晶片、微电子与技术升级

人类社会正处在世纪之交的转变年代．２０世纪是科学技术突飞猛进的１００年，原子能、半导体、激光和电子计算机成为２０世纪的四大发明创造．可以看出，后三大发明是紧密相关的．激光器可以有气体激光器、半导体激光器和其他固体激光器等．其中半导体激光器是用半导体材料制作的．而组装电子计算机的芯片也是半导体集成电路．所以，可以说激光和电子计算机都是以半导体材料作为基础的．计算机和激光技术都是信息技术的重要支撑技术．因此，半导体材料技术在信息技术，以至于整个高技术领域有着举足轻重的作用．可以说半导体技术是人类进入…     

半导体微碟激光器设计原理与工艺制作

用经典量子电动力学理论初步研究了半导体碟型微腔激光器的设计原理，采用光刻、反应离子刻蚀和选择化学腐蚀等现代微加工技术制备出抽运阈值功率很低用品质因数很高的低温光抽运InGaAs/InGaAsP多量子阱微碟激光器。这种激光器制作工艺简单，对有效光子状态密度调制较大，是比较理想的半导体微腔激光器。     

多单管堆叠半导体激光器热分析及光纤耦合模拟仿真设计

多单管合束技术是获得高输出功率密度半导体激光器的重要方法,但其存在封装方式单一、体积大等问题,难以满足更高功率密度和较好光束质量的需求.本文设计了一种多单管半导体激光器堆叠排布的封装结构,通过将多个单管半导体激光器垂直封装在辅助热沉之间,使得器件更加小型化,在充分利用单管半导体激光器优势的同时,既增加了单管半导体激光器...     

大功率半导体激光器发展及相关技术概述

激光被称为"最快的刀"、"最准的尺"、"最亮的光",与原子能、计算机、半导体并称为20世纪新四大发明。大功率半导体激光器在工业加工、医疗美容、光纤通信、无人驾驶、智能机器人等方面有着广泛的应用。如何实现大功率半导体激光光源,一直以来都是国际的研究前沿和学科热点。为此,简述了大功率半导体激光器的发展历史,综述了大功率半导体激光器的共用技术,包括大功率芯片技术和大功率合束技术,并对大功率半导体激光的发展方向进行了展望。     

半导体激光器近场图的实验观测

半导体激光器近场图的实验观测杨枫（东北师范大学物理系１３００２４）在许多激光应用中使用的都是半导体激光器，并且往往要求激光器单模输出，所以观测激光器的工作模式非常重要．激光器的纵模可以通过光谱分析观测．半导体激光器谐振腔反射镜很小，所以激光束的方向性...     

增益开关半导体激光器在外光注入下脉冲抖动的实验研究

采用增益开关半导体激光器作为注入种子光源来降低另一个增益开关DFB或Fabry-Perot（FP ）半导体激光器的脉冲抖动.相位噪声测量技术表明：增益开关FP激光器在外部脉冲光注入 下，激光脉冲抖动（均方值）由1.2ps降低至830fs；增益开关DFB半导体激光器在外脉冲注 入下，脉冲抖动由12ps降低至1.8ps. 关键词： 半导体激光器 光脉冲产生 时间抖动 光子注入     

ZnSe蓝色半导体发光和激光器件的研究进展

阐述了研制蓝色半导体发光和激光器件在光电子技术发展中的重要性。通过对ＺｎＳｅ半导体发光和激光器件发展过程的评论，说明了获得ｐ型ＺｎＳｅ所遇到的困难和解决的途径。介绍了近期在获得高导电ｐ型ＺｎＳｅ层方面的突破性进展，从而实现了ＺｎＳｅ－ｐ－ｎ结蓝色半导体发光和激光器件。     

具有横向效应的半导体激光器的同步传输技术

通过修正描述半导体激光器的动力学模型,给出了具有横向效应的半导体激光器的动力学方程,并分析了横向效应对半导体激光器输出特性的影响。在此基础上,进一步研究了具有横向效应的半导体激光器输出信号的同步传输技术。结果表明,考虑横向效应后,半导体激光器的输出呈现新的时空混沌态,且对初始值非常敏感。同时,无论是利用半导体激光器进行单通道信号的同步传输还是多通道信号的同步传输,其传输性能均十分稳定。该项同步技术十分简单,非常易于实际应用。     

半导体激光器的电流调制特性研究

本介绍了半导体激光器注入电流调制特性，研究了半导体激光器的输出光频与注入电流的关系，并给出了其测量结果。     

半导体量子点激光器研究进展

首先简要地回顾了半导体激光器发展的历史和量子点激光器所特有的优异性能,进而介绍半导体量子点及其三维量子点阵列的制备技术,然后分别讨论了量子点激光器（能带）结构设计思想,实现基态激射时所必须具备的条件和近年来国内外半导体量子点器的研究进展。最后分析讨论了量子点激光器研制中存在的问题和发展趋势。     

一种基于光学倍乘原理的绝对距离干涉测量系统

介绍了一个基于光学倍乘原理的绝对距离干涉测量系统。系统包括两个干涉仪:采用半导体激光器作为光源的定位干涉仪和测量位移的外差干涉仪。介绍了光源的选择,系统的设计以及信号的采集和处理方案。采用这套绝对测量系统,可以实现长度为2m以内的绝对距离测量,定位精度可以达到±0.5μm。     

VISAR准零程差调试方法研究

介绍了任意反射面速度干涉仪(VISAR)中马赫-曾德干涉仪必须满足的准零程差条件.根据白光光程差调试精度高但不易相干的特点,提出了先利用激光粗调,再利用白光调试来实现零程差精密调节的方案.详细分析了激光粗调马赫-曾德干涉仪的调试原理、调试精度以及光程差不确定性.针对光程差不确定性,提出了改进的激光粗调方案,将光程差调节精度由毫米量级提高到微米量级,大大减小了白光调试的盲区,使白光精调变得简易可行.干涉仪最终光程差调试精度为1.6 μm.     

