Photoluminescence dynamics due to exciton and free carrier transport in GaAs/AlAs superlattices

Photogenerated carrier transfer is investigated in a set of three GaAs/AlAs short-period superlattices (SPSs) with different barrier thicknesses by steady-state and time-resolved photoluminescence (PL) spectroscopy at 15–20 K as a function of excitation power. The tunneling transport of carriers is evaluated by detecting excitonic PL signals from an embedded GaAs single quantum well (SQW) in the middle of the SPS layer. We find that, as the barrier thickness is decreased, the PL intensity ratio of SQW/SPS increases systematically due to enhanced tunneling efficiencies of both electrons and holes. However, the PL intensity ratio significantly increases with decreases in the excitation power by more than two orders of the magnitude. We attribute the enhanced PL intensity of SQW relative to the SPS to the faster transport of electrons that can recombine with residual holes to form excitons in SQW. The PL dynamics of SQW and SPS thus shows unique density-dependent PL intensity and time behaviors due to variations in relative amounts of excitons and free carriers to be transported into the SQW layer.     

In_(0.2)Ga_(0.8)As/GaAs单量子阱PL谱温度特性及其机制

测量了不同阱宽In0.2Ga0.8As/GaAs单量子阱的PL谱的峰值波长和荧光谱线半峰全宽随温度的变化。利用Varshni公式对实验峰值波长进行拟合,得到了新的参数。结果表明,无位错应变量子阱带隙仍具有其体材料的特性:荧光谱线半峰全宽随温度升高迅速展宽,这主要归因于声子关联作用增强和激子热离化为自由载流子所致;阱宽越窄荧光峰值能量越高,将其与量子尺寸效应的理论计算结果进行了比较。文中还考察了谱线半峰全宽和阱宽的关系,利用合金无序对这一现象进行了解释。     

Lineshape analysis of photoreflectance spectra from InGaAs/GaAs quantum wells

The fundamental optical transitions in In_0.15Ga_0.85As/GaAs single symmetric quantum wells (QWs) are studied through photoreflectance (PR) measurements and their dependence on the well distance from the surface. A phase rotation of the lineshape of the PR signal is observed as was predicted in our previous works. PR spectra of several samples, measured at 77 K, are compared with results of PR lineshape calculations, and a fairly good agreement is found. The quantum-confined Stark effect is shown to be the dominant modulation mechanism in the QW. Pronounced interference effects make PR spectra from QWs sensitive to the cap layer thickness.     

Role of localized excitons in the stimulated emission in ultra-thin CdSe/ZnSe/ZnSSe single quantum-well structures

Photo-pumped lasing properties have been investigated in a CdSe/ZnSe/ZnSSE single quantum wells (SQWs) with the well-layer thickness (L_W) of 1, 2 and 3 monolayer (ML). At 20 K, the laser threshold for the SQW withL_W = 1 ML was the lowest in spite of the smallest active layer thickness. The carrier (exciton) sheet density at the threshold (n)_thwas estimated to be as low as 7 × 10¹⁰cm⁻², which is well below Mott's screening density. Time-resolved photoluminescence has revealed that the localized biexciton band, whose peak energy agrees with the lasing peak, appeared on the low-energy side of the main PL peak at this level of carrier concentrations. Theoretical calculation has also shown that the localized biexciton recombination has to be taken into account for the lasing process. On the contrary, then_thvalues of the SQWs with 2 and 3 ML are 1 order of magnitude larger than that of the SQW with 1 ML. This may be due to the smaller oscillator strength of both localized excitons and localized biexcitons because of the larger inhomogeneous broadening, resulting in an increased carrier density for achieving optical gain sufficient to overcome the reflection losses.     

Up-conversion luminescence via a below-gap state in GaAs/AlGaAs quantum wells

We observe a band-to-band photoluminescence (PL) of the well layers in GaAs/AlGaAs quantum well structures (hν_P = 1.56 eV) under below-gap excitation (BGE) with a Nd:YAG laser (hν_B = 1.17 eV) at 77 K. The origin of the up-conversion luminescence was inside the epitaxially grown well layers and is different from those reported in GaAs substrates. A detailed study of a two-wavelength excited PL was carried out by changing the density of both the BGE and the above-gap excitation (AGE) by a He–Ne laser (hν_A = 1.96 eV) individually. The up-conversion process corresponds to the increase in the PL intensity due to the BGE in two-wavelength excited PL, which reveals the mechanism of a cascade excitation via a below-gap state in quantum wells for the first time. A rate- equation analysis explained the measured BGE density dependence of the up-conversion luminescence.     

