracting sample. This involves the use of a single crystal as an analyser to study diffraction pattern from the sample bathed in a white beam and diffracting at any fixed scattering angle. In this paper we report the results of our investigations and have compared this technique with other diffraction techniques. Taking Si, KCl and KNO₃ as typical specimens we have illus. trated the results of our technique and we find that the results are comparable to those obtained by conventional neutron diffraction and TOF diffraction. The technique is simple in mechanical design and data acquisition. It can be easily adapted for high pressure diffraction which is being attempted.     

Analytical solution of crystal diffraction intensity

Plasma density and temperature can be diagnosed by x-ray line emission measurement with crystal, and bent crystals such as von Hamos and Hall structures are proposed to improve the diffraction brightness. In this study, a straightforward solution for the focusing schemes of flat and bent crystals is provided. Simulations with XOP code are performed to validate the analytical model, and good agreements are achieved. The von Hamos or multi-cone crystal can lead to several hundred times intensity enhancements for a 200μm plasma source. This model benefits the applications of the focusing bent crystals.     

透射光栅的实验标定和衍射效率的理论模拟

透射光栅广泛应用于软X射线能谱测量.为了获得用于惯性约束聚变研究的透射光栅的各级衍射效率及其他参数,在北京同步辐射源上200—1600 eV能量范围内对其进行了标定,获得了透射光栅衍射效率的实验结果.扩展了透射光栅衍射效率的计算方法,提出了7边准梯形截面衍射效率计算模型.分析拟合了实验数据,理论结果与实验结果很好符合.得到了7边准梯形的透射光栅栅线截面结构. 关键词： 透射光栅 衍射效率 实验标定 光栅模型     

凹面光栅衍射效率的研究进展

凹面光栅因同时具有聚焦和色散功能而广泛应用于各类紫外、可见和红外波段的光谱分析仪器中,尤其是平场凹面光栅可以结合线阵或面阵探测器来实现即时分析。凹面光栅衍射效率的高低直接影响光谱仪器的信噪比和信号采集,其相关研究也逐渐为人们所关注。介绍了凹面光栅衍射效率的研究进展,比较了由机械刻划法和全息法制作的凹面光栅在掠入射下衍射效率的差别,分析了现有计算衍射效率方法的优缺点,并且对凹面光栅衍射效率的研究趋势做了简要预测,提出了需要同时在凹面光栅的主截面和非主截面内考虑光束对其衍射效率的影响。     

衍射光学元件衍射效率的测量

根据衍射光学元件衍射效率的测量原理,建立衍射光学元件衍射效率测量的双光路装置,简要介绍了双光路测量的优点。针对衍射光学元件衍射效率的测量装置,讨论了影响衍射效率测量精度的因素,合理地选择测量装置中的针孔光阑,即可以让主衍射级次的光全部通过被探测器接收,又可以滤掉次级衍射光,保证测量结果的准确度。针对所设计研制的一个折衍射混合成像光学系统,测量了可见光波段3个激光波长的衍射效率,并对测量结果进行了模拟和分析。在473～632.8nm波段范围内任意一个波长处,衍射效率的测量结果同理论值的偏差均小于5.0%。实验证明,双光路测量装置可以用于测量衍射光学元件的衍射效率。     

多晶材料X射线衍射定量分析的多项式拟合法

提出了多晶材料X射线衍 (XRD)射定量分析的多项式拟合法 ,该方法将数学函数模型与计算机技术相结合 ,在建立衍射峰数学函数模型的基础上 ,利用计算机软件对谱线进行多项式全谱拟合 ,分析实验获得的XRD图谱 ,并求得各衍射峰的积分强度 ,从而精确求出混合试样中各相物质的重量分数。文章主要工作包括 3部分 :1 根据混合物的粉末衍射谱是各组成物相的粉末谱的权重叠加 ,各相的权重因子是与该相在混合物中的体积或重量分数有关的事实 ,建立全谱多项式拟合理论 ,找出各相的权重因子 ,进而求出其重量分数 ;2 数据采集与分析 ,给出了数据的处理方法及步骤 ;3 对定量分析的结果进行了比较讨论。该方法简化了数据处理的过程 ,提高了分析结果的精度 ,使粉末衍射数据处理工作变得相对容易     

透射光栅衍射效率的通用模型

在远场条件下采用夫朗和费衍射近似,经过波动光学的计算推导,得到透射光栅各级绝对衍射效率及相对衍射效率通用计算模型. 此模型可以用来计算任意栅线截面情况下透射光栅的衍射效率. 利用此模型,分别建立了矩形、梯形和5边准梯形截面的衍射效率计算模型,并对模型正确性进行了验证. 关键词： 透射光栅 衍射效率 数值模拟     

相干衍射辐射在超短电子束团长度测量中的应用

利用相干衍射辐射(CDR)光学自相关技术在线无阻拦频域测量超短电子束团的长度是当前国际束测领域的研究热点. 文中分析和数值计算了利用上海应用物理研究所(SINAP)飞秒电子束装置提供的超短电子束团产生的宽带连续强CDR，介绍了超短电子束团长度测量的实验原理和装置示意，并研究了分束器对束团长度测量的影响. 结果表明，该束团可直接用于产生覆盖远红外至毫米波段的宽带连续强CDR；辐射能量主要集中在轴线附近，宏脉冲辐射能量可达毫焦耳量级；利用光学自相关技术研制的远红外Michelson干涉仪和Golay探测仪组成束团长度测量系统，通过实验测量CDR干涉图FWHM可近似求得超短束团长度；干涉图籍助傅立叶变换光谱法，可推算求得束团电子密度分布的信息.