Polychromatic light interferometer for high-accuracy positioning

Superposition of different-wavelength, multimode- and single-mode laser diode beams is investigated to locate the fringe of zero interference order in a Twyman-Green interferometer. The possibility of central fringe detection using three multimode laser diodes or one single-mode together with a pair of multimode laser diodes is shown. If a single-mode laser diode is applied, a simultaneous fringe-counting technique for displacement measurement is available. The influence of the angle between wavefronts entering the interferometer is analyzed. A repeatability of about 5 nm is shown for surface position determination when using three-beam source.     

光纤干涉仪臂差的测量

用白光干涉和Michelson干涉仪技术测量光纤Michelson干涉仪和Mach-Zehnder干涉仪的臂差.这种方法能在线测量任意长度的光纤干涉仪臂差,包括零臂差,测量的精度由光源的相干长度确定,为微米数量级.     

Diode laser spectrally fixed at an atomic absorption line

A simple all-optical technique for fixing the spectrum of the output from semiconductor laser at a chosen absorption atomic line is realized and studied. The technique, which is not of a laser locking type, uses a conventional diode laser without any influence on its operation. For implementation of the technique, the diode laser output is fed to a modified Michelson interferometer, and controllable disturbing of phase and amplitude correlation between the interfering beams in the two arms of the interferometer is achieved by frequency scanning through a contour of a reference absorption line of a substance introduced in one of the arms of the interferometer. It is shown both by experiment and theory that, under properly chosen conditions, the spectrum of the obtained light is fixed at the atomic line and has a linewidth comparable to the linewidth of the used absorption line.     

Accurate monitoring of an interferometric fiber-optic sensor with a multimode semiconductor laser

A technique for monitoring interferometric sensors by correlation of the optical signal from the sensor with the signal from a phase-modulated reference interferometer is described. The technique is applied to temperature measurement with a fiber Fabry-Perot sensing head. We extend the 7 degrees C unambiguous measurement range obtained with a 1.3-mum laser diode as the light source to 43 degrees C by adding a second laser diode emitting at 1.55mum . Experimentally, a rms phase-measurement error of +/-0.28rad , corresponding to a temperature error of +/-0.32 degrees C , was achieved with a low-quality multimode Fabry-Perot laser. The phase error was improved to +/-0.14rad , corresponding to a temperature error of +/-0.16 degrees C , by use of a distributed-feedback laser diode.     

共光路移相单频激光干涉测长系统

单频激光干涉系统采用偏振光移相方法,用来解决常规单频激光干涉仪中的光强"零漂"问题。共光路设计提高了干涉系统的测量稳定性和重复性。采用光程差放大技术提高了干涉系统的分辨力。在构造了一套实验布局的基础上,分析了影响系统测长精度的主要因素,并对干涉系统的测量误差分量做了定量的分析,完成了系统的精度测试。     

Transient thermal lensing measurement in a laser diode pumped NdxY1−xAl3(BO3)4 laser using a holographic shearing interferometer

A new technique for measuring a thermal lens, using a holographic shearing interferometer is presented. This technique was used to measure transient thermal lensing in a laser diode pumped NYAB laser. The measured thermal lensing power was proportional to the pumping laser diode intensity, with a gradient of 1.1 × 10⁻¹ m⁻¹ mm²/W. The transient response time of the thermal lens was 1.5 s, this value being consistent with the temporal decline of the second harmonic power.     

In-plane ESPI using an achromatic interferometer with low-coherence laser source

The use of an achromatic interferometer is explored as a means of doing in-plane ESPI measurements using a laser diode as the light source. This interferometer type, which uses a diffraction grating in place of the conventional beamsplitter, has two features that make it suitable for making ESPI measurements over extended areas, even when using a low-coherence laser diode source. First, the parallelogram optical geometry of the interferometer causes all rays passing through to have the same optical path lengths. Second, the interferometer is achromatic, whereby the piezo-actuated mirror that steps the illumination light does so by the same phase angle, independent of wavelength. This latter feature accommodates the spectral impurity of a laser diode source. A periodic variation of fringe visibility is observed in experiments, where narrow ranges of high visibility occur at regular spatial intervals. This behavior derives from the clustered discrete spectral character of laser diode light output. A method to “tune” the interferometer by slightly rotating the diffraction grating is described so as to achieve consistent high fringe visibility throughout the measured images.     

Sinusoidal Phase-Modulating Superluminescent Diode Interferometer with Fabry-Perot Etalone for Step-Profile Measurement

In this paper we use a superluminescent diode (SLD) as the light source of an interferometer and extract a narrow spectrum from a wide spectrum of the SLD with a Fabry-Perot Etalone (FPE). By varying sinusoidally the distance between the two mirrors of FPE, the central wavelength of the narrow spectrum is scanned sinusoidally. The distance between the mirrors is exactly set by a feedback control system, and sinusoidal phase-modulated SLD light that has a large scanning width of about 10 nm can be obtained with high stability and spatial uniformity. The phase of the interference signal has two different components. One is amplitude Z_b of sinusoidal phase modulation, which is proportional to the optical path difference (OPD) and the scanning width. The other is conventional phase α, which provides a fractional value of the OPD in the range of the wavelength. By combining the two values of the OPD obtained from Z_b and α, an exact OPD larger than the wavelength can be measure with ment accuracy in α. Characteristics of the interferometer are made clearly through step-profile measurements.