Characterization of aluminium concentration in shallow quantum wells AlxGa1−xAs/GaAs types

We report a reflectance study on series of shallow quantum wells GaAs/Al_xGa_1−xAs types with different aluminium concentration. The observed barrier exciton reflectance line shape depends strongly on the shift in aluminium concentration in the two barriers, with the appropriate choice of the cap layer thickness. This observation was based on the reflectivity line shape analysis of anti-Bragg structures.     

The optical properties of ZnO/ZnMgO single quantum well grown by P-MBE

In this paper, ZnO/Zn_0.9Mg_0.1O single quantum well (SQW) structures were fabricated on c-plane sapphire (Al₂O₃) substrate by plasma-assisted molecular beam epitaxy (P-MBE). The photoluminescence (PL) peak of the SQW shifted from 3.31 to 3.37 eV as the well layer thickness was decreased from 6 to 2 nm. The spectral linewidth increases with temperature due to the scattering of excitons with acoustic and optical phonons. The transition energy of the localized exciton in the ZnO/Mg_0.1Zn_0.9O SQW with well width of 3 nm was found to be about 3.407 eV at 80 K, consistent with theoretical calculation. The first subband energies in the conduction and valence band were calculated to be 49 and 11 meV, respectively.     

Photoluminescence studies of confined states in AlGaAs/GaAs asymmetric quantum well

In the recombination spectra of AlGaAs/GaAs heterostructures, a peculiar and asymmetric photoluminescence (PL) band F has previously been reported [Aloulou et al., Mater. Sci. Eng. B 96 (2002) 14] to be due to recombinations of confined electrons from the two-dimensional electron gas (2DEG) formed at AlGaAs/GaAs interface in asymmetric quantum well (AQW). Detailed experiments are reported here on GaAs/Al_0.31Ga_0.69As/GaAs:δSi/Al_0.31Ga_0.69As/GaAs samples with different spacer layer thicknesses. We show that the band F is the superposition of two PL bands F′ and F″ associated, respectively, to AQW and a symmetric quantum well (SQW). In the low excitation regime, the F′ band present a blue shift (4.4 meV) followed by important red shift (16.5 meV) when increasing optical excitation intensity. The blue shift in energy is interpreted in terms of optical control of the 2DEG density in the AQW while the red shift is due to the narrowing of the band gaps caused by the local heating of the sample and band bending modification for relatively high-optical excitation intensity. Calculation performed using self-consistent resolution of the coupled Schrödinger–Poisson equations are included to support the interpretation of the experimental data.     

Picosecond dynamics and stimulated emissions of excitons in Zn1-xCdxSe/ZnSe quantum wells

The dynamics and stimulated emission processes of the exciton luminescence are studied in quantum wells (QWs) of the Zn_1-xCd_xSe/ZnSe system. A multiquantum well (MQW) structure shows an exciton lifetime of 150-280 ps and a stimulated emission effect due to exciton-exciton scattering as well as due to electron-hole plasma recombination. A combined-QW structure in which a single quantum well (SQW) is located adjacent to MQWs shows a tunneling process of the excitons from the MQWs through the barriers to the SQW. The stimulated emission takes place in the SQW due to phase space filling effects of the excitons. These observed stimulated emission processes are highly related to the blue-laser-diode operation at both low and room temperatures.     

Exciton relaxation in Ga1 − xInxAs/GaAs self-organized quantum dots

The exciton dynamics in Ga_1 − xIn_xAs/GaAs self-organized quantum dots grown on GaAs (111)B substrates are studied by the time-resolved photoluminescence (PL). We have found the intra-dot exciton relaxation by the reduction of the linewidth and peak energy and also by the energy-dependent PL rise time in the transient PL spectra. Compared with the energy relaxation in the reference quantum wells, we have confirmed that the exciton relaxation in three-dimensionally confined quantum dots is slower than in the quantum wells.     

The exciton-longitudinal-optical-phonon coupling in InGaN/GaN single quantum wells with various cap layer thicknesses

This paper studies the exciton-longitudinal-optical-phonon coupling in InGaN/GaN single quantum wells with various cap layer thicknesses by low temperature photoluminescence (PL) measurements.With increasing cap layer thickness,the PL peak energy shifts to lower energy and the coupling strength between the exciton and longitudinal-optical (LO) phonon,described by Huang-Rhys factor,increases remarkably due to an enhancement of the internal electric field.With increasing excitation intensity,the zero-phonon peak shows a blueshift and the Huang-Rhys factor decreases.These results reveal that there is a large built-in electric field in the well layer and the exciton-LO-phonon coupling is strongly affected by the thickness of the cap layer.     

Photoluminescence linewidth broadening due to alloy/thickness fluctuation of CdxZn1 − xSe/ZnSe triple quantum wells

Photoluminescence (PL) linewidth broadening of Cd_xZn_{1 − x}Se/ZnSe triple quantum wells, grown on GaAs substrates by molecular beam epitaxy (MBE), has been investigated. Various quantum well (QW) samples have been prepared with different QW thickness and composition (Cd-composition). Measured and calculated PL linewidth are compared. Both composition and thickness fluctuations are considered for the calculation with the parameters such as the volume of exciton, nominal thickness and composition of QWs. Surface roughness measured by atomic force microscopy (AFM) is used to estimate the interface roughness. Results show that when Cd-composition increases additional linewidth broadening due to Zn/Cd interdiffusion is enhanced.     

A study of GaInP/GaAs interfaces: metallurgical coupling of successive quantum wells

We present a study of GaInP/GaAs interfaces by means of photoluminescence (PL) of multi quantum wells (MQW), embedded in GaInP, or asymmetric structures having an AlGaAs barrier GaInP/GaAs/AlGaAs. The PL energies of quantum wells were compared with calculations based on the transfer matrix envelope function approximation, well suited for asymmetric structures. GaInP/GaAs/AlGaAs MQW structures (GaInP grown first) are in reasonably good agreement with calculations. Reverse ones, AlGaAs/GaAs/GaInP, present a lower PL energy than calculated. But the agreement with theory is recovered on single quantum well samples, or in MQW when the GaInP thickness is increased up to 100 nm. We interpret this phenomenon as a diffusion of arsenic atoms from the next GaAs well through the GaInP barrier. Arsenic atoms exchange with phosphorus atoms at the GaInP-on-GaAs interface of the former well, leading to a small gap strained InGaAs region responsible for the lowering of PL energies.     

Exciton capture and thermal escape in InAs dot-in-a-well laser structures

The photoluminescence (PL), its temperature and power dependences have been studied in InAs quantum dots (QDs) embedded in asymmetric In_xGa_1?y As/GaAs quantum wells (QWs) with variable In_xGa_1?x As compositions in the capping layer. Three stages for thermally activated decay of QD PL intensity have been revealed. A set of rate equations for exciton dynamics (relaxation into QWs and QDs, and thermal escape) are solved to analyze the mechanism of PL thermal decay. The variety of PL intensities and peak positions, as well as the activation energies of PL intensity decay in DWELL structures with different compositions of a capping layer are discussed.     

Optical spectra in the region of exciton resonances in quantum wells and quantum dots of In0.3Ga0.7As/GaAs heterostructures

The transparency, reflection and luminescence spectra of In_0.3Ga_0.7As structures with 8 nm thickness and quantum wells limited by the barrier layer GaAs of a 9 nm (upper layer) and 100 nm (bottom layer) thickness had been studied in the region of photon energy 0.5–1.6 eV. Lines associated with the transitions hh,lh1-e1(1s,2s,3s), hh2,lh2-e2(1s,2s,3s), hh1,lh1-e2(1s) and hh3,lh3-e3(1s) had been revealed in reflection spectra. The shapes of the reflection and transparency lines had been calculated using a single oscillator model of dispersion relations and the Kramers–Kronig integrals. The binding energy of hh,lh1-e1 excitons, the effective mass m_hh^∗ and m_lh^∗ and the damping factor for the optical transitions to QW and QD had been determined. The lifetime of charge carriers on quantum dots varies in the range of 0.04–0.1 ps, while the radiative lifetime of excitons in quantum wells in the considered structure is around 2 ps.     

Influence of semiconductor cap layer on the impurity-free vacancy disordering of the In<Subscript>0.2</Subscript>Ga<Subscript>0.8</Subscript>As/GaAs multiquantum-well structure by dielectric capping layers

The feasibility of normal GaAs, low-temperature-grown GaAs (LT-GaAs) and low-temperature-grown InGaAs (LT-InGaAs) as the capping layers for impurity-free vacancy disordering (IFVD) of the In_0.2Ga_0.8As/GaAs multiquantum-well (MQW) structure has been studied. The normal GaAs, LT-GaAs and LT-InGaAs layers were tested as the outermost capping layer and the intermediate cap layer underneath the SiO₂ or Si₃N₄ capping layer. The degree of quantum-well intermixing (QWI) induced by rapid thermal annealing was estimated by the shift of the photoluminescence (PL) peak energy. It was found that the IFVD of the In_0.2Ga_0.8As/GaAs MQW structure using LT-GaAs (LT-InGaAs) as the outermost capping layer was much smaller (larger) than that using a SiO₂ (Si₃N₄) capping layer. It was also observed that the insertion of the normal GaAs, LT-GaAs and LT-InGaAs cap layers below the SiO₂ or Si₃N₄ capping layer reduces the degree of QWI and the PL intensity after the QWI. A plausible explanation for the influence of normal GaAs, LT-GaAs and LT-InGaAs cap layers for the QWI of the InGaAs/GaAs structure is also discussed. PACS 68.55.Ln; 73.20.Dx; 78.55.-m     

近红外波段InAs量子点结构与光学特性

采用分子束外延技术,分别在480,520℃的生长温度下,制备了淀积厚度2.7ML的InAs/GaAs量子点。用原子力显微镜对样品进行形貌测试和统计分布。结果表明,在相应的生长温度下,量子点密度分别为8.0×10¹⁰,5.0×10⁹cm^-2,提高生长温度有利于获得大尺寸的量子点,并且量子点按高度呈双模分布。结合光致发光谱的分析,在480℃的生长条件下,最近邻量子点之间的合并导致了量子点尺寸的双模分布;而在525℃的生长温度下,In偏析和InAs解析是形成双模分布的主要原因。     

干法刻蚀影响应变量子阱发光的机理研究

采用感应耦合等离子体刻蚀技术对InAsP/InP应变多量子阱和InAsP/InGaAsP应变单量子阱材料的覆盖层进行了不同厚度的干法刻蚀. 实验结果表明，干法刻蚀后量子阱光致荧光强度得到了不同程度的增强. 干法刻蚀过程不仅增加了材料表面粗糙度，同时使其内部微结构发生变化. 采用湿法腐蚀方法去除表面变粗糙对量子阱发光特性的影响，得到干法刻蚀覆盖层20 nm后应变单量子阱微结构变化和其表面粗糙度变化两个因素分别使荧光强度提高1.8倍和1.2倍的结果. 关键词： 干法刻蚀 应变多量子阱 光致发光谱 损伤     

Absence of nonradiative recombination centers in modulation-doped quantum wells revealed by two-wavelength excited photoluminescence

Absence of nonradiative recombination (NRR) centers inside GaAs wells and at GaAs/Al_0.2Ga_0.8As hetero-interfaces in a Si modulation-doped GaAs/Al_0.2Ga_0.8As multiple quantum well (MQW) structure became clear for the first time by an improved two-wavelength excited photoluminescence (PL). The NRR parameters of modulation and uniform-doped MQWs were determined self-consistently by combining the analysis of the PL intensity change due to the below-gap excitation with the internal quantum efficiency and the recombination lifetime. These results showed the superiority of modulation-doping scheme over that of uniform-doping for light emitting devices.     

有机量子阱的光学性质

采用多源有机分子气相沉积系统(OMBD)制备了Alq₃，PBD/Alq₃，PBD/Alq₃/PBD单层、双层以及量子阱结构，利用电化学循环伏安法和吸收光谱、荧光光谱研究了量子阱的类型和样品的光致发光特性.电化学循环伏安法和吸收光谱的测量结果表明，PBD/Alq₃有机量子阱为Ⅰ型量子阱结构.荧光光谱的研究结果表明，单层Alq₃的光致发光峰不随Alq₃厚度变化而变化；但是双层PBD/Alq₃结构光致发光峰随Alq₃厚度的减小而发生蓝移；同样对于PBD/Alq₃/PBD量子阱结构光致发光峰随Alq₃厚度的减小而发生蓝移.对引起光谱蓝移的原因进行了讨论. 关键词： 有机量子阱 光谱蓝移